2AOA7-MDUSBJSQ101Receiver with BT BLE

Hefei Madao Information Technology Co., Ltd.

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Application Details

Equipment Class: DTS - Digital Transmission System
Date of Grant: Jul 08, 2021
Application Purpose: Original Equipment
Date of Application: Jul 08, 2021
Equipment Note: Receiver with BT BLE
Frequency Range: 2402.00000000 - 2480.00000000
Company: Hefei Madao Information Technology Co., Ltd.
Country: China

Documents & Files

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

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External Photos

Reference No.: WTX21X05052064W Page 2 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX21X05052064W Page 3 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX21X05052064W Page 4 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6

ID Label/Location Info

Reference N Waltek Tes Http://www EXHIBI Proposed Specification it is visible durable to r expected lif e Proposed FCC I Loc No.: WTX21X sting Group w.waltek.com T 1 - PRO FCC ID La ns: The label or easily acc emain fully l etime. Label Loca ID Label cation X05052064W (Shenzhen) m.cn ODUCT L abel Forma shall be secu cessible to th legible and in ation on EU W Co., Ltd. LABELIN at urely affixed t he user, and ntact on the UT Page 1 of 9 ANNEX NG to a permane shall not be device in al l 9 ently attached readily detac l normal cond d part of the d chable. The l ditions of use device, in a lo label shall be e throughout ocation where e sufficiently t the device’s e y s

Internal Photos

Reference No.: WTX21X05052064W Page 5 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX21X05052064W Page 6 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 2 Antenna View

RF Exposure Info

RF Exposure Requirements Product Description: Receiver Model No.: MDUSBJSQ101 FCC ID: 2AOA7-MDUSBJSQ101 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 1.082dBm Tune-Up output power: 2dBm RF channel transmit frequency: 2440MHz Result: 0.5 Limit: 3.0 The exclusion thresholds is 0.5 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 36 TEST REPORT Reference No. .................... : WTX21X05052064W FCC ID ................................ : 2AOA7-MDUSBJSQ101 Applicant ........................... : Hefei Madao Information Technology Co.,Ltd Address ............................. : Room 1115, Building E1, Innovation Industrial Park Phase II, No.2800, Chuangxin Avenue, High-tech Zone, Hefei Product Name ................... : Receiver Test Model. ........................ : MDUSBJSQ101 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : May. 28, 2021 Date of Test........................ : May. 28, 2021 to Jun. 11, 2021 Date of Issue ..................... : Jun. 11, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X05052064W Page 2 of 36 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 7 2. SUMMARY OF TEST RESULTS ........................................................................................................................... 9 3. ANTENNA REQUIREMENT ................................................................................................................................ 10 3.1 STANDARD APPLICABLE ....................................................................................................................................... 10 3.2 EVALUATION INFORMATION ................................................................................................................................ 10 4. POWER SPECTRAL DENSITY ........................................................................................................................... 11 4.1 STANDARD APPLICABLE ....................................................................................................................................... 11 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 11 4.3 TEST PROCEDURE ................................................................................................................................................. 11 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 11 5. DTS BANDWIDTH ................................................................................................................................................. 12 5.1 STANDARD APPLICABLE ....................................................................................................................................... 12 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 12 5.3 TEST PROCEDURE ................................................................................................................................................. 12 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 6. RF OUTPUT POWER ............................................................................................................................................ 13 6.1 STANDARD APPLICABLE ....................................................................................................................................... 13 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 13 6.3 TEST PROCEDURE ................................................................................................................................................. 13 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 7. FIELD STRENGTH OF SPURIOUS EMISSIONS ............................................................…

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Test Setup Photos

Reference No.: WTX21X05052064W Page 7 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX21X05052064W Page 8 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX21X05052064W Page 9 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****