2AGRNKX03B00Xkey Air 37

Federal Communications Commission Authorization and Evaluation Division 1435 Oakland Mills Road Columbia, MD 21046 Date: Dec. 03, 2015 SUB JECT: FCC Application for (FCC ID: 2AGRNKX03B00) To Whom It May Concern: I, the undersigned, hereby attest to the fact that I will apply the Declaration of Conformity procedure to the class B computer peripheral portion of this composite device. I understand the following FCC requirements: 1. Devices subject to the DoC procedure are required to be tested to show compliance with the FCC technical regulations by a recognized accredited testing laboratory. The testing laboratory must be accredited by a Commission approved accreditation body or designated under the terms of a government-to-government Mutual Recognition Agreement (MRA). A listing of those accredited testing laboratories that have been recognized by the Commission is published on the FCC Webpage: https://apps.fcc.gov/oetcf/eas/reports/TestFirmSearch.cfm (Select the "accredited" option to search for FCC recognized accredited test firms.) 2. Test facilities located in countries, where the U.S. does not have an operational Telcom MRA are not recognized by the FCC to test for the DoC procedure. 3. Pt 2.1077 contains the list of information that must be included in the Declaration of Conformity, which must be supplied with each product sold. The DoC compliance info shall be included in the User’s Manual or as a separate sheet. The info must contain thename, address, and phone number of the responsible party, which must be located within the United States.According to 2.909(c)(2), the responsible party is either the Manufactureror if the product is imported the Importer . Regards, Signature: Typed name and title: Jerry Chan/COO Applicant: CME Pte. Ltd. Address: 20 MAXWELL ROAD #11-16 MAXWELL HOUSE SINGAPORE (069113)

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs - Constructional Details Model KX03B00- External Photos W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

FCC Label Sample and Label Location for model: KX03B00 The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable.

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn M odel KX03B00- Internal Photos W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn ANT W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

TEST REPORT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cnPage 1 of 40 Reference No....................... : WTD15S1137730E FCC ID .................................... : 2AGRNKX03B00 Applicant ............................... : CME Pte. Ltd. Address ................................. : 20 MAXWELL ROAD #11-16 MAXWELL HOUSE SINGAPORE (069113) Manufacturer ........................ : Dongguan Longjoin Electronics Co., LTD Address ................................. : Gong Ye Da Dao,Shui Lang Village, Dalingshan Town, Dongguan City, Guangdong Province, China Product Name ...................... : Xkey Air 37 Model No. .............................. : KX03B00 Standards .............................. : FCC CFR47 Part 15 Section 15.247:2015 Date of Receipt sample ..... : Nov. 19, 2015 Date of Test .......................... : Nov. 20, 2015-Jan. 10, 2016 Date of Issue ........................ : Jan. 26, 2016 Test Result ............................ : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by:Approved by: Zero Zhou / Test Engineer Philo Zhong / Manager Reference No.: WTD15S1137730EPage 2 of 40 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Test Summary Test ItemsTest RequirementResult Radiated Emissions 15.205(a) 15.209(a) PASS Conducted Emissions15.207(a)PASS Bandwidth15.247(a)(2)PASS Maximum Peak Output Power15.247(b)(3),(4)PASS Power Spectral Density15.247(e)PASS Band Edge15.247(d)PASS Antenna Requirement15.203PASS Maximum Permissible Exposure (Exposure of Humans to RF Fields) 1.1307(b)(1)PASS Reference No.: WTD15S1137730EPage 3 of 40 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1 COVER PAGE .......................................................................................................................................................... 1 2TEST SUMMARY........................................................................................................................................................... 2 3CONTENTS..................................................................................................................................................................... 3 4GENERAL INFORMATION.......................................................................................................................................... 5 4.1G ENERALDESCRIPTION OFE.U.T...................................................................................................................... 5 4.2D ETAILS OFE.U.T................................................................................................................................................5 4.3C HANNELLIST...................................................................................................................................................... 5 4.4T ESTMODE...........................................................................................................................................................5 4.5T ESTFACILITY...................................................................................................................................................... 5 5EQUIPMENT USED DURING TEST...........................................................................................................................7 5.1E QUIPMENTSLIST.................................................................................................................................................7 5.2M EASUREMENTUNCERTAINTY.............................................................................................................................8 5.3T ESTEQUIPMENTCALIBRATION.......................................................................................................................... 8 6CONDUCTED EMISSION.............................................................................................................................................9 6.1E.U.T. O PERATION...............................................................................................................................................9 6.2EUT S ETUP.......................................................................................................................................................... 9 6.3M EASUREMENTDESCRIPTION..............................................................................................................................9 6.4C ONDUCTEDEMISSIONTESTRESULT.............................................................................................................. 10 7RADIATED EMISSIONS............................................................................................................................................. 12 7.1EUT O PERATION................................................................................................................................................12 7.2T ESTSETUP........................................................................................................................................................13 7.3S PECTRUMANALYZERSETUP........................................................................................................................... 14 7.4T ESTPROCEDURE..............................................................................................................................................15 7.5C ORRECTEDAMPLITUDE&MARGINCALCULATION......................................................................................... 15 …

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Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs –Model KX03B00 Test S etup Photograph – Radiated Emission Test frequency 36.768KHz to 30MHz Test Site 2# Test frequency from 30MHz to 1GHz Test Site 2# W altek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Test frequency above 1GHz Test Site 1# P hotograph – Conducted Emission Test Setup at Test Site 1#