2A2HI-NYWK-2Garbage Disposal Self-Powered Wireless Switch Kit

Reference No.: WTX21X04033155W-1 Page 2 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX21X04033155W-1 Page 3 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX21X04033155W-1 Page 4 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6

Reference No.: WTX21X04033155W-1 Page 5 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX21X04033155W-1 Page 6 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX21X04033155W-1 Page 7 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 27 TEST REPORT Reference No. ....................: WTX21X04033155W-1 FCC ID ............................... .: 2A2HI-NYWK-2 Applicant .......................... .: Hangzhou Cleesink Mechanical & Electrical Co.,Ltd. Address ............................ .: Room 218, No.171 Xingqiao North Road Xingqiao Town Yuhang Area, Hangzhou, China. Product Name .................. .: Garbage Disposal Self-Powered Wireless Switch Kit Test Model. ....................... .: NYWK-2 Standards ......................... .: FCC Part 15.249 Date of Receipt sample ... .: Apr. 14, 2021 Date of Test....................... .: Apr. 14, 2021 to Jun. 23, 2021 Date of Issue .................... .: Jun. 23, 2021 Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Mike Shi / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X04033155W-1 Page 2 of 27 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENTS .............................................................................................................................. 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 TEST RESULT........................................................................................................................................................ 11 4. RADIATED EMISSIONS ....................................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST PROCEDURE ................................................................................................................................................. 12 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 15 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 5. OUT OF BAND EMISSIONS ................................................................................................................................. 19 5.1 STANDARD APPLICABLE ....................................................................................................................................... 19 5.2 TEST PROCEDURE ................................................................................................................................................. 19 5.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 6. EMISSION BANDWIDTH ..................................................................................................................................... 24 6.1 STANDARD APPLICABLE ....................................................................................................................................... 24 6.2 TEST PROCEDURE ................................................................................................................................................. 24 6.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 24 7. CONDUCTED EMISSIONS .................................................................................................................................. 26 7.1 TEST PROCEDURE ................................................................................................................................................. 26 7.2 BASIC TEST SETUP BLOCK DIAGRAM ........................................................…

Text truncated - open the document above for the full version.

Reference No.: WTX21X04033155W-1 Page 8 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTX21X04033155W-1 Page 9 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (1GHz to 18GHz) Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****