2A423-SB-2101SPEAKER with BT

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QAISE INC 2626 N WEST LANE UNIT 1000, STOCKTON, California 95205, United States --------------------------------------------------------------------------------------------------------------------- Date: 2022-04-12 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2A423-SB-2101 Confidentiality Request To whom it may concern, Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of the information accompanying this application as outlined below: ☒ Block Diagram ☐ Tune-Up Information ☒ Operational Description ☐ Security Information ☒ Schematics ☐ Software Defined Radio (SDR) Information ☐ Parts List The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, QAISE INC ------------------------------- (YOUSAF AHMADI) (Manager)

QAISE INC 2626 N WEST LANE UNIT 1000, STOCKTON, California 95205, United States -------------------------------------------------------------------------------- (FCC ID ： 2A423-SB-2101) POWER OF ATTORNEY DATE: 2022-04-12 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf shall have the same effect as acts of our own. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, QAISE INC are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, QAISE INC ------------------------------- (YOUSAF AHMADI) (Manager)

QAISE INC Supplier’s Declaration Of Conformity for the FCC SDoC Procedure The following Equipment adapt FCC SDoC Procedure according to FCC part 2.906 : Product Name: SPEAKER Brand Nam: QAISE Model Number: SB-2101 Report Number: WTX22X02025349W-2 It’s herewith confirmed to comply with the requirements of FCC Part 15 Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) This device must accept any interference received, including interference that may cause undesired operation. It is understood that each unit marketed is identical to the device as tested, and any changes to the device that could adversely affect the emission characteristics will require retest. The following importer / responsible party in United States: Company Name: QAISE INC Company Address: 2626 N WEST LANE UNIT 1000, STOCKTON CA 95205, UNITED STATES Telephone: (530) 844-7497 Fax: (530) 844-7497 Person is responsible for marking this declaration: YOUSAF AHMADI Name (Full name ) Manager Position / Title 2022-04-12 Legal Signature Date

Reference No.: WTX22X02025349W-1 Page 2 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX22X02025349W-1 Page 3 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX22X02025349W-1 Page 4 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX22X02025349W-1 Page 5 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7 EUT View 8 Reference No.: WTX22X02025349W-1 Page 6 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 9

Reference No.: WTX22X02025349W-1 Page 1 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2A423-SB-2101 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX22X02025349W-1 Page 7 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX22X02025349W-1 Page 8 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX22X02025349W-1 Page 9 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 3 Solder Board-Component View 4 Reference No.: WTX22X02025349W-1 Page 10 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 5 Solder Board-Component View 6

Reference No.: WTX22X02025349W-1 Page 11 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 7 Solder Board-Component View 8 Reference No.: WTX22X02025349W-1 Page 12 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 9 Solder Board-Component View 10 Reference No.: WTX22X02025349W-1 Page 13 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 11 Solder Board-Component View 12

Reference No.: WTX22X02025349W-1 Page 14 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 13 Solder Board-Component View 14 Reference No.: WTX22X02025349W-1 Page 15 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 15 Solder Board-Component View 16 Reference No.: WTX22X02025349W-1 Page 16 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 17 Solder Board-Component View 18 Reference No.: WTX22X02025349W-1 Page 17 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View

1. MAXIMUM PERMISSIBLE EXPOSURE (MPE) 1.1 General Information Client Information Applicant: QAISE INC Address of applicant: 2626 N WEST LANE UNIT 1000, STOCKTON CA 95205, UNITED STATES Manufacturer: GUANGZHOU MSH ELECTRONICS TECHNOLOGY CO LTD Address of manufacturer: UNIT 8,NO.28 JUFU WEST ROAD,YAYAO TOWN,HUADU DISTRICT,GUANGZHOU CITY, GUANGDONG PROVINCE, P.R.CHINA General Description of EUT: Product Name: SPEAKER Trade Name: QAISE Model No.: SB-2101 Adding Model(s): / Rated Voltage: AC Port:AC120V/60Hz Battery:DC12V Power Adapter 7Ah FCC ID: 2A423-SB-2101 Equipment Type: Fixed device Technical Characteristics of EUT: Bluetooth Bluetooth Version: V5.1 (BR/EDR mode) Frequency Range: 2402-2480MHz RF Output Power: -20.43dBm (Conducted) Data Rate: 1Mbps, 2Mbps, 3Mbps Modulation: GFSK, π/4 DQPSK, 8DPSK Quantity of Channels: 79 Channel Separation: 1MHz Type of Antenna: PCB Antenna Antenna Gain: 0dBi 1.2 Standard Applicable According to §1.1307(b)(1) and KDB 447498 D01 General RF Exposure Guidance v06, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. (a) Limits for Occupational / Controlled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-3.0 614 1.63 (100)* 6 3.0-30 1842/f 4.89/f (900/f)* 6 30-300 61.4 0.163 1.0 6 300-1500 / / F/300 6 1500-100000 / / 5 6 (b) Limits for General Population / Uncontrolled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-1.34 614 1.63 (100)* 30 1.34-30 824/f 2.19/f (180/f)* 30 30-300 27.5 0.073 0.2 30 300-1500 / / F/1500 30 1500-100000 / / 1 30 Note: f = frequency in MHz: * = Plane-wave equivalents power density 1.3 MPE Calculation Method S = (30*P*G) / (377*R 2 ) S = power density (in appropriate units, e.g., mw/cm 2 ) P = power input to the antenna (in appropriate units, e.g., mw) G = power gain of the antenna in the direction of interest relative to an isotropic radiator, the power gain factor is normally numeric gain. R = distance to the center of radiation of the antenna (in appropriate units, e.g., cm) 1.4 MPE Calculation Result For Bluetooth Maximum Tune-Up output power: -20(dBm) Maximum peak output power at antenna input terminal: 0.01(mW) Prediction distance: >20(cm) Prediction frequency: 2480(MHz) Antenna gain: 0 (dBi) Directional gain (numeric gain): 1.00 The worst case is power density at prediction frequency at 20cm: 0.0001(mw/cm 2 ) MPE limit for general population exposure at prediction frequency: 1 (mw/cm 2 ) Result: Pass

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 64 TEST REPORT Reference No. ....................: WTX22X02025349W-1 FCC ID ............................... .: 2A423-SB-2101 Applicant .......................... .: QAISE INC Address ............................ .: 2626 N WEST LANE UNIT 1000, STOCKTON CA 95205, UNITED STATES Manufacturer .................... .: GUANGZHOU MSH ELECTRONICS TECHNOLOGY CO LTD Address ............................ .: UNIT 8,NO.28 JUFU WEST ROAD,YAYAO TOWN,HUADU DISTRICT,GUANGZHOU CITY,GUANGDONG PROVINCE,P.R.CHINA Product Name .................. .: SPEAKER Model No... ........................ .: SB-2101 Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: 2022-02-24 Date of Test....................... .: 2022-02-24 to 2022-04-07 Date of Issue .................... .: 2022-04-07 Test Report Form No. ...... . : WTX_Part 15_247W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Silin Chen Reference No.: WTX22X02025349W-1 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 64 TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................... 6 1.3 TEST METHODOLOGY ............................................................................................................................................. 6 1.4 TEST FACILITY ....................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 13 3. ANTENNA REQUIREMENT ................................................................................................................................ 14 3.1 STANDARD APPLICABLE ....................................................................................................................................... 14 3.2 EVALUATION INFORMATION ................................................................................................................................ 14 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS ................................................................................... 15 4.1 STANDARD APPLICABLE ....................................................................................................................................... 15 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 15 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 16 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 17 5.1 STANDARD APPLICABLE ....................................................................................................................................... 17 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 7 5.3 TEST PROCEDURE ................................................................................................................................................. 17 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 18 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 19 6.1 STANDARD APPLICABLE ....................................................................................................................................... 19 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 9 6.3 TEST PROCEDURE ................................................................................................................................................. 19 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 20 7. 20DB BANDWIDTH ............................................................................................................................................... 21 7.1 STANDARD APPLICABLE .................................................................................................…

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Reference No.: WTX22X02025349W-1 Page 18 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX22X02025349W-1 Page 19 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX22X02025349W-1 Page 20 of 20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****