2AF9IMODEL1Pi-Top laptop

Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B EUT View 3 EUT View 4 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B EUT View 5 EUT View 6

Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AF9IMODEL1 This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Specifications: Text is Black in color and justified. Labels are printed in indelible ink on permanent adhesive silk-screened onto the EUT or shall be affixed at a conspicuous location on the EUT. Proposed Label Location on EUT FCC ID Label Location

Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B Solder Board-Component View 1 Solder Board-Component View 2 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B Solder Board-Component View 3 Solder Board-Component View 4 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B Solder Board-Component View 5 Solder Board-Component View 6 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B Solder Board-Component View 7 Solder Board-Component View 8

Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I PAGE 1 OF 16 FCC PART 15B FCC Part 15B Measurement and Test Report For CEED LTD 32-38 Leman Street, London, E1 8EW FCC ID: 2AF9IMODEL1 Test Rule(s): FCC Part 15 Subpart B Product Description: Pi-Top laptop Tested Model: Model 1 Report No.: STR15088316I Tested Date: 2015-09-06 to 2015-10-14 Issued Date: 2015-10-22 Tested By: RODE Liu / Engineer Reviewed By: Jack Kang / EMC Manager Approved & Authorized By: Jandy so / PSQ Manager Prepared By: Shenzhen SEM.Test Technology Co., Ltd. 1/F, Building A, Hongwei Industrial Park, Liuxian 2nd Road, Bao'an District, Shenzhen, P.R.C.（518101） Tel.: +86-755-33663308 Fax.: +86-755-33663309 Website: www.semtest.com.cn Note: This test report is limited to the above client company and the product model only. It may not be duplicated without prior permitted by Shenzhen SEM.Test Technology Co., Ltd. Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I PAGE 2 OF 16 FCC PART 15B TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 3 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 3 1.2 TEST STANDARDS ................................................................................................................................................... 4 1.3 TEST METHODOLOGY ............................................................................................................................................. 4 1.4 TEST FACILITY ....................................................................................................................................................... 4 1.5 EUT SETUP AND OPERATION MODE ...................................................................................................................... 5 1.6 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 5 2. SUMMARY OF TEST RESULTS ........................................................................................................................... 6 3. CONDUCTED EMISSIONS .................................................................................................................................... 7 3.1 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 3.2 TEST PROCEDURE ................................................................................................................................................... 7 3.3 BASIC TEST SETUP BLOCK DIAGRAM ..................................................................................................................... 7 3.4 ENVIRONMENTAL CONDITIONS .............................................................................................................................. 8 3.5 SUMMARY OF TEST RESULTS/PLOTS ...................................................................................................................... 8 3.6 CONDUCTED EMISSIONS TEST DATA ...................................................................................................................... 8 4. RADIATED EMISSIONS ....................................................................................................................................... 11 4.1 MEASUREMENT UNCERTAINTY ............................................................................................................................ 11 4.2 TEST PROCEDURE ................................................................................................................................................. 11 4.3 TEST RECEIVER SETUP ......................................................................................................................................... 12 4.4 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 12 4.5 ENVIRONMENTAL CONDITIONS ............................................................................................................................ 12 4.6 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I PAGE 3 OF 16 FCC PART 15B 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: CEED LTD Address of applicant: 32-38 Leman Street, London, E1 8EW Manufacturer: Shenzhen Zealfull Technology Co., Ltd. Address of manufacturer: 2nd Floor East, B1 Building, Shunheda Area, Liuxiandong Industrial Zone, Nanshan, Shenzhen General Description of EUT Product Name: Pi-Top laptop Trade Name: Pi-Top Model No.: Model 1 Adding Model(s): / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Rated Voltage: Adapter DC 18V Rated Current: 3A Rated Power: 30W(Charging), 5W(Not Charging) Power Adapter Model: ZF120A-1803000 I/P: 100-240V 1A, 50/60Hz; O/P: 18V DC 3A Lowest Internal Frequency: 27MHz Highest Internal Frequency: 1GHz Classification of ITE: CLASS B Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I PAGE 4 OF 16 FCC PART 15B 1.2 Test Standards The following report is prepared on behalf of the CEED LTD in accordance with Part 2, Subpart J, and Part 15, Subparts A and B of the Federal Communication Commissions rules. The objective is to determine compliance with FCC Part 15, Subpart B, and section 15.205, 15.107, and 15.109 rules. Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which result in lowering the emission, should be checked to ensure compliance h…

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Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Shenzhen SEM.Test Technology Co., Ltd. REPORT NO.: STR15088316I FCC PART 15B Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (Above 1GHz)