2AAWUTL100-E26LUMINI -3WELD DIMMABLE MOOD LIGHT BULB

AVC Technology (International) Limited

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Application Details

Equipment Class: DTS - Digital Transmission System
Date of Grant: Jun 22, 2014
Application Purpose: Original Equipment
Date of Application: Jun 22, 2014
Equipment Note: LUMINI -3WELD DIMMABLE MOOD LIGHT BULB
Frequency Range: 2402.00000000 - 2480.00000000
Company: AVC Technology (International) Limited
Country: Hong Kong

Documents & Files

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

External Photos

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs - Constructional Details EUT - External View Model: TL100-E12 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Model: TL100-E26 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

ID Label/Location Info

FCC and IC Label Location for model: TL100-E26, TL100-E12 This device complies with part 15 of the FCC rules and industry Canada license-exempt RSS standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. IC Label Location for Model: TL100-E12 FCC ID: 2AAW UTL100-E26 IC: 5422B-TL100E26 Model: TL100-E12 This device complies with part 15 of the FCC rules and industry Canada license-exempt RSS standard(s). IC Label Location for Model: TL100-E26 FCC ID: 2AAW UTL100-E26 IC: 5422B-TL100E26 Model: TL100-E26 This device complies with part 15 of the FCC rules and industry Canada license-exempt RSS standard(s).

ID Label/Location Info

FCC and IC Label Sample for model: TL100-E26, TL100-E12 This device complies with part 15 of the FCC rules and industry Canada license-exempt RSS standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. IC Label Sample for Model: TL100-E26 IC Label Sample for Model: TL100-E12 FCC ID: 2AAW UTL100-E26 IC: 5422B-TL100E26 Model: TL100-E26 This device complies with part 15 of the FCC rules and industry Canada license-exempt RSS standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. FCC ID: 2AAW UTL100-E26 IC: 5422B-TL100E26 Model: TL100-E12 This device complies with part 15 of the FCC rules and industry Canada license-exempt RSS standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

Internal Photos

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Model TL100-E26 - Internal View Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn RF module Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn ANT

Test Report

TEST REPORT Waltek Services (Shenzhen) Co.,Ltd.Page 1 of 38 http://www.waltek.com.cn Reference No....................... : WTS14S0513948E FCC ID.................................... : 2AAWUTL100-E26 Applicant ............................... : AVC Technology (International) Limited Address ................................. : 6/F, Enterprise Square Three, 39 Wang Chiu Road, Kowloon Bay, Hong Kong Manufacturer ........................ : SHENZHEN SUNLIGHT TECHNOLOGY CO., LTD Address ................................. : Block B, Xinshidai gongrong Industrial Park, Shihuan RD, Shilong, Shiyan street, Baoan, Shenzhen. China. Product Name...................... : LuMini -3WLED dimmable mood light bulb Model No............................... : TL100-E26, TL100-E12 Standards .............................. : FCC CFR47 Part 15 Section 15.247:2012 Date of Receipt sample..... :May 13, 2014 Date of Test .......................... : May 14-16, 2014 Date of Issue ........................ : Jun.19, 2014 Test Result ............................ : Pass * *Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Testing location: The same as above Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by:Approved by: Zero Zhou / Project EngineerPhilo Zhong / Manager Reference No.: WTS14S0513948EPage 2 of 38 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Test Summary Test ItemsTest RequirementResult Radiated Emissions 15.205(a) 15.209(a) PASS Conducted Emissions15.207(a)PASS 6dB Bandwidth15.247(a)(2)PASS Maximum Peak Output Power15.247(b)(3),(4)PASS Power Spectral Density15.247(e)PASS Band Edge15.247(d)PASS Antenna Requirement15.203PASS Maximum Permissible Exposure (Exposure of Humans to RF Fields) 1.1307(b)(1)PASS Reference No.: WTS14S0513948EPage 3 of 38 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1 COVER PAGE..........................................................................................................................................................1 2TEST SUMMARY.................................................................................................................................................... 2 3CONTENTS.............................................................................................................................................................. 3 4GENERAL INFORMATION....................................................................................................................................5 4.1G ENERALDESCRIPTION OFE.U.T.................................................................................................................. 5 4.2D ETAILS OFE.U.T............................................................................................................................................5 4.3C HANNELLIST...................................................................................................................................................5 4.4T ESTMODE.......................................................................................................................................................5 4.5T ESTFACILITY...................................................................................................................................................6 5EQUIPMENT USED DURING TEST.................................................................................................................... 7 5.1E QUIPMENTSLIST.............................................................................................................................................7 5.2M EASUREMENTUNCERTAINTY.........................................................................................................................8 5.3T ESTEQUIPMENTCALIBRATION.......................................................................................................................8 6CONDUCTED EMISSIONS....................................................................................................................................9 6.1E.U.T. O PERATION...........................................................................................................................................9 6.2EUT S ETUP.......................................................................................................................................................9 6.3M EASUREMENTDESCRIPTION..........................................................................................................................9 6.4C ONDUCTEDEMISSIONTESTRESULT.......................................................................................................... 10 7RADIATED EMISSIONS...................................................................................................................................... 12 7.1EUT O PERATION............................................................................................................................................ 12 7.2T ESTSETUP....................................................................................................................................................13 7.3S PECTRUMANALYZERSETUP........................................................................................................................14 7.4T ESTPROCEDURE.......................................................................................................................................... 15 7.5C ORRECTEDAMPLITUDE&MARGINCALCULATION..............................................................................…

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Test Setup Photos

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs – Model TL100-E26 Test Setup Conducted Emission Radiated Emission Test frequency below 30MHz Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Test frequency from 30MHz to 1GHz Test frequency above 1GHz