2A7SX-BTA-250Amplifier

FCC Warning This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: —Reorient or relocate the receiving antenna. —Increase the separation between the equipment and receiver. —Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. —Consult the dealer or an experienced radio/TV technician for help. Note: The Grantee is not responsible for any changes or modifications not expressly approved by the party responsible for compliance. such modifications could void the user's authority to operate the equipment. The device has been evaluated to meet general RF exposure require- ment.To maintain compliance with FCC's RF exposure guidelines, the distance must be at least 20 cm between the radiator and your body, and fully supported by the operating and installation

2A7SX-BTA-250

Earthquake Sound Corporation Date: 2023-10-10 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2A7SX-BTA-250 To Whom It May Concern: This letter is to statement that BTA-250 / Amplifier has been tested according to FCC Part 15B by Waltek Testing Group Co., Ltd. (Test Report No.: WTD23D09211205W001). And the SDOC file, meetting the requirements of the FCC regulations, would been provided when the device is sold by the responsible party in US. The service will not be sold until the SDOC is provided. If the sale does not have an SDOC, all responsibility is the responsibility of the applicant. Sincerely, Signature Abraham Sahyoun, V. P. of Operations Earthquake Sound Corporation

Appendix-BTA-250-Photos Page 3 of 9 2. Photographs –Constructional Details 2.1. EUT – External View Model BTA-250 FCC ID: 2A7SX-BTA-250 Appendix-BTA-250-Photos Page 4 of 9 Appendix-BTA-250-Photos Page 5 of 9 Appendix-BTA-250-Photos Page 6 of 9 Appendix-BTA-250-Photos Page 7 of 9

Product Name:Amplifier Model:BTA-250 FCC ID: 2A7SX-BTA-250

Appendix-BTA-250-Photos Page 8 of 9 2.2. EUT – Internal View Model BTA-250 FCC ID: 2A7SX-BTA-250 ANT Appendix-BTA-250-Photos Page 9 of 9 ======End======

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 8 TEST REPORT Reference No. .................... : WTD23D09211205W003 FCC ID ................................ : 2A7SX-BTA-250 Applicant ............................ : Earthquake Sound Corporation Address .............................. : 2727 McCone Avenue, Hayward, CA, USA 94545 Manufacturer .................... : Earthquake Sound Corporation Address .............................. : 2727 McCone Avenue, Hayward, CA, USA 94545 Product ............................... : Amplifier Model(s). ............................ : BTA-250 Brand Name ....................... : Earthquake Standards........................... : FCC 47CFR Part 2 Subpart J Section 2.1091 Date of Receipt sample .... : 2023-09-27 Date of Test ....................... : 2023-09-27 to 2023-10-17 Date of Issue ...................... : 2023-10-17 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Will Tan / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTD23D09211205W003 Page 2 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2. Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2. CONTENTS ............................................................................................................................................... 2 3. REVISION HISTORY ................................................................................................................................. 3 4. GENERAL INFORMATION ....................................................................................................................... 4 4.1. GENERAL DESCRIPTION OF E.U.T.................................................................................................... 4 4.2. DETAILS OF E.U.T. ......................................................................................................................... 4 4.3. TEST FACILITY ................................................................................................................................ 5 4.4. SUBCONTRACTED ........................................................................................................................... 5 4.5. ABNORMALITIES FROM STANDARD CONDITIONS ................................................................................ 5 5. TEST SUMMARY ...................................................................................................................................... 6 6. RF EXPOSURE ......................................................................................................................................... 7 6.1. REQUIREMENTS .............................................................................................................................. 7 6.2. THE PROCEDURES / LIMIT ................................................................................................................ 7 6.3. MPE CALCULATION METHOD........................................................................................................... 8 6.4. RADIO FREQUENCY RADIATION EXPOSURE EVALUATION ................................................................... 8 Reference No.: WTD23D09211205W003 Page 3 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 3. Revision History Test Report No. Date of Receipt Sample Date of Test Date of Issue Purpose Comment Approved WTD23D09211205W003 2023-09-27 2023-09-27 to 2023-10-17 2023-10-17Original - Valid Reference No.: WTD23D09211205W003 Page 4 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4. General Information 4.1. General Description of E.U.T. Product: Amplifier Model(s): BTA-250 Model difference: N/A BT Version: 4.1 Hardware Version: V1.0 Software Version: V1.0 4.2. Details of E.U.T. Operation Frequency: 2402~2480MHz Max. RF output power: -2.72dBm Modulation Technology: GFSK, π/4DQPSK, 8DPSK Antenna installation: PCB printed antenna Antenna Gain: 0.95dBi Note: #: The antenna gain is provided by the applicant, and the applicant should be responsible for its authenticity, WALTEK lab has not verified the authenticity of its information. Ratings: Input: DC24.0V, by AC adapter (adapter Input: 100-240V~, 50/60Hz, 1.8A) Output: 17-24V 3.52A, 60.0W, Model: F150602-A Reference No.: WTD23D09211205W003 Page 5 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4.3. Test Facility The test facility has a test site registered with the following organizations: ISED CAB identifier: CN0013. Test Firm Registration No.: 7760A. Waltek Testing Group Co., Ltd. Has been registered and fully described in a report filed with the Industry Canada. The acceptance letter from the Industry Canada is maintained in our files. Registration number 7760A, October 15, 2016. FCC Designation No.: CN1201. Test Firm Registration No.: 523476. Waltek Testing Group Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration number 523476, September 10, 2019. 4.4. Subcontracted Whether parts of tests for the product have been subcontracted to other labs: Yes No If Yes, list the related test items and lab information: Test Lab: N/A Lab address: N/A Test items: N/A 4.5. Abnormalities from Standard Conditions None. Reference No.: WTD23D09211205W003 Page 6 of 8…

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Test ing Report Engi ne er Customer Name:SHENZHENSHIXINZHONGXIN TECHNOLOGY.CO.,LTD Product Name: BT Antenna Sample Model: BM2020 Reference Standard:GB/T9410-2008; ANSI/IEEE Std 149-1979 IssueDate:2023.07.28 : Date: Auditor: Date: Appro ver: Date: 2023.07.28 2023.07.28 2023.07.28 1.GeneralInformation 1 . 1GeneralInformationoftestinginstitutions Name ShenzhenHetuoTechnologyCo.,Ltd. Address Room1202B,BuildingC6,HengfengIndustrialCity,Xixiang,Baoan District,Shenzhen Tel 18665849001 E-mail [email protected] Equipm ent Agilent5071C 1.2Testingprinciple Multi-probe OTA Measurement System AntennaPhoto&Lenght(mm) Brief summary of Procedure 1.3 Test equipment Equipment Model No.Serial No.Manufacturer Calibration date Next calibration date 24 probe microwave chamber 4*3*3NASATIMO2023.06.29 Network Analyze 2023.09.30 r 5071CNA Agilent 1.4 Test environment Temperature 2 4C±1.5C Humidity 45%RH Pressure 101kPa 1.5 2023.06.29 1. SATIMO turn on the Upper Computer Software, Name: VeryView99.exe, Version No.: V1.10; 2. VeryView99 via GPIB (General Purpose Interface Bus) to control the shielding room (darkroom)'s SATIMO; 3. Meanwhiel, GPIB control the Agilent 5071C to read the Antenna data by 24 Probe; 4. Agilent 5071C will analyse the data and generate the result; 2023.09.30 5. Agilent 5071C will feedback to VeryView99 software to generate the test report. upper computer software Agilent Darkroom Probe 2.SampleInformation 2.1Clientinformation Name SHENZHENSHIXINZHONGXINTECHNOLOGY.CO.,LTD Address A1,ShajingDonghuanIndustrialZone,Bao'anDistrict,Shenzhen Contacts MaChao Tel 18218809918 E-mail [email protected] 2.2DescriptionofEUT(S) ProductName BTAntenna SampleModel BM2020 AntennaSize 5.97662*14.38148mm AntennaType PCBantenna SerialNo. / TestItem AntennaGain,Radiationpattern FrequencyRange 2400-2500MHz ReceivedDate 2023.07.28 TestDate 2023.07. 28 Remark ThelengthoftheRFcableis50mm Thetestphotos Frequency ID1234567891011 Fre quency (MHz)2400.0 2410.0 2420.0 2430.0 2440.0 2450.0 2460.0 2470.0 2480.0 2490.0 2500.0 Efficienc y (dBi)-8.39-8.02-7.74-7.50-7.10-6.88-6.74-6.51-6.30-6.05-5.80 Gain (dBi)-0.94 -0.67 -0.41 -0.47 -0.23 -0.05 0.12 0.52 0.95 1.28 1.51 Efficienc y (%)14.50 15.77 16.83 17.78 19.52 20.53 21.17 22.36 23.45 24.82 26.31 Directivit y (dB)7.45 7.35 7.33 7.03 6.86 6.82 6.86 7.02 7.25 7.33 7.31 Peak Gain Position (Theta)135.00 135.00 135.00 135.00 135.00 135.00 135.00 135.00 135.00 135.00 135.00 Peak Gain Position (Phi)90.00 90.00 90.00 90.00 90.00 90.00 90.00 90.00 90.00 90.00 90.00 Efficienc y ThetaPol (%)5.49 5.85 6.06 6.39 6.90 7.22 7.45 7.95 8.50 9.12 9.87 Efficienc y PhiPol (%)9.01 9.92 10.76 11.39 12.62 13.31 13.71 14.41 14.95 15.70 16.44 U pper Hem. Efficiency (%)6.02 6.62 7.17 7.59 8.34 8.56 8.80 9.16 9.52 10.05 10.73 Lower Hem. Efficienc y (%)8.48 9.15 9.66 10.19 11.18 11.97 12.37 13.20 13.93 14.78 15.58 VER7 T90(H) 9.41 9.36 9.70 9.20 8.69 8.16 8.66 8.40 8.91 7.84 7.72 Gain 15de g (dBi) E1(XZ) 96.00 96.00 39.00 97.00 93.00 90.00 81.00 91.00 88.00 94.00 92.00 E1(XZ)1 1.82 2.68 3.84 2.95 3.34 3.32 2.90 1.42 1.91 1.25 1.37 E2(YZ) 35.00 33.00 37.00 36.00 37.00 59.00 74.00 37.00 36.00 35.00 35.00 E2(YZ)1 11.67 10.91 10.61 10.06 8.46 8.23 7.64 6.92 7.33 7.08 7.05 (P) 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 (P)1 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 Hc(XY) 42.00 54.00 39.00 52.00 55.00 56.00 64.00 59.00 61.00 69.00 70.00 Hc(XY)1 4.32 4.14 4.32 4.25 4.29 3.99 4.16 3.24 3.40 3.06 3.03 Em pty max26.31 min14.50 14.50 26.31 0.00 10.00 20.00 30.00 40.00 50.00 60.00 70.00 80.00 90.00 100.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Efficiency (%) Max-Min 1.51 -0.94 -10.00 -8.00 -6.00 -4.00 -2.00 0.00 2.00 4.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 0.00 10.00 20.00 30.00 40.00 50.00 60.00 70.00 80.00 90.00 100.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Efficiency ThetaPol (%) Efficiency PhiPol (%) 0.00 10.00 20.00 30.00 40.00 50.00 60.00 70.00 80.00 90.00 100.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Upper Hem. Efficiency (%) Lower Hem. Efficiency (%) 2400.0MHz H+V, Eff: 14.5%Back View2400.0MHz Total(E1-XZ), Max= -5.99dBi2400.0MHz Total(E2-YZ), Max= -0.94dBiTotal(H-XY), Max= -4.50dBi, CirD=9.41 -0.94 -2.78 -4.62 -6.46 -8.3 -10.15 -11.99 -13.83 -15.67 -17.52 -19.36 -21.2 -23.04 -24.88 -26.73 -28.57 -30.41 -32.25 2410.0MHz H+V, Eff: 15.8%Back View2410.0MHz Total(E1-XZ), Max= -5.66dBi2410.0MHz Total(E2-YZ), Max= -0.67dBiTotal(H-XY), Max= -4.28dBi, CirD=9.36 -0.67 -2.51 -4.35 -6.19 -8.04 -9.88 -11.72 -13.56 -15.41 -17.25 -19.09 -20.93 -22.77 -24.62 -26.46 -28.3 -30.14 -31.98 2420.0MHz H+V, Eff: 16.8%Back View2420.0MHz Total(E1-XZ), Max= -4.80dBi2420.0MHz Total(E2-YZ), Max= -0.41dBiTotal(H-XY), Max= -3.57dBi, CirD=9.70 -0.41 -2.25 -4.09 -5.94 -7.78 -9.62 -11.46 -13.3 -15.15 -16.99 -18.83 -20.67 -22.51 -24.36 -26.2 -28.04 -29.88 -31.73 2430.0MHz H+V, Eff: 17.8%Back View2430.0MHz Total(E1-XZ), Max= -5.24dBi2430.0MHz Total(E2-YZ), Max= -0.47dBiTotal(H-XY), Max= -3.70dBi, CirD=9.20 -0.47 -2.31 -4.15 -6 -7.84 -9.68 -11.52 -13.37 -15.21 -17.05 -18.89 -20.73 -22.58 -24.42 -26.26 -28.1 -29.94 -31.79 2440.0MHz H+V, Eff: 19.5%Back View2440.0MHz Total(E1-XZ), Max= -4.39dBi2440.0MHz Total(E2-YZ), Max= -0.23dBiTotal(H-XY), Max= -3.35dBi, CirD=8.69 -0.23 -2.08 -3.92 -5.76 -7.6 -9.44 -11.29 -13.13 -14.97 -16.81 -18.66 -20.5 -22.34 -24.18 -26.02 -27.87 -29.71 -31.55 2450.0MHz H+V, Eff: 20.5%Back View2450.0MHz Total(E1-XZ), Max= -4.27dBi2450.0MHz Total(E2-YZ), Max= -0.05dBiTotal(H-XY), Max= -2.82dBi, CirD=8.16 -0.05 -1.89 -3.74 -5.58 -7.42 -9.26 -11.1 -12.95 -14.79 -16.63 -18.47 -20.31 -22.16 -24 -25.84 -27.68 -29.53 -31.37 2460.0MHz H+V, Eff: 21.2%Back View2460.0MHz Total(E1-XZ), Max= -3.78dBi2460.0MHz Total(E2-YZ), Max= 0.12dBiTotal(H-XY), Max= -2.62dBi, CirD=8.66 0.12 -1.72 -3.56 -5.41 -7.25 -9.09 -10.93 -12.77 -14.62 -16.46 -18.3 -20.14 -21.99 -23.83 -25.67 -27.51 -29.35 -31.2 247…

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Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 74 TEST REPORT Re ference No. .................... : WTD23D09211205W002 FCC ID ................................ : 2A7SX-BTA-250 Applicant ............................ : Earthquake Sound Corporation Address .............................. : 2727 McCone Avenue, Hayward, CA, USA 94545 Manufacturer .................... : Earthquake Sound Corporation Address .............................. : 2727 McCone Avenue, Hayward, CA, USA 94545 Product ............................... : Amplifier Model(s). ............................ : BTA-250 Brand Name ....................... : Earthquake Standards........................... : FCC 47CFR Part 15.247 Date of Receipt sample .... : 2023-09-27 Date of Test ....................... : 2023-09-27 to 2023-10-17 Date of Issue ...................... : 2023-10-17 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Will Tan / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTD23D09211205W002 Page 2 of 74 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 CONTENTS ............................................................................................................................................... 2 3 REVISION HISTORY ................................................................................................................................. 4 4 GENERAL INFORMATION ....................................................................................................................... 5 4.1 GENERAL DESCRIPTION OF E.U.T. ....................................................................................................... 5 4.2 DETAILS OF E.U.T. .............................................................................................................................. 5 4.3 CHANNEL LIST ..................................................................................................................................... 6 4.4 TEST MODE ........................................................................................................................................ 6 4.5 TEST FACILITY .................................................................................................................................... 7 5 TEST SUMMARY ...................................................................................................................................... 8 6 EQUIPMENT USED DURING TEST ......................................................................................................... 9 6.1 EQUIPMENTS LIST ............................................................................................................................... 9 6.2 DESCRIPTION OF SUPPORT UNITS ...................................................................................................... 10 6.3 MEASUREMENT UNCERTAINTY ........................................................................................................... 10 7 CONDUCTED EMISSION ....................................................................................................................... 11 7.1 E.U.T. OPERATION ............................................................................................................................ 11 7.2 EUT SETUP ...................................................................................................................................... 11 7.3 MEASUREMENT DESCRIPTION ............................................................................................................ 11 7.4 CONDUCTED EMISSION TEST RESULT ................................................................................................ 12 8 RADIATED SPURIOUS EMISSIONS ..................................................................................................... 14 8.1 EUT OPERATION ............................................................................................................................... 14 8.2 TEST SETUP ..................................................................................................................................... 15 8.3 SPECTRUM ANALYZER SETUP ............................................................................................................ 16 8.4 TEST PROCEDURE ............................................................................................................................. 17 8.5 CORRECTED AMPLITUDE & MARGIN CALCULATION .............................................................................. 17 8.6 SUMMARY OF TEST RESULTS ............................................................................................................. 18 9 CONDUCTED SPURIOUS EMISSIONS ................................................................................................. 21 9.1 TEST PROCEDURE ............................................................................................................................. 21 9.2 TEST RESULT .................................................................................................................................... 22 10 BAND EDGE MEASUREMENT .............................................................................................................. 32 10.1 TEST PROCEDURE ...........................…

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Appendix-BTA-250-Photos Page 1 of 9 1. Test Setup photos Model BTA-250 FCC ID: 2A7SX-BTA-250 1.1 Photograph – Conducted Emission Test Setup For Conducted Emission Test Site 1# 1.2 Photograph – Radiated Emissions For 9kHz-30MHz Test Site 2# Appendix-BTA-250-Photos Page 2 of 9 For 30MHz-1000MHz Test Site 2# For Above 1GHz Test Site 1#