2A54N-ESP8266ESP8266 Development Board

Reference No.: WTX22X03050683W Page 1 of 6 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2A54N-ESP8266 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

1. MAXIMUM PERMISSIBLE EXPOSURE (MPE) 1.1 General Information Client Information Applicant: Shenzhen HiLetgo E-Commerce Co., Ltd Address of applicant: Room 1716, HuaNan FaZhan Building, HuaNanCheng, PingHu, LongGang, ShenZhen, GuangDong, China Manufacturer: Shenzhen HiLetgo E-Commerce Co., Ltd Address of manufacturer: Room 1716, HuaNan FaZhan Building, HuaNanCheng, PingHu, LongGang, ShenZhen, GuangDong, China General Description of EUT: Product Name: ESP8266 Development Board Trade Name: / Model No.: ESP8266 Adding Model(s): / Rated Voltage: DC 5V FCC ID: 2A54N-ESP8266 Equipment Type: Mobile device Technical Characteristics of EUT: Wi-Fi Support Standards: 802.11b, 802.11g, 802.11n Frequency Range: 2412-2462MHz for 802.11b/g/n(HT20) RF Output Power: 15.52dBm (Conducted) Type of Modulation: CCK, OFDM, QPSK, BPSK, 16QAM, 64QAM Quantity of Channels: 11 for 802.11b/g/n(HT20) Channel Separation: 5MHz Type of Antenna: PCB Printed Antenna Antenna Gain: 2dBi 1.2 Standard Applicable According to §1.1307(b)(1) and KDB 447498 D01 General RF Exposure Guidance v06, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. (a) Limits for Occupational / Controlled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-3.0 614 1.63 (100)* 6 3.0-30 1842/f 4.89/f (900/f)* 6 30-300 61.4 0.163 1.0 6 300-1500 / / F/300 6 1500-100000 / / 5 6 (b) Limits for General Population / Uncontrolled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-1.34 614 1.63 (100)* 30 1.34-30 824/f 2.19/f (180/f)* 30 30-300 27.5 0.073 0.2 30 300-1500 / / F/1500 30 1500-100000 / / 1 30 Note: f = frequency in MHz: * = Plane-wave equivalents power density 1.3 MPE Calculation Method S = (30*P*G) / (377*R 2 ) S = power density (in appropriate units, e.g., mw/cm 2 ) P = power input to the antenna (in appropriate units, e.g., mw) G = power gain of the antenna in the direction of interest relative to an isotropic radiator, the power gain factor is normally numeric gain. R = distance to the center of radiation of the antenna (in appropriate units, e.g., cm) 1.4 MPE Calculation Result For Wi-Fi: Maximum Tune-Up output power: 16.0 (dBm) Maximum peak output power at antenna input terminal: 39.81 (mW) Prediction distance: >20(cm) Prediction frequency: 2412 (MHz) Antenna gain: 2.0 (dBi) Directional gain (numeric gain): 1.58 The worst case is power density at prediction frequency at 20cm: 0.0126 (mw/cm 2 ) MPE limit for general population exposure at prediction frequency: 1 (mw/cm 2 ) Result: Pass

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 51 TEST REPORT Reference No. .................... : WTX22X03050683W FCC ID ................................ : 2A54N-ESP8266 Applicant ........................... : Shenzhen HiLetgo E-Commerce Co., Ltd Address.............................. : Room 1716, HuaNan FaZhan Building, HuaNanCheng, PingHu, LongGang, ShenZhen, GuangDong, China Manufacturer ..................... : The same as Applicant Address.............................. : The same as Applicant Product Name ................... : ESP8266 Development Board Model No... ......................... : ESP8266 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : 2022-03-23 Date of Test........................ : 2022-03-26 to 2022-04-15 Date of Issue ..................... : 2022-04-15 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jack Huang Silin Chen Reference No.: WTX22X03050683W Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 51 TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION................................................................................................................................. 11 4. POWER SPECTRAL DENSITY ........................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 12 4.3 TEST PROCEDURE ................................................................................................................................................. 12 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 5. DTS BANDWIDTH ................................................................................................................................................. 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 13 5.3 TEST PROCEDURE ................................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 6. RF OUTPUT POWER ............................................................................................................................................ 14 6.1 STANDARD APPLICABLE ....................................................................................................................................... 14 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 6.3 TEST PROCEDURE ................................................................................................................................................. 14 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 14 7. FIELD STRENGTH OF SPURIOUS …

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Reference No.: WTX22X03050683W Page 4 of 6 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX22X03050683W Page 5 of 6 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX22X03050683W Page 6 of 6 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****