2A2H6-2310Bicolor Wireless Headset

Operating 0-40 temperatue 0-40

Tim Payne Digitally signed by Tim Payne DN: cn=Tim Payne, o=FCC US Agent, LLC, ou=FCC US Agent, LLC, [email protected], c=US Date: 2023.12.20 11:59:49 -06'00'

ReportNo.:EED32P81988001Page 48 of 57 8 HOTOGRAHSOFEUTConstructonalDetals ViewofProduct-1 ViewofProduct-2 ReportNo.:EED32P81988001Page 49 of 57 ViewofProduct-3 ViewofProduct-4 ReportNo.:EED32P81988001Page 50 of 57 ViewofProduct-5 ViewofProduct-6 ReportNo.:EED32P81988001Page 51 of 57 ViewofProduct-7 ViewofProduct-8 ReportNo.:EED32P81988001Page 52 of 57 ViewofProduct-9 ViewofProduct-10 ReportNo.:EED32P81988001Page 53 of 57 ViewofProduct-11

3106EHXXXX1101 2310 2A2H6-2310 8

Report No. : EED32P81988001Page 53 of 60 View of Product-11 View of Product-12 Report No. : EED32P81988001Page 54 of 60 View of Product-13 View of Product-14 Report No. : EED32P81988001Page 55 of 60 View of Product-15 View of Product-16

Report No. : EED32P81988001Page 56 of 60 View of Product-17 View of Product-18 Report No. : EED32P81988001Page 57 of 60 View of Product-19 View of Product-20 Report No. : EED32P81988001Page 58 of 60 View of Product-21 View of Product-22

Report No. : EED32P81988001Page 59 of 60 View of Product-23 View of Product-24 Report No. : EED32P81988001Page 60 of 60 View of Product-25 View of Product-26 The test report is effective only with both signature and specialized stamp, The result(s) shown in this report refer only to the sample(s) tested. Without written approval of CTI, this report can’t be reproduced except in full. *** End of Report ***

Report No. : EED32P81988002Page 1 of 7 1 COVER PAGE RF Exposure Evaluation Report Product:Bicolor Wireless Headset Trade mark:MINISO Model/Type reference:2310 Serial Number:N/A Report Number:EED32P81988002 FCC ID:2A2H6-2310 Date of Issue:Dec. 19, 2023 Test Standards: 47 CFR Part 1.1307 47 CFR Part 1.1310 47 CFR Part 2.1091 47 CFR Part 2.1093 447498 D04 Interim General RF Exposure Guidance v01 Test result:PASS Prepared for: Shenzhen Bao Tianhua Technology Co., Ltd 301,Building Plant No.5 Ailiang Road, Xi Keng Community Yuanshan Sub-district. Longgang district, Shenzhen, Guangdong,China Prepared by: Centre Testing International Group Co., Ltd. Hongwei Industrial Zone, Bao’an 70 District, Shenzhen, Guangdong, China TEL: +86-755-3368 3668 FAX: +86-755-3368 3385 Compiled by:Reviewed by: Mark ChenFrazer Li Approved by:Date:Dec. 19, 2023 Aaron Ma Check No.: 8103061223 Report No. : EED32P81988002Page 2 of 7 2 Version Version No.DateDescription 00 Dec. 19, 2023 Original Report No. : EED32P81988002Page 3 of 7 3 Contents Page 1 COVER PAGE....................................................................................................................................................................1 2 VERSION............................................................................................................................................................................ 2 3 CONTENTS........................................................................................................................................................................ 3 4 GENERAL INFORMATION..............................................................................................................................................4 4.1 C LIENTINFORMATION................................................................................................................................................... 4 4.2 G ENERALDESCRIPTION OFEUT...................................................................................................................................4 4.3 P RODUCTSPECIFICATION SUBJECTIVE TO THIS STANDARD...........................................................................................4 4.4 T EST LOCATION.............................................................................................................................................................5 4.5 D EVIATION FROMSTANDARDS......................................................................................................................................5 4.6 A BNORMALITIES FROMSTANDARDCONDITIONS..........................................................................................................5 4.7 O THERINFORMATIONREQUESTED BY THECUSTOMER................................................................................................5 5 SAR EVALUATION...........................................................................................................................................................6 5.1 RF EXPOSURECOMPLIANCEREQUIREMENT.................................................................................................................6 5.1.1 Limits....................................................................................................................................................................6 5.1.2 T estProcedure....................................................................................................................................................6 5.1.3 EUT RF Exposure Evaluation..........................................................................................................................7 Report No. : EED32P81988002Page 4 of 7 4 General Information 4.1 Client Information Applicant:Shenzhen Bao Tianhua Technology Co., Ltd Address of Applicant:301,Building Plant No.5 Ailiang Road, Xi Keng Community Yuanshan Sub-district. Longgang district, Shenzhen, Guangdong,China Manufacturer:Shenzhen Bao Tianhua Technology Co., Ltd Address of Manufacturer:301,Building Plant No.5 Ailiang Road, Xi Keng Community Yuanshan Sub-district. Longgang district, Shenzhen, Guangdong,China Factory:Shenzhen Bao Tianhua Technology Co., Ltd Address of Factory:301,Building Plant No.5 Ailiang Road, Xi Keng Community Yuanshan Sub-district. Longgang district, Shenzhen, Guangdong,China 4.2 General Description of EUT Product Name: Bicolor Wireless Headset Model No.(EUT): 2310 Trade Mark: MINISO 4.3 Product Specification subjective to this standard Frequency Range:2402MHz~2480MHz Modulation Type:GFSK, π/4DQPSK, 8DPSK Test Power Grade:Default Test Software of EUT:BT_Tool.exe Antenna Type: PCB Antenna Antenna Gain: 1.9dBi Power Supply:Battery DC 3.7V Sample Received Date: Dec. 07, 2023 Sample tested Date: Dec. 07, 2023 to Dec. 15, 2023 Remark: Company Name and Address shown on Report, the sample(s) and sample Information was/ were provided by the applicant who should be responsible for the authenticity which CTI hasn’t verified. Report No. : EED32P81988002Page 5 of 7 4.4 Test Location All tests were performed at: Centre Testing International Group Co., Ltd Building C, Hongwei Industrial Park Block 70, Bao'an District, Shenzhen, China Telephone: +86 (0) 755 33683668 Fax:+86 (0) 755 33683385 No tests were sub-contracted. FCC Designation No.: CN1164 4.5 Deviation from Standards None. 4.6 Abnormalities from Standard Conditions None. 4.7 Other Information Requested by the Customer None. Report No. : EED32P81988002Page 6 of 7 5 SAR Evaluation 5.1 RF Exposure Compliance Requirement 5.1.1Limits The SAR-based exemption formula of § 1.1307(b)(3)(i)(B), repeated here as Formula (B.2), applies for single fixed, mobile, and portable RF sources with available maximum time-averaged power or effective radiated power (ERP), whichever is greater, of less than or equal to the threshold Pth (mW). This method shall only be used at separation distances from 0.5 cm to 40 cm and at frequencies from 0.3 GHz to 6 GHz (inclusive).…

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Product specification Antenna module on the system boar Quick Reference Date d Frequenc Range 2400 ~ 2500MHz Ant. Port Input Pwr. (dBm) 0 (Typ. BT class 2 output power) Tot. Rad. Pwr. (dBm) -1.2 (Input pwr – loss pwr) Peak EIRP(dBm) 1.2 Directivity (dBi) 1 (all direction antenna) Efficiency (dB) 6 0.2 % Gain (dBi) 1.2 (Avg Gain XY-plane) Maximum Power (dBm) 1.7 (XY-plane) Minimum Power (dBm) -4(XY-plane) Avg. Power (dBm) -0.5(XY-plane) Input Impendence(ohm) 50 Polarization Type V ertical & Horizontal V . S .W . R < 1.4 All the technical data and information contained herein are subject to change without prior notice Antenna Layout & module on the system board Antenna Gain Gain Table Unit in dBi @2.44GHz XY-plane XZ-plane YZ-plane Efficiency Peak Avg. Peak Avg. Peak Avg. Module Board 1.2 -0.5 1.9 -3.6 1.1 -3.0 6 0.2 % Retum Loss The Environment of Antenna Radiation Pattem 3D radiation pattern diagram XY-plane XZ-plane YZ-plane Manufacturer:Shenzhen Jumingsheng Technology Co., Ltd. Shenzhen Bao'an District Ring Road Liancheng SoundAddress: Photoelectric Industrial Park Jupiter 708

Report No. : EED32P81988001Page 1 of 57 TEST REPORT Product:Bicolor Wireless Headset Trade mark:MINISO Model/Type reference:2310 Serial Number:N/A Report Number:EED32P81988001 FCC ID:2A2H6-2310 Date of Issue:Dec. 19, 2023 Test Standards: 47 CFR Part 15 Subpart C Test result:PASS Prepared for: Shenzhen Bao Tianhua Technology Co., Ltd 301,Building Plant No.5 Ailiang Road, Xi Keng Community Yuanshan Sub-district. Longgang district, Shenzhen, Guangdong,China Prepared by: Centre Testing International Group Co., Ltd. Hongwei Industrial Zone, Bao’an 70 District, Shenzhen, Guangdong, China TEL: +86-755-3368 3668 FAX: +86-755-3368 3385 Compiled by:Reviewed by: Mark ChenFrazer Li Approved by:Date:Dec. 19, 2023 Aaron Ma Check No.: 8103061223 Report No. : EED32P81988001Page 2 of 57 1 Contents Page 1 CONTENTS......................................................................................................................................................................2 2 VERSION..........................................................................................................................................................................3 3 TEST SUMMARY............................................................................................................................................................4 4 GENERAL INFORMATION...........................................................................................................................................5 4.1 C LIENTINFORMATION.................................................................................................................................................5 4.2 G ENERALDESCRIPTION OFEUT.................................................................................................................................5 4.3 T EST CONFIGURATION................................................................................................................................................ 7 4.4 T EST ENVIRONMENT...................................................................................................................................................8 4.5 D ESCRIPTION OFSUPPORTUNITS ............................................................................................................................... 8 5 TEST RESULTS AND MEASUREMENT DATA.....................................................................................................13 5.1 A NTENNAREQUIREMENT..........................................................................................................................................13 5.2 M AXIMUMCONDUCTEDOUTPUTPOWER.................................................................................................................14 5.3 20 DB E MISSIONBANDWIDTH....................................................................................................................................15 5.4 C ARRIERFREQUENCYSEPARATION..........................................................................................................................16 5.5 N UMBER OFHOPPINGCHANNEL...............................................................................................................................17 5.6 T IME OFOCCUPANCY................................................................................................................................................18 5.7 B AND EDGEMEASUREMENTS................................................................................................................................... 19 5.8 C ONDUCTEDSPURIOUSEMISSIONS...........................................................................................................................20 5.9 P SEUDORANDOMFREQUENCYHOPPINGSEQUENCE.................................................................................................21 5.10 R ADIATEDSPURIOUSEMISSION& R ESTRICTED BANDS.........................................................................................23 6 APPENDIX BLUETOOTH CLASSIC.........................................................................................................................45 7 PHOTOGRAPHS OF TEST SETUP..........................................................................................................................46 8 PHOTOGRAPHS OF EUT CONSTRUCTIONAL DETAILS..................................................................................48 Report No. : EED32P81988001Page 3 of 57 2 Version Version No.DateDescription 00 Dec. 19, 2023 Original Report No. : EED32P81988001Page 4 of 57 3 Test Summary Test ItemTest RequirementResult Antenna Requirement 47 CFR Part 15, Subpart C Section 15.203/15.247 (c) PASS AC Power Line Conducted Emission 47 CFR Part 15, Subpart C Section 15.207 N/A Maximum Conducted Output Power 47 CFR Part 15, Subpart C Section 15.247 (b)(1) PASS 20dB Emission Bandwidth 47 CFR Part 15, Subpart C Section 15.247 (a)(1) PASS Carrier Frequency Separation 47 CFR Part 15, Subpart C Section 15.247 (a)(1) PASS Number of Hopping Channels 47 CFR Part 15, Subpart C Section 15.247 (a)(1) PASS Time of Occupancy47 CFR Part 15, Subpart C Section 15.247 (a)(1)PASS Pseudorandom Frequency Hopping Sequence 47 CFR Part 15, Subpart C Section 15.247(b)(4) PASS Band Edge Measurements 47 CFR Part 15, Subpart C Section 15.247(d) PASS Conducted Spurious Emissions 47 CFR Part 15, Subpart C Section 15.247(d) PASS Radiated Spurious emissions 47 CFR Part 15, Subpart C Section 15.205/15.209PASS Restricted bands around fundamental frequency 47 CFR Part 15, Subpart C Section 15.205/15.209PASS Remark: N/A: When the EUT charging, BT will not work,so Not Applicable. Company Name and Address shown on Report, the sample(s) and sample Information was/ were provided by the applicant who should be responsible for the authenticity which CTI hasn’t verified. Report No. : EED32P81988001Page 5 of 57 4 General Information 4.1Client Information Applicant:Shenzhen Bao Tianhua Technology Co., Lt…

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Report No. : EED32P81988001Page 46 of 57 7 PHOTOGRAPHS OF TEST SETUP Radiated spurious emission Test Setup-1 (Below 1GHz) Radiated spurious emission Test Setup-2( Above 1GHz) Report No. : EED32P81988001Page 47 of 57 Radiated spurious emission Test Setup-3(Above 1GHz) There are absorbing materials under the ground.