2AWTK-CONQUEST-S16TD-LTE Smart Phone

FCC RF Exposure Information and Statement This device meets the government's requirements for exposure to radio waves. The guidelines are based on standards that were developed by independent scientific organizations through periodic and thorough evaluation of scientific studies. The standards include a substantial safety margin designed to assure the safety of all persons regardless of age or health. The SAR limit of USA (FCC) is 1.6 W/kg averaged. Device types: TD-LTE Smart Phone (FCC ID: 2AWTK-CONQUEST-S16) has also been tested against this SAR limit. SAR information on this and other pad can be viewed onϋline at http://www.fcc.gov/oet/ea/fccid/. Please use the device FCC ID number for search. This device was tested simulation typical 10mm to body. To maintain compliance with FCC RF exposure requirements, use accessories should maintain a separation distance between the user's bodies mentioned above, the use of holsters and similar accessories should not contain metallic components in its assembly, the use of accessories that do not satisfy these requirements may not comply with FCC RF exposure requirements, and should be avoided. FCC Warning This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) This device must accept any interference received, including interference that may cause undesired operation. NOTE 1: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: - Reorient or relocate the receiving antenna. - Increase the separation between the equipment and receiver. - Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. - Consult the dealer or an experienced radio/TV technician for help. NOTE 2: Any changes or modifications to this unit not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment.

Reference N Waltek Tes http://www EXHIBI EUT View 1 EUT View 2 No.: WTX20X sting Group w.semtest.co T 2 - EUT 1 2 X06035309W (Shenzhen) m.cn T EXTER W-3/4/5/6 Co., Ltd. RNAL PH HOTOGR APHS Reference N Waltek Tes http://www EUT View 3 EUT View 4 No.: WTX20X sting Group w.semtest.co 3 4 X06035309W (Shenzhen) m.cn W-3/4/5/6 Co., Ltd. Reference N Waltek Tes http://www EUT View 5 EUT View 6 No.: WTX20X sting Group w.semtest.co 5 6 X06035309W (Shenzhen) m.cn W-3/4/5/6 Co., Ltd. Reference N Waltek Tes http://www EUT View 7 No.: WTX20X sting Group w.semtest.co 7 X06035309W (Shenzhen) m.cn W-3/4/5/6 Co., Ltd.

Reference N Waltek Tes http://www EXHIBI Proposed Specificatio n it is visible durable to r expected lif e Proposed No.: WTX20X sting Group w.semtest.co T 1 - PRO FCC ID La ns: The label or easily acc emain fully l etime. Label Loca X06035309W (Shenzhen) m.cn ODUCT L abel Forma FCC ID: shall be secu cessible to th legible and in ation on EU W-3/4/5/6 Co., Ltd. LABELIN at 2AWTK-C urely affixed t he user, and ntact on the UT FCC NG CONQUES to a permane shall not be device in al l ID Label Lo ST-S16 ently attached readily detac l normal cond cation d part of the d chable. The l ditions of use device, in a lo label shall be e throughout ocation where e sufficiently t the device’s e y s

Reference N Waltek Tes http://www EXHIBI EUT Housi n EUT Housi n No.: WTX20X sting Group w.semtest.co T 3 - EUT ng and Boar ng and Boar X06035309W (Shenzhen) m.cn T INTER rd View 1 rd View 2 W-3/4/5/6 Co., Ltd. NAL PHO OTOGRA APHS Reference N Waltek Tes http://www Solder Boa r Solder Boar No.: WTX20X sting Group w.semtest.co rd-Compone rd-Compone X06035309W (Shenzhen) m.cn ent View 1 ent View 2 W-3/4/5/6 Co., Ltd. Reference N Waltek Tes http://www Solder Boa r Solder Boar No.: WTX20X sting Group w.semtest.co rd-Compone rd-Compone X06035309W (Shenzhen) m.cn ent View 3 ent View 4 W-3/4/5/6 Co., Ltd. Reference N Waltek Tes http://www Solder Boa r Solder Boa r No.: WTX20X sting Group w.semtest.co rd-Compone rd-Compone X06035309W (Shenzhen) m.cn ent View 5 ent View 6 W-3/4/5/6 Co., Ltd. Reference N Waltek Tes http://www Antenna V i G W No.: WTX20X sting Group w.semtest.co iew GSM /WCDM Wi-Fi/BT/GP X06035309W (Shenzhen) m.cn MA /LTE Ant PS Ant W-3/4/5/6 Co., Ltd. . LTE E RX Ant. NFC A Antenna

Ref : ACR.233.1.17.SATU.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD. 1/F, BUILDING A, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD BAO'AN DISTRICT SHENZHEN (518101), CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 45/15 EPGO280 Calibrated at MVG US 2105 Barrett Park Dr. - Kennesaw, GA 30144 Calibration Date: 07/08/2019 Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed in MVG USA using the CALISAR / CALIBAIR test bench, for use with a COMOSAR system only. All calibration results are traceable to national metrology institutions. COMOSAR E-Field Probe Calibration Report COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 2/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Jérôme LUC Product Manager 7/8/2019 Checked by : Jérôme LUC Product Manager 7/8/2019 Approved by : Kim RUTKOWSKI Quality Manager 7/8/2019 Customer Name Distribution : Waltek Testing Group (Shenzhen) Co., Ltd. Issue Date Modifications A 7/8/2019 Initial release COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 3/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Linearity ________________________________________________________________ 4 3.2 Sensitivity _______________________________________________________________ 5 3.3 Lower Detection Limit _____________________________________________________ 5 3.4 Isotropy _________________________________________________________________ 5 3.5 Boundary Effect __________________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 5 5 Calibration Measurement Results .............................................................................. 6 5.1 Sensitivity in air __________________________________________________________ 6 5.2 Linearity ________________________________________________________________ 7 5.3 Sensitivity in liquid ________________________________________________________ 7 5.4 Isotropy _________________________________________________________________ 8 6 List of Equipment .................................................................................................... 10 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 4/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number SN 45/15 EPGO280 Product Condition (new / used) New Frequency Range of Probe 0.7 GHz-6GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.193 M Dipole 2: R2=0.188 M Dipole 3: R3=0.198 M A yearly calibration interval is recommended. 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEEE 1528, OET 65 Bulletin C and CEI/IEC 62209 standards. Figure 1 – MVG COMOSAR Dosimetric E field Dipole Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEEE 1528, OET 65 Bulletin C, CENELEC EN50361 and CEI/IEC 62209 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1 LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg. COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 5/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards. 3.3 LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurement. The required lower detection limit is 10 mW/kg. 3.4 ISOTROPY The axial isotropy was evaluated by exposing the probe to a reference wave from a standard dipole with the dipole mounted under the flat phantom in the test configuration suggested for system validations and checks. The probe was rotated along its main axis from 0 - 360 degrees in 15 degree steps. The hemispherical isotropy is determined by inserting the probe in a thin plastic box filled with tissue-equivalent liquid, with the plasti…

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Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 136 TEST REPORT Reference No. .................... : WTX20X06035309W FCC ID ................................ : 2AWTK-CONQUEST-S16 Applicant ........................... : Shen Zhen Conquest Communication Equipment Co., Ltd. Address ............................. : 2nd Floor, Building B, Yong xiang Street East on the 17th, Bantian Street, Longgang District, Shen Zhen, Guangdong, China Product Name ................... : TD-LTE Smart Phone Test Model. ........................ : conquest-S16 Standards .......................... : FCC Part 2.1093 ANSI / IEEE C95.1 : 2005+A1:2010 ANSI / IEEE C95.3 : 2002(R2008) IEEE 1528 :2013 Date of Receipt sample .... : Jun.09, 2020 Date of Test........................ : Jun.10, 2020 to Jun.28, 2020 Date of Issue ..................... : Jun.29, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Sun / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X06035309W Page 2 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 3 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 3 1.2 Test Standards .................................................................................................................................................... 6 1.3 Test Methodology ................................................................................................................................................ 6 1.4 Test Facility ......................................................................................................................................................... 6 2. Summary of Test Results .......................................................................................................................................... 7 3. Specific Absorption Rate (SAR) ................................................................................................................................ 8 3.1 Introduction .......................................................................................................................................................... 8 3.2 SAR Definition ..................................................................................................................................................... 8 4. SAR Measurement System ........................................................................................................................................ 9 4.1 The Measurement System .................................................................................................................................. 9 4.2 Probe ................................................................................................................................................................... 9 4.3 Probe Calibration Process ................................................................................................................................. 11 4.4 Phantom ............................................................................................................................................................ 12 4.5 Device Holder .................................................................................................................................................... 12 4.6 Test Equipment List ........................................................................................................................................... 13 5. Tissue Simulating Liquids ....................................................................................................................................... 14 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 14 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 16 5.3 Tissue Calibration Result ................................................................................................................................... 17 6. SAR Measurement Evaluation ................................................................................................................................ 18 6.1 Purpose of System Performance Check ............................................................................................................ 18 6.2 System Setup .................................................................................................................................................... 18 6.3 Validation Results .............................................................................................................................................. 19 7. EUT Testing Position ............................................................................................................................................... 21 7.1 Define Two Imaginary Lines on The Handset .................................................................................................... 21 7.2 Cheek Positi…

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Reference No.: WTX20X06035309W Page 71 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MEASUREMENT 7 For Head Liquid Type: Validation measurement (Fast, 75.00 %) Measurement duration: 12 minutes 21 seconds E-field Probe: SSE2 - SN 45/15 EPGO280; ConvF: Refer to the Calibration Certificate; Calibrated: 2019/07/08 A. Experimental conditions Area Scan dx=8mm dy=8mm Phantom Validation plane Device Position Dipole Band CW5200 Signal CW (Crest factor: 1.0) B. SAR Measurement Results Frequency (MHz) 5200.000000 Relative Permittivity (real part) 35.612911 Conductivity (S/m) 4.871483 Power Variation (%) 0.943213 Ambient Temperature 21.1 Liquid Temperature 21.2 SURFACE SAR VOLUME SAR Reference No.: WTX20X06035309W Page 72 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Maximum location: X=1.00, Y=0.00 SAR 10g (W/Kg) 5.310334 SAR 1g (W/Kg) 16.946226 Z (mm) 0.00 2.00 7.00 12.00 17.00 22.00 27.00 SAR (W/Kg) 41.7264 27.2408 6.5746 1.6234 0.3765 0.0793 0.0129 3D screen shot Hot spot position Reference No.: WTX20X06035309W Page 73 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MEASUREMENT 8 For Head Liquid Type: Validation measurement (Fast, 75.00 %) Measurement duration: 12 minutes 21 seconds E-field Probe: SSE2 - SN 45/15 EPGO280; ConvF: Refer to the Calibration Certificate; Calibrated: 2019/07/08 A. Experimental conditions Area Scan dx=8mm dy=8mm Phantom Validation plane Device Position Dipole Band CW5800 Signal CW (Crest factor: 1.0) B. SAR Measurement Results Frequency (MHz) 5800.000000 Relative Permittivity (real part) 35.612911 Conductivity (S/m) 5.171483 Power Variation (%) 0.943782 Ambient Temperature 21.1 Liquid Temperature 21.2 SURFACE SAR VOLUME SAR Reference No.: WTX20X06035309W Page 74 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Maximum location: X=1.00, Y=1.00 SAR 10g (W/Kg) 5.879544 SAR 1g (W/Kg) 17.190731 Z (mm) 0.00 2.00 7.00 12.00 17.00 22.00 27.00 SAR (W/Kg) 48.4695 30.5699 5.7100 1.0698 0.1906 0.0364 0.0052 3D screen shot Hot spot position Reference No.: WTX20X06035309W Page 75 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MEASUREMENT 9 For Body Liquid Type: Validation measurement (Fast, 75.00 %) Measurement duration: 12 minutes 21 seconds E-field Probe: SSE2 - SN 45/15 EPGO280; ConvF: Refer to the Calibration Certificate; Calibrated: 2019/07/08 A. Experimental conditions Area Scan dx=8mm dy=8mm Phantom Validation plane Device Position Dipole Band CW750 Signal Duty Cycle 1:1 B. SAR Measurement Results Frequency (MHz) 750.000000 Relative Permittivity (real part) 54.964739 Conductivity (S/m) 0.931048 Power Variation (%) 0.034745 Ambient Temperature 21.1 Liquid Temperature 21.3 SURFACE SAR VOLUME SAR Reference No.: WTX20X06035309W Page 76 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Maximum location: X=0.00, Y=0.00 SAR 10g (W/Kg) 1.000865 SAR 1g (W/Kg) 2.124211 Z Axis Scan Z (mm) 0.00 4.00 9.00 14.00 19.00 24.00 29.00 SAR (W/Kg) 0.0000 2.5132 1.1087 0.8214 0.5160 0.4875 0.4864 3D screen shot Hot spot position Reference No.: WTX20X06035309W Page 77 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MEASUREMENT 10 For Body Liquid Type: Validation measurement (Fast, 75.00 %) Measurement duration: 12 minutes 21 seconds E-field Probe: SSE2 - SN 45/15 EPGO280; ConvF: Refer to the Calibration Certificate; Calibrated: 2019/07/08 A. Experimental conditions Area Scan dx=8mm dy=8mm Phantom Validation plane Device Position Dipole Band CW835 Signal Duty Cycle 1:1 B. SAR Measurement Results Frequency (MHz) 835.000000 Relative Permittivity (real part) 54.851214 Conductivity (S/m) 0.951454 Power Variation (%) 0.901472 Ambient Temperature 21.1 Liquid Temperature 21.3 SURFACE SAR VOLUME SAR Reference No.: WTX20X06035309W Page 78 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Maximum location: X=0.00, Y=0.00 SAR 10g (W/Kg) 1.028956 SAR 1g (W/Kg) 2.354211 Z Axis Scan Z (mm) 0.00 4.00 9.00 14.00 19.00 24.00 29.00 SAR (W/Kg) 0.0000 2.5789 1.1300 0.8795 0.5940 0.5011 0.5100 3D screen shot Hot spot position Reference No.: WTX20X06035309W Page 79 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MEASUREMENT 11 For Body Liquid Type: Validation measurement (Fast, 75.00 %) Measurement duration: 12 minutes 21 seconds E-field Probe: SSE2 - SN 45/15 EPGO280; ConvF: Refer to the Calibration Certificate; Calibrated: 2019/07/08 A. Experimental conditions Area Scan dx=8mm dy=8mm Phantom Validation plane Device Position Dipole Band CW1800 Signal CW (Crest factor: 1.0) B. SAR Measurement Results Frequency (MHz) 1800.000000 Relative Permittivity (real part) 51.224510 Conductivity (S/m) 1.461261 Power Variation (%) 0.845690 Ambient Temperature 21.1 Liquid Temperature 21.2 SURFACE SAR VOLUME SAR Reference No.: WTX20X06035309W Page 80 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Maximum location: X=0.00, Y=0.00 SAR 10g (W/Kg) 5.221202 SAR 1g (W/Kg) 9.582560 Z Axis Scan Z (mm) 0.00 4.00 9.00 14.00 19.00 24.00 29.00 SAR (W/Kg) 0.0000 11.2425 9.4123 8.0345 6.9125 6.3092 3.9460 3D screen shot Hot spot position Reference No.: WTX20X06035309W Page 81 of 136 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MEASUREMENT 12 For Body Liquid Type: Validation measurement (Fast, 75.00 %) Measurement duration: 12 minutes 21 seconds E-field Probe: SSE2 - SN 45/15 EPGO280; ConvF: Refer to the Calibration Certificate; Calibrated: 2019/07/08 A. Experimental conditions Area Scan dx=8mm dy=8mm Phantom Validation plane Device Position Dipole Band CW1900 Signal Duty Cycle 1:1 B. SAR Measurement Results Frequency (MHz) 1900.000000 Relative Permittivity (real part) 52.420415 Conductivity (S/m) 1.501966 Power Variation (%) 0.541872 Ambient Temperature 21.1 Liquid Temperature 21.3 SURFACE SAR VOLUME SAR Reference No.: WTX20X06035309W Page 82 of 136 Waltek Test…

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Reference No.: WTX20X06035309W-2 Page 1 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Appendix for Band 4 Product Name: TD-LTE Smart Phone Model No: conquest-S16 Reference No.: WTX20X06035309W-2 Page 2 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Appendix A: Average Power Output Data Test Result Channel Bandwidth: 1.4 MHz Modulati on Channel RB Configuration Average Power [dBm]Verdict Size Offset QPSK LCH 1 0 22.67 PASS 1 3 22.67 PASS 1 5 22.68 PASS 3 0 22.59 PASS 3 2 22.63 PASS 3 3 22.57 PASS 6 0 21.5 PASS MCH 1 0 22.45 PASS 1 3 22.53 PASS 1 5 22.45 PASS 3 0 22.58 PASS 3 2 22.58 PASS 3 3 22.58 PASS 6 0 21.46 PASS HCH 1 0 22.29 PASS 1 3 22.37 PASS 1 5 22.23 PASS 3 0 22.41 PASS 3 2 22.43 PASS 3 3 22.43 PASS 6 0 21.3 PASS 16QAM LCH 1 0 21.73 PASS 1 3 22 PASS 1 5 21.73 PASS 3 0 21.68 PASS 3 2 21.67 PASS 3 3 21.7 PASS 6 0 20.58 PASS MCH 1 0 21.83 PASS 1 3 22 PASS 1 5 21.88 PASS 3 0 21.58 PASS Reference No.: WTX20X06035309W-2 Page 3 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 3 2 21.62 PASS 3 3 21.6 PASS 6 0 20.49 PASS HCH 1 0 21.58 PASS 1 3 21.73 PASS 1 5 21.56 PASS 3 0 21.44 PASS 3 2 21.49 PASS 3 3 21.44 PASS 6 0 20.48 PASS Channel Bandwidth: 3 MHz Modulation Channel RB Configuration Average Power [dBm]Verdict Size Offset QPSK LCH 1 0 22.45 PASS 1 7 22.7 PASS 1 14 22.5 PASS 8 0 21.47 PASS 8 4 21.51 PASS 8 7 21.51 PASS 15 0 21.47 PASS MCH 1 0 22.47 PASS 1 7 22.67 PASS 1 14 22.48 PASS 8 0 21.44 PASS 8 4 21.48 PASS 8 7 21.47 PASS 15 0 21.43 PASS HCH 1 0 22.38 PASS 1 7 22.47 PASS 1 14 22.31 PASS 8 0 21.32 PASS 8 4 21.32 PASS 8 7 21.27 PASS 15 0 21.31 PASS 16QAM LCH 1 0 21.73 PASS 1 7 21.97 PASS 1 14 21.77 PASS 8 0 20.58 PASS 8 4 20.66 PASS 8 7 20.6 PASS Reference No.: WTX20X06035309W-2 Page 4 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 15 0 20.51 PASS MCH 1 0 21.91 PASS 1 7 22.13 PASS 1 14 21.92 PASS 8 0 20.53 PASS 8 4 20.58 PASS 8 7 20.54 PASS 15 0 20.54 PASS HCH 1 0 21.69 PASS 1 7 21.78 PASS 1 14 21.6 PASS 8 0 20.37 PASS 8 4 20.35 PASS 8 7 20.34 PASS 15 0 20.36 PASS Channel Bandwidth: 5 MHz Modulation Channel RB Configuration Average Power [dBm]Verdict Size Offset QPSK LCH 1 0 22.47 PASS 1 12 22.53 PASS 1 24 22.41 PASS 12 0 21.51 PASS 12 6 21.56 PASS 12 13 21.48 PASS 25 0 21.48 PASS MCH 1 0 22.47 PASS 1 12 22.72 PASS 1 24 22.41 PASS 12 0 21.48 PASS 12 6 21.52 PASS 12 13 21.49 PASS 25 0 21.53 PASS HCH 1 0 22.38 PASS 1 12 22.59 PASS 1 24 22.29 PASS 12 0 21.35 PASS 12 6 21.41 PASS 12 13 21.28 PASS 25 0 21.35 PASS 16QAM LCH 1 0 21.72 PASS Reference No.: WTX20X06035309W-2 Page 5 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 1 12 21.67 PASS 1 24 21.77 PASS 12 0 20.64 PASS 12 6 20.67 PASS 12 13 20.62 PASS 25 0 20.6 PASS MCH 1 0 21.78 PASS 1 12 21.98 PASS 1 24 21.74 PASS 12 0 20.69 PASS 12 6 20.72 PASS 12 13 20.68 PASS 25 0 20.59 PASS HCH 1 0 21.58 PASS 1 12 21.85 PASS 1 24 21.5 PASS 12 0 20.38 PASS 12 6 20.44 PASS 12 13 20.4 PASS 25 0 20.49 PASS Channel Bandwidth: 10 MHz Modulation Channel RB Configuration Average Power [dBm]Verdict Size Offset QPSK LCH 1 0 22.46 PASS 1 24 22.64 PASS 1 49 22.48 PASS 25 0 21.58 PASS 25 12 21.56 PASS 25 25 21.58 PASS 50 0 21.56 PASS MCH 1 0 22.53 PASS 1 24 22.64 PASS 1 49 22.42 PASS 25 0 21.57 PASS 25 12 21.52 PASS 25 25 21.61 PASS 50 0 21.56 PASS HCH 1 0 22.41 PASS 1 24 22.52 PASS 1 49 22.31 PASS Reference No.: WTX20X06035309W-2 Page 6 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 25 0 21.44 PASS 25 12 21.41 PASS 25 25 21.34 PASS 50 0 21.41 PASS 16QAM LCH 1 0 21.77 PASS 1 24 21.97 PASS 1 49 21.84 PASS 25 0 20.67 PASS 25 12 20.67 PASS 25 25 20.64 PASS 50 0 20.65 PASS MCH 1 0 21.93 PASS 1 24 21.81 PASS 1 49 21.85 PASS 25 0 20.66 PASS 25 12 20.66 PASS 25 25 20.71 PASS 50 0 20.71 PASS HCH 1 0 21.64 PASS 1 24 21.8 PASS 1 49 21.55 PASS 25 0 20.51 PASS 25 12 20.5 PASS 25 25 20.45 PASS 50 0 20.5 PASS Channel Bandwidth: 15 MHz Modulation Channel RB Configuration Average Power [dBm]Verdict Size Offset QPSK LCH 1 0 22.43 PASS 1 37 22.74 PASS 1 74 22.43 PASS 37 0 21.59 PASS 37 18 21.57 PASS 37 38 21.59 PASS 75 0 21.56 PASS MCH 1 0 22.48 PASS 1 37 22.64 PASS 1 74 22.33 PASS 37 0 21.57 PASS 37 18 21.61 PASS Reference No.: WTX20X06035309W-2 Page 7 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 37 38 21.58 PASS 75 0 21.6 PASS HCH 1 0 22.42 PASS 1 37 22.7 PASS 1 74 22.23 PASS 37 0 21.53 PASS 37 18 21.48 PASS 37 38 21.4 PASS 75 0 21.42 PASS 16QAM LCH 1 0 21.74 PASS 1 37 21.95 PASS 1 74 21.77 PASS 37 0 20.63 PASS 37 18 20.64 PASS 37 38 20.63 PASS 75 0 20.63 PASS MCH 1 0 21.83 PASS 1 37 21.86 PASS 1 74 21.62 PASS 37 0 20.66 PASS 37 18 20.63 PASS 37 38 20.6 PASS 75 0 20.64 PASS HCH 1 0 21.7 PASS 1 37 21.88 PASS 1 74 21.54 PASS 37 0 20.48 PASS 37 18 20.52 PASS 37 38 20.39 PASS 75 0 20.51 PASS Channel Bandwidth: 20 MHz Modulation Channel RB Configuration Average Power [dBm]Verdict Size Offset QPSK LCH 1 0 22.52 PASS 1 49 22.80 PASS 1 99 22.46 PASS 50 0 21.58 PASS 50 25 21.58 PASS 50 50 21.57 PASS 100 0 21.56 PASS Reference No.: WTX20X06035309W-2 Page 8 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn MCH 1 0 22.48 PASS 1 49 22.73 PASS 1 99 22.37 PASS 50 0 21.51 PASS 50 25 21.56 PASS 50 50 21.58 PASS 100 0 21.5 PASS HCH 1 0 22.29 PASS 1 49 22.47 PASS 1 99 22.09 PASS 50 0 21.4 PASS 50 25 21.46 PASS 50 50 21.32 PASS 100 0 21.35 PASS 16QAM LCH 1 0 21.72 PASS 1 49 21.82 PASS 1 99 21.68 PASS 50 0 20.64 PASS 50 25 20.64 PASS 50 50 20.64 PASS 100 0 20.61 PASS MCH 1 0 21.91 PASS 1 49 21.81 PASS 1 99 21.7 PASS 50 0 20.62 PASS 50 25 20.68 PASS 50 50 20.64 PASS 100 0 20.6 PASS HCH 1 0 21.65 PASS 1 49 21.82 PASS 1 99 21.45 PASS 50 0 20.53 PASS 50 25 20.55 PASS 50 50 20.45 PASS 100 0 20.43 PASS Reference No.: WTX20X06035309W-2 Page 9 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Appendix B: Peak-to-Average Ratio Test Result Channel Bandwidth: 1.4…

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Reference No.: WTX20X06035309W-2 Page 60 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Channel Bandwidth: 10 MHz_LCH_QPSK_50RB#0 Channel Bandwidth: 10 MHz_MCH_QPSK_1RB#0 Channel Bandwidth: 10 MHz_MCH_QPSK_1RB#24 Reference No.: WTX20X06035309W-2 Page 61 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Channel Bandwidth: 10 MHz_MCH_QPSK_1RB#49 Channel Bandwidth: 10 MHz_MCH_QPSK_25RB#0 Channel Bandwidth: 10 MHz_MCH_QPSK_25RB#12 Reference No.: WTX20X06035309W-2 Page 62 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Channel Bandwidth: 10 MHz_MCH_QPSK_25RB#25 Channel Bandwidth: 10 MHz_MCH_QPSK_50RB#0 Reference No.: WTX20X06035309W-2 Page 63 of 285 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Channel Bandwidth: 10 MHz_HCH_QPSK_1RB#0 Channel Bandwidth: 10 MHz_HCH_QPSK_1RB#24 Channel Bandwidth: 10 MHz_HCH_QPSK_1RB#49 Channel Bandwidth: 10 MHz_HCH_QPSK_25RB#0 Reference No.: WTX20X06035309W-2 Page 64 of …

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