2AXOB-KELIC00RF Controller

Shenzhen Kelic Technology Co. LTD Building 3,Yangguang Yuehai Garden Phase II,No 38l8,Baishi RoadNanshan District, Shenzhen, 518000. China Date: 2020-10-12 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC lD: 2AXOB-KELIC00 Confidentiality Req uest To whom it may concern, Pursuant to Sections 0.457 and 0.459 of the Commission's Rules, we hereby request confidential treatment of the information accompanying this application as outlined below: El Block Diagram ! Tune-Up lnformation X Operational Description E Security Information X Schematics n Software Defined Radio (SDR) f] Parts List lnformation The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmfulto the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this applicaiion and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Shenzhen Kelic Technology Co. LTD Vloaz-t^*g )) (Weizhong Li) (engineer)

Shenzhen Kelic Technology Co. LTD Building 3rYangg'uang Yuehai Garden Phase IIrNo 3818,Baishi Road,Nanshan District' Shenzhen, 518000, China (FCC rD : 2A)COB-KELrCoo) POIVER OF ATTORNEY DATE: 2O20'LO-L2 Federal Communications Commission Authorization and Eva]uation Division 7435 Oakl-and Mi-lls Road Col-umbia, MD 2104 6 To Whom It May Concern: Into, l-ha rrndcrs'i onad- hcrchrrr :rrj- horize Wal-tek Testing Group (Shenzhen) Co., Ltd. vrEr erYrrvvt .Tandrr ea nn 6117 L.^1-'r1€ +a rnnlrz j. o fhe F'ederaI Communications Commission on our UClldI ! t LU aYPf J uv urre eorrioment. Anv and all acts carried out by Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf shall have the same effect as acts of our own. This is to advise that we are in full compfiance with the Anti-Drug Abuse Act. We, Shenzhen Kelic Technology Co. LTD are not subject to a deniaf of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988' 21 USC853a' and na narirr i.o the application is sub;ect to a denial of federal- benefits pursuant to that section. Sincerely. Shenzhen Kel-ic Technology Co. LTD \/r/"^ il/r*t "h (Weizhong Li ) f onai naar'l

Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6

Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AXOB-KELIC00 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View SRD Antenna

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 24 TEST REPORT Reference No. .................... : WTH20X08059212W FCC ID ................................ : 2AXOB-KELIC00 Applicant ........................... : Shenzhen Kelic Technology Co. LTD Address.............................. : 906A8, Building 3, Yangguang Yuehai Garden Phase II, No. 3818, Baishi Road, Yuegui Community, Yuehai Street, Nanshan District, Shenzhen Product Name ................... : RF Controller Test Model. ........................ : KLK19008 Standards .......................... : FCC Part 15.231 Date of Receipt sample .... : Aug.24, 2020 Date of Test........................ : Aug.25, 2020 to Sep.11, 2020, Nov. 4, 2020 Date of Issue ..................... : Nov. 4, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTH20X08059212W Page 2 of 24 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................6 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................7 2. SUMMARY OF TEST RESULTS ...........................................................................................................................8 3. ANTENNA REQUIREMENT ..................................................................................................................................9 3.1 STANDARD APPLICABLE .........................................................................................................................................9 3.2 TEST RESULT..........................................................................................................................................................9 4. RADIATED EMISSIONS ....................................................................................................................................... 10 4.1 STANDARD APPLICABLE ....................................................................................................................................... 10 4.2 TEST PROCEDURE ................................................................................................................................................. 11 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 12 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 5. 20DB BANDWIDTH ............................................................................................................................................... 17 5.1 STANDARD APPLICABLE ....................................................................................................................................... 17 5.1 TEST PROCEDURE ................................................................................................................................................. 17 5.2 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 6. TRANSMISSION TIME ......................................................................................................................................... 19 6.1 STANDARD APPLICABLE ....................................................................................................................................... 19 6.2 TEST PROCEDURE ................................................................................................................................................. 19 6.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 7. DUTY CYCLE ......................................................................................................................................................... 21 7.1 STANDARD APPLICABLE ....................................................................................................................................... 21 7.2 TEST PROCEDURE ............................................…

Text truncated - open the document above for the full version.

Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (1GHz to 18GHz) Radiation Emission Test Setup (Above 18GHz) Reference No.: WTH20X08059212W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn