2BB8VN1OneKey Neo

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ONEKEY LIMITED Rm 1517,15F Amiata Industrial Building, 58 Lei MukRoad,KwaiChung Hong Kong, China Federal Communications Commission Authorization and Evaluation Division Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 2026/06/26 U.S. Agent Designation ONEKEY LIMITED acknowledges their consent for the following contact located in the United States to act as their agent for service of process for the equipment for which authorization is sought (FCC ID: 2BB8VN1): Name and company of U.S. agent: GLOCERTS TECHNOLOGY INC Physical U.S. address of agent: 19784 SUNKISSED RIDGE DR RIVERSIDE, CA 92507 United States FRN of U.S. agent: 0036339737 Phone of U.S. agent: (626) 588-8039 Email address of U.S. agent: [email protected] GLOCERTS TECHNOLOGY INC acknowledges their obligation to accept service of process on behalf of ONEKEY LIMITED with the FRN [0034048033] accepts its obligation to maintain an agent for service of process in the United States for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. By signing this form, we confirm the above and that we are aware of the application requirements listed under § 2.911(d)(7). The information provided in this letter is based on the referenced rule parts of Title 47 of the CFR as well as KDB 986446 D01. An expiration date for this letter does not exist. In case the U.S. agent changes, the grantee is obligated to notify the FCC within 30 days via the granting TCB. An expiration date for this letter does not exist. Sincerely, Signature qiang wang Manager ONEKEY LIMITED Signature Huiying Fan Director GLOCERTS TECHNOLOGY INC 48_[mo del] US_Agent_2.911(d)(7) - U, V0 5

FCC ID: 2BB8VN1 External Photos of the EUT FCC ID: 2BB8VN1

Label and Location Size: L: 2.0cm*W: 1.0cm Label and Location FCC ID: 2BB8VN1

FCC ID: 2BB8VN1 Internal Photos of the EUT FCC ID: 2BB8VN1 BLE ANT FCC ID: 2BB8VN1 FCC ID: 2BB8VN1 WPT RX ANT NFC ANT

Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn RF Exposure evaluation Report Reference No. ..................... : FCC ID............................................. : CTA26043001103 2BB8VN1 Compiled by ( position+printed name+signature) . : File administrators Zoey Cao Supervised by ( position+printed name+signature) . : Project Engineer Ace Chai Approved by ( position+printed name+signature) . : RF Manager Eric Wang Date of issue .................................... : May 21, 2026 Testing Laboratory Name .............. : Shenzhen CTA Testing Technology Co., Ltd. Address............................................ : Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Applicant’s name ............................ : ONEKEY LIMITED Address............................................ : Rm 1517,15F Amiata Industrial Building, 58 Lei MukRoad, KwaiChung Hong Kong, China Standard ........................................... : 47CFR §1.1310 47CFR §2.1093 KDB447498 D01 General RF Exposure Guidance v06 Shenzhen CTA Testing Technology Co., Ltd. All rights reserved. This publication may be reproduced in whole or in part for non-commercial purpses as long as the Shenzhen CTA Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen CTA Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Test item description ..................... : OneKey Neo Trade Mark ....................................... : OneKey Manufacturer .................................... : ONEKEY LIMITED Model/Type reference ...................... : OneKey Neo Listed Models ................................... : N/A Rating ............................................... : Input: 5V 1200mA Battery: 3.85V 700mAh 2.695Wh Result ............................................... : PASS Report No.: CTA26043001103 Page 2 of 9 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn T E S T R E P O R T Equipment under Test : OneKey Neo Model /Type : OneKey Neo Listed Models : N/A Applicant : ONEKEY LIMITED Address : Rm 1517,15F Amiata Industrial Building, 58 Lei MukRoad,KwaiChung Hong Kong, China Manufacturer : ONEKEY LIMITED Address : Rm 1517,15F Amiata Industrial Building, 58 Lei MukRoad,KwaiChung Hong Kong, China Test Result: PASS The test report merely corresponds to the test sample. It is not permitted to copy extracts of these test result without the written permission of the test laboratory. Report No.: CTA26043001103 Page 3 of 9 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn Contents 1 TEST STANDARDS ............................................................................................................ 4 2 SUMMARY .......................................................................................................................... 5 2.1 General Remarks .................................................................................................... 5 2.2 Product Description ................................................................................................. 5 2.3 Special Accessories ................................................................................................ 5 2.4 Modifications ........................................................................................................... 5 3 TEST ENVIRONMENT ....................................................................................................... 6 3.1 Address of the test laboratory ................................................................................. 6 3.2 Test Facility ............................................................................................................. 6 3.3 Statement of the measurement uncertainty ............................................................ 6 4 Test limit .............................................................................................................................. 7 4.1 Requirement ........................................................................................................... 7 4.2 Conducted Power Results ...................................................................................... 8 4.3 Manufacturing tolerance ......................................................................................... 8 4.4 Evaluation Result .................................................................................................... 9 4.5 Simultaneous Transmission for SAR Exclusion ..................................................... 9 5 Conclusion ........................................................................................................................... 9 Report No.: CTA26043001103 Page 4 of 9 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn 1 T E S T S T A N D A R D S The tests were performed according to following standards: ANSI C95.1–1999: IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagn…

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Approval sheet Sep. 2012ASC_RFANT5220110A0T_V13Page 1 of 9 MULTILAYER CERAMIC ANTENNA RFANT Pb free Series – RoHS Compliance Halogens Free Product 2.4 GHz ISM Band Working Frequency P/N: RFANT5220110A0T *Contents in this sheet are subject to change without prior notice. Add: 24th Floor, No. 1, Songzhi Road, Xinyi District, Taipei City Approval sheet Page 2 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 FEATURES 1. Surface Mounted Devices with a small dimension of 5.2 x 2.0 x 1.1 mm 3 meet future miniaturization trend. 2. Embedded and LTCC (Low Temperature Co-fired Ceramic) technology is able to future integrate with system design as well as beautifying the housing of final product. 3. High Stability in Temperature / Humidity Change APPLICATIONS 1. Bluetooth 2. Wireless LAN 3. HormRF 4. ISM band 2.4GHz wireless applications DESCRIPTION Walsin Technology Corporation develops a new ceramic embedded antenna specified for 2.4 GHz ISM Band application, as shown in below “CONSTRUCTION”. Both of Wireless LAN IEEE 802.11b and Bluetooth TM typically located on this unlicensed frequency band which range covers from 2.4GHz to 2.4835GHz. To fulfil the friendly usage for antenna, this antenna has been designed to a typical 150MHz bandwidth through Walsin’s advanced LTCC (Low Temperature Co-fired Ceramic) technology and superior product design via 3D EM Simulation Skill. This antenna has a rectangular ceramic body with a tiny dimension of 5.2x 2.0 x 1.1 mm 3 meet the future SMT automation and miniaturization requirements on modern portable devices. CONSTRUCTION Identification mark Soldering terminal W T C W T C Feeding Identification mark Soldering terminal W T C W T C Feeding DIMENSIONS Figure Symbol Dimension L 5.20 ± 0.20 mm W 2.00 ± 0.20 mm T 1.15 ± 0.10 mm A 0.40 ± 0.25 mm Approval sheet Page 3 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 SOLDER LAND PATTERN DESIGN Figure ELECTRICAL CHARACTERISTICS RFANT5220110A0T Specification Working Frequency Range 2.4 GHz ～ 2.5GHz Gain 2 dBi (Typical) VSWR 2 max. Polarization Linear Azimuth Bandwidth Omni-directional Impedance 50Ω Rated Power (max.) 3 Watts Maximum Input Power 5 Watts for 5 minutes Operation Temperature -40 ̊C ~ +85 ̊C Remark: The specification is defined based on the test board dimension as in below Approval sheet Page 4 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 Antenna on Test Board ( FR4 Thickness 0.8mm) Antenna S11 on Test Board Bandwidth >150MHzBandwidth >150MHz Empty Area Empty Area 18x9 mm 50Ω ΩΩ ΩFeed line GROUND 30x18 mm 1mm 3.3mm 1.5mm WTC 2.5mm 18mm Empty Area Empty Area 18x9 mm 50Ω ΩΩ ΩFeed line GROUND 30x18 mm 1mm 3.3mm 1.5mm WTC 2.5mm 18mm Approval sheet Page 5 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 RADIATION PATTERN Radiation Pattern and Gain were dependent on measurement board design. The specification of RFANT5220110A0T antenna was measured based on the PCB size and installation position as shown in the below figure Test Board Vertical Horizontal Y - Z Plane Average Gain= -0.82 dBi Peak Gain = 1.69 dBi Average Gain =-3.22 dBi Peak Gain= -5.42 dBi Average Gain=-8.98 dBi X - Z Plane Average Gai n=-0.91 dBi Peak Gain= -5.97 dBi Average Gain=-3.24dBi Peak Gain= 2.66 dBi Average Gain= -8.61 dBi X - Y Plane Average Gain= -0.68 dBi Peak Gain= -5.97 dBi Average Gain=-3.12 dBi Peak Gain= 2.59 dBi Average Gain= -9.24 dBi Y Z WTC X Y Z WTC X Y Z WTC X Y Z WTC X Y Z WTC X Y Z WTC X z Y z Y z X z X X Y X Y Empty Area GROUND 30x18 mm WTC X Y Z Empty Area GROUND 30x18 mm WTC X Y Z X Y Z Approval sheet Page 6 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 RELIABILITY TEST Test item Test condition / Test method Specification Solderability JIS C 0050-4.6 JESD22-B102D *Solder bath temperature：235 ± 5°C *Immersion time：2 ± 0.5 sec *Solder：Sn3Ag0.5Cu for lead-free At least 95% of a surface of each terminal electrode must be covered by fresh solder. Leaching (Resistance to dissolution of metallization) IEC 60068-2-58 *Solder bath temperature：260 ± 5°C *Leaching immersion time：30 ± 0.5 sec *Solder : SN63A Loss of metallization on the edges of each electrode shall not exceed 25%. Resistance to soldering heat JIS C 0050-5.4 *Preheating temperature：120~150°C, 1 minute. *Solder temperature：270±5°C *Immersion time：10±1 sec *Solder：Sn3Ag0.5Cu for lead-free Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Loss of metallization on the edges of each electrode shall not exceed 25%. Drop Test JIS C 0044 *Height：75 cm *Test Surface：Rigid surface of concrete or steel. *Times：6 surfaces for each units；2 times for each side. No mechanical damage. Samples shall satisfy electrical specification after test. Adhesive Strength of Termination JIS C 0051- 7.4.3 *Pressurizing force： 5N(≦0603)；10N(>0603) *Test time：10±1 sec No remarkable damage or removal of the termination. Bending test JIS C 0051- 7.4.1 The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm/s per second until the deflection becomes 1mm/s and then pressure shall be maintained for 5±1 sec. Measurement to be made after keeping at room temperature for 24±2 hours No mechanical damage. Samples shall satisfy electrical specification after test. Approval sheet Page 7 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 Temperature cycle JIS C 0025 1. 30±3 minutes at -40°C±3°C, 2. 10~15 minutes at room temperature, 3. 30±3 minutes at +85°C±3°C, 4. 10~15 minutes at room temperature, Total 100 continuous cycles Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Vibration JIS C 0040 *Frequency：10Hz~55Hz~10Hz(1min) *Total amplitude：1.5mm *Test times：6hrs.(Two hrs each in three mutually perpendicular directions) No mechanical damage. Samples shall satisfy electrical specification after test. High temperature JIS C 0021 *Temperature：85°C±2°C *Test duration：1000+24/-0 hours Measurement to be made after keepin…

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Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn FCC PART 15 SUBPART C TEST REPORT FCC PART 15.247 Report Reference No. ...................: FCC ID. ......................................... : CTA26043001101 2BB8VN1 Compiled by ( position+printed name+signature) : File administrators Zoey Cao Supervised by ( position+printed name+signature) : Project Engineer Ace Chai Approved by ( position+printed name+signature) : RF Manager Eric Wang Date of issue ...................................: May 21, 2026 Testing Laboratory Name .............: Shenzhen CTA Testing Technology Co., Ltd. Address ..........................................: Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Applicant’s name...........................: ONEKEY LIMITED Address ...........................................: Rm 1517,15F Amiata Industrial Building,58 Lei MukRoad, KwaiChung, Hong Kong, China Test specification ......................... : Standard ..........................................: FCC Part 15.247 Shenzhen CTA Testing Technology Co., Ltd. All rights reserved. This publication may be reproduced in whole or in part for non-commercial purposes as long as the Shenzhen CTA Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen CTA Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Equipment description ................ : OneKey Neo Trade Mark ......................................: OneKey Manufacturer ...................................: ONEKEY LIMITED Model/Type reference .....................: OneKey Neo Listed Models ..................................: N/A Modulation ......................................: GFSK Frequency .......................................: From 2402MHz to 2480MHz Ratings ............................................: Input: 5V 1200mA Battery: 3.85V 700mAh 2.695Wh Result ..............................................: PASS Report No.: CTA26043001101 Page 2 of 36 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn T E S T R E P O R T Equipment under Test : OneKey Neo Model /Type : OneKey Neo Listed Models : N/A Applicant : ONEKEY LIMITED Address : Rm 1517,15F Amiata Industrial Building,58 Lei MukRoad, KwaiChung, Hong Kong, China Manufacturer : ONEKEY LIMITED Address : Rm 1517,15F Amiata Industrial Building,58 Lei MukRoad, KwaiChung, Hong Kong, China Test Result: PASS The test report merely corresponds to the test sample. It is not permitted to copy extracts of these test result without the written permission of the test laboratory. Report No.: CTA26043001101 Page 3 of 36 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn Contents 1 TEST STANDARDS ...................................................................................................................................... 4 2 SUMMARY .................................................................................................................................................... 5 2.1 General Remarks .............................................................................................................................. 5 2.2 Product Description* .......................................................................................................................... 5 2.3 Equipment Under Test ....................................................................................................................... 5 2.4 Short description of the Equipment under Test (EUT) ...................................................................... 5 2.5 EUT configuration .............................................................................................................................. 5 2.6 EUT operation mode ......................................................................................................................... 5 2.7 Block Diagram of Test Setup ............................................................................................................. 6 2.8 Related Submittal(s) / Grant (s) ......................................................................................................... 6 2.9 Modifications ...................................................................................................................................... 6 3 TEST ENVIRONMENT ................................................................................................................................. 7 3.1 Address of the test laboratory ........................................................................................................... 7 3.2 Test Facility........................................................................................................................................ 7 3.3 Environmental conditions .................................................................................................................. 7 3.4 Summary of measurement results .................................................................................................... 8 3.5 Statement of the measurement uncertainty .........................................................…

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1 FCC Appendix RF Test Data for BLE FCC ID : 2BB8VN1 Company : ONEKEY LIMITED EUT : OneKey Neo Model Number : OneKey Neo Report No. : CTA26043001101 Reviewed By : Eric Wang 2 Appendix A: DTS Bandwidth Test Result TestMode Antenna Freq(MHz) DTS BW [MHz] FL[MHz] FH[MHz] Limit[MHz] Verdict BLE_1M Ant1 2402 0.648 2401.696 2402.344 0.5 PASS 2440 0.640 2439.696 2440.336 0.5 PASS 2480 0.648 2479.684 2480.332 0.5 PASS 3 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 4 5 Appendix B: Occupied Channel Bandwidth Test Result TestMode Antenna Freq(MHz) OCB [MHz] FL[MHz] FH[MHz] Limit[MHz] Verdict BLE_1M Ant1 2402 1.0048 2401.5182 2402.5230 --- --- 2440 1.0093 2439.5155 2440.5248 --- --- 2480 1.0113 2479.5160 2480.5273 --- --- 6 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 7 8 Appendix C: Maximum conducted output power Test Result TestMode Antenna Freq(MHz) Conducted Peak Powert[dBm] Conducted Limit[dBm] Verdict BLE_1M Ant1 2402 0.79 ≤30 PASS 2440 0.19 ≤30 PASS 2480 -0.09 ≤30 PASS 9 Appendix D: Maximum power spectral density Test Result TestMode Antenna Freq(MHz) Result[dBm/3kHz] Limit[dBm/3kHz] Verdict BLE_1M Ant1 2402 -14.84 ≤8.00 PASS 2440 -15.37 ≤8.00 PASS 2480 -16.13 ≤8.00 PASS 10 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 11 12 Appendix E: Band edge measurements Test Result TestMod e Antenn a ChNam e Freq(MHz ) RefLevel[dBm ] Result[dBm ] Limit[dBm ] Verdic t BLE_1M Ant1 Low 2402 0.28 -49.56 ≤-19.72 PASS High 2480 -0.12 -52.92 ≤-20.12 PASS 13 Test Graphs BLE_1M_Ant1_Low_2402 BLE_1M_Ant1_High_2480 14 Appendix F: Conducted Spurious Emission Test Result TestMode Antenna Freq(MHz) FreqRange [MHz] RefLevel [dBm] Result[dBm] Limit[dBm] Verdict BLE_1M Ant1 2402 Reference 0.10 0.10 --- PASS 30~1000 0.10 -67.89 ≤-19.9 PASS 1000~26500 0.10 -40.8 ≤-19.9 PASS 2440 Reference -0.17 -0.17 --- PASS 30~1000 -0.17 -67.89 ≤-20.17 PASS 1000~26500 -0.17 -40.69 ≤-20.17 PASS 2480 Reference -0.32 -0.32 --- PASS 30~1000 -0.32 -66.83 ≤-20.32 PASS 1000~26500 -0.32 -42.67 ≤-20.32 PASS 15 Test Graphs BLE_1M_Ant1_2402_0~Reference BLE_1M_Ant1_2402_30~1000 BLE_1M_Ant1_2402_1000~26500 16 BLE_1M_Ant1_2440_0~Reference BLE_1M_Ant1_2440_30~1000 17 BLE_1M_Ant1_2440_1000~26500 BLE_1M_Ant1_2480_0~Reference BLE_1M_Ant1_2480_30~1000 18 BLE_1M_Ant1_2480_1000~26500 19 Appendix G: Duty Cycle Test Result TestMode Antenna Freq(MHz) ON Time [ms] Period [ms] X DC [%] xFactor Limit Verdict BLE_1M Ant1 2402 0.41 0.62 0.6613 66.13 1.80 --- --- 2440 0.41 0.62 0.6613 66.13 1.80 --- --- 2480 0.42 0.63 0.6667 66.67 1.76 --- --- 20 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 21 22 Appendix H: Emissions in Restricted Bands Test Result TestMod e Antenn a ChNam e Freq(MH z) Detector Freq [MHz] Result [dBm] Gain [dB] DC Factor [dB] Result [dBuV/m] Limit [dBuV/m] Verdict BLE_1M Ant1 Low 2402 AV 2310.000 -59.95 2.66 1.80 39.71 ≤54 PASS AV 2365.205 -58.19 2.66 1.80 41.47 ≤54 PASS AV 2390.000 -59.82 2.66 1.80 39.84 ≤54 PASS Peak 2310.000 -51.39 2.66 0.00 46.47 ≤74 PASS Peak 2366.150 -48 2.66 0.00 49.86 ≤74 PASS Peak 2390.000 -48.26 2.66 0.00 49.6 ≤74 PASS High 2480 AV 2483.500 -57.51 2.66 1.76 42.11 ≤54 PASS AV 2484.240 -56.75 2.66 1.76 42.87 ≤54 PASS AV 2500.000 -59.29 2.66 1.76 40.33 ≤54 PASS Peak 2483.500 -49.15 2.66 0.00 48.71 ≤74 PASS Peak 2485.920 -46.45 2.66 0.00 51.41 ≤74 PASS Peak 2500.000 -49.15 2.66 0.00 48.71 ≤74 PASS Note： 1. The limit in dBm for average detector is conversion from 54dBuV/m, according to 15.209(a). The limit in dBm for peak detector is 20dB above the limit of average detector in dBm. 23 Test Graphs BLE_1M_Ant1_Low_2402_AV BLE_1M_Ant1_Low_2402_Peak BLE_1M_Ant1_High_2480_AV 24 BLE_1M_Ant1_High_2480_Peak

FCC ID: 2BB8VN1 Test Setup Photos of the EUT FCC ID: 2BB8VN1 FCC ID: 2BB8VN1