2ASG7649918Mercedes-Benz Headphones

September 29, 2025

Label Position : behind Ear pad

Test Report No. 15860840S-E Page 1 of 22 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 EMI TEST REPORT Test Report No.15860840S-E Customer Foster Electric Company, Limited Description of EUT Mercedes-Benz Headphones Model Number of EUT MB WHP 2 FCC ID 2ASG7649918 Test Regulation FCC Part 15 Subpart B, Class B Test Result Complied Issue Date August 8, 2025 Remarks- Representative test engineer Approved by Naoki Saga Engineer Toyokazu Imamura Engineer CERTIFICATE 1266.03 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Report Cover Page - Form-ULID-003532 (DCS:13-EM-F0429) Issue# 24.0 Test Report No. 15860840S-E Page 2 of 22 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 ANNOUNCEMENT REVISION HISTORY Revision Test report No. Date Revised Contents - (Original) 15860840S-E August 8, 2025 -  This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.  The results in this report appl y only to the sample tested. (Laboratory was not involved in sampling.)  This sample tested is in compliance with the limits of the above re gulation.  The test results in this test report are traceable to the national or international standards.  This test report must not be used by the customer to claim product certification, approval, or endorsement b y the A2LA accreditation body.  This test report covers EMC technical requirements. It does not cover administrative issues such as Manual or non-EMC test related Requirements. (if applicable )  The all test items in this test report are conducted b y UL Japan, Inc. Shonan EMC Lab.  The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan, Inc. has been accredited.  The information provided b y the customer for this report is identified in Section 1.  The laboratory is not responsible for information provided by the customer which can impact the validit y of the results.  For any test report referred in this report, the latest version (including any revisions) is always referred to.  If the latest version is a revision, it replaces the previous version. See the table below for revisions and versions. Test Report No. 15860840S-E Page 3 of 22 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Reference: Abbreviations (Including words undescribed in this report) A2LA The American Association for Laboratory Accreditation ICES Interference-Causing Equipment Standard AAN Asymmetric Artificial Network I/O Input/Output AC Alternating Current IEC International Electrotechnical Commission AE Auxiliary equipment IEEE Institute of Electrical and Electronics Engineers AM Amplitude Modulation IF Intermediate Frequency AMN Artificial Mains Network ILAC International Laboratory Accreditation Conference Amp, AMP Amplifier ISED Innovation, Science and Economic Development Canada ANSI American National Standards Institute ISN Impedance Stabilization Network Ant, ANT Antenna ISO International Organization for Standardization AP Access Point JAB Japan Accreditation Board ASK Amplitude Shift Keying LAN Local Area Network Atten., ATT Attenuator LCL Longitudinal Conversion Loss AV Average LIMS Laboratory Information Management System BPSK Binary Phase-Shift Keying LISN Line Impedance Stabilization Network BR Bluetooth Basic Rate MRA Mutual Recognition Arrangement BT Bluetooth N/A Not Applicable BT LE Bluetooth Low Energy NIST National Institute of Standards and Technology BW BandWidth NS No signal detect. C.F Correction Factor NSA Normalized Site Attenuation Cal Int Calibration Interval OBW Occupied BandWidth CAV CISPR AV OFDM Orthogonal Frequency Division Multiplexing CCK Complementary Code Keying PER Packet Error Rate CDN Coupling Decoupling Network PK Peak Ch., CH Channel P LT long-term flicker severity CISPR Comite International Special des Perturbations Radioelectriques POHC(A) Partial Odd Harmonic Current Corr. Correction Pol., Pola. Polarization CPE Customer premise equipment PR-ASK Phase Reversal ASK CW Continuous Wave P ST short-term flicker severity DBPSK Differential BPSK QAM Quadrature Amplitude Modulation DC Direct Current QP Quasi-Peak DET Detector QPSK Quadrature Phase Shift Keying D-factor, D.fac. Distance factor r.m.s., RMS Root Mean Square Dmax maximum absolute voltage change during an observation period RBW Resolution BandWidth DQPSK Differential QPSK RE Radio Equipment DSSS Direct Sequence Spread Spectrum REV Reverse DUT Device Under Test RF Radio Frequency EDR Enhanced Data Rate RFID Radio Frequency Identifier e.i.r.p., EIRP Equivalent Isotropically Radiated Power RNSS Radio Navigation Satellite Service EM clamp Electromagnetic clamp RSS Radio Standards Specifications EMC ElectroMagnetic Compatibility Rx Receiving EMI ElectroMagnetic Interference S.fac. Site factor EMS ElectroMagnetic Susceptibility SINAD Ratio of (Signal + Noise + Distortion) to (Noise + Distortion) EN European Norm S/N Signal to Noise ratio e.r.p., ERP Effective Radiated Power SA, S/A Spectrum Analyzer ETSI European Telecommunications Standards Institute SABS South African Bureau of Standards EU European Union SANS South African National Standards EUT Equipment Under Test SG Signal Generator Fac. Factor SVSWR Site-Voltage Standing Wave Ratio FCC Federal Communications Commission THC(A) Total Harmonic Current FHSS Frequency Hopping Spread Spectrum THD(%) Total Harmonic Distortion FM Frequency Modulation TR, T/R Test Receiver Freq. Frequency Tx Transmitting FSK Frequency Shift Keying VBW Video BandWidth Fund Fundamental Vert. Vertical FWD Forward WLAN Wireless LAN GFSK Gaussian Frequency-Shift Keying xDSL Generic term for all types of DSL technology (DSL: Digital Subscriber Line) GNS…

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