2A5SE-ECLIPSE-L1Lunar Eclipse L1 (Mobile Phone)

8 CONDUCTED RF OUPUT POWER 8.1 GSM Output Power 8.2 WCDMA Output Power 8.3 LTE Output Power 8.3.1 LTE Band2 Output Power 8.3.2 LTE Band4 Output Power 8.3.3 LTE Band5 Output Power 8.3.4 LTE Band12 Output Power 8.3.5 LTE Band17 Output Power 8.3.6 LTE Band25 Output Power 8.3.7 LTE Band26 Output Power 8.3.8 LTE Band66 Output Power 8.3.9 LTE Band71 Output Power 8.3.10 LTE Band41 Output Power 8.4 Intra-Band Uplink CA Power 8.4.1 LTE Band7 Uplink CA Output Power 8.4.2 LTE Band38 Uplink CA Output Power 8.4.3 LTE Band41 Uplink CA Output Power 8.5 5G NR Output Power 8.5.1NR Band2 Output Power 8.5.2NR Band5 Output Power 8.5.3NR Band25 Output Power 8.5.4NR Band41 Output Power 8.5.5NR Band66 Output Power 8.5.6NR Band71 Output Power 8.5.7NR Band77 Output Power 8.6LTE Downlink Carrier Aggregation Setup Configurations 8.6.1Downlink Bandwidth Combination Sets for Intra-Band CA 8.6.2Downlink Bandwidth Combination Sets for Inter-Band CA 8.6.3Power Confirmation for SAR test Exclusion for LTE Downlink CA 8.1GSM Output Power GSM-Full Power-Ant.0 GSM850 Band Burst Average Power(dBm)Tune-up Power(dBm) Frame-Averaged power Tune-up Power(dBm） Channel128190251128190251 GSM (GMSK, 1-Slot) 32.71 32.82 32.84 33.50 23.52 23.63 23.65 24.31 GPRS (GMSK, 1-Slot) 32.71 32.81 32.84 33.50 23.52 23.62 23.65 24.31 GPRS (GMSK, 2-Slots) 31.94 32.04 32.07 32.50 25.81 25.91 25.94 26.37 GPRS (GMSK, 3-Slots) 30.17 30.26 30.29 30.50 25.75 25.84 25.87 26.08 GPRS (GMSK, 4-Slots) 29.08 29.20 29.24 29.50 25.90 26.02 26.06 26.32 EGPRS (8PSK, 1-Slot) 26.40 26.46 26.56 28.00 17.21 17.27 17.37 18.81 EGPRS (8PSK, 2-Slots) 25.19 25.16 25.32 26.00 19.06 19.03 19.19 19.87 EGPRS (8PSK, 3-Slots) 22.33 22.16 22.71 24.00 17.91 17.74 18.29 19.58 EGPRS (8PSK, 4-Slots) 20.80 21.25 21.10 22.50 17.62 18.07 17.92 19.32 GSM-Full Power-Ant.1 GSM1900 Band Burst Average Power(dBm)Tune-up Power(dBm) Frame-Averaged Tune-up Power(dBm） Channel512661810512661810 GSM (GMSK, 1-Slot) 16.22 16.21 16.16 17.00 7.03 7.02 6.97 7.81 GPRS (GMSK, 1-Slot) 16.28 16.22 16.15 17.00 7.09 7.03 6.96 7.81 GPRS (GMSK, 2-Slots) 16.32 16.26 16.20 17.00 10.19 10.13 10.07 10.87 GPRS (GMSK, 3-Slots) 16.34 16.28 16.22 17.00 11.92 11.86 11.80 12.58 GPRS (GMSK, 4-Slots) 16.35 16.29 16.23 17.00 13.17 13.11 13.05 13.82 EGPRS (8PSK, 1-Slot) 19.26 19.47 19.59 20.00 10.07 10.28 10.40 10.81 EGPRS (8PSK, 2-Slots) 17.86 18.06 18.15 19.00 11.73 11.93 12.02 12.87 EGPRS (8PSK, 3-Slots) 15.53 15.63 15.59 16.00 11.11 11.21 11.17 11.58 EGPRS (8PSK, 4-Slots) 13.90 14.05 14.50 15.00 10.72 10.87 11.32 11.82 8.2WCDMA Output Power WCDMA-Full Power-Ant.1 BandBand 2 Tune-up Limit Power(dBm) Channel926294009538 Frequency1852.40 1880.00 1907.60 AMR 12.2Kbps19.40 19.42 19.34 20.50 RMC 12.2Kbps19.56 19.74 19.45 20.50 HSDPA Subtest-1 18.55 18.47 18.43 19.50 HSDPA Subtest-2 18.69 18.53 18.37 19.50 HSDPA Subtest-3 18.23 18.04 17.97 19.50 HSDPA Subtest-4 18.20 18.03 17.83 19.50 HSUPA Subtest-1 16.56 16.73 16.68 18.50 HSUPA Subtest-2 16.51 16.53 16.65 17.50 HSUPA Subtest-3 17.42 17.54 17.64 18.50 HSUPA Subtest-4 15.94 16.05 16.17 17.50 HSUPA Subtest-5 17.30 17.50 17.37 18.50 HSPA+ 16.51 16.37 16.65 17.50 BandBand 4 Tune-up Limit Power(dBm) Channel131214121513 Frequency1712.40 1732.40 1752.60 AMR 12.2Kbps19.11 18.85 19.01 20.50 RMC 12.2Kbps19.20 19.00 19.14 20.50 HSDPA Subtest-1 18.00 18.20 18.23 19.50 HSDPA Subtest-2 18.05 18.25 18.15 19.50 HSDPA Subtest-3 17.69 17.77 17.60 19.00 HSDPA Subtest-4 17.65 17.80 17.72 19.00 HSUPA Subtest-1 16.55 16.70 16.52 18.50 HSUPA Subtest-2 16.25 16.18 16.37 17.50 HSUPA Subtest-3 17.34 17.16 17.29 18.50 HSUPA Subtest-4 15.91 15.72 15.88 17.50 HSUPA Subtest-5 16.99 17.18 17.21 18.50 HSPA+ 16.09 16.30 16.30 17.50 WCDMA-Full Power-Ant.0 BandBand 5 Tune-up Limit Power(dBm) Channel413241824233 Frequency826.40 836.40 846.60 AMR 12.2Kbps23.24 23.21 23.10 24.00 RMC 12.2Kbps23.24 23.22 23.10 24.00 HSDPA Subtest-1 22.27 22.23 22.16 23.00 HSDPA Subtest-2 22.27 22.23 22.17 23.00 HSDPA Subtest-3 21.82 21.78 21.70 22.00 HSDPA Subtest-4 21.80 21.75 21.64 22.00 HSUPA Subtest-1 20.26 20.22 20.16 21.00 HSUPA Subtest-2 20.24 20.23 20.17 21.00 HSUPA Subtest-3 21.27 21.23 21.17 22.00 HSUPA Subtest-4 19.77 19.74 19.68 20.00 HSUPA Subtest-5 21.25 21.22 21.14 21.50 HSPA+ 20.09 20.23 20.30 21.00 8.3.1LTE Band2 Output Power LTE B2-Full Power -Ant.1 Bandwidth (MHRB SizeRB offestModulation186071890019193 Tune-up power(dBm) 1.4 1 LOWQPSK19.11 19.03 18.91 19.50 MIDQPSK19.15 19.22 19.15 19.50 HIGHQPSK19.09 19.10 18.85 19.50 3 LOWQPSK19.02 18.98 18.96 19.50 MIDQPSK19.29 19.35 19.19 19.50 HIGHQPSK19.21 19.29 19.06 19.50 6LOWQPSK18.04 18.28 17.93 18.50 1.4 1 LOWQ1618.33 18.40 18.45 18.50 MIDQ1618.39 18.29 18.49 18.50 HIGHQ1618.23 18.42 18.44 18.50 3 LOWQ1618.40 18.32 18.33 18.50 MIDQ1618.36 18.25 18.26 18.50 HIGHQ1618.48 18.31 18.46 18.50 6LOWQ1616.97 17.16 17.08 17.50 1.4 1 LOW64QAM17.41 17.47 17.44 17.50 MID64QAM17.39 17.11 17.33 17.50 HIGH64QAM17.33 17.44 17.50 17.50 3 LOW64QAM17.27 17.39 17.40 17.50 MID64QAM17.31 17.15 17.25 17.50 HIGH64QAM17.26 17.38 17.47 17.50 6LOW64QAM16.04 16.04 15.88 16.50 Bandwidth (MHRB SizeRB offestModulation186151890019185 Tune-up power(dBm) 3 1 LOWQPSK18.98 19.04 18.96 19.50 MIDQPSK19.07 19.16 19.13 19.50 HIGHQPSK19.08 19.21 18.92 19.50 8 LOWQPSK18.06 18.13 18.12 18.50 MIDQPSK18.22 18.22 18.01 18.50 HIGHQPSK18.05 18.27 18.07 18.50 15LOWQPSK17.96 18.29 18.04 18.50 3 1 LOWQ1618.42 18.43 18.50 18.50 MIDQ1618.33 18.22 18.46 18.50 HIGHQ1618.34 18.42 18.48 18.50 8 LOWQ1617.08 17.09 16.94 17.50 MIDQ1617.19 17.11 17.04 17.50 HIGHQ1617.13 17.22 17.02 17.50 15LOWQ1616.96 17.15 17.15 17.50 3 1 LOW64QAM17.46 17.25 17.44 17.50 MID64QAM17.30 17.29 17.31 17.50 HIGH64QAM17.31 17.39 17.48 17.50 8 LOW64QAM16.16 16.31 16.11 16.50 MID64QAM16.15 16.22 15.86 16.50 HIGH64QAM16.07 16.07 15.95 16.50 15LOW64QAM15.95 16.24 16.01 16.50 Bandwidth (MHRB SizeRB offestModulation186251890019175 Tune-up power(dBm) 5 1 LOWQPSK19.04 19.18 19.04 19.50 MIDQPSK19.08 19.31 19.05 19.50 HIGHQPSK18.98 19.18 18.89 19.50 12 LOWQPSK18…

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Report No.: BL-SZ2450047-AC 1 / 100 CALIBRATION REPORT F.1 E-Field Probe (EX3DV4 - SN:7607) Report No.: BL-SZ2450047-AC 2 / 100 Report No.: BL-SZ2450047-AC 3 / 100 Report No.: BL-SZ2450047-AC 4 / 100 Report No.: BL-SZ2450047-AC 5 / 100 Report No.: BL-SZ2450047-AC 6 / 100 Report No.: BL-SZ2450047-AC 7 / 100 Report No.: BL-SZ2450047-AC 8 / 100 Report No.: BL-SZ2450047-AC 9 / 100 Report No.: BL-SZ2450047-AC 10 / 100 Report No.: BL-SZ2450047-AC 11 / 100 Report No.: BL-SZ2450047-AC 12 / 100 Report No.: BL-SZ2450047-AC 13 / 100 Report No.: BL-SZ2450047-AC 14 / 100 Report No.: BL-SZ2450047-AC 15 / 100 Report No.: BL-SZ2450047-AC 16 / 100 Report No.: BL-SZ2450047-AC 17 / 100 Report No.: BL-SZ2450047-AC 18 / 100 Report No.: BL-SZ2450047-AC 19 / 100 Report No.: BL-SZ2450047-AC 20 / 100 Report No.: BL-SZ2450047-AC 21 / 100 Report No.: BL-SZ2450047-AC 22 / 100 Report No.: BL-SZ2450047-AC 23 / 100 F.2 Data Acquisition Electronics (DAE4 - SN:1711) Report No.: BL-SZ2450047-AC 24 / 100 Report No.: BL-SZ2450047-AC 25 / 100 Report No.: BL-SZ2450047-AC 26 / 100 F.3 750MHz Dipole Report No.: BL-SZ2450047-AC 27 / 100 Report No.: BL-SZ2450047-AC 28 / 100 Report No.: BL-SZ2450047-AC 29 / 100 Report No.: BL-SZ2450047-AC 30 / 100 Report No.: BL-SZ2450047-AC 31 / 100 Report No.: BL-SZ2450047-AC 32 / 100 D750V3 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.07.05 2022.07.05 / Return Loss(dB) -31.829 -30.143 5.59% Impedance 50.362 Ω + 1.112 jΩ 50.569 Ω - 3.713 jΩ 4.824Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2450047-AC 33 / 100 F.4 835 MHz Dipole Report No.: BL-SZ2450047-AC 34 / 100 Report No.: BL-SZ2450047-AC 35 / 100 Report No.: BL-SZ2450047-AC 36 / 100 Report No.: BL-SZ2450047-AC 37 / 100 Report No.: BL-SZ2450047-AC 38 / 100 Report No.: BL-SZ2450047-AC 39 / 100 F.5 1750 MHz Dipole Report No.: BL-SZ2450047-AC 40 / 100 Report No.: BL-SZ2450047-AC 41 / 100 Report No.: BL-SZ2450047-AC 42 / 100 Report No.: BL-SZ2450047-AC 43 / 100 Report No.: BL-SZ2450047-AC 44 / 100 Report No.: BL-SZ2450047-AC 45 / 100

Report No.: BL-SZ2450047-AC 46 / 100 F.6 1950 MHz Dipole Report No.: BL-SZ2450047-AC 47 / 100 Report No.: BL-SZ2450047-AC 48 / 100 Report No.: BL-SZ2450047-AC 49 / 100 Report No.: BL-SZ2450047-AC 50 / 100 Report No.: BL-SZ2450047-AC 51 / 100 Report No.: BL-SZ2450047-AC 52 / 100 Report No.: BL-SZ2450047-AC 53 / 100 D1950V3 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.09.11 2022.09.12 / Return Loss(dB) -27.437 -24.483 16.84% Impedance 50.742 Ω + 2.023 jΩ 49.381 Ω + 3.781 jΩ -1.758Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2450047-AC 54 / 100 F.7 2450 MHz Dipole Report No.: BL-SZ2450047-AC 55 / 100 Report No.: BL-SZ2450047-AC 56 / 100 Report No.: BL-SZ2450047-AC 57 / 100 Report No.: BL-SZ2450047-AC 58 / 100 Report No.: BL-SZ2450047-AC 59 / 100 Report No.: BL-SZ2450047-AC 60 / 100 F.8 2600 MHz Dipole Report No.: BL-SZ2450047-AC 61 / 100 Report No.: BL-SZ2450047-AC 62 / 100 Report No.: BL-SZ2450047-AC 63 / 100 Report No.: BL-SZ2450047-AC 64 / 100 Report No.: BL-SZ2450047-AC 65 / 100 Report No.: BL-SZ2450047-AC 66 / 100 F.9 3.5GHz Dipole Report No.: BL-SZ2450047-AC 67 / 100 Report No.: BL-SZ2450047-AC 68 / 100 Report No.: BL-SZ2450047-AC 69 / 100 Report No.: BL-SZ2450047-AC 70 / 100 Report No.: BL-SZ2450047-AC 71 / 100 Report No.: BL-SZ2450047-AC 72 / 100 Report No.: BL-SZ2450047-AC 73 / 100 D3500V2 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.07.05 2022.07.06 / 3.4GHz Return Loss(dB) -23.147 -21.133 9.53% 3.4GHz Impedance 43.016 Ω – 0.546 jΩ 41.256 Ω + 0.669 jΩ 1.76Ω (Real part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2450047-AC 74 / 100 Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.07.05 2022.07.06 / 3.5GHz Return Loss(dB) -27.933 -26.753 4.63% 3.5GHz Impedance 46.317 Ω + 2.191 jΩ 48.854 Ω + 1.566 jΩ - 2.537Ω (Real part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2450047-AC 75 / 100 F.10 3.7GHz Dipole Report No.: BL-SZ2450047-AC 76 / 100 Report No.: BL-SZ2450047-AC 77 / 100 Report No.: BL-SZ2450047-AC 78 / 100 Report No.: BL-SZ2450047-AC 79 / 100 Report No.: BL-SZ2450047-AC 80 / 100 Report No.: BL-SZ2450047-AC 81 / 100 D3700V2 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.07.05 2022.07.06 / Return Loss(dB) -29.942 -27.773 7.81% Impedance 50.83 Ω + 2.132 jΩ 50.451 Ω + 1.696 jΩ 0.437Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2450047-AC 82 / 100 F.11 5GHz Dipole Report No.: BL-SZ2450047-AC 83 / 100 Report No.: BL-SZ2450047-AC 84 / 100 Report No.: BL-SZ2450047-AC 85 / 100 Report No.: BL-SZ2450047-AC 86 / 100 Report No.: BL-SZ2450047-AC 87 / 100 Report No.: BL-SZ2450047-AC 88 / 100 Report No.: BL-SZ2450047-AC 89 / 100 Report No.: BL-SZ2450047-AC 90 / 100 Report No.: BL-SZ2450047-AC 91 / 100 Report No.: BL-SZ2450047-AC 92 / 100 Report No.: BL-SZ2450047-AC 93 / 100 Report No.: BL-SZ2450047-AC 94 / 100 Report No.: BL-SZ2450047-AC 95 / 100

Report No.: BL-SZ2450047-701 Tel: +86-755-66850100 E-mail: [email protected] Page No. 1 / 307 Web: www.titcgroup.com Template No.: TRP-FCC DASY-Phone-3 (2023-11-02) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China TEST REPORT Applicant: Lunar USA Inc. Address: 1721 W Plano Parkway, Suite 128, Plano, TX 75075 Equipment Type: Lunar Eclipse L1 Model Name: Eclipse L1 Brand Name: Lunar Eclipse L1 FCC ID: 2A5SE-ECLIPSE-L1 Test Standard: FCC 47 CFR Part 2.1093 (refer section 3.1) Maximum SAR: Head (1 g@0mm): 1.09 W/kg Body-worn (1 g@15mm): 0.44 W/kg Hotspot (1 g@10mm): 0.86 W/kg Specific (10 g@10mm): 0.33 W/kg Sample Arrival Date: Apr. 30, 2024 Test Date: May 10, 2024 - Jun. 28, 2024 Date of Issue: Jul. 26, 2024 ISSUED BY: Shenzhen BALUN Technology Co., Ltd. Tested by: Ruan Zhaoyi Checked by: Xu Rui Approved by: Tolan Tu (Testing Director) _______________ _______________ _______________ Report No.: BL-SZ2450047-701 Tel: +86-755-66850100 E-mail: [email protected] Page No. 2 / 307 Web: www.titcgroup.com Template No.: TRP-FCC DASY-Phone-3 (2023-11-02) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Revision History Version Issue Date Revisions Content Rev. 01 Jul. 26, 2024 Initial Issue TABLE OF CONTENTS 1 GENERAL INFORMATION ........................................................................................................ 5 1.1 Test Laboratory ............................................................................................................ 5 1.2 Test Location ................................................................................................................ 5 1.3 Test Environment Condition .......................................................................................... 5 2 PRODUCT INFORMATION ....................................................................................................... 6 2.1 Applicant Information .................................................................................................... 6 2.2 Manufacturer Information .............................................................................................. 6 2.3 General Description for Equipment under Test (EUT) ................................................... 6 2.4 Ancillary Equipment ...................................................................................................... 6 2.5 Technical Information ................................................................................................... 7 3 SUMMARY OF TEST RESULT ................................................................................................. 9 3.1 Test Standards ............................................................................................................. 9 3.2 Device Category and SAR Limit ................................................................................. 10 3.3 Test Result Summary ................................................................................................. 11 3.4 Test Uncertainty ......................................................................................................... 13 4 MEASUREMENT SYSTEM ..................................................................................................... 14 4.1 Specific Absorption Rate (SAR) Definition .................................................................. 14 4.2 DASY SAR System .................................................................................................... 15 5 SYSTEM VERIFICATION ........................................................................................................ 22 5.1 Purpose of System Check .......................................................................................... 22 5.2 System Check Setup .................................................................................................. 22 6 TEST POSITION CONFIGURATIONS .................................................................................... 23 6.1 Head Exposure Conditions ......................................................................................... 23 6.2 Body-worn Position Conditions ................................................................................... 25 Report No.: BL-SZ2450047-701 Tel: +86-755-66850100 E-mail: [email protected] Page No. 3 / 307 Web: www.titcgroup.com Template No.: TRP-FCC DASY-Phone-3 (2023-11-02) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China 6.3 Hotspot Mode Exposure Position Conditions .............................................................. 26 6.4 Product Specific 10g Exposure Consideration ............................................................ 26 7 MEASUREMENT PROCEDURE ............................................................................................. 27 7.1 Measurement Process Diagram ................................................................................. 27 7.2 SAR Scan General Requirement ................................................................................ 28 7.3 Measurement Procedure ............................................................................................ 29 7.4 Area & Zoom Scan Procedure .................................................................................... 29 7.5 LTE (TDD) Considerations.......................................................................................... 30 8 CONDUCTED RF OUPUT POWER ........................................................................................ 32 8.1 GSM ........................................................................................................................... 32 8.2 WCDMA ..................................................................................................................... 32 8.3 LT…

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OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 1 OTATESTREPORT(Passive) ApplicantShenzhenGeneralTestSystemCo.,Ltd ProductRayZone1800 IssueDateMay9,2024 Shenzhen3GoodWirelessCommunicationCo.,Ltd. TestedtheaboveequipmentinaccordancewiththerequirementsinANTI/IEEEStd149-2008.Thetest resultsshowthattheequipmenttestediscapableofdemonstratingcompliancewiththeRequirementsas documentedinthisreport. Preparedby:LangZhu Approvedby:WuZhou OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 2 Shenzhen3GoodWirelessCommunicationCo.,Ltd Room501-508,jinfulaiBuilding,No.49-1,DabaoRoad,BaoanDistrict,Shenzhen 1.TestLaboratory 1.1NotesoftheTestreport Thisreportshallnotbereproducedinfullorpartial.Theresultsdocumentedinthisreportapply onlytothetestedsample,undertheconditionsandmodesofoperationasdescribedherein. MeasurementUncertaintieswerenottakenintoaccountandarepublishedforinformational purposesonly.Thisreportiswrittentosupportregulatorycomplianceofapplicablestandards statedabove. 1.2Testfacility GTS1800MicrowaveAnechoicChamber：testingfrequencyrangesfrom600MHzto 6GHz. 1.3TestingLocation Company:Shenzhen3GoodWirelessCommunicationCo.,Ltd Address:Room501-508,jinfulaiBuilding,No.49-1,DabaoRoad,BaoanDistrict, Shenzhen Contact: LangZhu Telephone:17608490732 E-mail:[email protected] OTA Test Report Shenzhen3GoodWirelessCommunicationCo., Ltd Page 3 1.4 LaboratoryEnvironment 2. GeneralDescriptionof EquipmentunderTest 2.1 Applicantand Manufacturerinformation ApplicantName ShenzhenGeneralTestSystemCo.,Ltd Applicantaddress BuildingC-A7Suite805,2190LiuxianAvenue,NanshanDistrict, Shenzhen,P.R. China ManufacturerName ShenzhenGeneralTest SystemCo., Ltd Manufactureraddress BuildingC-A7Suite805,2190LiuxianAvenue,NanshanDistrict, Shenzhen,P.R. China 2.2Generalinformation EUT Description ProductName RayZone1800 Model GTS-ANTD-H HW Version RayZone1800V1.0 SW Version MaxSign100 AntennaType FPC Antenna AntennaManufacturer Shenzhen3GoodWirelessCommunicationCo., Ltd Test Frequency 800MHz-2500MHz 2.3AppliedStandards Accordingto the specificationsof the manufacturer,it mustcomplywiththe requirementsof the followingstandards: Test Method:ANSI/IEEEStd 149-2008 3. Test Conditions 3.1 Test Configuration The methodis usedto measurethe antenna3D GAINof EUT in OTA qualifiedanechoic Temperature Min.=19°C, Max.=25°C RelativehumidityMin.=40%，Max.=72% Shieldeffect0.6-7GHz>100dB Groundresistance<0.5 Ω OTA Test Report Shenzhen 3Good Wireless Communication Co., Ltd Page 4 chamber. Equipment Under Test (EUT) geometry centre vertical projection at the centre of platform, the distance from EUT to measurement antenna is 1m. 3.2 Test Measurement Spherical coordinate system Figure 1 Test coordinate system Note: Theta is from 0-180degree.Phi is from EUT and record the Date, the step of rotation is 15 degree. Test Setup OTA Test Report Shenzhen 3Good Wireless Communication Co., Ltd Page 5 4. Antenna location map All of Implementation antenna Ant0: GSM850; WCDMA B5; LTE B5/12/13/17/26/71; NR-n5/71 RX&TX; Ant1: GSM1900; WCDMA B1/B2/B4; LTE B2/B4/B25/B66 RX&TX; Ant2: NR-n77 RX&TX Ant3: LTE B41; NR-n41 RX&TX Ant4: NR-N2/N25/N41/N66/N77 RX Ant5: n2/n25/n66 RX&TX Ant6: WiFi/BT/GPS 2412MHz~2472MHz, 5180MHz~5825MHz,1575.42MHz; 5. Test Results 5.1 Antenna Max. Peak Gain GSM850：-2.2dBi EGSM900： -2.1dBi DCS1800： -2.8dBi PCS1900：-0.8dBi W-B1：-0.9dBi W-B2：-0.8dBi W-B4：-2.8dBi W-B5：-2.2dBi LTE-B2： -0.8dBi LTE-B4：-2.8dBi OTA Test Report Shenzhen3GoodWirelessCommunicationCo., Ltd Page 6 LTE-B5：-2.2dBi LLTE-B12：-1.3dBi LLTE-B13：-2.8dBi LTE-B 17：-1.3dBi LTE-B 25：-0.8dBi LTE-B 26：-2.2dBi LTE-B 66：-2.8dBi LTE-B 71：-2.9dBi LTE-B 41：-0.6dBi NR-N2：-1.4dBi NR-N5：-2.2dBi NR-N25：-1.4dBi NR-N41：-0.6dBi NR-N66：-2.3dBi NR-N71：-2.9dBi NR-N77：-1.4dBi WIFI 2.4G/BT：2.7dBi WIFI 5G：-0.8 dBi GPS：0.4dBi OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 7 5.2Antenna radiationpattern GSM900/W-B8 GSM850+W-B5+LTE-B5+NR-N5 OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 8 LTE-B12/B17 LTE-B13 OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 9 LTE-B71+NR-N71 DCS1800+W-B4+LTE-B4/B66 OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 10 NR-N66 PCS1900+W-B2+LTE-B2/B25 OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 11 NR-N2/N25 W-B1 OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 12 LTE-B41+NR-N41 NR-N77 OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 13 GPS WIFI2.4G OTATestReport Shenzhen3GoodWirelessCommunicationCo.,Ltd Page 14 WIFI5.8G 5.EquipmentList TypeofEquipmentManufactureModelNumber NetworkAnalyzerAgilentTechnologiesE5071B SwitchcontrolSystemGTS RayZone1800 SoftwareGTSMaxSign100Patten Measurementsoftware

Report No.: BL-SZ2450047-602 Tel: +86-755-66850100 E-mail: [email protected] Page No. 1 / 72 Web: www.titcgroup.com Template No.: TRP-FCC Part 15.247 (2022-01-12) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China TEST REPORT Applicant: Lunar USA Inc. Address: 1721 W Plano Parkway, Suite 128, Plano, TX 75075 Equipment Type: Lunar Eclipse L1 Model Name: Eclipse L1 Brand Name: Lunar Eclipse L1 FCC ID: 2A5SE-ECLIPSE-L1 Test Standard: 47 CFR Part 15 Subpart C (refer to section 3.1) Sample Arrival Date: Apr. 30, 2024 Test Date: May 13, 2024 – Jun. 03, 2024 Date of Issue: Jul. 26, 2024 ISSUED BY: Shenzhen BALUN Technology Co., Ltd. Tested by: Si Xiao Checked by: Ye Hongji Approved by: Liao Jianming (Technical Director) _______________ _______________ _______________ Report No.: BL-SZ2450047-602 Tel: +86-755-66850100 E-mail: [email protected] Page No. 2 / 72 Web: www.titcgroup.com Template No.: TRP-FCC Part 15.247 (2022-01-12) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Revision History Version Issue Date Revisions Rev. 01 Jul. 26, 2024 Initial Issue TABLE OF CONTENTS 1 GENERAL INFORMATION .............................................................................................................. 4 1.1 Test Laboratory ......................................................................................................................... 4 1.2 Test Location ............................................................................................................................. 4 2 PRODUCT INFORMATION ............................................................................................................. 5 2.1 Applicant Information ................................................................................................................. 5 2.2 Manufacturer Information .......................................................................................................... 5 2.3 General Description for Equipment under Test (EUT) .............................................................. 5 2.4 Technical Information ................................................................................................................ 6 3 SUMMARY OF TEST RESULTS ..................................................................................................... 8 3.1 Test Standards .......................................................................................................................... 8 3.2 Test Verdict ............................................................................................................................... 9 4 GENERAL TEST CONFIGURATIONS .......................................................................................... 10 4.1 Test Environments .................................................................................................................. 10 4.2 Test Equipment List ................................................................................................................. 10 4.3 Test Software List .................................................................................................................... 11 4.4 Measurement Uncertainty ....................................................................................................... 12 4.5 Description of Test Setup ........................................................................................................ 12 4.6 Measurement Results Explanation Example ........................................................................... 15 5 TEST ITEMS .................................................................................................................................. 16 5.1 Antenna Requirements ............................................................................................................ 16 5.2 Output Power .......................................................................................................................... 17 5.3 Occupied Bandwidth ............................................................................................................... 19 5.4 Conducted Spurious Emission ................................................................................................ 20 5.5 Band Edge (Authorized-band band-edge) ............................................................................... 22 Report No.: BL-SZ2450047-602 Tel: +86-755-66850100 E-mail: [email protected] Page No. 3 / 72 Web: www.titcgroup.com Template No.: TRP-FCC Part 15.247 (2022-01-12) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China 5.6 Conducted Emission ............................................................................................................... 24 5.7 Radiated Spurious Emission ................................................................................................... 25 5.8 Band Edge (Restricted-band band-edge) ................................................................................ 30 5.9 Power Spectral density (PSD) ................................................................................................. 31 ANNEX A TEST RESULT ................................................................................................................. 32 A.1 Output Power, Duty Cycle ....................................................................................................... 32 A.2 Occupied Bandwidth ............................................................................................................... 35 A.3 Conducted Spurious Emissions .............................................................................................. 39 A.4 Band Edge (Authorized-band band-edge) ...................................................................…

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Report No.: BL-SZ2450047-603 Tel: +86-755-66850100 E-mail: [email protected] Page No. 1 / 73 Web: www.titcgroup.com Template No.: TRP-FCC Part 15.247 (2022-01-12) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China TEST REPORT Applicant: Lunar USA Inc. Address: 1721 W Plano Parkway, Suite 128, Plano, TX 75075 Equipment Type: Lunar Eclipse L1 Model Name: Eclipse L1 Brand Name: Lunar Eclipse L1 FCC ID: 2A5SE-ECLIPSE-L1 Test Standard: 47 CFR Part 15 Subpart C (refer to section 3.1) Sample Arrival Date: Apr. 30, 2024 Test Date: May 13, 2024 – Jun. 03, 2024 Date of Issue: Jul. 26, 2024 ISSUED BY: Shenzhen BALUN Technology Co., Ltd. Tested by: Si Xiao Checked by: Ye Hongji Approved by: Liao Jianming (Technical Director) _______________ _______________ _______________ Report No.: BL-SZ2450047-603 Tel: +86-755-66850100 E-mail: [email protected] Page No. 2 / 73 Web: www.titcgroup.com Template No.: TRP-FCC Part 15.247 (2022-01-12) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Revision History Version Issue Date Revisions Rev. 01 Jul. 26, 2024 Initial Issue TABLE OF CONTENTS 1 GENERAL INFORMATION .............................................................................................................. 4 1.1 Test Laboratory ......................................................................................................................... 4 1.2 Test Location ............................................................................................................................. 4 2 PRODUCT INFORMATION ............................................................................................................. 5 2.1 Applicant Information ................................................................................................................. 5 2.2 Manufacturer Information ............................................................…

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