2A9VNHL-W580BPortable Stamp Controlling machine

Beijing Huilang Times Technology Co. LTD Model Difference Data：2023.01.03 Product description: Portable Stamp Controlling machine Model name: HL-W580B, HL-W580E, HL-W580B-A Trade Name: N/A FCC ID: 2A9VNHL-W580B All the model are the same circuit and RF module, except model names . Regards Sincerely Client’s signature : Client’s name / title : Hao Chen（Project research and development Assistant） Contact information / address：Room101, Floor1, Building4, No.23 Ke Yuan Road, Beijing Daxing District Economic Development zone, Daxing District, Beijing, China

Beijing Huilang Times Technology Co. LTD (2023.01.03) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (Portable Stamp Controlling machine / HL-W580B, HL-W580E, HL-W580B-A / FCC ID: 2A9VNHL-W580B ) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☐ Internal Photos ☐ NOTE 1 ☐ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: Hao Chen Title: Project research and development Assistant

Beijing Huilang Times Technology Co. LTD (2023.01.03) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen CTB Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: Hao Chen Title: Project research and development Assistant

External Photos

Model: HL-W580B FCC ID: 2A9VNHL-W580B This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Label Location

Internal Photos ANT

Shenzhen CTB Testing Co., Ltd. FCC ID: 2A9VNHL-W580B Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. BLE: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 3.079 2.03 3±1 4.00 2.51 <5 0.77860 3.00 YES 2.44 3.02 2.00 3±1 4.00 2.51 <5 0.78474 3.00 YES 2.480 3.129 2.06 3±1 4.00 2.51 <5 0.79114 3.00 YES GFSK Conclusion: For the max result : 0.79114≤ FCC Limit 3.0 for 1g SAR.

Antenna Test Report 一．TEST INSTRUMENTATION CHAMBERSATIMO Chamber Wireless Networking Test Set Agilent 8960 5515C NETWORK ANALYZER Agilent 8753D TEMPERATURE 20±2°C HUMIDITY 50±20%rh Antenna Picture 二. Definitions VSWR ：Voltage Standing Wave Rate TRP：total radiated power TIS：total istropic sensitivity VSWR1.1 Standing wave ratio of main antenna: Freq Effi Gain (MHz) (%) (dBi) 2400 30.91 -1.2 2410 30.74 -1.21 2420 31.4 -1.18 2430 32.06 -1.18 2440 32.66 -1.24 2450 33.14 -1.37 2460 33.31 -1.48 2470 33.49 -1.49 2480 33.81 -1.08 2490 33.79 -0.79 2500 33.38 -0.96 Passive direction cha rt:

Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB221226001RFX Report Tel: 4008-707-283Web: http://www.ctb-lab.net Page 1 of 35 TEST REPORT Compiled by: Reviewed by: Approved by: Chen Zheng Arron Liu Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Product Name: Portable Stamp Controlling machine FCC ID: 2A9VNHL-W580B Trademark: N/A Model Number: HL-W580B, HL-W580E, HL-W580B-A Prepared For: Beijing Huilang Times Technology Co. LTD Address: Room101, Floor1, Building4, No.23 Ke Yuan Road, Beijing Daxing District Economic Development zone, Daxing District, Beijing Manufacturer: Beijing Huilang Times Technology Co. LTD Address: Room101, Floor1, Building4, No.23 Ke Yuan Road, Beijing Daxing District Economic Development zone, Daxing District, Beijing Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Dec. 20, 2022 Sample tested Date: Dec. 20, 2022 to Dec. 26, 2022 Issue Date: Dec. 26, 2022 Report No.: CTB221226001RFX Te s t Standards FCC Part15.247 ANSI C63.10:2013 Test Results PASS Remark: This is Bluetooth radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB221226001RFX Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 35 TABLE OF CONTENT Test Report Declaration Page 1. VERSION ........................................................................................................................................ 3 2. TEST SUMMARY ........................................................................................................................... 4 3. MEASUREMENT UNCERTAINTY ................................................................................................. 5 4. PRODUCT INFORMATION AND TEST SETUP ............................................................................ 6 4.1 Product Information .......................................................................................................................... 6 4.2 Test Setup Configuration .................................................................................................................. 6 4.3 Support Equipment........................................................................................................................... 6 4.4 Channel List ..................................................................................................................................... 7 4.5 Test Mode ........................................................................................................................................ 7 4.6 Test Environment ............................................................................................................................. 7 5. TEST FACILITY AND TEST INSTRUMENT USED ....................................................................... 8 5.1 Test Facility ...................................................................................................................................... 8 5.2 Test Instrument Used ....................................................................................................................... 8 6. AC POWER LINE CONDUCTED EMISSION ................................................................................ 10 6.1 Block Diagram Of Test Setup ......................................................................................................... 10 6.2 Limit ................................................................................................................................................ 10 6.3 Test procedure ............................................................................................................................... 10 6.4 Test Result ..................................................................................................................................... 12 7. RADIATED SPURIOUS EMISSION ............................................................................................. 14 7.1 Block Diagram Of Test Setup ......................................................................................................... 14 7.2 Limit ................................................................................................................................................ 14 7.3 Test procedure ............................................................................................................................... 15 7.4 Test Result ..................................................................................................................................... 16 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS ............................................... 23 8.1 Block Diagram Of Test Setup ......................................................................................................... 23 8.2 Limit ................................................................................................................................................ 23 8.3 Test procedure ............................................................................................................................... 23 8.4 Test Result ..................................................................................................................................... 24 9. COUDU…

Text truncated - open the document above for the full version.

Radiated Emission Below 1G Above 1G Conducted emissions