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  3. 2AHFT7854

2AHFT7854TD-LTE Wireless Data Terminal

Shenzhen DO Intelligent Technology Co., Ltd.

Application Details

Equipment Class
PCE - PCS Licensed Transmitter held to ear
Date of Grant
Jun 16, 2024
Application Purpose
Original Equipment
Date of Application
Jun 13, 2024
Equipment Note
TD-LTE Wireless Data Terminal
Frequency Range
1710.70000000 - 1779.30000000
Company
Shenzhen DO Intelligent Technology Co., Ltd.
Country
China

Documents & Files

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Attestation Statements

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Cover Letter(s)

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ID Label/Location Info

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RF Exposure Info

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Test Report

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

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Attestation Statements

Rev1/26/2023 ShenzhenDOIntelligentTechnologyCo.,Ltd. FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA Date:3June2024 Ref:AttestationStatementsPart2.911(d)(5)(i)Filing FCCID:2AHFT7854 ShenzhenDOIntelligentTechnologyCo.,Ltd.(“theapplicant”)certifiesthattheequipmentforwhich authorizationissoughtisnot“covered”equipmentprohibitedfromreceivinganequipment authorizationpursuanttosection2.903oftheFCCrules. Sincerely, WuDajun Rev1/26/2023 ShenzhenDOIntelligentTechnologyCo.,Ltd. FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA Date:3June2024 Ref:AttestationStatementsPart2.911(d)(5)(ii)Filing FCCID:2AHFT7854 ShenzhenDOIntelligentTechnologyCo.,Ltd.(“theapplicant”)certifiesthat,asofthedateofthefilingof theapplication,theapplicantisnotidentifiedontheCoveredListasanentityproducing“covered” equipment.ShenzhenDOIntelligentTechnologyCo.,Ltd.certifiesthat,asofthedateofthefillingofthe application,theapplicantisnotidentifiedontheCoverlist(asspecificallynamedentityoranyofits subsidiariesoraffiliates)asanentityproducing”coveredequipment. Sincerely, WuDajun

Cover Letter(s)

Date: 3 June 2024 Shenzhen DO Intelligent Technology Co., Ltd. To: Federal Communications Commission, Authorization & Evaluation Division, 7435 Oakland Mills Road, Columbia, MD 21046 To Whom It May Concern: The Shenzhen DO Intelligent Technology Co., Ltd., the undersigned, hereby authorizes Mr. Wu Xuewen from Shenzhen BALUN Technol ogy Co., Ltd., to act on the behalf of the Shenzhen DO Intelligent Technology Co., Ltd. solely in matters relating to the application for an FCC equipment authorization for FCC ID: 2AHFT7854 including the signing of documents in connection with this Application. Necessary acts carried out by Shenzhen BALUN Technology Co., Ltd. in connection with the Application shall have the same effect as acts of the Shenzhen DO Intelligent Technology Co., Ltd. . The Shenzhen DO Intelligent Technology Co., Ltd. also hereby certify that no party to this application is subject to a denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. Section 862. Yours Sincerely, _______ Wu Dajun

Cover Letter(s)

Date: 3 June 2024 Shenzhen DO Intelligent Technology Co., Ltd. To: Federal Communications Commission, Authorization & Evaluation Division, 7435 Oakland Mills Road, Columbia, MD 21046 Re: Shenzhen DO Intelligent Technology Co., Ltd. FCC ID: 2AHFT7854 FCC Certification Confidentiality Request Gentlemen: This letter is to comply with 47 CFR 0.457 and 0.459 pertaini ng to confidentiality material. Shenzhen DO Intelligent Technology Co., Ltd. requests that the following documents regarding this submission for FCC ID: 2AHFT7854 be kept confidential: Exhibit Type File Name Block Diagram Block Diagram.pdf Schematics Schematics.pdf Operational Description Operational Description.pdf Part list BOM.pdf Tune-Up-Procedure Tune up procedure.pdf And below exhibit kept short-term confidential (180 days): External photos External photos.pdf Test setup photos test photo.pdf Internal photos Internal photos.pdf User manual User manual.pdf Those documents contain detailed system and equipment description and related information about the product which Shenzhen DO Intelligent Technology Co., Ltd. considers to be confidential proprietary, a custom design and, otherwise, not releasable to the general public. Since this design is a basis form which future technological products will evolve, Shenzhen DO Intelligent Technology Co., Ltd. considers this information would be of benefit to its competitors, and that the disclosure of the information i n these documents would gi ve competitors an unfair advantage in the market. Yours Sincerely, Wu Dajun

ID Label/Location Info

Label: Location:bottom

RF Exposure Info

Report No.: BL-SZ2430243-701 Tel: +86-755-66850100 E-mail: [email protected] Page No. 1 / 67 Web: www.titcgroup.com Template No.: TRP-FCC DASY-BodyI-1 (2023-01-30) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China TEST REPORT Applicant: Address: Equipment Type: Model Name: Brand Name: FCC ID: Test Standard: Maximum SAR: Sample Arrival Date: Test Date: Date of Issue: Shenzhen DO Intelligent Technology Co., Ltd 11th Floor , 3# Building, Guo le Tech Park, Lirong Road, Dalang, Longhua District, Shenzhen 518109, China TD-LTE Wire less Data Terminal IDK01 IDO 2AHFT7854 FCC 47 CFR Part 2.1093 (refe r to section 3.1) Front of Face (1 g@10mm): 0.59 W/kg Extremity (10 g@0mm): 0.90 W/kg Mar . 07 , 2024 Apr. 20, 2024 - Apr. 30, 2024 Jun. 04, 2024 ISSUED BY: Shenzhen BALUN Technology Co., Ltd. Tested by: Zhang Jiwei Checked by: Xu Rui Approved by: Tolan Tu (Testing Director) _______________ _______________ _______________ Report No.: BL-SZ2430243-701 Tel: +86-755-66850100 E-mail: [email protected] Page No. 2 / 67 Web: www.titcgroup.com Template No.: TRP-FCC DASY-BodyI-1 (2023-01-30) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Revision History Version Issue Date Revisions Content Rev. 01 Jun. 04, 2024 Initial Issue TABLE OF CONTENTS 1 GENERAL INFORMATION ........................................................................................................ 4 1.1 Test Laboratory ............................................................................................................ 4 1.2 Test Location ................................................................................................................ 4 1.3 Test Environment Condition .......................................................................................... 4 2 PRODUCT INFORMATION ....................................................................................................... 5 2.1 Applicant Information .................................................................................................... 5 2.2 Manufacturer Information .............................................................................................. 5 2.3 General Description for Equipment under Test (EUT) ................................................... 5 2.4 Ancillary Equipment ...................................................................................................... 5 2.5 Technical Information ................................................................................................... 6 2.6 Antenna location sketch ................................................................................................ 7 3 SUMMARY OF TEST RESULT ................................................................................................. 8 3.1 Test Standards ............................................................................................................. 8 3.2 Device Category and SAR Limit ................................................................................... 9 3.3 Test Result Summary ................................................................................................. 10 3.4 Test Uncertainty ......................................................................................................... 11 4 MEASUREMENT SYSTEM ..................................................................................................... 12 4.1 Specific Absorption Rate (SAR) Definition .................................................................. 12 4.2 DASY SAR System .................................................................................................... 13 5 SYSTEM VERIFICATION ........................................................................................................ 20 5.1 Purpose of System Check .......................................................................................... 20 5.2 System Check Setup .................................................................................................. 20 6 TEST POSITION CONFIGURATIONS .................................................................................... 21 6.1 Front-of-face device .................................................................................................... 21 6.2 Limb-worn device ....................................................................................................... 21 Report No.: BL-SZ2430243-701 Tel: +86-755-66850100 E-mail: [email protected] Page No. 3 / 67 Web: www.titcgroup.com Template No.: TRP-FCC DASY-BodyI-1 (2023-01-30) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China 7 MEASUREMENT PROCEDURE ............................................................................................. 22 7.1 Measurement Process Diagram ................................................................................. 22 7.2 SAR Scan General Requirement ................................................................................ 23 7.3 Measurement Procedure ............................................................................................ 24 7.4 Area & Zoom Scan Procedure .................................................................................... 24 8 CONDUCTED RF OUPUT POWER ........................................................................................ 25 8.1 GSM ........................................................................................................................... 25 8.2 LTE ............................................................................................................................. 25 9 TEST RESULT ........................................................................................................................ 26 9.1 GSM 850 ...........................…

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RF Exposure Info

Report No.: BL-SZ2430243-AC 1 / 47 CALIBRATION REPORT F.1 E-Field Probe (EX3DV4 - SN:7506) Report No.: BL-SZ2430243-AC 2 / 47 Report No.: BL-SZ2430243-AC 3 / 47 Report No.: BL-SZ2430243-AC 4 / 47 Report No.: BL-SZ2430243-AC 5 / 47 Report No.: BL-SZ2430243-AC 6 / 47 Report No.: BL-SZ2430243-AC 7 / 47 Report No.: BL-SZ2430243-AC 8 / 47 Report No.: BL-SZ2430243-AC 9 / 47 Report No.: BL-SZ2430243-AC 10 / 47 F.2 Data Acquisition Electronics (DAE4 - SN:1711) Report No.: BL-SZ2430243-AC 11 / 47 Report No.: BL-SZ2430243-AC 12 / 47 Report No.: BL-SZ2430243-AC 13 / 47 F.3 750MHz Dipole Report No.: BL-SZ2430243-AC 14 / 47 Report No.: BL-SZ2430243-AC 15 / 47 Report No.: BL-SZ2430243-AC 16 / 47 Report No.: BL-SZ2430243-AC 17 / 47 Report No.: BL-SZ2430243-AC 18 / 47 Report No.: BL-SZ2430243-AC 19 / 47 D750V3 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.07.05 2022.07.05 / Return Loss(dB) -31.829 -30.143 5.59% Impedance 50.362 Ω + 1.112 jΩ 50.569 Ω - 3.713 jΩ 4.824Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2430243-AC 20 / 47 F.4 835 MHz Dipole Report No.: BL-SZ2430243-AC 21 / 47 Report No.: BL-SZ2430243-AC 22 / 47 Report No.: BL-SZ2430243-AC 23 / 47 Report No.: BL-SZ2430243-AC 24 / 47 Report No.: BL-SZ2430243-AC 25 / 47 Report No.: BL-SZ2430243-AC 26 / 47 D835V2 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.05.15 2022.05.16 / Return Loss(dB) -29.596 -32.412 -8.69% Impedance 50.906 Ω - 3.2194 jΩ 50.497 Ω - 2.356 jΩ -0.8634Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2430243-AC 27 / 47 F.5 1750 MHz Dipole Report No.: BL-SZ2430243-AC 28 / 47 Report No.: BL-SZ2430243-AC 29 / 47 Report No.: BL-SZ2430243-AC 30 / 47 Report No.: BL-SZ2430243-AC 31 / 47 Report No.: BL-SZ2430243-AC 32 / 47 Report No.: BL-SZ2430243-AC 33 / 47 D1750V2 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.05.15 2022.05.16 / Return Loss(dB) -30.774 -30.021 2.51% Impedance 51.337Ω - 2.6099 jΩ 51.965Ω - 2.004 jΩ -0.628Ω (Real part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2430243-AC 34 / 47 F.6 1900 MHz Dipole Report No.: BL-SZ2430243-AC 35 / 47 Report No.: BL-SZ2430243-AC 36 / 47 Report No.: BL-SZ2430243-AC 37 / 47 Report No.: BL-SZ2430243-AC 38 / 47 Report No.: BL-SZ2430243-AC 39 / 47 Report No.: BL-SZ2430243-AC 40 / 47 D1900V2 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.05.18 2022.05.19 / Return Loss(dB) -29.246 -29.438 -0.65% Impedance 53.522 Ω - 0.589 jΩ 53.067 Ω + 1.639 jΩ -2.228Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL Report No.: BL-SZ2430243-AC 41 / 47 F.7 2600 MHz Dipole Report No.: BL-SZ2430243-AC 42 / 47 Report No.: BL-SZ2430243-AC 43 / 47 Report No.: BL-SZ2430243-AC 44 / 47 Report No.: BL-SZ2430243-AC 45 / 47 Report No.: BL-SZ2430243-AC 46 / 47 Report No.: BL-SZ2430243-AC 47 / 47 D2600V2 Dipole impedance and return loss Validation Meas. Results Current Meas. Previous Meas. Max. Deviation Meas. Data 2023.05.17 2022.05.18 / Return Loss(dB) -23.004 -21.995 4.59% Impedance 49.096 Ω - 4.315 jΩ 50.184 Ω - 7.194 jΩ 2.879Ω (Imaginary part) Return Loss for Head TSL Impedance for Head TSL --END OF REPORT--

RF Exposure Info

8 CONDUCTED RF OUPUT POWER 8.1GSM Output Power 8.2LTE Output Power 8.2.1LTE Band2 Output Power 8.2.2LTE Band4 Output Power 8.2.3LTE Band5 Output Power 8.2.4LTE Band7 Output Power 8.2.5LTE Band12 Output Power 8.2.6LTE Band66 Output Power 8.2.7LTE Band38 Output Power 8.2.8LTE Band41 Output Power BL-SZ2430243-AP 8.1GSM Output Power GSM GSM850 Band Burst Average Power(dBm)Tune-up Power(dBm) Frame-Averaged power Tune-up Power(dBm) Channel128190251128190251 GSM (GMSK, 1-Slot) 33.19 33.25 33.31 34.00 24.00 24.06 24.12 24.81 GPRS (GMSK, 1-Slot) 33.31 33.33 33.43 34.00 24.12 24.14 24.24 24.81 GPRS (GMSK, 2-Slots) 33.31 33.36 33.47 34.00 27.18 27.23 27.34 27.87 GPRS (GMSK, 3-Slots) 30.24 30.27 30.40 31.00 25.82 25.85 25.98 26.58 GPRS (GMSK, 4-Slots) 28.37 28.40 28.50 29.50 25.19 25.22 25.32 26.32 EGPRS (8PSK, 1-Slot) 23.93 23.93 24.05 25.00 14.74 14.74 14.86 15.81 EGPRS (8PSK, 2-Slots) 21.29 21.40 21.43 23.00 15.16 15.27 15.30 16.87 EGPRS (8PSK, 3-Slots) 19.17 19.27 19.34 21.00 14.75 14.85 14.92 16.58 EGPRS (8PSK, 4-Slots) 16.89 16.95 17.01 18.50 13.71 13.77 13.83 15.32 GSM1900 Band Burst Average Power(dBm)Tune-up Power(dBm) Frame-Averaged Tune-up Power(dBm) Channel512661810512661810 GSM (GMSK, 1-Slot) 28.26 28.53 28.79 30.00 19.07 19.34 19.60 20.81 GPRS (GMSK, 1-Slot) 28.07 28.08 28.34 30.00 18.88 18.89 19.15 20.81 GPRS (GMSK, 2-Slots) 28.09 28.09 28.24 30.00 21.96 21.96 22.11 23.87 GPRS (GMSK, 3-Slots) 26.75 26.72 26.50 28.50 22.33 22.30 22.08 24.08 GPRS (GMSK, 4-Slots) 24.91 24.81 24.56 26.50 21.73 21.63 21.38 23.32 EGPRS (8PSK, 1-Slot) 24.32 23.70 23.59 25.50 15.13 14.51 14.40 16.31 EGPRS (8PSK, 2-Slots) 21.18 20.65 20.51 22.50 15.05 14.52 14.38 16.37 EGPRS (8PSK, 3-Slots) 18.32 18.82 18.08 20.00 13.90 14.40 13.66 15.58 EGPRS (8PSK, 4-Slots) 16.13 15.60 15.03 17.00 12.95 12.42 11.85 13.82 BL-SZ2430243-AP 8.2.1LTE Band2 Output Power LTE B2 Bandwidth (MHz)RB SizeRB offestModulation186071890019193 Tune-up power(dBm) 1.4 1 LOWQPSK23.17 22.69 22.55 24.50 MIDQPSK23.15 22.68 22.73 24.50 HIGHQPSK 23.24 22.67 22.91 24.50 3 LOWQPSK23.21 22.59 22.59 24.50 MIDQPSK23.23 22.68 22.69 24.50 HIGHQPSK23.18 22.66 22.84 24.50 6LOWQPSK22.16 21.67 21.63 23.50 1.4 1 LOWQ1622.21 21.98 21.55 23.50 MIDQ1622.32 22.04 21.79 23.50 HIGHQ1622.35 22.01 21.94 23.50 3 LOWQ1622.22 21.86 21.73 23.50 MIDQ1622.24 21.84 21.94 23.50 HIGHQ1622.32 21.86 21.98 23.50 6LOWQ1621.24 20.60 20.86 22.50 Bandwidth (MHz)RB SizeRB offestModulation186151890019185 Tune-up power(dBm) 3 1 LOWQPSK 23.23 22.56 22.54 24.50 MIDQPSK23.21 22.80 22.58 24.50 HIGHQPSK23.22 22.51 22.85 24.50 8 LOWQPSK22.30 21.61 21.53 23.50 MIDQPSK22.30 21.67 21.56 23.50 HIGHQPSK22.23 21.63 21.66 23.50 15LOWQPSK22.24 21.72 21.55 23.50 3 1 LOWQ1622.12 21.85 21.56 23.50 MIDQ1622.19 22.16 21.57 23.50 HIGHQ1622.07 21.87 21.90 23.50 8 LOWQ1621.27 20.73 20.63 22.50 MIDQ1621.22 20.83 20.53 22.50 HIGHQ1621.14 20.77 20.70 22.50 15LOWQ1621.13 20.71 20.58 22.50 Bandwidth (MHz)RB SizeRB offestModulation186251890019175 Tune-up power(dBm) 5 1 LOWQPSK23.40 22.60 22.71 24.50 MIDQPSK23.41 22.85 22.51 24.50 HIGHQPSK23.37 22.55 22.94 24.50 12 LOWQPSK22.24 21.52 21.50 23.50 MIDQPSK22.30 21.76 21.53 23.50 HIGHQPSK22.28 21.55 21.52 23.50 25LOWQPSK22.24 21.70 21.62 23.50 5 1 LOWQ1622.49 21.97 21.80 23.50 MIDQ1622.49 22.29 21.59 23.50 HIGHQ1622.53 22.05 22.06 23.50 12 LOWQ1621.21 20.66 20.53 22.50 MIDQ1621.13 20.95 20.56 22.50 HIGHQ1621.10 20.74 20.63 22.50 25LOWQ1621.11 20.77 20.51 22.50 BL-SZ2430243-AP LTE B2 Bandwidth (MHz)RB SizeRB offestModulation186501890019150 Tune-up power(dBm) 10 1 LOWQPSK23.45 22.59 22.95 24.50 MIDQPSK23.36 22.75 22.71 24.50 HIGHQPSK23.27 22.57 22.85 24.50 25 LOWQPSK22.25 21.58 21.72 23.50 MIDQPSK22.12 21.66 21.80 23.50 HIGHQPSK22.11 21.50 21.55 23.50 50LOWQPSK21.81 21.58 21.87 23.50 10 1 LOWQ1622.32 21.91 21.94 23.50 MIDQ1622.19 22.10 21.79 23.50 HIGHQ1622.18 21.93 21.81 23.50 25 LOWQ1621.02 20.56 20.71 22.50 MIDQ1620.93 20.74 20.92 22.50 HIGHQ1620.78 20.50 20.56 22.50 50LOWQ1620.78 20.92 20.78 22.50 Bandwidth (MHz)RB SizeRB offestModulation186751890019125 Tune-up power(dBm) 15 1 LOWQPSK23.29 22.55 23.65 24.50 MIDQPSK23.03 22.71 22.77 24.50 HIGHQPSK22.80 22.65 22.66 24.50 36 LOWQPSK22.13 21.54 22.04 23.50 MIDQPSK22.19 21.72 21.97 23.50 HIGHQPSK21.98 21.55 21.61 23.50 75LOWQPSK22.58 22.75 22.18 23.50 15 1 LOWQ1622.24 21.86 22.91 23.50 MIDQ1621.91 22.13 22.30 23.50 HIGHQ1621.82 22.06 22.14 23.50 36 LOWQ1622.81 22.97 22.35 23.50 MIDQ1622.79 22.97 22.35 23.50 HIGHQ1622.78 22.96 22.35 23.50 75LOWQ1622.78 22.96 22.35 23.50 Bandwidth (MHz)RB SizeRB offestModulation187001890019100 Tune-up power(dBm) 20 1 LOWQPSK 23.31 22.77 23.09 24.50 MIDQPSK23.24 22.74 22.84 24.50 HIGHQPSK22.69 22.82 22.53 24.50 50 LOWQPSK21.85 21.65 22.40 23.50 MIDQPSK21.98 21.73 21.84 23.50 HIGHQPSK22.03 21.56 21.92 23.50 100LOWQPSK22.65 22.88 22.00 23.50 20 1 LOWQ1622.79 22.21 22.54 23.50 MIDQ1622.68 22.26 22.16 23.50 HIGHQ1622.17 22.29 21.91 23.50 50 LOWQ1623.09 23.29 22.31 23.50 MIDQ1623.07 23.28 22.31 23.50 HIGHQ1623.07 23.28 22.30 23.50 100LOWQ1623.06 23.28 22.30 23.50 BL-SZ2430243-AP 8.2.2LTE Band4 Output Power LTE B4 Bandwidth (MHz)RB SizeRB offestModulation199572017520393 Tune-up power(dBm) 1.4 1 LOWQPSK23.95 23.91 23.93 24.50 MIDQPSK24.01 24.12 23.87 24.50 HIGHQPSK 24.12 23.79 24.07 24.50 3 LOWQPSK23.69 23.87 24.07 24.50 MIDQPSK23.79 23.90 24.10 24.50 HIGHQPSK24.00 24.08 23.86 24.50 6LOWQPSK23.18 23.31 23.07 23.50 1.4 1 LOWQ1623.20 23.13 23.01 23.50 MIDQ1623.35 23.32 23.28 23.50 HIGHQ1623.09 23.20 23.27 23.50 3 LOWQ1623.17 23.06 23.14 23.50 MIDQ1623.17 23.27 23.22 23.50 HIGHQ1623.33 23.27 23.19 23.50 6LOWQ1622.35 22.34 22.42 22.50 Bandwidth (MHz)RB SizeRB offestModulation199652017520385 Tune-up power(dBm) 3 1 LOWQPSK23.77 23.99 23.81 24.50 MIDQPSK23.86 24.10 24.01 24.50 HIGHQPSK23.98 24.03 24.02 24.50 8 LOWQPSK22.48 22.46 22.61 23.50 MIDQPSK22.74 22.75 22.73 23.50 HIGHQPSK22.77 22.72 22.86 23.50 15LOWQPSK23.17 22.63 23.23 23.50 3 1 LOWQ1623.22 23.12 23.30 23.50 MIDQ1623.15 23.15 23.21 23.50 HIGHQ1623…

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Test Report

Report No.: BL-SZ2430243-501 Tel: +86-755-66850100 E-mail: [email protected] Page No. 1 / 129 Web: www.titcgroup.com Template No.: TRP-FCC (2023-08) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China TEST REPORT Applicant: Shenzhen DO Intelligent Technology Co., Ltd Address: 11th Floor, 3# Building, Guole Tech Park, Lirong Road, Dalang, Longhua District, Shenzhen 518109, China Equipment Type: TD-LTE Wireless Data Terminal Model Name: IDK01 Brand Name: IDO FCC ID: 2AHFT7854 Test Standard: 47 CFR Part 2 (Others refer to chapter 3.1) Sample Arrival Date: Mar. 06, 2024 Test Date: Mar. 06, 2024 - Mar. 25, 2024 Date of Issue: May 17, 2024 ISSUED BY: Shenzhen BALUN Technology Co., Ltd. Tested by: Liu Juren Checked by: Wu Huihui Approved by: Tolan Tu (Testing Director) _______________ _______________ _______________ Report No.: BL-SZ2430243-501 Tel: +86-755-66850100 E-mail: [email protected] Page No. 2 / 129 Web: www.titcgroup.com Template No.: TRP-FCC (2023-08) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Revision History Version Issue Date Revisions Content Rev. 01 May 17, 2024 Initial Issue TABLE OF CONTENTS 1 GENERAL INFORMATION ......................................................................................................... 4 1.1 Test Laboratory ..................................................................................................................... 4 1.2 Test Location ......................................................................................................................... 4 2 PRODUCT INFORMATION ......................................................................................................... 5 2.1 Applicant Information ............................................................................................................ 5 2.2 Manufacturer Information ...................................................................................................... 5 2.3 General Description for Equipment under Test (EUT) .......................................................... 5 2.4 Technical Information ............................................................................................................ 6 3 SUMMARY OF TEST RESULTS ................................................................................................. 8 3.1 Test Standards ...................................................................................................................... 8 3.2 Test Verdict ........................................................................................................................... 9 4 GENERAL TEST CONFIGURATIONS ...................................................................................... 10 4.1 Test Environments .............................................................................................................. 10 4.2 Test Equipment List ............................................................................................................ 10 4.3 Test Configurations ............................................................................................................. 12 4.4 Test Setup ........................................................................................................................... 18 5 TEST ITEMS .............................................................................................................................. 21 5.1 Transmitter Radiated Power (EIRP/ERP) ........................................................................... 21 5.2 Peak to Average Ratio ........................................................................................................ 25 5.3 Occupied Bandwidth ........................................................................................................... 27 5.4 Frequency Stability .............................................................................................................. 29 5.5 Spurious Emission at Antenna Terminals ........................................................................... 31 5.6 Band Edge .......................................................................................................................... 35 5.7 Field Strength of Spurious Radiation .................................................................................. 39 ANNEX A TEST RESULTS ........................................................................................................... 44 Report No.: BL-SZ2430243-501 Tel: +86-755-66850100 E-mail: [email protected] Page No. 3 / 129 Web: www.titcgroup.com Template No.: TRP-FCC (2023-08) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China A.1Transmitter Radiated Power (EIRP/ERP) ........................................................................... 44 A.2Peak to Average Ratio ........................................................................................................ 87 A.3Occupied Bandwidth ........................................................................................................... 90 A.4Frequency Stability .............................................................................................................. 99 A.5Spurious Emission at Antenna Terminals ......................................................................... 106 A.6Band Edge ........................................................................................................................ 115 A.7Field Strength of Spurious Radiation ................................................................................ 126 ANNEX B TEST SETUP PHOTOS ............................................................................................. 128 ANNEX C EUT EXTERNAL PHOTOS ...............................................…

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Test Report

DocumentNo: BL-SZ2430243-501 Data Part 1Page 1 of 73 AnnexA.2 Peak to AverageRatio DocumentNo: BL-SZ2430243-501 Data Part 1Page 2 of 73 1. LTE_Band2 1.1. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:1,Channel:18700, Bandwidth:20,Modulation:QPSK,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 18600.14.7313Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 3 of 73 1.2. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:2,Channel:18700, Bandwidth:20,Modulation:QPSK,RB Number:100, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 18600.15.1613Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 4 of 73 1.3. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:3,Channel:18700, Bandwidth:20,Modulation:Q16,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 18600.15.313Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 5 of 73 1. 4. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:5,Channel:18900, Bandwidth:20,Modulation:QPSK,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 18800.15.1613Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 6 of 73 1. 5. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:6,Channel:18900, Bandwidth:20,Modulation:QPSK,RB Number:100, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 18800.15.6213Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 7 of 73 1. 6. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:7,Channel:18900, Bandwidth:20,Modulation:Q16,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 18800.15.8113Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 8 of 73 1. 7. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:9,Channel:19100, Bandwidth:20,Modulation:QPSK,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 19000.14.2213Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 9 of 73 1. 8. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:10,Channel:19100, Bandwidth:20,Modulation:QPSK,RB Number:100, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 19000.15.213Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 10 of 73 1. 9. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:11,Channel:19100, Bandwidth:20,Modulation:Q16,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 19000.15.213Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 11 of 73 2. LTE_Band4 2.1. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:1,Channel:20050, Bandwidth:20,Modulation:QPSK,RB Number:1, RB Position:LOW) CenterFrequency(MHz)PAR Percent(%)PAR (dB)UpperLimit (dB)Verdict 17200.14.513Pass DocumentNo: BL-SZ2430243-501 Data Part 1Page 12 of 73 2.2. LTE Peak to AverageRatio_Part22-24-27(NTNV)(Subtest:2,Channel:20050, Bandwidth:20,Modulation:QPSK,RB Number:100…

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Contact Information

Applicant

Wu Dajun
[email protected]4006-123-55Fax: 4006-123-56

Technical Contact

Shenzhen BALUN Technology Co., Ltdxuewen wu
[email protected]86-755-66850100

Block B, FL 1, Baisha Science and Technology Park, · China

Non-Technical Contact

Shenzhen BALUN Technology Co., LtdTiffany Zhang
[email protected]86-755-66850100

Test Firm

Shenzhen BALUN Technology Co., Ltd.Hanson Lin
[email protected]86-755-66833830

Technical Specifications

#Rule PartsFrequency RangePower OutputEmissionTolerance
27271.71 GHz - 1.78 GHz146.00 mW4M50W7D2.5 ppm
Confidentiality
Long Term
Grant Notes
Output power is ERP for Part 22 ; EIRP for Part 24 and Part 27. This is a portable device. End-users must be provided with operating conditions for satisfying RF exposure compliance. The highest reported SAR for product specific (next-to-mouth) and product specific (10g) are 0.59 W/kg and 0.90 W/kg (10g), respectively.

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