2AYEI-PL-P30ZSMART FINGERPRINT PADLOCK

使用距离小于20cm的产品：使用距离（使用产品时，与人的距离） This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Any changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. NOTE: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -- Reorient or relocate the receiving antenna. -- Increase the separation between the equipment and receiver. -- Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -- Consult the dealer or an experienced radio/TV technician for help. The device has been evaluated to meet general RF exposure requirement. The device can be u sed in portable exposure condition without restriction

C5266091_X8_Ed.1 Letter of Authorization Wenzhou Boshi Electric Technology Co,Ltd. Company: Wenzhou Boshi Electric Technology Co,Ltd. Address: NO.3 Building,Jinchang,NO 281 Weiqi Road,Yueqing Economic Development Zone,Yueqing,Zhejiang,China Product Name: SMART FINGERPRINT PADLOCK Model Number: PL-P30Z FCC Identifier: 2AYEI-PL-P30Z We authorize LGAI Technological Center S.A., Ronda de la Font del Carme, s/n, 08193 Bellaterra, Spain, to act on our behalf on all matters concerning the above named equipment. Any individual within LGAI Technological Center S.A. is authorized to act on our behalf and take action on the application. We declare that authorize LGAI Technological Center S.A., Ronda de la Font del Carme, s/n, 08193 Bellaterra, Spain, is allowed to forward all information related to the approval project to the Federal Communication Commission and to discuss any issues concerning the approval application. Any and all acts carried out by LGAI Technological Center S.A. on our behalf shall have the same effect as acts of our own. Name: Date: 2020.12.08 Title: Technical director Signature of applicant: 1/1 Xuewen Liu

C5266091_X10_Ed.2 Wenzhou Boshi Electric Technology Co,Ltd. Office of Engineering Technology Federal Communications Commission 7435 Oakland Mills Road Columbia, MD 21046 Date: 2020.12.08 Subject: Request for Confidentiality FCC ID: 2AYEI-PL-P30Z To Whom It May Concern, Pursuant to the provisions of Sections 0.457 and 0.459 of Commission's rules (47CFR0.457, 0.459), we are requesting the Commission to withhold the following attachment(s) as confidential document from public disclosure. Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☐ Internal Photos ☐ NOTE 1 ☐ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No NOTE 1: Long-Term Confidentiality may be permitted under special conditions (See II. LONG-TERM CONFIDENTIALITY, Section 3 of KDB 726920, use last in force) NOTE 2: Short-Term Confidentiality can be requested for a maximum of 180 days from the date of the grant. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. In case of short-term Confidentiality, the applicant requests the exhibits selected above are withheld from public view for a period of ____45__ days from the date of the Grant of Equipment Authorization and prior to marketing. It is our understanding that all measurement test reports, FCC ID label format and correspondent during certification review process cannot be granted as confidential documents and those information will be available for public review once the grant of equipment authorization is issued. 1/1 C5266091_X10_Ed.2 Sincerely, Signature: Name: Title: Technical director 1/1 Xuewen Liu

External Photos

Model: PL-P30Z FCC ID: 2AYEI-PL-P30Z Label Location

Internal Photos ANT RF08

Shenzhen CTB Testing Co., Ltd. FCC ID: 2AYEI-PL-P30Z Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. BLE: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402-0.9130.810±1 1.001.26<50.390233.00YES 2.44-0.7450.840±11.001.26<50.393303.00YES 2.480-1.0160.79-1±10.001.00<50.314963.00 YES GFSK Conclusion: For the max result : 0. 39330W/Kg ≤ FCC Limit 3.0 for 1g SAR.

Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB201203002RFX TEST REPORT Compiled by: Reviewed by: Approved by: Arron Liu Bin Mei Rita Xiao / Director The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. Product Name: SMART FINGERPRINT PADLOCK FCC ID: 2AYEI-PL-P30Z Trademark: Model Number: PL-P30Z Prepared For: Wenzhou Boshi Electric Technology Co,Ltd. Address: NO.3 Building, Jinchang, NO 281 Weiqi Road, Yueqing Economic Development Zone, Yueqing, Zhejiang, China Manufacturer: Wenzhou Boshi Electric Technology Co,Ltd. Address: NO.3 Building, Jinchang, NO 281 Weiqi Road, Yueqing Economic Development Zone, Yueqing, Zhejiang, China Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: Floor 1&2, Building A, No. 26 of Xinhe Road, Xinqiao Street, Baoan District, Shenzhen China Sample Received Date: Dec. 1, 2020 Sample tested Date: Dec. 1, 2020 to Oct. Dec. 3, 2020 Issue Date: Dec. 3, 2020 Report No.: CTB201203002RFX Te s t Standards FCC Part15.247 ANSI C63.10:2013 Test Results PASS Remark: This is Bluetooth radio test report. Report Tel: 4008-707-283Web: http://www.ctb-lab.netPage 1 of 36 Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB201203002RFX TABLE OF CONTENT Test Report Declaration Page 1. VERSION ...................................................................................................... 4 2. TEST SUMMARY ........................................................................................... 5 3. MEASUREMENT UNCERTAINTY .................................................................. 6 4. PRODUCT INFORMATION AND TEST SETUP ............................................... 7 4.1 Product Information ............................................................................................. 7 4.2 Test Setup Configuration ..................................................................................... 7 4.3 Support Equipment .............................................................................................. 7 4.4 Channel List ........................................................................................................ 8 4.5 Test Mode ........................................................................................................... 8 4.6 Test Environment ................................................................................................ 8 5. TEST FACILITY AND TEST INSTRUMENT USED .......................................... 9 5.1 Test Facility ......................................................................................................... 9 5.2 Test Instrument Used .......................................................................................... 9 6. AC POWER LINE CONDUCTED EMISSION ................................................... 11 6.1 Block Diagram Of Test Setup ............................................................................ 11 6.2 Limit ................................................................................................................... 11 6.3 Test procedure .................................................................................................. 11 6.4 Test Result ........................................................................................................ 13 7. RADIATED SPURIOUS EMISSION............................................................... 15 7.1 Block Diagram Of Test Setup ............................................................................ 15 7.2 Limit ................................................................................................................... 15 7.3 Test procedure .................................................................................................. 16 7.4 Test Result ........................................................................................................ 17 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS ................... 24 8.1 Block Diagram Of Test Setup ............................................................................ 24 8.2 Limit ................................................................................................................... 24 8.3 Test procedure .................................................................................................. 24 8.4 Test Result ........................................................................................................ 25 9. COUDUCTED PEAK OUTPUT POWER ........................................................ 27 9.1 Block Diagram Of Test Setup ............................................................................ 27 Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 36 Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB201203002RFX 9.2 Limit ................................................................................................................... 27 9.3 Test procedure .................................................................................................. 27 9.4 Test Result ........................................................................................................ 28 10. 6DB OCCUPIED BANDWIDTH ..................................................................... 30 10.1 Block Diagram Of Test Setup .......................................................................... 30 10.2 Limit ................................................................................................................. 30 10.3 Test procedure ................................................................................................ 30 10.4 Test Result ......................................................................................................…

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Radiated Emission Below 1G Above 1G Conducted Emission