2AX4YM30Smart Phone with BT,WFI,GSM,WCDMA,LTE&NFC

73 Specific Absorption Rate (SAR) information: This Smart Phonemeets the government's requirements for exposure to radio waves. The guide lines are basedon standards that were developed by independent scientific organizations through periodic and thorough evaluation of scientific studies. The standards include a substantial safety margin designed to assure the safety of all persons regardless of age or health. FCC RF Exposure Information and Statement The SAR limit of USA (FCC) is 1.6 W/kg averaged over one gram of tissue. Device types: Smart Phone (FCC ID: 2AX4YM30 ) has also been tested against this SAR limit The highest SAR value reported under this standard during product certification is 1.398W/kg when properly worn on the body. This device was tested for typicalbody-worn operations with the back of the Smart Phone kept 10mm from the body. To maintain compliance with FCC RF exposure requirements, use accessories that maintain a 0.1cm separation distance between the user's body andthe back of the Smart Phone. The use of belt clips, holsters and similar accessories should not contain metallic components in its assembly. The use of accessories that do not satisfy these requirements may not comply with FCC RF exposure requirements, and should be avoided very high volume, prolonged listening to a mobile phone can damage your hearing. 73 1) FCC 15.19 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. 2）FCC 15.21 Warning: Changes or modifications to this unit not expressly approved by the part responsible for compliance could void the user’s authority to operate the equipment. 3) FCC 15.105 For a Class B digital device or peripheral, the instructions furnished the user shall include the following or similar statement, placed in a prominent location in the text of the manual: Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: —Reorient or relocate the receiving antenna. —Increase the separation between the equipment and receiver. —Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. —Consult the dealer or an experienced radio/TV technician for help. Label: 1,OpentheSmartPhonemaininterfaceandfindtheSettingsinthefigure Step1 2，ClicktheAboutphone Step2 3，ClicktheAboutphoneLegalinformationandclicktheCertification, thefinallabelisshowninthefigure Step3

D O D G EE U S ER M AN U AL T H A N K S F O R C H OO S I N G D O OG EE PR O D UC T S S C A N T H E Q R C O DE FO R M O R E FUN C T I O N I NF OR M A T I O N

Page 211 of 240 Report No.: AiTSZ-260313004FW1 Page 212 of 240 Report No.: AiTSZ-260313004FW1 Page 213 of 240 Report No.: AiTSZ-260313004FW1 Page 214 of 240 Report No.: AiTSZ-260313004FW1 Page 215 of 240 Report No.: AiTSZ-260313004FW1 Page 216 of 240 Report No.: AiTSZ-260313004FW1 Page 217 of 240 Report No.: AiTSZ-260313004FW1 Page 218 of 240 Report No.: AiTSZ-260313004FW1 Page 219 of 240 Report No.: AiTSZ-260313004FW1 Page 220 of 240 Report No.: AiTSZ-260313004FW1 Page 221 of 240 Report No.: AiTSZ-260313004FW1 Page 222 of 240 Report No.: AiTSZ-260313004FW1 Page 223 of 240 Report No.: AiTSZ-260313004FW1 Page 224 of 240 Report No.: AiTSZ-260313004FW1 Page 225 of 240 Report No.: AiTSZ-260313004FW1 Page 226 of 240 Report No.: AiTSZ-260313004FW1 Page 227 of 240 Report No.: AiTSZ-260313004FW1 Page 228 of 240 Report No.: AiTSZ-260313004FW1 Page 229 of 240 Report No.: AiTSZ-260313004FW1 Page 230 of 240 Report No.: AiTSZ-260313004FW1 Page 231 of 240 Report No.: AiTSZ-260313004FW1 Page 232 of 240 Report No.: AiTSZ-260313004FW1 Page 233 of 240 Report No.: AiTSZ-260313004FW1 Page 234 of 240 Report No.: AiTSZ-260313004FW1 Page 235 of 240 Report No.: AiTSZ-260313004FW1 Page 236 of 240 Report No.: AiTSZ-260313004FW1 Page 237 of 240 Report No.: AiTSZ-260313004FW1 Page 238 of 240 Report No.: AiTSZ-260313004FW1 Page 239 of 240 Report No.: AiTSZ-260313004FW1 Appendix E. Justification of the extended calibration If dipoles are verified in return loss (<-20dB, within 20% of prior calibration for below 3GHz, and <-8dB, within 20% of prior calibration for 5GHz to 6GHz), and in impedance (within 5 ohm of prior calibration), the annual calibration is not necessary and the calibration interval can be extended. <Head 835MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -42.84 - 50.5 - Feb. 21, 2024 -42.803 0.09 50.592 0.092 Feb. 20, 2025 -42.812 0.07 50.584 0.084 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. <Head 1800MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -24.53 - 44.8 - Feb. 21, 2024 -24.545 0.06 44.809 0.009 Feb. 20, 2025 -24.540 0.04 44.805 0.005 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. <Head 1900MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -23.28 - 46.2 - Feb. 21, 2024 -23.518 1.02 46.516 0.316 Feb. 20, 2025 -23.512 1.00 46.511 0.311 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. <Head 2450MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -29.27 - 53.6 - Feb. 21, 2024 -29.39 0.41 53.742 0.142 Feb. 20, 2025 -29.30 0.10 53.730 0.130 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Page 240 of 240 Report No.: AiTSZ-260313004FW1 <Head 2600MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -25.57 - 54.5 - Feb. 21, 2024 -25.248 1.26 54.653 0.153 Feb. 20, 2025 -25.237 1.30 54.642 0.142 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. <Head 5200MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -9.64 - 25.80 - Feb. 21, 2024 -9.1819 4.75 25.891 0.091 Feb. 20, 2025 -9.1720 4.85 25.874 0.074 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. <Head 5800MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -14.91 - 38.53 - Feb. 21, 2024 -14.349 3.76 38.715 0.185 Feb. 20, 2025 -14.334 3.86 38.710 0.180 Feb. 19, 2026 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. ※※END OF THE REPORT※※

FCC ID: 2AX4YM30 Test Positions Left Cheek (Separation distance of 0mm) Left Tilt 15 Degree (Separation distance of 0mm) Right Cheek (Separation distance of 0mm) Right Tilt 15 Degree (Separation distance of 0mm) Front Side (Separation distance of 5mm) Back Side (Separation distance of 5mm) Left Side (Separation distance of 5mm) Right Side (Separation distance of 5mm) FCC ID: 2AX4YM30 Top Side (Separation distance of 5mm) Bottom Side (Separation distance of 5mm)

1.1.PhotoofRadiatedEmissionTest(InSemiAnechoicChamber) 30-1000MHz 1.2.PhotoofPowerLineConductedEmissionTest 1.3.RadiatedEmissionsTestPhotos Above1GHz 1.4.ConductedRFTestPhotos

TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 1 of 45 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict,Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 RFTestReport For ApplicantName:ShenzhenDOOGEEHengtongTechnologyCO.,LTD Address: B,2/F,BuildingA4,SiliconValleyPowerDigitalIndustrialPark,No.22, LonghuaNewDistrict,Shenzhen,China EUTName: SmartPhone BrandName: DOOGEE ModelNumber: M30 SeriesModelNumber: M30Pro,M30Max,M30Ultra,M30Lite,M30SE,M30Power,M30 Play,M30E,M40,M40Pro,M40Plus,M40ProMax,M40Lite, M40SE,M40Turbo,M40Play FCCID:2AX4YM30 IssuedBy Companyname: BTFTestingLab(Shenzhen)Co.,Ltd. Address: 101/201/301,Building1,Block2,TantouIndustrialPark,Tantou Community,SonggangSubdistrict,Bao'anDistrict,Shenzhen,China Reportnumber: BTF260410R00404 Teststandards: FCCCFRTitle47Part15SubpartE(§15.407) Testconclusion: Pass Dateofsample receipt: 2026-01-28 Testdate: 2026-01-28to2026-04-23 Dateofissue: 2026-04-24 Testby: SeanHe/Tester Preparedby: Approved by: ChrisLiu/ProjectengineerRyan.CJ/EMCmanager Note:Allthetestresultsinthisreportonlyrelatedtothetestingsamples.Whichcanbeduplicatedcompletelyforthelegalusewithapprovalof applicant;itshallnotbereproducedexceptinfullwithoutthewrittenapprovalofBTFTestingLab(Shenzhen)Co.,Ltd.,Alltheobjectionsshouldbe raisedwithinthirtydaysfromthedateofissue.Tovalidatethereport,youcancontactus. ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 2 of 45 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict,Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 RevisionHistory VersionIssuedateRevisionscontent R_V02026-04-24Original Note:Oncetherevisionhasbeenmade,thenpreviousversionsreportsareinvalid. ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 3 of 45 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict,Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 TableofContents 1Introduction...............................................................................................................................................................5 1.1LaboratoryLocation..........................................................................................................................................5 1.2LaboratoryFacility............................................................................................................................................5 1.3Announcement..................................................................................................................................................5 2ProductInformation..................................................................................................................................................6 2.1ApplicationInformation.....................................................................................................................................6 2.2ManufacturerInformation.................................................................................................................................6 2.3FactoryInformation...........................................................................................................................................6 2.4GeneralDescriptionofEquipmentunderTest(EUT)......................................................................................6 2.5TechnicalInformation.......................................................................................................................................7 3TestInformation........................................................................................................................................................8 3.1TestStandards.................................................................................................................................................8 3.2SummaryofTest..............................................................................................................................................8 3.3UncertaintyofTest............................................................................................................................................9 3.4Additionsto,deviations,orexclusionsfromthemethod..................................................................................9 3.5TestAuxiliaryEquipment..................................................................................................................................9 3.6TestEquipmentList..........................................................................................................................................9 4TestConfiguration..................................................................................................................................................11 4.1Testmode.......................................................................................................................................................11 4.2TestChannelofEUT......................................................................................................................................11 4.3Testprocedure................................................................................................................................................13 4.4Testsoftware..................................................................................................................................................13 4.5TestSetupBlock.............................................................................................…

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ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page121of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC20SISO_Ant1_5825_5925~40000 11AC40SISO_Ant1_5190_30~5140 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page122of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC40SISO_Ant1_5190_5360~40000 11AC40SISO_Ant1_5230_30~5140 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. 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Page125of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC40SISO_Ant1_5795_5925~40000 11AC80SISO_Ant1_5210_30~5140 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page126of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC80SISO_Ant1_5210_5360~40000 11AC80SISO_Ant1_5775_30~5650 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page127of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC80SISO_Ant1_5775_5925~40000 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page128of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 AppendixG:FrequencyStability TestResult Voltage TestModeAntenna Freq(M Hz) Voltage [Vdc] Temper ature (°C) Deviation (Hz) Deviation (ppm) Limit (ppm) Verdict 11AAnt1 5180 NVNT20000.003.86100420PASS LVNT20000.003.86100420PASS HVNT20000.003.86100420PASS 5200 NVNT-20000.00-3.84615420PASS LVNT-40000.00-7.69230820PASS HVNT-40000.00-7.69230820PASS 5240 NVNT-20000.00-3.81679420PASS LVNT-20000.00-3.81679420PASS HVNT-40000.00-7.63358820PASS 5745 NVNT-20000.00-3.48128820PASS LVNT-20000.00-3.48128820PASS HVNT-20000.00-3.48128820PASS 5785 NVNT-20000.00-3.45721720PASS LVNT-20000.00-3.45721720PASS HVNT-40000.00-6.91443420PASS 5825 NVNT-20000.00-3.43347620PASS LVNT-20000.00-3.43347620PASS HVNT-20000.00-3.43347620PASS 11N20SI SO Ant1 5180 NVNT0.000.00000020PASS LVNT0.000.00000020PASS HVNT0.000.00000020PASS 5200 NVNT-20000.00-3.84615420PASS LVNT-20000.00-3.84615420PASS HVNT0.000.00000020PASS 5240 NVNT0.000.00000020PASS LVNT-40000.00-7.63358820PASS HVNT0.000.00000020PASS 5745 NVNT-20000.00-3.48128820PASS LVNT20000.003.48128820PASS HVNT0.000.00000020PASS 5785 NVNT-20000.00-3.45721720PASS LVNT-40000.00-6.91443420PASS HVNT0.000.00000020PASS 5825NVNT-20000.00-3.43347620PASS ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page129of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 LVNT-60000.00-10.30042920PASS HVNT0.000.00000020PASS 11N40SI SO Ant1 5190 NVNT0.000.00000020PASS LVNT0.000.00000020PASS HVNT-40000.00-7.70712920PASS 5230 NVNT0.000.00000020PASS LVNT-40000.00-7.64818420PASS HVNT0.000.00000020PASS 5755 NVNT-40000.00-6.95047820PASS LVNT0.000.00000020PASS HVNT0.000.00000020PASS 5795 NVNT-40000.00-6.90250220PASS LVNT0.000.00000020PASS HVNT40000.006.90250220PASS 11AC20S ISO Ant1 5180 NVNT-20000.00-3.86100420PASS LVNT-20000.00-3.86100420PASS HVNT0.000.00000020PASS 5200 NVNT-20000.00-3.84615420PASS LVNT-20000.00-3.84615420PASS HVNT0.000.00000020PASS 5240 NVNT-20000.00-3.81679420PASS LVNT-40000.00-7.63358820PASS HVNT-40000.00-7.63358820PASS 5745 NVNT0.000.00000020PASS LVNT0.000.00000020PASS HVNT-20000.00-3.48128820PASS 5785 NVNT0.000.00000020PASS LVNT-20000.00-3.45721720PASS HVNT-20000.00-3.45721720PASS 5825 NVNT0.000.00000020PASS LVNT-20000.00-3.43347620PASS HVNT-20000.00-3.43347620PASS 11AC40S ISO Ant1 5190 NVNT-40000.00-7.70712920PASS LVNT-40000.00-7.70712920PASS HVNT-40000.00-7.70712920PASS 5230 NVNT-40000.00-7.64818420PASS LVNT40000.007.64818420PASS HVNT0.000.00000020PASS 5755 NVNT0.000.00000020PASS LVNT0.000.00000020PASS ReportNumber:BTF260410R00404 Totalorpartialreproductionofthisdocum…

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Page113of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11N40SISO_Ant1_5230_5360~40000 11N40SISO_Ant1_5755_30~5650 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page114of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11N40SISO_Ant1_5755_5925~40000 11N40SISO_Ant1_5795_30~5650 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page115of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistri…

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ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page81of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC40SISO_Ant1_5230 11AC40SISO_Ant1_5755 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page82of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC40SISO_Ant1_5795 11AC80SISO_Ant1_5210 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page83of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 11AC80SISO_Ant1_5775 ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page84of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 AppendixE:Bandedgemeasurements TestResultB1/2/3 TestModeAntennaChNameFreq(MHz)Result[dBm]Limit[dBm]Verdict 11AAnt1 Low5180-33.09≤-27PASS High5240-40.14≤-27PASS 11N20SISOAnt1 Low5180-33.18≤-27PASS High5240-41.26≤-27PASS 11N40SISOAnt1 Low5190-27.38≤-27PASS High5230-40.69≤-27PASS 11AC20SISOAnt1 Low5180-32.97≤-27PASS High5240-41.19≤-27PASS 11AC40SISOAnt1 Low5190-32.51≤-27PASS High5230-40.5≤-27PASS 11AC80SISOAnt1 Low5210-27.65≤-27PASS High5210-40.55≤-27PASS TestResultB4 TestModeAntennaChNameFreq(MHz) FreqRange [MHz] Result [dBm] Limit [dBm] Verdict 11AAnt1 Low5745 5650~5700-34.37≤-26.51PASS 5700~5720-33.72≤10.42PASS 5720~5725-34.85≤15.98PASS 5760~5650-32.83≤-27PASS High5825 5850~5855-31.79≤15.65PASS 5855~5875-33.23≤10.51PASS 5875~5925-34.4≤-26.87PASS 5925~5935-33.09≤-27PASS 11N20SIS O Ant1 Low5745 5650~5700-34.27≤-26.63PASS 5700~5720-32.97≤10.28PASS 5720~5725-30.16≤20.92PASS 5760~5650-33.06≤-27PASS High5825 5850~5855-34.12≤15.65PASS 5855~5875-34.64≤10.02PASS 5875~5925-33.84≤-26.87PASS 5925~5935-32.47≤-27PASS 11N40SIS O Ant1Low5755 5650~5700-33.95≤-25.63PASS 5700~5720-33.2≤10.21PASS 5720~5725-32.85≤15.90PASS ReportNumber:BTF260410R00404 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed. Page85of158 BTFTestingLab(Shenzhen)Co.,Ltd. 101/201/301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangSubdistrict,Bao'anDistrict, Shenzhen,China Email:[email protected]:+86-755-23146130http://www.btf-lab.com Version:1/00 5780~5650-34.35≤-27PASS High5795 5850~5855-33.3≤15.85PASS 5855~5875-32.31≤10.68PASS 5875~5925-32.84≤-25.02PASS 5925~5935-32.71≤-27PASS 11AC20SI SO Ant1 Low5745 5650~5700-34.47≤-26.88PASS 5700~5720-33.82≤10.28PASS 5720~5725-33.07≤15.98PASS 5760~5650-34≤-27PASS High5825 5850~5855-34.86≤15.65PASS 5855~5875-32.41≤10.89PASS 5875~5925-34.05≤-26.87PASS 5925~5935-32.96≤-27PASS 11AC40SI SO Ant1 Low5755 5650~5700-35.49≤-26.94PASS 5700~5720-25.87≤14.38PASS 5720~5725-30.83≤15.90PASS 5780~5650-34.5≤-…

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