2AILI-SDFV22401SDD Finder 2 with BLE

1、Label 2、location(Inside the back cover)

NOTE: This document is issued by Shenzhen Morlab Communications Technology Co., Ltd., the test report shall not be reproduced except in full without prior written permission of the company. The test results apply only to the particular sample(s) tested and to the specific tests carried out which is available on request for validation and information confirmed at our website. MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 1 of 8 REPORT No.：SZ24020133S01 RF EXPOSURE EXEMPT REPORT APPLICANT : Swissdigital(Asia) Co., Limited PRODUCT NAME : SDD Finder 2 MODEL NAME : SWISSDIGITAL DESIGN 2 BRAND NAME : SWISSDIGITAL DESIGN FCC ID : 2AILI-SDFV22401 STANDARD(S) : 47 CFR Part 2(2.1093) RECEIPT DATE : 2024-02-27 TEST DATE : 2024-03-05 to 2024-03-14 ISSUE DATE : 2024-04-07 Edited by: Zeng Xiaoying (Rapporteur) Approved by: Shen Junsheng (Supervisor) MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 2 of 8 REPORT No.：SZ24020133S01 DIRECTORY 1. Technical Information ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 3 1.1 Applicant and Manufacturer Information ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 3 1.2 Equipment Under Test (EUT) Description ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 3 1.3 Applied Reference Documents ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 4 2. Device Category and RF Exposure Limit ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 5 3. Maximum Average Power Summary ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 6 4. RF Exposure Assessment ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 7 Annex A Testing Laboratory Information ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 8 Change History Version Date Reason for change 1.0 2024-04-07 First edition MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 3 of 8 REPORT No.：SZ24020133S01 1. Technical Information Note: Provide by applicant. 1.1 Applicant and Manufacturer Information Applicant: Swissdigital(Asia) Co., Limited Applicant Address: Flat/Rm 1505B 15/F Fortress Tower 250 King's Road North Point H.K. Manufacturer: Quanzhou New Hunter Bags & Luggages(Light Industry) Co., Ltd Manufacturer Address: Chengnan Industry Zone,Hui'an County, Quanzhou, Fujian, China, 362100 1.2 Equipment Under Test (EUT) Description Product Name: SDD Finder 2 Sample No.: 4# Hardware Version: V1.0 Software Version: 1.0.9 Equipment Type: Bluetooth LE Operating Frequency Range: 2402MHz-2480MHz Modulation Type: GFSK Antenna Type: Ceramic Antenna Antenna Gain: 2.7dBi MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 4 of 8 REPORT No.：SZ24020133S01 1.3 Applied Reference Documents Leading reference documents for testing: Identity Document Title Method Determination /Remark 47 CFR Part 2(2.1093) Radio Frequency Radiation Exposure Assessment: Portable devices No deviation KDB 447498 D01v06 General RF Exposure Guidance No deviation Note 1: Additions to, deviation, or exclusions from the method shall be judged in the "method determination" column of add, deviate or exclude from the specific method shall be explained in the "Remark" of the above table. Note 2: When the test result is a critical value, we will use the measurement uncertainty give the judgment result based on the 95% confidence intervals. MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 5 of 8 REPORT No.：SZ24020133S01 2. Device Category and RF Exposure Limit Per user manual, based on 47 CFR 2.1093, this device belongs to portable device category with General Population/Uncontrolled exposure. Portable Devices: 47 CFR 2.1093(b) For purposes of this section, a portable device is defined as a transmitting device designed to be used so that the radiating structure(s) of the device is/are within 20 centimeters of the body of the user. General Population/Uncontrolled Exposure: 47 CFR 2.1093(d) (2) Limits for General Population/Uncontrolled exposure: 0.08 W/kg as averaged over the whole-body and spatial peak SAR not exceeding 1.6 W/kg as averaged over any 1 gram of tissue (defined as a tissue volume in the shape of a cube). Exceptions are the hands, wrists, feet and ankles where the spatial peak SAR shall not exceed 4 W/kg, as averaged over any 10 grams of tissue (defined as a tissue volume in the shape of a cube). General Population/Uncontrolled limits apply when the general public may be exposed, or when persons that are exposed as a consequence of their employment may not be fully aware of the potential for exposure or do not exercise control over their exposure. Warning labels placed on consumer devices such as cellular telephones will not be sufficient reason to allow these de…

Text truncated - open the document above for the full version.

2.4GHz 3216 Ch ip Antenna: RANT3216F245C0 3 _ Application: WLAN,802.11b/g,Bluetooth,WLAN,etc... Features SMD,highreliability,ultraImpact,Omni-directional... PartnumberInformation RANT3216F245C03 (A)(B)(C) (D)(E)(F) El ectr ical Sp ecifi cati on ThespecificationisdefinedonEVB. Dimension and Terminal Confi gurati on No.Te rmina l Name 1Fe eding/GNG 2GND/Fe eding (A)Product TypeChip Antenna (B) Size Code 3.2x1.6mm( ± 0.2mm) (C) MaterialHigh K material (D) Fr equency2.4 ~ 2.5GHz (E) Fe eding modePIFA & Single Fe eding (F) Antenna typeTy pe=03 Worki ng Fr equency Range2400 ~2500 MHz Bandwidth120 MHz (Min.) Peak Gain2.7 dBi (Typ.) Impedance50 Ohm Return loss10 dB ( Min) PolarizationLinear Azimuth BeamwidthOmni-direct ional Operation Te mperature( °C )-40 ~85 °C Resi st ance to Soldering Heats 10se c. ( @ 280 °C ) TerminationNi / Au (Leadless) Dimens ion (mm) L 3.20 ± 0.20 W 1.60±0.20 T 0.45±0.20 咏成國際科技有限公司電話:13530576606 RAIN International Technology Co., Ltd. Room 707, Building F, Tongan Zhichuangyuan, xixiang street, Baoan District, Shenzhen. 2.4GHz3216ChipAntenna:RANT3216F245C03 _ 1 EvaluationBoardReference 长条板PCB 推荐 Dimension 圆板AntennaLayoutReference Unit:mm ElectricalCharacteristics ReturnLoss&Radiation ReturnLoss Frequency(MHz) S11(dB) 2400-10.50 2450-30.62 2500-11.47 Radiation 2400MHz2450MHz2500MHz Efficiency82.52%85.26%83.01% X Y Z 2.4GHz3216ChipAntenna:RANT3216F245C03 _ TapingSpecifications ReelandTapingSpecification ReelSpecification TYPESIZEABCD 32167”5K/Reel 9.0±0.5 60±213.5±0.5178±2 TappingSpecification PackagingTypeABWEFGHTψDP PaperType3216 1.90±0.2 0 3.50±0.2 0 8.0±0.2 0 1.75±0.1 0 3.5±0.054.0±0.102.0±0.050.75±0.1 0 1.50±0.1 0 4.0±0.1 2.4GHz3216ChipAntenna:RANT3216F245C03 _ ReliabilityTable TestItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfilltheelectrical specification UserSpec. Thermal Shock 1.Preconditioning: 50±10°C/1hr,thenkeepfor24±1hrsatroomtemp. 2.Initialmeasure:Spec:referInitialspec. 3.Rapidchangeoftemperaturetest: -30°Cto+85°C;100cycles; 15minutesatLowercategorytemperature; 15minutesatUppercategorytemperature. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 107 Temperature Cycling 1.Initialmeasure:Spec:referInitialspec. 2.100Cycles(-30°Cto+85°C),SoakMode=1(2Cycle/hours). 3.Measurementat24±2Hoursaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. JESD22 JA104 HighTemperature Exposure 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered;500hours@T=+85°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 LowTemperature Storage 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered:500hours@T=-30°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 Solderability (SMDBottomSide) Dippingmethod: a.Temperature:235±5°C b.Dippingtime:3±0.5s Thesoldershouldcover over95%ofthecritical areaofbottomside. IEC60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150±10°C. Preheatingtime:1~2min. Soldertemperature:260±5°C. Dippingtime:5±0.5s NoVisibleDamage.IEC60384-21/22 4.10 Vibration5g'sfor20min.,12cycleseachof3orientations Note:Use8"X5"PCB.031"thick7securepointson,onelong sideand2securepointsatcornersofoppositesides.Parts mountedwithin2"fromanysecurepoint.Testfrom10-2000 Hz. NoVisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksineachdirectionshallbeappliedalongthethree mutuallyperpendicularaxesofthetestspecimen(18shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4ft/s Waveform:Half-sine NoVisibleDamage.MIL-STD-202 Method213 Humidity Bias 1.Humidity:85%R.H.,Temperature:85±2°C. 2.Time:500±24hours. 3.Measurementat24±2hrsaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 Method106 2.4GHz3216ChipAntenna:RANT3216F245C03 _ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds.NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12019/03/01NewDatasheet 22020/02/22Add2Dradiationcharacteristic 32020/02/22Add2Dradiationcharacteristic

NOTE: This document is issued by Shenzhen Morlab Communications Technology Co., Ltd., the test report shall not be reproduced except in full without prior written permission of the company. The test results apply only to the particular sample(s) tested and to the specific tests carried out which is available on request for validation and information confirmed at our website. MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 1 of 69 REPORT No.：SZ24020133W01 TEST REPORT APPLICANT : Swissdigital(Asia) Co., Limited PRODUCT NAME : SDD Finder 2 MODEL NAME : SWISSDIGITAL DESIGN 2 BRAND NAME : SWISSDIGITAL DESIGN FCC ID : 2AILI-SDFV22401 STANDARD(S) : 47 CFR Part 15 Subpart C RECEIPT DATE : 2024-02-27 TEST DATE : 2024-03-05 to 2024-03-14 ISSUE DATE : 2024-04-07 Edited by: Zeng Xiaoying (Rapporteur) Approved by: Shen Junsheng (Supervisor) MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 2 of 69 REPORT No.：SZ24020133W01 DIRECTORY 1. Summary of Test Result ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 4 1.1. Testing Applied Standards ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 5 1.2. Test Equipment List ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 6 1.3. Measurement Uncertainty ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 8 1.4. Testing Laboratory ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 8 2. General Description ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 9 2.1. Information of Applicant and Manufacturer ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 9 2.2. Information of EUT ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 9 2.3. Channel List of EUT ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 10 2.4. Test Configuration of EUT ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 11 2.5. Test Conditions ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 11 2.6. Test Setup Layout Diagram ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 11 3. Test Results ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 14 3.1. Antenna Requirement ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 14 3.2. Duty Cycle of Test Signal ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 15 3.3. Maximum Peak Conducted Output Power ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 16 3.4. Maximum Average Conducted Output Power ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 17 3.5. 6 dB Bandwidth ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 18 3.6. Conducted Spurious Emissions and Band Edge ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 19 3.7. Power Spectral Density ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 20 3.8. Conducted Emission ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 21 3.9. Restricted Frequency Bands ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 22 3.10. Radiated Emission ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 23 Annex A Test Data and Result ꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏꞏ 25 MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 3 of 69 REPORT No.：SZ24020133W01 Change History Version Date Reason for change 1.0 2024-04-07 First edition MORLAB Shenzhen Morlab Communications Technology Co., Ltd. FL.1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 4 of 69 REPORT No.：SZ24020133W01 1. Summary of Test Result No. Section Description Test Date Test Engineer Result Method Determination /Remark 1 15.203 Antenna Requirement N/A N/A PASS No deviation 2 N/A Duty Cycle of Test Signal Mar. 07, 2024 Su Xiaoxian PASS No deviation 3 15.247(b) Maximum Peak Conducted Output Power Mar. 07, 2024 Su Xiaoxian PASS No deviation 4 15.247(b) Maximum Average Conducted Output Power Mar. 07, 2024 Su Xiaoxian PASS No deviation 5 15.247(a) Bandwidth Mar. 07, 2024 Su Xiaoxian PASS No deviation 6 15.247(d) Conducted Spurious Emission and Band Edge Mar. 07, 2024 Su Xiaoxian PASS No deviation 7 15.247(e) Power Spectral Density Mar. 07, 2024 Su Xiaoxian PASS No deviation 8 15.207 Conducted Emission N/A N/A N/A Note1 N/A 9 15.247(d) Restricted Frequency Bands Mar. 04, 2024 Li Hanbin PASS No deviation 10 15.209, 15.247(d) Radiated Emission Mar. 06, 2024 Li Hanbin PASS No deviation Note 1: Measurements to demonstrate compliance with the conducted limits are not required for devices which only employ battery power for operation and which do not operate from the AC power lines or contain provisions for operation while connected to the AC power lines. Note 2: The tests were performed according to the method of measurements prescribed in ANSI C63.10-2013 and KDB558074 D01 v05r02. Note 3: Additions…

Text truncated - open the document above for the full version.