2ACCJH024HSUPA/HSDPA/UMTS Quad-band/GSM Quad-band mobile phone

12 www.sar-tick.com This product meets applicable national SAR limits of 1.6 W/kg. The specific maximum SAR values can be found in the RADIOWAVES section of this user guide. When carrying the product or using it while worn on your body, either use an approved accessory such as a holster or otherwise maintain a distance of 10 mm from the body to ensure compliance with RF exposure requirements. Note that the product may be transmitting even if you are not making a phone call. English - CJB28D1ALAAA Quick Start Guide For more information about how to use your phone, please visit www.alcatelonetouch.com to download the complete user manual. From the website, you can consult the FAQ, perform software upgrades, etc.


 PROTECT YOUR HEARING To prevent possible hearing damage, do not listen at high volume levels for long periods. Exercise caution when holding your device near your ear while the loudspeaker is in use. 1 Your mobile ������������������ 1�1 Keys and connectors Headset connector Micro-USB connector Back key Home key Recents key Touch screen Front Camera Pop 35_5015A_5015E US QG_Eng_EN_03_150701.indd 1-22015/7/2 8:51:50 34 Power key • Press: Lock the screen/Light up the screen. • Press and hold: Show the popup menu to select from Restart/ Power off/Aeroplane mode� • Press and hold the Power key and Volume down key to capture a screenshot. • Press and hold the power key for at least 10 seconds to force reboot or hold it longer to power off. Volume Keys • In call mode, adjusts the earpiece or headset volume. • In Music/Video/Streaming mode, adjusts the media volume. • In general mode, adjusts the ringtone volume. • Mutes the ringtone of an incoming call. Volume up Volume down Camera Flash/Torch Power key Recents key • Recent apps� Touch to open a list of thumbnail images of apps you've worked with recently. Touch it to open an app. Swipe it left or right to remove a thumbnail from the list. Home key • From any application or screen, touch to return to the Home screen. • Long press to open Google search. Back key • Touch to go back to the previous screen, or to close a dialog box, options menu, the notification panel, etc. Pop 35_5015A_5015E US QG_Eng_EN_03_150701.indd 3-42015/7/2 8:51:50 56 Installing or removing the battery Power off your phone before removing the battery. • Insert and click the battery into place, then close the cover. • Unclip the cover, then remove the battery. Installing or removing the microSD card To install, insert the microSD card first, and then place it into the slot with the gold contact facing down. To remove the external microSD card, slide and take it out from the slot. Charging the battery Connect battery charger to your phone and plug into the socket. If the battery is very low, there will be no indication that power is being received until the charge is sufficient to show the charging status bar. To reduce power consumption and energy waste, once the battery is fully charged, disconnect your charger from the plug; switch off Wi-Fi, GPS, Bluetooth or background-running applications when not in use; reduce the backlight time, etc. 1�2 Getting started 1�2�1 Set up Removing or installing the back cover Inserting or removing the SIM card You must insert your SIM card to make phone calls. Power off your phone before inserting or removing the SIM card. SIM1 Place the SIM card with the chip facing downwards and slide it into its housing. Make sure that it is correctly inserted. To remove the card, press and slide it out. SIM2 (1) Release the SIM card holder by sliding it in the direction of the arrow and lift it. Insert the SIM card with the gold contacts facing down and make sure the SIM card is put flatly. Lower the SIM card holder and slide it in the opposite direction to lock it. For dual SIM models, both SIM1 and SIM2 can support 2G and 3G networks. If both of them are 3G SIM cards, only one card can support 3G network (1) . Your phone only supports micro-SIM card. Do not attempt to insert other SIM types like mini and nano cards, otherwise you may damage your phone. (1) 5015E only. Pop 35_5015A_5015E US QG_Eng_EN_03_150701.indd 5-62015/7/2 8:51:55 78 1�3�1 Using the touchscreen Touch To access an application, touch it with your finger. Long press Long press the item to enter the available options. Drag Place your finger on the screen to drag an object to another location. Slide/Swipe Slide the screen up and down to scroll through the applications, images, web pages, etc. Flick Similar to swiping, but flicking makes it move quicker. Pinch/Spread Place your fingers of one hand on the screen surface and draw them apart or together to scale an element on the screen. Rotate Automatically change the screen orientation from portrait to landscape by turning the phone sideways to have a better view. 1�3�2 Status bar From the status bar, you can see both phone status (to the right side) and notification information (to the left side). 1�2�2 Power on your phone Hold down the Power key until the phone powers on. It will take a few seconds before the screen lights up. Set up your phone for the first time The first time you power on the phone, you should set the following options: Language, Google account, etc. Even if no SIM card is installed, your phone will still power on and you will be able to connect to a Wi-Fi network, sign into your Google account and use some of the phone's features. 1�2�3 Power off your phone Hold down the Power key from the Home screen until the phone options appear, select Power off. 1�3 Home screen You can move all of the items (applications, shortcuts, folders and widgets) you use most frequently to your Home screen for quick access. Touch the Home key to switch to the Home screen. Touch to enter application list. Status bar • Status/Notification indicators • Touch and drag down to open the notification panel. Touch an icon to open an application, folder, etc. Favourite tray applications • Touch to enter the application. • Long …

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5 Z S TCL Communic 5F, C building, N ZhangJiang Hig Shanghai, P.R. Tel: +86 21 61 4 201 Fe d Offi Equ 734 Colu Sub To W Purs con - Bl - Sc - Op - BO The rele app Yo u Zhiz Prod TCL cation Ltd. No. 232, Liang J gh-Tech Park, P China. 201203 46 0666 Fax: + 5-07-01 deral Comm fice of Engin uipment Aut 45 Oakland M umbia, Mar bject: Perma Whom It M suant to sec fidential tre lock Diagra chematics perational D OM list/Tun e above mat eased to the licant and p urs Sincerel zhou GONG duct Certifi L Commun Jing Road, udong +86 21 6146 06 munications C neering and thorization Mills Road ryland 2104 anent Confid May Concern ctions 0.457 eatment of th am Description ne-Up-Proce erials conta public. The provide unju ly, G cation Ma n nication Lt 02 Commission d Technolog Division 46 dentiality re n, 7 and 0.459 he followin edure ain trade sec e public disc ustified ben nager td. n gy equest for F of CFR 47, ng informati crets and pro closure of th efits to its c FCC ID: 2AC the applica ion accompa oprietary in hese matter competitors CCJH024 ant requests anying this nformation n s might be h . htt permanent applicatio n not customa harmful to t p://tclcom.tcl.co n: arily the om

TCL Communication Ltd. 5F, C building, No. 232, Liang Jing Road, ZhangJiang High-Tech Park, Pudong Shanghai, P.R. China. 201203 Tel: +86 21 6146 0666 Fax: +86 21 6146 0602 http://tclcom.tcl.com Date 2015-07-01 To: Federal Communications Commission, Authorization & Evaluation Division, 7345 Oakland Mills Road Columbia, MD 21046 And American Certification Body, Inc. 6731 Whittier Avenue Suite C110 McLean, VA 22101 To Whom It May Concern: CTTL-Terminals Test Lab of China Academy of Telecommunication Research of MIIT is authorized to act on our behalf, until otherwise notified, for applications to American Certification Body, Inc. (ACB). We certify that we are not subject to denial of federal benefits, which includes FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, U.S.C. 862. Further, no party, as defined in 47 CFR1.2002 (b) to the application is subject to denial of federal benefits, that includes FCC benefits. Thank you. Regards, Zhizhou GONG Product Certification Manager TCL Communication Ltd.

EUT photograph Mobile Phone Mobile Phone Mobile Phone Mobile Phone Mobile Phone Mobile Phone Mobile phone Charger AE1 Label of Charger AE1 Charger AE2 Label of Charger AE2 USB Cable AE3 USB Cable AE4 USB Cable AE5 USB Cable AE6 Headset AE7 Headset AE8 Headset AE9 Headset AE10 Headset AE11 Headset AE12 Headset AE13 Headset AE14 Battery AE15 Battery AE15-1 Battery AE16 Battery AE16-1

EUT Interior photograph Mobile Phone Mobile Phone Mobile Phone Mobile Phone Mobile Phone

©Copyright. All rights reserved by CTTL. SAR TEST REPORT No. I15Z41312-SEM03 For TCL Communication Ltd HSUPA/HSDPA/UMTS Quad-band/GSM Quad-band mobile phone Model Name: 5015E With Hardware Version: PIO Software Version: v1A1D FCC ID: 2ACCJH024 Issued Date: 2015-07-14 Note: The test results in this test report relate only to the devices specified in this report. This report shall not be reproduced except in full without the written approval of CTTL. Test Laboratory: CTTL, Telecommunication Technology Labs, Academy of Telecommunication Research, MIIT No. 51 Shouxiang Science Building, Xueyuan Road, Haidian District, Beijing, P. R. China100191 Te l:+86(0)10-62304633-2512,Fax:+86(0)10-62304633-2504 Email: [email protected], website:www.chinattl.com TESTING CNAS L0570 No. I15Z41312-SEM03 Page 2 of 135 ©Copyright. All rights reserved by CTTL. REPORT HISTORY Report Number Revision Issue Date Description I15Z41312-SEM03 Re v.0 2015-07-14 Initial creation of test report No. I15Z41312-SEM03 Page 3 of 135 ©Copyright. All rights reserved by CTTL. TABLE OF CONTENT 1 TEST LABORATORY .................................................................................................................... 5 1.1 TESTING LO C AT I O N ........................................................................................................................................ 5 1.2 TESTING ENVIRONMENT ................................................................................................................................. 5 1.3 PROJECT DATA ............................................................................................................................................... 5 1.4 SIGNATURE ..................................................................................................................................................... 5 2 STATEMENT OF COMPLIANCE .................................................................................................. 6 3 CLIENT INFORMATION ................................................................................................................ 8 3.1 APPLICANT INFORMATION .............................................................................................................................. 8 3.2 MANUFACTURER INFORMATION ..................................................................................................................... 8 4 EQUIPMENT UNDER TEST (EUT) AND ANCILLARY EQUIPMENT (AE) ................................. 9 4.1 ABOUT EUT ................................................................................................................................................... 9 4.2 INTERNAL IDENTIFICATION OF EUT USED DURING THE TEST .......................................................................... 9 4.3 INTERNAL IDENTIFICATION OF AE USED DURING THE TEST ............................................................................ 9 5 TEST METHODOLOGY .............................................................................................................. 10 5.1 APPLICABLE LIMIT REGULATIONS ................................................................................................................ 10 5.2 APPLICABLE MEASUREMENT STANDARDS .................................................................................................... 10 6 SPECIFIC ABSORPTION RATE(SAR) ....................................................................................... 11 6.1 INTRODUCTION ............................................................................................................................................. 11 6.2 SAR DEFINITION .......................................................................................................................................... 11 7 TISSUE SIMULATING LIQUIDS ................................................................................................. 12 7.1 TARGETS FOR TISSUE SIMULATING LIQUID .................................................................................................... 12 7.2 DIELECTRIC PERFORMANCE ......................................................................................................................... 12 8 SYSTEM VERIFICATION ............................................................................................................ 16 8.1 SYSTEM SETUP ............................................................................................................................................. 16 8.2 SYSTEM VERIFICATION ................................................................................................................................. 17 9 MEASUREMENT PROCEDURES .............................................................................................. 18 9.1 TESTS TO BE PERFORMED ............................................................................................................................. 18 9.2 GENERAL MEASUREMENT PROCEDURE ........................................................................................................ 19 9.3 WCDMA MEASUREMENT PROCEDURES FOR SAR ...................................................................................... 20 9.4 BLUETOOTH &WI-FI MEASUREMENT PROCEDURES FOR SAR ..................................................................... 21 9.5 POWER DRIFT ............................................................................................................................................... 21 10 AREA SCAN BASED 1-G SAR ................................................................................................. 22 10.1 REQUIREMENT OF KDB .............................................................................................................................. 22 10.2 FAST SAR ALGORITHMS ............................................................................................................................ 22 11 CONDUCTED OUTPUT POWER …

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No. I15Z41312-SEM03 Page 76 of 13 5 ©Copyright. All rights reserved by CTTL. ANNEX C SAR Measurement Setup C.1 Measurement Set-up The Dasy4 or DASY5 system for performing compliance tests is illustrated above graphically. This system consists of the following items: Picture C.1SAR Lab Test Measurement Set-up  A standard high precision 6-axis robot (StäubliTX=RX family) with controller, teach pendant and software. An arm extension for accommodating the data acquisition electronics (DAE).  An isotropic field probe optimized and calibrated for the targeted measurement.  A data acquisition electronics (DAE) which performs the signal amplification, signal multiplexing, AD-conversion, offset measurements, mechanical surface detection, collision detection, etc. The unit is battery powered with standard or rechargeable batteries. The signal is optically transmitted to the EOC.  The Electro-optical converter (EOC) performs the conversion from optical to electrical signals for the digital communication to the DAE. To use optical surface detection, a special version of the EOC is required. The EOC signal is transmitted to the measurement server.  The function of the measurement server is to perform the time critical tasks such as signal filtering, control of the robot operation and fast movement interrupts.  The Light Beam used is for probe alignment. This improves the (absolute) accuracy of the probe positioning.  A computer running WinXP and the DASY4 or DASY5 software.  Remote control and teach pendant as well as additional circuitry for robot safety such as  warning lamps, etc.  The phantom, the device holder and other accessories according to the targeted measurement. No. I15Z41312-SEM03 Page 77 of 13 5 ©Copyright. All rights reserved by CTTL. C.2 Dasy4 or DASY5 E-field Probe System The SAR measurements were conducted with the dosimetric probe designed in the classical triangular configuration and optimized for dosimetric evaluation. The probe is constructed using the thick film technique; with printed resistive lines on ceramic substrates. The probe is equipped with an optical multifiber line ending at the front of the probe tip. It is connected to the EOC box on the robot arm and provides an automatic detection of the phantom surface. Half of the fibers are connected to a pulsed infrared transmitter, the other half to a synchronized receiver. As the probe approaches the surface, the reflection from the surface produces a coupling from the transmitting to the receiving fibers. This reflection increases first during the approach, reaches maximum and then decreases. If the probe is flatly touching the surface, the coupling is zero. The distance of the coupling maximum to the surface is independent of the surface reflectivity and largely independent of the surface to probe angle. The DASY4 or DASY5 software reads the reflection durning a software approach and looks for the maximum using 2 nd ord curve fitting. The approach is stopped at reaching the maximum. Probe Specifications: Model: ES3DV3, EX3DV4 Frequency 10MHz — 6.0GHz(EX3DV4) Range: 10MHz — 4GHz(ES3DV3) Calibration: In head and body simulating tissue at Frequencies from 835 up to 5800MHz Linearity: ± 0.2dB(30 MHz to 6 GHz) for EX3DV4 Picture C.2 Near-field Probe ± 0.2dB(30 MHz to 4 GHz) for ES3DV3 DynamicRange: 10 mW/kg — 100W/kg Probe Length: 330 mm Probe Tip Length: 20 mm Body Diameter: 12 mm Tip Diameter: 2.5 mm (3.9 mm for ES3DV3) Tip-Center: 1 mm (2.0mm for ES3DV3) Application: SAR Dosimetry Testing Compliance tests of mobile phones Dosimetry in strong gradient fields Picture C.3 E-field Probe C.3 E-field Probe Calibration Each E-Probe/Probe Amplifier combination has unique calibration parameters. A TEM cell calibration procedure is conducted to determine the proper amplifier settings to enter in the probe parameters. The amplifier settings are determined for a given frequency by subjecting the probe to a known E-field density (1 mW/cm 2 ) using an RF Signal generator, TEM cell, and RF Power Meter. The free space E-field from amplified probe outputs is determined in a test chamber. This calibration can be performed in a TEM cell if the frequency is below 1 GHz and inn a waveguide or other methodologies above 1 GHz for free space. For the free space calibration, the probe is placed No. I15Z41312-SEM03 Page 78 of 13 5 ©Copyright. All rights reserved by CTTL. in the volumetric center of the cavity and at the proper orientation with the field. The probe is then rotated 360 degrees until the three channels show the maximum reading. The power density readings equates to 1 mW/cm 2 . . E-field temperature correlation calibration is performed in a flat phantom filled with the appropriate simulated brain tissue. The E-field in the medium correlates with the temperature rise in the dielectric medium. For temperature correlation calibration a RF transparent thermistor-based temperature probe is used in conjunction with the E-field probe. T SARC t ∆ = ∆ Where: ∆t = Exposure time (30 seconds), C = Heat capacity of tissue (brain or muscle), ∆T = Temperature increase due to RF exposure. 2 E SAR σ ρ ⋅ = Where: σ = Simulated tissue conductivity, ρ = Tissue density (kg/m 3 ). C.4 Other Test Equipment C.4.1 Data Acquisition Electronics(DAE) The data acquisition electronics consist of a highly sensitive electrometer-grade preamplifier with auto-zeroing, a channel and gain-switching multiplexer, a fast 16 bit AD-converter and a command decoder with a control logic unit. Transmission to the measurement server is accomplished through an optical downlink for data and status information, as well as an optical uplink for commands and the clock. The mechanical probe mounting device includes two different sensor systems for frontal and sideways probe contacts. They are used for mechanical surface detection and probe collision detection. The input impedance of the DAE is 200 MOhm; the inputs are symmetrical and floating. Common mode rejection is above …

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©Copyright. All rights reserved by CTTL. FCC PART 15C TESTREPORT No. I15Z41312-SRD04 for TCL Communication Ltd. HSUPA/HSDPA/UMTS Quad-band/GSM Quad-band mobile phone MODEL NAME: 5015E with FCC ID: 2ACCJH024 Hardware Version: PIO Software Version: v1A1D Issued Date: 2015-07-03 Note: The test results iEEn this test report relate only to the devices specified in this report. This report shall not be reproduced except in full without the written approval of CTTL. Test Laboratory: CTTL, Telecommunication Technology Labs, Academy of Telecommunication Research, MIIT No.52, HuayuanNorth Road, Haidian District, Beijing, P. R. China 100191. Tel:+86(0)10-62304633-2512,Fax:+86(0)10-62304633-2504 Email:[email protected], website:www.chinattl.com TESTING CNAS L0570 No. I15Z41312-SRD04 Page2 of 119 ©Copyright. All rights reserved by CTTL. REPORT HISTORY Report Number Revision Description Issue Date I15Z41312-SRD04 Rev.0 1st edition 2015-07-03 No. I15Z41312-SRD04 Page3 of 119 ©Copyright. All rights reserved by CTTL. CONTENTS 1. TEST LABORATORY .............................................................................................................. 5 1.1. TESTINGLOCATION ........................................................................................................... 5 1.2. TESTINGENVIRONMENT ................................................................................................... 5 1.3. PROJECT DATA .................................................................................................................. 5 1.4. SIGNATURE ........................................................................................................................ 5 2. CLIENTINFORMATION ........................................................................................................... 6 2.1. APPLICANT INFORMATION............................................................................................... 6 2.2. MANUFACTURER INFORMATION ..................................................................................... 6 3. EQUIPMENT UNDERTEST (EUT) AND ANCILLARY EQUIPMENT (AE) ............................. 7 3.1. ABOUT EUT ........................................................................................................................ 7 3.2. INTERNAL IDENTIFICATION OF EUT ............................................................................... 7 3.3. INTERNAL IDENTIFICATION OF AE .................................................................................. 7 3.4. GENERAL DESCRIPTION .................................................................................................. 8 3.5. INTERPRETATION OF THE TEST ENVIRONMENT .......................................................... 8 4. REFERENCE DOCUMENTS .................................................................................................. 8 4.1. DOCUMENTS SUPPLIED BY APPLICANT ........................................................................ 8 4.2. REFERENCE DOCUMENTS FOR TESTING ...................................................................... 8 5. TEST RESULTS ...................................................................................................................... 9 5.1. SUMMARY OF TEST RESULTS ......................................................................................... 9 5.2. STATEMENTS ..................................................................................................................... 9 5.3. TEST CONDITIONS ............................................................................................................ 9 6. TEST FACILITIES UTILIZED ................................................................................................ 10 ANNEX A: DETAILED TEST RESULTS ...................................................................................... 11 A.1. MEASUREMENT METHOD .................................................................................................. 11 A.2. MAXIMUM OUTPUT POWER .............................................................................................. 12 A.2.1. PEAK OUTPUT POWER-CONDUCTED ................................................................................... 12 A.2.2. AVERAGE OUTPUT POWER-CONDUCTED ............................................................................. 13 A.3. PEAK POWER SPECTRAL DENSITY ................................................................................. 15 A.4. DTS 6-DB SIGNAL BANDWIDTH ........................................................................................ 23 A.5. BAND EDGES COMPLIANCE ............................................................................................. 30 A.6. TRANSMITTER SPURIOUS EMISSION .............................................................................. 35 No. I15Z41312-SRD04 Page4 of 119 ©Copyright. All rights reserved by CTTL. A.6.1 TRANSMITTER SPURIOUS EMISSION – CONDUCTED .............................................................. 35 A.6.2 TRANSMITTER SPURIOUS EMISSION - RADIATED .................................................................. 88 A.7. AC POWER-LINE CONDUCTED EMISSION ..................................................................... 115 ANNEX B: ACCREDITATION CERTIFICATE ............................................................................ 119 No. I15Z41312-SRD04 Page5 of 119 ©Copyright. All rights reserved by CTTL. 1. Test Laboratory 1.1. Testing Location Location 1:CTTL(Huayuan North Road) Address: No. 52, Huayuan North Road, Haidian District, Beijing, P. R. China100191 Location 2:CTTL(Shouxiang) Address: No. 51 Shouxiang Science Building, Xueyuan Road, Haidian District, Beijing, P. R. China100191 1.2. Testing Environment Normal Temperature: 15-35°C Extreme Temperature: -20/+55°C Relative Humidity: 20-75% 1.3. Project data Testing Start Date: 2015-06-11 Testing End Date: 2015-06-29 1.4. Signature Xu Zhongfei (Prepared this test report) Li Zh…

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No. I15Z41312-SRD04 Page52 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.25 Transmitter Spurious Emission - Conducted (802.11g, Ch1, Center Frequency) Fig.A.6.1.26 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 30 MHz-1 GHz) No. I15Z41312-SRD04 Page53 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.27 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 1 GHz-2.5 GHz) Fig.A.6.1.28 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 2.5 GHz-7.5 GHz) No. I15Z41312-SRD04 Page54 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.29 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 7.5 GHz-10 GHz) Fig.A.6.1.30 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 10 GHz-15 GHz) No. I15Z41312-SRD04 Page55 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.31 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 15 GHz-20 GHz) Fig.A.6.1.32 Transmitter Spurious Emission - Conducted (802.11g, Ch1, 20 GHz-26 GHz) No. I15Z41312-SRD04 Page56 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.33 Transmitter Spurious Emission - Conducted (802.11g, Ch6, Center Frequency) Fig.A.6.1.34 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 30 MHz-1 GHz) No. I15Z41312-SRD04 Page57 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.35 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 1 GHz-2.5 GHz) Fig.A.6.1.36 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 2.5 GHz-7.5 GHz) No. I15Z41312-SRD04 Page58 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.37 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 7.5 GHz-10 GHz) Fig.A.6.1.38 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 10 GHz-15 GHz) No. I15Z41312-SRD04 Page59 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.39 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 15 GHz-20 GHz) Fig.A.6.1.40 Transmitter Spurious Emission - Conducted (802.11g, Ch6, 20 GHz-26 GHz) No. I15Z41312-SRD04 Page60 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.41 Transmitter Spurious Emission - Conducted (802.11g, Ch11, Center Frequency) Fig.A.6.1.42 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 30 MHz-1 GHz) No. I15Z41312-SRD04 Page61 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.43 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 1 GHz-2.5 GHz) Fig.A.6.1.44 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 2.5 GHz-7.5 GHz) No. I15Z41312-SRD04 Page62 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.45 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 7.5 GHz-10 GHz) Fig.A.6.1.46 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 10 GHz-15 GHz) No. I15Z41312-SRD04 Page63 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.47 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 15 GHz-20 GHz) Fig.A.6.1.48 Transmitter Spurious Emission - Conducted (802.11g, Ch11, 20 GHz-26 GHz) No. I15Z41312-SRD04 Page64 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.49 Transmitter Spurious Emission - Conducted (802.11n-HT20, Ch1, Center Frequency) Fig.A.6.1.50 Transmitter Spurious Emission - Conducted (802.11n-HT20, Ch1, 30 MHz-1 GHz) No. I15Z41312-SRD04 Page65 of 119 ©Copyright. All rights reserved by CTTL. Fig.A.6.1.51 Tr…

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