2ALS7F50Microphone

The antenna is permanent connected to the negative stage of the battery; Make sure the product is in normal use. If the transmitting antenna is deformed or damaged, please stop using it immediately and return it to the manufacturer for repair.

Reference No.: WTD20X10073383W Page 2 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTD20X10073383W Page 3 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTD20X10073383W Page 4 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6

Reference No.: WTD20X10073383W Page 1 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2ALS7F50 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTD20X10073383W Page 5 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTD20X10073383W Page 6 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT Housing and Board View 3 Solder Board-Component View 1 Reference No.: WTD20X10073383W Page 7 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTD20X10073383W Page 8 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View

RF Exposure Requirements Product Description: Microphone Model No.: F50, F56, F30, F36 FCC ID: 2ALS7F50 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 202.2MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 4.33dBm Tune-Up output power: 5dBm RF channel transmit frequency: 202.2MHz Result: 0.3 Limit: 3.0 The exclusion thresholds is 0.3< 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 28 TEST REPORT Reference No. .................... : WTD20X10073383W FCC ID ................................ : 2ALS7F50 Applicant ........................... : Dongguan City MeiZhiZun Electronics Technology Co.,Ltd Address.............................. : No. 33, Hehe Road, Xiangxi Village, Liaobu Town,Dongguan, Guangdong. China Product Name ................... : Microphone Test Model. ........................ : F50 Standards .......................... : FCC Part 15.236 Date of Receipt sample .... : Oct.12, 2020 Date of Test........................ : Oct.12, 2020 to Nov.02, 2020 Date of Issue ..................... : Nov.18, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Mike Shi / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTD20X10073383W Page 2 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ....................................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT EXERCISE SOFTWARE ....................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................6 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................7 2. SUMMARY OF TEST RESULTS ...........................................................................................................................8 3. ANTENNA REQUIREMENTS ................................................................................................................................9 3.1 STANDARD APPLICABLE .........................................................................................................................................9 3.2 TEST RESULT..........................................................................................................................................................9 4. RF OUTPUT POWER ............................................................................................................................................ 10 4.1 STANDARD APPLICABLE ....................................................................................................................................... 10 4.2 TEST PROCEDURE ................................................................................................................................................. 10 4.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 10 5. OCCUPIED BANDWIDTH .................................................................................................................................... 11 5.1 STANDARD APPLICABLE ....................................................................................................................................... 11 5.2 TEST PROCEDURE ................................................................................................................................................. 11 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 11 6. RADIATED SPURIOUS EMISSION .................................................................................................................... 12 6.1 STANDARD APPLICABLE ....................................................................................................................................... 12 6.2 TEST PROCEDURE ................................................................................................................................................. 12 6.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 14 7. RADIATED EMISSION ......................................................................................................................................... 18 7.1 STANDARD APPLICABLE ....................................................................................................................................... 18 7.2 TEST PROCEDURE ................................................................................................................................................. 18 7.3 TEST RECEIVER SETUP ..........................................................................................................…

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Reference No.: WTD20X10073383W Page 8 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTD20X10073383W Page 9 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (1GHz to 18GHz) ***** END OF REPORT *****