2BB6Q-V52TWS Bluetooth headset

(Shenzhen Lancest Technology Co., Ltd.) (July 29, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for (FCC ID: 2BB6Q-V52) [Shenzhen Lancest Technology Co., Ltd.] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. Sincerely, (Applicant signature) (Applicant printed name) Yilong Wang (Shenzhen Lancest Technology Co., Ltd.) (July 29, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for (FCC ID: 2BB6Q-V52) [Shenzhen Lancest Technology Co., Ltd.] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, (Applicant signature) (Applicant printed name) Yilong Wang

Shenzhen Lancest Technology Co., Ltd. Model Difference Data：July 29, 2023 Product description: TWS Bluetooth headset Model name: V52, V29, V23, V30, V31, V32, V33, V35, V36, V37, V38, V39, V50, V51, V53, V55, V56, V57, V58, V59 Trade Name: Aolon FCC ID: 2BB6Q-V52 All the model are the same circuit and RF module, except model names . Regards Sincerely Client’s signature : Client’s name / title : Yilong Wang（Manager） Contact information / address：Room 626, Building B, City Shanhai Center, No. 11, Zhongxing Road, Ma'antang Community, Bantian Street, Longgang District, Shenzhen

Shenzhen Lancest Technology Co., Ltd. (July 29, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (TWS Bluetooth headset / V52, V29, V23, V30, V31, V32, V33, V35, V36, V37, V38, V39, V50, V51, V53, V55, V56, V57, V58, V59 / FCC ID: 2BB6Q-V52) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☒ Internal Photos ☐ NOTE 1 ☒ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: Yilong Wang Title: Manager

Shenzhen Lancest Technology Co., Ltd. (July 29, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen CTB Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: Yilong Wang Title: Manager

External Photos

FCC ID LABEL: Label Location: FCC ID: 2BB6Q-V52 Model No.: V52

Internal Photos L ANT R ANT

Shenzhen CTB Testing Co., Ltd. FCC ID:2BB6Q-V52 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. EDR: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 2.57 1.81 2±1 3.00 2.00 <5 0.61847 3.00 YES 2.441 3.193 2.09 3±1 4.00 2.51 <5 0.78490 3.00 YES 2.480 2.374 1.73 2±1 3.00 2.00 <5 0.62843 3.00 YES 2.402 3.208 2.09 3±1 4.00 2.51 <5 0.77860 3.00 YES 2.441 3.824 2.41 3±1 4.00 2.51 <5 0.78490 3.00 YES 2.480 2.922 1.96 2±1 3.00 2.00 <5 0.62843 3.00 YES GFSK π /4DQPSK BLE: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 3.028 2.01 3±1 4.00 2.51 <5 0.77860 3.00 YES 2.44 3.188 2.08 3±1 4.00 2.51 <5 0.78474 3.00 YES 2.480 2.143 1.64 2±1 3.00 2.00 <5 0.62843 3.00 YES GFSK Conclusion: For the max result : 0.7849≤ FCC Limit 3.0 for 1g SAR.

深圳市朋伴兴业科技有限公司 UNLESS OTHER SPECIFIED TOLERANCES ON： X＝±X.X＝±X.XX＝ AN G L E S＝ ± H O L E D I A＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESE DRAWINGS AND SPECIFICATIONS ARE THE PROPERTY OF PBXY TECHNOLOGY Limited AND SHALL NOT BE REPRODUCED OR USED AS THE BASIS FOR THE MANUFACTURE OR SALE OF APPARATUS OR DEVICES WITHOUT PERMISSION DRAWN BY : SeraCHECKED BY: XD DESIGNED BY: SeraAPPROVED BY: XD TITLE：CHIP2450-3216 Specification DOCUMENT NO. 3216 SPEC REV. P1 产品规格承认书 SPECIFICATIONS 客户: CUSTOMER: 产品名称: DESCRIPTION: BT ANT 客户型号: CUSTOMER PART No: 产品型号: OUR MODEL NO:PBX3216MP01 日期: DATE:2020/12/22 确认签字,盖章后请返回承认书一份 PLEASE RETURN TO US ONE COPY OF “SPECIFICATION FOR APPROVAL” WITH YOUR APPROVED SIGNATURES 核准审核刘飞制作刘小美 客户承认签印 日期 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 PBX3216MP01Specification OperatingTemp.:-40°C~+85°C 1. FEATURES : ●Lightweight,compact ●Widebandwidth,lowcost ●Built-inantennawithhighgain 2. APPLICATIONS : ●Bluetooth,WirelessLAN,MobileTV ●HomeRFSystem,etc 3.PRODUCTIDENTIFICATION (1)(2)(3) (1)Producttype:MultilayerchipAntenna (2)CenterFrequency:2450MHz (3)ExternalDimensions(L×W)(mm):3.2*1.6 4.SHAPEANDDIMENSIONS: LWHA 3.2±0.21.6±0.2 0.52 ± 0.10.4 ± 0.1 CH IP45 032 2 16 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 测试板参考尺寸： 单位：mm 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 打孔参考示意图 APPLICATIONGUIDE 5.SPECIFICATIONS: *Testcondition:Testboardsize90*40mm Matchingcircuit:Pimatchingcircuitwillberequired 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 6.ElectricalCharacteristics: 回波损耗 驻波比 MarkFrequencyVSWR 12400MHz1.513 22440MHz1.068 32480MHz1.464 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 RadiationPattern TheGainpatternismeasuredinFAR-fieldchamber.DUTisplacedonthetableofrotator,a standardhornantennaandVectorNetworkAnalyzerisusedtocollectdata. ◎效率 最大增益 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 ◎3DGainPattern(2400MHz) ◎3DGainPattern(2440MHz) ◎3DGainPattern(2480MHz) 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 7.EnvironmentalCharacteristics (1)ReliabilityTest (2)StorageCondition (a)Atwarehouse: Thetemperatureshouldbewithin0~30°Candhumidityshouldbelessthan60%RH. Theproductshouldbeusedwithin1yearfromthetimeofdelivery. (b)Onboard: Thetemperatureshouldbewithin-40~85°Candhumidityshouldbelessthan85%RH. (3)OperatingTemperatureRange Operatingtemperaturerange:-40 °C to+105 °C . 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 8.RecommendedReflowSoldering (1)SolderingGunProcedure Notethefollows,incaseofusingsoldergunforreplacement. (a)Thetiptemperaturemustbelessthan350 ° Cfortheperiodwithin3secondsby usingsolderinggununder30W. (b)Thesolderingguntipshallnottouchthisproductdirectly. (2)SolderingVolume Notethatexcessofsolderingvolumewilleasilygetcrackthebodyofthisproduct. 深圳市朋伴兴业科技有限公司 UNLESSOTHERSPECIFIEDTOLERANCESON： X＝±X.X＝±X.XX＝ ANGLES＝ ± HOLEDIA＝ ± 深圳市朋伴兴业科技有限公司 SCALE：N/AUNIT：mm THESEDRAWINGSANDSPECIFICATIONSARETHEPROPERTYOFPBXY TECHNOLOGYLimitedANDSHALLNOTBEREPRODUCEDORUSEDAS THEBASISFORTHEMANUFACTUREORSALEOFAPPARATUSOR DEVICESWITHOUTPERMISSION DRAWNBY:SeraCHECKEDBY:XD DESIGNEDBY:SeraAPPROVEDBY:XD TITLE：CHIP2450-3216Specification DOCUMENT NO. 3216 SPECREV. P1 9.TapingPackageandLabelMarking: (unit:mm) (1)Quantity…

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Shenzhen CT B Testing Technology Co., Ltd. Report No.: CTB230710031RFX Report Tel: 4008-707- 283Web: http://www.ctb-lab. net Page 1 of 53 TEST REPORT Compiled by: Reviewed by: Approved by: Zhou Kui Arron Liu Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Product Name: TWS Bluetooth headset FCC ID: 2BB6Q-V52 Trademark: Aolon Model Number: V52 , V29, V23 , V30, V31, V32, V33, V35, V36, V37, V38, V39, V50, V51, V53, V55, V56, V57, V58, V59 Prepared For: Shenzhen Lancest Technology Co., Ltd. Add ress: Room 626, Building B, City Shanhai Center, No. 11, Zhongxing Road,Ma'antang Community, Bantian Street, Longgang District, Shenzhen Manufacturer: Shenzhen Lancest Technology Co., Ltd. Address: Room 626, Building B, City Shanhai Center, No. 11, Zhongxing Road,Ma'antang Community, Bantian Street, Longgang District, Shenzhen Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Jul. 06, 2023 Sample tested Date: Jul. 06, 2023 to Jul. 11, 2023 Issue Date: Jul. 1 1, 2023 Report No.: CTB230710031RFX Test Standards FCC Part15.247 ANSI C63.10:2013 Test Results PASS Remark: This is Bluetooth radio test report. Shenzhen CT B Testing Technology Co., Ltd. Report No.: CTB230710031RFX Report Tel: 4008-707- 283Web: http://www.ctb-lab. net Page 2 of 53 TABLE OF CONTENT Test Report Declaration Page 1.VERSION .......................................................................... 4 2.TEST SUMMARY ................................................................... 5 3.MEASUREMENT UNCERTAINTY ..................................................... 6 4.PRODUCT INFORMATION AND TEST SETUP .......................................... 7 4.1 Product Information .................................................................... 7 4.2 Test Setup Configuration ............................................................... 7 4.3 Support Equipment .................................................................... 7 4.4 Channel List .......................................................................... 8 4.5 Test Mode ............................................................................ 8 4.6 Test Environment ...................................................................... 8 5.TEST FACILITY AND TEST INSTRUMENT USED ....................................... 9 5.1 Test Facility ........................................................................... 9 5.2 Test Instrument Used .................................................................. 9 6.AC POWER LINE CONDUCTED EMISSION ............................................ 11 6.1 Block Diagram Of Test Setup .......................................................... 11 6.2 Limit ................................................................................ 11 6.3 Test procedure ....................................................................... 11 6.4 Test Result .......................................................................... 13 7.RADIATED SPURIOUS EMISSION ................................................... 15 7.1 Block Diagram Of Test Setup .......................................................... 15 7.2 Limit ................................................................................ 15 7.3 Test procedure ....................................................................... 16 7.4 Test Result .......................................................................... 17 8.BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS .......................... 26 8.1 Block Diagram Of Test Setup .......................................................... 26 8.2 Limit ................................................................................ 26 8.3 Test procedure ....................................................................... 26 8.4 Test Result .......................................................................... 27 9.COUDUCTED PEAK OUTPUT POWER ............................................... 32 9.1 Block Diagram Of Test Setup .......................................................... 32 9.2 Limit ................................................................................ 32 9.3 Test procedure ....................................................................... 32 9.4 Test Result .......................................................................... 33 10.20DB OCCUPIED BANDWIDTH...................................................... 36 10.1 Block Diagram Of Test Setup ......................................................... 36 10.2 Limit ............................................................................... 36 10.3 Test procedure ...................................................................... 36 10.4 Test Result ......................................................................... 36 11.CARRIERFREQUENCIES SEPARATION .............................................. 39 11.1 Block Diagram Of Test Setup ......................................................... 39 11.2 Limit ............................................................................... 39 11.3 Test procedure ...................................................................... 39 11.4 Test Result ......................................................................... 39 12.HOPPING CHANNEL NUMBE…

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Radiated Emission Below 1G Above 1G Conducted emissions