2AJUKEV-EL-A5IBLUETOOTH HEADPHONE

BLUETOOTH HEADPHONE This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1)This device may not cause harmful interference, and (2) (2) this device must accept any interference received, including (3) interference that may cause undesired operation. NOTE: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -- Reorient or relocate the receiving antenna. -- Increase the separation between the equipment and receiver. -- Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -- Consult the dealer or an experienced radio/TV technician for help. Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. The device has been evaluated to meet general RF exposure requirement. The device can be used in portable exposure condition without restriction.

ShenzhenChuangShiCaiElectronicCo.,Ltd. CERTIFICATIONSCONCERNING“COVERED”EQUIPMENT Date:Sep.08,2023 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,Maryland21046 FCCID:2AJUKEV-EL-A5I ToWhomItMayConcern: Asrequiredbysection 2.911(d)(5)(i),ShenzhenChuangShiCaiElectronicCo.,Ltd. (“the applicant”)certifiesthattheequipmentforwhichauthorizationissoughtisnot “covered”equipmentprohibitedfromreceivinganequipmentauthorizationpursuant tosection2.903oftheFCCrules. Asrequiredbysection2.911(d)(5)(ii), ShenzhenChuangShiCaiElectronicCo.,Ltd. (“theapplicant”)certifiesthat,asofthedateofthefilingoftheapplication,the applicantisnotidentifiedontheCoveredListasanentityproducing“covered” equipment. Thankyouforyourattentiontothismatter. Sincerelyyours, Signature: PrintedName:DavidLiu Company:ShenzhenChuangShiCaiElectronicCo.,Ltd. JobTitle:Manager Email:[email protected] Telephone:0755-82572758

ShenzhenChuangShiCaiElectronicCo.,Ltd. Date:Sep.08,2023 Subject:authorizationforaddingfamilymodels ConfidentialityRequestregardingapplicationforcertificationofFCCID:2AJUKEV-EL-A5I TowhomitMayconcern,Statement WewouldliketoconfirmtheBLUETOOTHHEADPHONEWithModels(EL-A5i,LULE-KING,RT-10, RT-20,D50,WH-850I,LULE-W728,LULE-W758,KIPFPRO,H2,M-295ANC, LULE-SOLO,LULE-ZEUS,WH-910i,LULE-H1,LULE-H2,LULE-H3）aresameinallrespects.Onlythe modelnamesaredifferentfordifferentmarketrequirement. Yourssincerely, Signature: PrintedName:DavidLiu Company:ShenzhenChuangShiCaiElectronicCo.,Ltd. JobTitle:Manager Email:[email protected] Telephone:0755-82572758

ShenzhenChuangShiCaiElectronicCo.,Ltd. LetterofAgency Date：Sep.08,2023 ElementMaterialsTechnology 100FrobisherBusinessPark Malvern Worcestershire WR141BX UK FCCID:2AJUKEV-EL-A5I ToWhomItMayConcern: Wecertifythatwearenotsubjecttodenialoffederalbenefits,thatincludesFCCbenefits, pursuanttoSection5301oftheAnti-DrugAbuseACTof1988,U.S.C.862.Further,noparty,as definedin47CFR1.2002(b),totheapplication,issubjecttodenialoffederalbenefits,that includesFCCbenefits. Thankyouforyourattentiontothismatter. Sincerelyyours, Signature: PrintedName:DavidLiu Company:ShenzhenChuangShiCaiElectronicCo.,Ltd. JobTitle:Manager Email:[email protected] Telephone:0755-82572758

ShenzhenChuangShiCaiElectronicCo.,Ltd. RequestforConfidentialityLetter-FCC Date：Sep.08,2023 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,Maryland21046 Re:Requestforconfidentiality FCCID:2AJUKEV-EL-A5I Towhomitmayconcern, Weherebyrespectfullyrequestthatundertheprovisionof47CFR0.459and0.457(d)the documentslistedbelowandattachedwiththisapplicationforcertificationbeprovidedwith confidentialstatus.  Schematics.pdf OperationalDescription.pdf  FrequencyBlockDiagrams.pdf Anyexhibit/informationforwhichwehaverequestedconfidentiality,butwhichmaynotbe accordedsuchtreatmentbytheFCC,shouldbereturnedtous. Thedocumentslistedabovecontaintradesecretsthataretreatedasconfidentialbyus. Substantialcompetitiveharmtouscouldresultshouldtheybemadeavailabletothepublic. Sincerely, Signature: PrintedName:DavidLiu Company:ShenzhenChuangShiCaiElectronicCo.,Ltd. JobTitle:Manager Email:[email protected] Telephone:0755-82572758

EUTPHOTO(ExternalPhotos) ※※※※※ENDOFREPORT※※※※※

FCCID:2AJUKEV-EL-A5I Thisdevicecomplieswithpart15oftheFCCRules. Operationissubjecttothefollowingtwoconditions: (1)Thisdevicemaynotcauseharmfulinterference, and(2)thisdevicemustacceptanyinterference received,includinginterferencethatmaycause undesiredoperation.

EUTPHOTO(InternalPhotos) 天线 ※※※※※ENDOFREPORT※※※※※

FCCID:2AJUKEV-EL-A5I RFExposureEvaluation AccordingtoKDB447498D01GeneralRFExposureGuidancev06andpart2.1093， UnlessspecificallyrequiredbythepublishedRFexposureKDBprocedures,standalone 1-gheadorbodyand10-gextremitySARevaluationforgeneralpopulationexposure conditions,bymeasurementornumericalsimulation,isnotrequiredwhenthe correspondingSARTestExclusionThresholdcondition(s),listedbelow,is(are)satisfied. For100MHzto6GHzandtestseparationdistances≤50mm,the1-gand10-gSARtest exclusionthresholdsaredeterminedbythefollowing: [(max.powerofchannel,includingtune-uptolerance,mW)/(min.testseparationdistance, mm)]·[√f (GHz) ]≤3.0for1-gSAR,and≤7.5for10-gextremitySAR,where f (GHz) istheRFchanneltransmitfrequencyinGHz PoweranddistanceareroundedtothenearestmWandmmbeforecalculation Theresultisroundedtoonedecimalplaceforcomparison Here, ForBT MaxPower(dBm)MaxPower(mW)Frequency(MHz)Min.distance(mm)Calc.thresholdslimit 1.441.39324415 0.435 3.0 ForBLE MaxPower(dBm)MaxPower(mW)Frequency(MHz)Min.distance(mm)Calc.thresholdslimit 0.141.03324805 0.323 3.0 SoaSARtestisnotrequired

承 認 書 SPECIFICATION FOR APPROVAL 客戶名稱 CUSTOMER ： 客戶料號 CUSTOMER’S P/N ： 料號 PART NUMBER ： KBAN3216D245H06 規格 DESCRIPTION ： Chip Antenna 3216 M-Ant 2.45G Type H06 版本 VERSION ： V1.0 日期 ISSUE DATE ： 2020/08/21 客 戶 承 認 CUSTOMER APPROVED 工 程 部 R&D CENTER 承 認 APPROVAL 確 認 CHECKED 製 作 DRAWN Ziv Alex Jerry 萬誠科技股份有限公司 OneWave Electronic Co., Ltd. 112台北市北投區立功街151號1樓 1F, No. 151, Li Gong Street, Beitou District, Taipei City 112, Taiwan 電話: (02) 2898-2220 TEL: +886 2 2898-2220 傳真: (02) 2898-5055 FAX: +886 2 2898-5055 ONEWAVE TECHNOLOGY CO., LTD. 2/11 3216 Chip antenna For Bluetooth / WLAN Applications Dimension (mm) L 3.23 ± 0.20 W 1.66 ± 0.20 T 1.13 ± 0.20 P/N: KBAN3216D245H06 ONEWAVE TECHNOLOGY CO., LTD. 3/11 Part Number Information KBAN 3216 D 245 H 06 A B C D E F A Product Series Antenna B Dimension L x W 3.2X1.6mm (+-0.2mm) C Material High K material D Working Frequency 2.4 ~ 2.5GHz E Feeding mode Monopole & Single Feeding F Antenna type Type = 06 1. Electrical Specification Remark : Bandwidth & Peak Gain was measured under evaluation board of next page Specification Part Number KBAN3216D245H06 Central Frequency 2450 MHz Bandwidth 100 (Min.) MHz Return Loss -6.5 (Max) dB Peak Gain 2.39 dBi Impedance 50 Ohm Operating Temperature -40～+110 °C Maximum Power 4 W Resistance to Soldering Heats 10 ( @ 260°C) sec. Polarization Linear Azimuth Beamwidth Omni-directional Termination Cu / Sn (Leadless) ONEWAVE TECHNOLOGY CO., LTD. 4/11 2. Recommended PCB Pattern Evaluation Board Dimension Unit : mm Suggested Matching Circuit 重要資訊 : 匹配元件建議使用精準度高的電感±0.1~0.3nH、電容±0.1pF ONEWAVE TECHNOLOGY CO., LTD. 5/11 Layout Dimensions in Clearance area(Size=5.2*5.0mm) 50 ohm transmission Line Matching Circuit FootPrint (Unit : mm) ONEWAVE TECHNOLOGY CO., LTD. 6/11 3. Measurement Results Return Loss ONEWAVE TECHNOLOGY CO., LTD. 7/11 Radiation Pattern Efficiency Peak Gain Directivity 2400MHz 45.61 % 1.13 dBi 4.54 dBi 2450MHz 55.65 % 2.39 dBi 4.93 dBi 2500MHz 47.63 % 1.65 dBi 4.87 dBi Chamber Coordinate System Z Y X ONEWAVE TECHNOLOGY CO., LTD. 8/11 4.Reliability and Test Condictions ITEM REQUIREMENTS TEST CONDITION Solderability 1. Wetting shall exceed 90% coverage 2. No visible mechanical damage Pre-heating temperature:150°C/60sec. Solder temperature:230±5°C Duration:4±1sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Solder heat Resistance 1. No visible mechanical damage 2. Central Freq. change :within ± 6% 10 ± 0.5 sec. 60 sec . . T E M P ( °C ) 150 °C 2 6 0 °C Pre-heating temperature:150°C/60sec. Solder temperature:260±5°C Duration:10±0.5sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Component Adhesion (Push test) 1. No visible mechanical damage The device should be reflow soldered(230±5°C for 10sec.) to a tinned copper substrate A dynometer force gauge should be applied the side of the component. The device must with-ST-F 0.5 Kg without failure of the termination attached to component. Component Adhesion (Pull test) 1. No visible mechanical damage Insert 10cm wire into the remaining open eye bend ,the ends of even wire lengths upward and wind together. Terminal shall not be remarkably damaged. Thermal shock 1. No visible mechanical damage 2. Central Freq. change :within ±6% Phase Temperature(°C) Time(min) 1 +110±5°C 30±3 2 Room Temperature Within 3sec 3 -40±2°C 30±3 4 Room Temperature Within 3sec +110°C=>30±3min -40°C=>30±3min Test cycle:10 cycles The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to High Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: +110±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to Low Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature:-40±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Humidity 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 40±2°C Humidity: 90% to 95% RH Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. 4±1 sec. 60sec TEMP (°C) 150°C 230°C ONEWAVE TECHNOLOGY CO., LTD. 9/11 5.Soldering and Mounting Mildly activated rosin fluxes are preferred. The minimum amount of solder can lead to damage from the stresses caused by the difference in coefficients of expansion between solder, chip and substrate. The terminations are suitable for all wave and re-flow soldering systems. If hand soldering cannot be avoided, the preferred technique is the utilization of hot air soldering tools. Recommended temperature profiles for re-flow soldering in Figure 1. Products attachment with a soldering iron is discouraged due to the inherent process control limitations. In the event that a soldering iron must be employed the following precautions are recommended. ‧Preheat circuit and products to 150°C ‧Never contact the ceramic with the iron tip ‧Use a 20 watt soldering iron with tip diameter of 1.0mm ‧280°C tip temperature (max) ‧1.0mm tip diameter (max) ‧Limit soldering time to 3 sec. SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) 60~120 s 10s max. 30~60s 250~260 230 180 150 TIME(sec.) Reflow Soldering SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) within 3s Gradual cooling 150 TIME(sec.) Iron Soldering Over 60s 350 300 ONEWAVE TECHNOLOGY CO., LTD. 10/11 6.Packaging Information ◆ Tape Specification: W Ao Bo Ko P F E D D1 Po P2 t 8.0 ±0.30 1.80 ±0.05 3.51 ±0.10 1.59 ±0.10 4.00 ±0.05 3.50 ±0.05 1.75 ±0.10 1.50 ±0.10 0.00 ±0.10 4.00 ±0.10 2.00 ±0.05 0.25 ±0.05 ◆ Reel Specification: (7’’, Φ180 mm) Tape Width(mm) A(mm) B(mm) C(mm) D(mm) Chip/Reel(pcs) 8 9.0±0.5 60±2 13.5±0.5 178±2 3000 ONEWAVE TECHNOLOGY CO., LTD. 11/11 7.Storage and Transportation Information Storage Conditions To maintain the solderability of terminal electrodes: 1. Temper…

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BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-1 Page 1 of 41 FCCPART15C MeasurementandTestReport For ShenzhenChuangShiCaiElectronicCo.,Ltd. FCCID:2AJUKEV-EL-A5I FCCRule(s)/Methods: FCCCFRTitle47Part15SubpartCSection15.247 ANSIC63.10:2013 ProductDescription: BLUETOOTHHEADPHONE Trademark / Model/Typereference.: EL-A5i,LULE-KING,RT-10,RT-20,D50,WH-850I, LULE-W728,LULE-W758,KIPFPRO,H2, M-295ANC,LULE-SOLO,LULE-ZEUS, WH-910i,LULE-H1,LULE-H2,LULE-H3. ReportNo.:BSL2305318275037F-1 Dateofreceiptoftestitem: Aug.18,2023 Dateofsampling: Aug.18,2023 TestedDate: Aug.18,2023toAug.28,2023 IssuedDate: Aug.28,2023 TestedBy: CindyZheng/Engineer ReviewedBy: HaleyWen/EMCManager Approved&AuthorizedBy: MikeMo/PSQManager BSLTestingCo.,LTD. 1/F,BuildingB,XinshidaiGRPark,ShiyanStreet,Bao'anDistrict,Shenzhen,Shiyan Street,Bao'anDistrict,Shenzhen,Guangdong,518052,People’sRepublicofChina Tel:400-882-9628Fax:86-755-26508703 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-1 Page 2 of 41 TableofContentsPage 1.VERSION....................................................................................................................4 2.SUMMARYOFTESTRESULTS...............................................................................5 2.1TESTFACILITY.................................................................................................................6 2.2MEASUREMENTUNCERTAINTY....................................................................................6 3.GENERALINFORMATION........................................................................................7 3.1GENERALDESCRIPTION................................................................................................7 3.2DESCRIPTIONOFTESTMODES....................................................................................9 3.3BLOCKDIGRAMSHOWINGTHECONFIGURATIONOFSYSTEMTESTED..............9 3.4DESCRIPTIONOFSUPPORTUNITS(CONDUCTEDMODE)........................................9 3.5EQUIPMENTSLISTFORALLTESTITEMS.................................................................10 4.EMCEMISSIONTEST.............................................................................................12 4.1CONDUCTEDEMISSIONMEASUREMENT..................................................................12 4.1.1POWERLINECONDUCTEDEMISSIONLimits...................................................12 4.1.2TESTPROCEDURE...............................................................................................12 4.1.3DEVIATIONFROMTESTSTANDARD..................................................................12 4.1.4TESTSETUP...........................................................................................................13 4.1.5EUTOPERATINGCONDITIONS...........................................................................13 4.2.1RADIATEDEMISSIONLIMITS...............................................................................16 4.2.2TESTPROCEDURE...............................................................................................17 4.2.3DEVIATIONFROMTESTSTANDARD..................................................................17 4.2.4TESTSETUP...........................................................................................................17 4.2.5EUTOPERATINGCONDITIONS...........................................................................18 5.RADIATEDBANDEMISSIONMEASUREMENT.....................................................23 5.1TESTREQUIREMENT:..............................................................................................23 5.2TESTPROCEDURE..................................................................................................23 5.3DEVIATIONFROMTESTSTANDARD.....................................................................23 5.4TESTSETUP..............................................................................................................24 5.5EUTOPERATINGCONDITIONS..............................................................................24 5.6TESTRESULT...........................................................................................................25 6.POWERSPECTRALDENSITYTEST......................................................................26 6.1APPLIEDPROCEDURES/LIMIT.............................................................................26 6.2TESTPROCEDURE..................................................................................................26 6.3DEVIATIONFROMSTANDARD...............................................................................26 6.4TESTSETUP..............................................................................................................26 6.5EUTOPERATIONCONDITIONS..............................................................................26 6.6TESTRESULT...........................................................................................................27 7.CHANNELBANDWIDTH.........................................................................................29 7.1APPLIEDPROCEDURES/LIMIT.............................................................................29 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-1 Page 3 of 41 TableofContentsPage 7.2TESTPROCEDURE..................................................................................................29 7.3DEVIATIONFROMSTANDARD...............................................................................29 7.4TESTSETUP..............................................................................................................29 7.5EUTOPERATIONCONDITIONS..............................................................................29 7.6TESTRESULT...........................................................................................................30 8.PEAKOUTPUTPOWERTEST................................................................................32 8.1APPLIEDPROCEDURES/LIMIT.............................................................................32 8.…

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BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 1 of 84 FCCPART15C MeasurementandTestReport For ShenzhenChuangShiCaiElectronicCo.,Ltd. FCCID:2AJUKEV-EL-A5I FCCRule(s)/Methods: FCCCFRTitle47Part15SubpartCSection15.247 ANSIC63.10:2013 ProductDescription: BLUETOOTHHEADPHONE Trademark / Model/Typereference.: EL-A5i,LULE-KING,RT-10,RT-20,D50,WH-850I, LULE-W728,LULE-W758,KIPFPRO,H2, M-295ANC,LULE-SOLO,LULE-ZEUS, WH-910i,LULE-H1,LULE-H2,LULE-H3. ReportNo.: BSL2305318275037F-2 Dateofreceiptoftestitem: Aug.18,2023 Dateofsampling: Aug.18,2023 TestedDate: Aug.18,2023toAug.28,2023 IssuedDate: Aug.28,2023 TestedBy: CindyZheng/Engineer ReviewedBy: HaleyWen/EMCManager Approved&AuthorizedBy: MikeMo/PSQManager BSLTestingCo.,LTD. 1/F,BuildingB,XinshidaiGRPark,ShiyanStreet,Bao'anDistrict,Shenzhen,Shiyan Street,Bao'anDistrict,Shenzhen,Guangdong,518052,People’sRepublicofChina Tel:400-882-9628Fax:86-755-26508703 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 2 of 84 Page 1.VERSION..................................................................................................................................4 2.TESTSUMMARY...................................................................................................................5 2.1TESTFACILITY.........................................................................................................................6 2.2MEASUREMENTUNCERTAINTY......................................................................................6 3.GENERALINFORMATION..................................................................................................7 3.1GENERALDESCRIPTIONOFEUT...................................................................................7 3.2TestSetupConfiguration........................................................................................................8 3.3SupportEquipment...................................................................................................................9 3.4TestMode.................................................................................................................................10 3.5EQUIPMENTSLISTFORALLTESTITEMS................................................................11 4.EMCEMISSIONTEST........................................................................................................13 4.1Conductedemissions............................................................................................................13 4.1.1POWERLINECONDUCTEDEMISSIONLimits.......................................................13 4.1.2TESTPROCEDURE..........................................................................................................13 4.1.3DEVIATIONFROMTESTSTANDARD.......................................................................13 4.1.4TESTSETUP.......................................................................................................................14 4.1.5EUTOPERATINGCONDITIONS..................................................................................14 4.1.6TestResult （ WorstcaseGFSK2402MHz ） .............................................................15 4.2Radiatedemissions................................................................................................................17 4.2.1RadiatedEmissionLimits.................................................................................................17 4.2.2TESTPROCEDURE..........................................................................................................17 4.2.3DEVIATIONFROMTESTSTANDARD.......................................................................18 4.2.4TESTSETUP.......................................................................................................................18 4.2.5EUTOPERATINGCONDITIONS..................................................................................19 4.2.6TESTRESULTS..................................................................................................................20 1GHZ~25GHZ............................................................................................................................23 5.RADIATEDBANDEMISSIONMEASUREMENT........................................................29 5.1TestRequirement:..................................................................................................................29 5.2TESTPROCEDURE..............................................................................................................29 5.3DEVIATIONFROMTESTSTANDARD...........................................................................30 5.4TESTSETUP...........................................................................................................................30 5.5EUTOPERATINGCONDITIONS......................................................................................30 5.6TESTRESULT........................................................................................................................31 6.CONDUCTEDBANDEDGEANDSPURIOUSEMISSION.......................................34 6.1Limit.............................................................................................................................................34 6.2TestSetup.................................................................................................................................34 6.3Testprocedure.........................................................................................................................34 6.4DEVIATIONFROMSTANDARD.......................................................................................34 6.5TestResult................................................................................................................................35 7.20DB&99%BANDWIDTH..................................................................................................56 7.1TestSetup..........................................................…

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BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 56 of 84 7.20DB&99%BANDWIDTH TestRequirement:FCCPart15CSection15.247(a)(1) TestMethod:ANSIC63.10:2013 7.1TestSetup 7.2Limit N/A 7.3Testprocedure 1.SetRBW=30kHz. 2.Setthevideobandwidth(VBW)≥3xRBW. 3.Detector=Peak. 4.Tracemode=maxhold. 5.Sweep=autocouple. 6.Allowthetracetostabilize. 7.Measurethemaximumwidthoftheemissionthatisconstrainedbythefrequenciesassociatedwiththetwo outermostamplitudepoints(upperandlowerfrequencies)thatareattenuatedby6dBrelativetothe maximumlevelmeasuredinthefundamentalemission. 7.4DEVIATIONFROMSTANDARD Nodeviation. 7.5TestResult ModeTestchannel 20dBEmission Bandwidth(MHz) 99%Bandwidth (MHz) Result GFSK Lowest0.9430.855 PassMiddle0.9510.856 Highest0.9430.851 π/4-DQPSK Lowest1.3211.180 PassMiddle1.3051.171 Highest1.3081.180 8-DPSK Lowest1.3151.181 PassMiddle1.3091.180 Highest1.2851.174 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 57 of 84 Testplots -20dBBandwidthNVNT1-DH52402MHzAnt1 -20dBBandwidthNVNT1-DH52441MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 58 of 84 -20dBBandwidthNVNT1-DH52480MHzAnt1 -20dBBandwidthNVNT2-DH52402MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 59 of 84 -20dBBandwidthNVNT2-DH52441MHzAnt1 -20dBBandwidthNVNT2-DH52480MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 60 of 84 -20dBBandwidthNVNT3-DH52402MHzAnt1 -20dBBandwidthNVNT3-DH52441MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 61 of 84 -20dBBandwidthNVNT3-DH52480MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 62 of 84 8.MaximumPeakOutputPower TestRequirement:FCCPart15CSection15.247(b)(1) TestMethod:ANSIC63.10:2013 Limit:GFSK:30dBm π/4-DQPSK&8-DPSK:20.97dBm 8.1BlockDiagramOfTestSetup 8.2Limit Forfrequencyhoppingsystemsoperatinginthe2400-2483.5MHzbandemployingatleast75 non-overlappinghoppingchannels,andallfrequencyhoppingsystemsinthe5725-5850MHzband:1watt. Forallotherfrequencyhoppingsystemsinthe2400-2483.5MHzband:0.125watts. ForFHSsoperatingintheband2400-2483.5MHz,themaximumpeakconductedoutputpowershallnot exceed1.0Wifthehopsetuses75ormorehoppingchannels;themaximumpeakconductedoutputpower shallnotexceed0.125Wifthehopsetuseslessthan75hoppingchannels.Thee.i.r.p.shallnotexceed4W. 8.3Testprocedure TheEUTwasdirectlyconnectedtothePowermeter 8.4DEVIATIONFROMSTANDARD Nodeviation. 8.5TestResult ModeTestchannel PeakOutputPower (dBm) FCCLimit (dBm) Result GFSK Lowest-0.82 30.00PassMiddle-1.34 Highest-0.25 π/4-DQPSK Lowest1.44 21.00PassMiddle0.81 Highest-0.95 8-DPSK Lowest1.29 21.00PassMiddle0.72 Highest-1.13 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 63 of 84 9.HOPPINGCHANNELSEPARATION TestRequirement:FCCPart15CSection15.247(a)(1) TestMethod:ANSIC63.10:2013 Receiversetup: RBW=100KHz,VBW=300KHz,detector=Peak Limit: GFSK:20dBbandwidth π/4-DQPSK&8DSK:0.025MHzor2/3ofthe20dBbandwidth(whichever isgreater) 9.1TestSetup 9.2Testprocedure 1.RemovetheantennafromtheEUTandthenconnectalowRFcablefromtheantennaporttothespectrum. 2.Setthespectrumanalyzer:RBW=2MHz.VBW=6MHz.Sweep=auto;DetectorFunction=Peak. 3.KeeptheEUTintransmittingatlowest,mediumandhighestchannelindividually.Recordthemaxvalue 9.3DEVIATIONFROMSTANDARD Nodeviation. BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 64 of 84 9.4TestResult ModulationTestChannelSeparation(MHz)Limit(MHz)Result GFSKLow 1.0160.943 PASS GFSKMiddle 1.0060.951 PASS GFSKHigh 1.0060.943 PASS π/4-DQPSKLow 0.996 0.881PASS π/4-DQPSKMiddle 1.004 0.870PASS π/4-DQPSKHigh 0.984 0.872PASS 8-DPSKLow 1 0.877PASS 8-DPSKMiddle 1.004 0.873PASS 8-DPSKHigh 1 0.857PASS Testplots CFSNVNT1-DH52402MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 65 of 84 CFSNVNT1-DH52441MHzAnt1 CFSNVNT1-DH52480MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 66 of 84 CFSNVNT2-DH52402MHzAnt1 CFSNVNT2-DH52441MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 67 of 84 CFSNVNT2-DH52480MHzAnt1 CFSNVNT3-DH52402MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 68 of 84 CFSNVNT3-DH52441MHzAnt1 CFSNVNT3-DH52480MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 69 of 84 10.NUMBEROFHOPPINGFREQUENCY TestRequirement:FCCPart15CSection15.247(a)(1)(iii) TestMethod:ANSIC63.10:2013 Receiversetup: RBW=100kHz,VBW=300kHz,Frequencyrange=2400MHz-2483.5MHz, Detector=Peak Limit: 15channels 10.1TestSetup 10.2Testprocedure 1.RemovetheantennafromtheEUTandthenconnectalowRFcablefromtheantennaporttothespectrum. 2.Setthespectrumanalyzer:RBW=100kHz.VBW=300kHz.Sweep=auto;DetectorFunction=Peak. Trace=Maxhold. 3.Allowthetracetostabilize.Itmayprovenecessarytobreakthespanuptosections.inordertoclearly showallofthehoppingfrequencies.ThelimitisspecifiedinoneofthesubparagraphsofthisSection. 4.Setthespectrumanalyzer:StartFrequency=2.4GHz,StopFrequency=2.4835GHz.Sweep=auto; 10.3DEVIATIONFROMSTANDARD Nodeviation. BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 70 of 84 10.4TestResult TestPlots: 79Channelsintotal HoppingNo.NVNT1-DH52402MHzAnt1 HoppingNo.NVNT2-DH52402MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 71 of 84 HoppingNo.NVNT3-DH52402MHzAnt1 BSLTestingCo.,LTD.ProjectNo.:BSL2305318275037F-2 Page 72 of 84 11.DWELLTIME TestRequirement:FCCPart15CSection15.247(a)(1)(iii) TestMethod:ANSIC63.10:2013 Receiversetup: RBW=1MHz,VBW=3MHz,Span=0Hz,Detector=Peak Limit:≤0.4Second 11.1TestSetup 11.2Testprocedure 1.RemovetheantennafromtheEUTandthenconnectalowRFcablefromtheantennaporttothespectrum. 2.Setspectrumanalyzerspan=0Hz; 3.SetRBW=1MHzandVBW=3MHz.Sweep=asnecessarytocapturetheentiredwelltimeperhopping channel.SettheEUTforDH1/DH2/2DH1/2DH3/3DH1/3DH3DH5/2DH5/3DH5packettransmitting. 4.Usethemarker-deltafunctiontodeterminethedwelltime.Ifthisvaluevarieswithdifferentmodesof oper…

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