
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
FCC Warning This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. NOTE 1: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: - Reorient or relocate the receiving antenna. - Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or an experienced radio/TV technician for help. NOTE 2: Any changes or modifications to this unit not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment.
Reference Waltek Testing http://www.sem EXHIBI EUT View 1 EUT View 2 e No.: WTX20 g Group (Shenz mtest.com.cn T 2 - EUT 1 2 0X05029753 zhen) Co., Ltd. T EXTER 3W RNAL PH HOTOGR APHS Reference Waltek Testing http://www.sem EUT View 3 EUT View 4 e No.: WTX20 g Group (Shenz mtest.com.cn 3 4 0X05029753 zhen) Co., Ltd. 3W Reference Waltek Testing http://www.sem EUT View 5 EUT View 6 e No.: WTX20 g Group (Shenz mtest.com.cn 5 6 0X05029753 zhen) Co., Ltd. 3W Reference Waltek Testing http://www.sem EUT View 7 EUT View 8 e No.: WTX20 g Group (Shenz mtest.com.cn 7 8 0X05029753 zhen) Co., Ltd. 3W
Reference Waltek Testing http://www.sem EXHIBI Proposed Specificatio n it is visible durable to r expected lif e Proposed e No.: WTX20 g Group (Shenz mtest.com.cn T 1 - PRO FCC ID La ns: The label or easily acc emain fully l etime. Label Loca 0X05029753 zhen) Co., Ltd. ODUCT L abel Forma shall be secu cessible to th legible and in ation on EU 3W LABELIN at FCC ID : urely affixed t he user, and ntact on the UT FCC NG : 2AWHSB to a permane shall not be device in al l ID Label Lo S0208 ently attached readily detac l normal cond cation d part of the d chable. The l ditions of use device, in a lo label shall be e throughout ocation where e sufficiently t the deviceβs e y s
Reference Waltek Testing http://www.sem EXHIBI EUT Housi n Solder Boa r e No.: WTX20 g Group (Shenz mtest.com.cn T 3 - EUT ng and Boar rd-Compone 0X05029753 zhen) Co., Ltd. T INTER rd View 1 ent View 1 3W NAL PHO OTOGRA APHS Reference Waltek Testing http://www.sem Solder Boa r Solder Boa r e No.: WTX20 g Group (Shenz mtest.com.cn rd-Compone rd-Compone 0X05029753 zhen) Co., Ltd. ent View 2 ent View 3 3W Reference Waltek Testing http://www.sem Solder Boa r Solder Boa r e No.: WTX20 g Group (Shenz mtest.com.cn rd-Compone rd-Compone 0X05029753 zhen) Co., Ltd. ent View 4 ent View 5 3W Reference Waltek Testing http://www.sem Solder Boa r Antenna V i e No.: WTX20 g Group (Shenz mtest.com.cn rd-Compone iew 0X05029753 zhen) Co., Ltd. ent View 6 3W BT Ante enna
RF Exposure Requirements Product Description: Wireless Speaker Model No.: YS-BS0208, HDSS-54, YS-BS0208U, YS-BSXXXX FCC ID: 2AWHSBS0208 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances β€ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] Β· [βf(GHz)] β€ 3.0 for 1-g SAR and β€ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation17 - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: -2.22dBm Tune-Up output power: -2dBm RF channel transmit frequency: 2020MHz Result: 0.2 Limit: 3.0 The exclusion thresholds is 0.2 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.
Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 56 TEST REPORT Reference No. .................... : WTX20X05029753W FCC ID ................................ : 2AWHSBS0208 Applicant ........................... : YOUNGSTAR ELECTRONIC CO., LIMITED Address ............................. : 7th Floor, HuaYi Building B block, Ping Ji Ave, Nanwan street, Longgang District, Shenzhen City, China Manufacturer ................... : YOUNGSTAR ELECTRONIC CO., LIMITED Address ............................. : 7th Floor, HuaYi Building B block, Ping Ji Ave, Nanwan street, Longgang District, Shenzhen City, China Product Name ................... : Wireless Speaker Test Model. ........................ : YS-BS0208 Additional Model(s) No. : HDSS-54, YS-BS0208U, YS-BSXXXX Brand Name ....................... : / Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : May.22, 2020 Date of Test........................ : May.22, 2020 to Jun.01, 2020 Date of Issue ..................... : Jun.01, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X05029753W Page 2 of 56 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. RF EXPOSURE ....................................................................................................................................................... 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 TEST RESULT........................................................................................................................................................ 11 4. ANTENNA REQUIREMENT ................................................................................................................................ 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 EVALUATION INFORMATION ................................................................................................................................ 12 5. FREQUENCY HOPPING SYSTEM REQUIREMENTS ................................................................................... 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 13 5.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 14 6. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 15 6.1 STANDARD APPLICABLE ....................................................................................................................................... 15 6.2 TEST PROCEDURE ................................................................................................................................................. 15 6.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 7. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 19 7.1 STANDARD APPLICABLE ....................................................................................................................................... 19 7.2 TEST PROCEDURE ................................................................................................................................................. 19 7.3 SUMMARY OF TEST RESULTS/PLOTS ...............................β¦
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Reference Waltek Testing http://www.sem EXHIBI Conducted Radiation E e No.: WTX20 g Group (Shenz mtest.com.cn T 4 - TES Emission Te Emission Tes 0X05029753 zhen) Co., Ltd. ST SETUP est Setup st Setup (Belo 3W P PHOTO ow 30MHz) OGRAPH HS Reference Waltek Testing http://www.sem Radiation E Radiation E e No.: WTX20 g Group (Shenz mtest.com.cn Emission Tes Emission Tes 0X05029753 zhen) Co., Ltd. st Setup (30M st Setup (1GH 3W MHz to 1GHz Hz to 18GHz z) z) Reference Waltek Testing http://www.sem Radiation E e No.: WTX20 g Group (Shenz mtest.com.cn Emission Tes 0X05029753 zhen) Co., Ltd. st Setup (Abo 3W ove 18GHz)
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.40 GHz - 2.48 GHz | 1.00 mW |

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