2BBXN-D8Bluetooth Headset

Thisdevicecomplieswithpart15oftheFCCRules.Operationissubjecttothe followingtwoconditions:(1)thisdevicemaynotcauseharmfulinterference,and (2)thisdevicemustacceptanyinterferencereceived,includinginterferencethat maycauseundesiredoperation. Anychangesormodificationsnotexpresslyapprovedbythepartyresponsiblefor compliancecouldvoidtheuser'sauthoritytooperatetheequipment. NOTE:Thisequipmenthasbeentestedandfoundtocomplywiththelimitsfora ClassBdigitaldevice,pursuanttoPart15oftheFCCRules.Theselimitsare designedtoprovidereasonableprotectionagainstharmfulinterferenceina residentialinstallation.Thisequipmentgenerates,usesandcanradiateradio frequencyenergyand,ifnotinstalledandusedinaccordancewiththeinstructions, maycauseharmfulinterferencetoradiocommunications.However,thereisno guaranteethatinterferencewillnotoccurinaparticularinstallation. Ifthisequipmentdoescauseharmfulinterferencetoradioortelevisionreception, whichcanbedeterminedbyturningtheequipmentoffandon,theuseris encouragedtotrytocorrecttheinterferencebyoneormoreofthefollowing measures: --Reorientorrelocatethereceivingantenna. --Increasetheseparationbetweentheequipmentandreceiver. --Connecttheequipmentintoanoutletonacircuitdifferentfromthattowhich thereceiverisconnected. --Consultthedealeroranexperiencedradio/TVtechnicianforhelp. ThedevicehasbeenevaluatedtomeetgeneralRFexposurerequirement.The devicecanbeusedinportableexposureconditionwithoutrestriction

Attestation Statements (Jul. 05, 2023) TO: Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046, USA RE: Attestation Statements Part 2.911(d)(7) request for (FCC ID:2BBXN-D8) (Shenzhen Landiao Electronic Technology Co, LTD), the undersigned, hereby authorize (STEYR INC) to act as our designated U.S. agent for service of process, (Shenzhen Landiao Electronic Technology Co, LTD) accepts to maintain an agent for no less than one year after the grantee has terminated all marketing and importation or the conclusion of any Commission-related proceeding involving the equipment. (STEYR INC) accepts the responsibility to act as designated U.S. agent for service of process, provides an agent for no less than one year after the grantee has terminated all marketing and importation or the conclusion of any Commission-related proceeding involving the equipment. Applicant Information： Company name: Shenzhen Landiao Electronic Technology Co, LTD Contact Name: shen longchang Address: 406 Xuda high-end Intelligent Manufacturing Industrial Park, Gushu Xiwai Park, Xixiang Street, Baoan District, Shenzhen, Guangdong Province Telephone No: 13538214502 Email: [email protected] U.S. Agent Information: Company Name: STEYR INC Address: 1312 17th Street #692, Denver, CO 80202, United States Contact Name: Fairy Lee Telephone No: (303) 731-9873 Email: [email protected] FRN: 0033737586 Applicant Signature: Applicant printed name: shen longchang Agent printed name: Fairy Lee

Shenzhen Landiao Electronic Technology Co, LTD Model Difference Data：2023.07.05 Product description: Bluetooth Headset Model name: D8, D6, D9, D10, D11, D12, D13, D15, D16, D18, Q11, L9, L19 Trade Name: N/A FCC ID: 2BBXN-D8 All the model are the same circuit and RF module, except model names . Regards Sincerely Client’s signature : Client’s name / title : shen longchang（Product manager） Contact information / address：406 Xuda high-end Intelligent Manufacturing Industrial Park, Gushu Xiwai Park, Xixiang Street, Baoan District, Shenzhen, Guangdong Province

Shenzhen Landiao Electronic Technology Co, LTD (2023.07.05) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (Bluetooth Headset / D8, D6, D9, D10, D11, D12, D13, D15, D16, D18, Q11, L9, L19/ FCC ID: 2BBXN-D8) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☒ Internal Photos ☐ NOTE 1 ☒ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: shen longchang Title: Product manager

Shenzhen Landiao Electronic Technology Co, LTD (2023.07.05) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen CTB Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: shen longchang Title: Product manager

External Photos

FCC ID LABEL: Label Location: FCC ID: 2BBXN-D8 Model No.: D8

Internal Photos L R ANT ANT

Shenzhen CTB Testing Co., Ltd. FCC ID:2BBXN-D8 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. EDR: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 -0.563 0.88 0±1 1.00 1.26 <5 0.39023 3.00 YES 2.441 -0.692 0.85 0±1 1.00 1.26 <5 0.39338 3.00 YES 2.480 -0.123 0.97 0±1 1.00 1.26 <5 0.39651 3.00 YES 2.402 0.244 1.06 0±1 1.00 1.26 <5 0.39023 3.00 YES 2.441 0.129 1.03 0±1 1.00 1.26 <5 0.39338 3.00 YES 2.480 0.702 1.18 0±1 1.00 1.26 <5 0.39651 3.00 YES 2.402 0.557 1.14 0±1 1.00 1.26 <5 0.39023 3.00 YES 2.441 0.55 1.14 0±1 1.00 1.26 <5 0.39338 3.00 YES 2.480 1.074 1.28 1±1 2.00 1.58 <5 0.49918 3.00 YES GFSK π /4DQPSK 8DQPSK Conclusion: For the max result : 0.49918≤ FCC Limit 3.0 for 1g SAR.

_______________________________________________________________________________________________________ Application: WLAN, 802.11b/g, Bluetooth, etc... Features SMD, high reliability, ultra Impact, Omni-directional... Part number AAN 2012 P (1) (2) (3) (4) 2G45 (5) (1)Product Type Chip Antenna (2)Size Code 2.0x1.2mm (3)Type Code (4)Packing Paper &Reel (5)Frequency 2.45GHz (6)Internal code Electrical Specification Working Frequency Range Peak Gain Impedance 50 Ohm Return loss 10 dB ( Min) Polarization Linear Azimuth Beamwidth Omni-directional Operation Temperature(°C) -40 ~85°C The specification is defined on EVB. Dimension and Terminal Configuration 2.4GHz 2012 Chip Antenna: AAN2012F0P2G45 F0 F0 1.32 dBi (Typ.) 2400 ~2483MHz _______________________________________________________________________________________________________ Evaluation Board Reference PCB Dimension Antenna Layout Reference Unit :mm Unit :mm Electrical Characteristics Return Loss & Radiation Return Loss Frequency (MHz) S11 (dB) 2400 -10.78 2442 -24.81 2484 -10.24 Radiation M 3 M 2 M 1 dB -10.243 GHz2.484000M 3 dB -24.812 GHz2.442000M 2 dB -10.776 GHz2.400000M 1 S11 Cal int Offs Invisible Ref 0 dB Ref 0 dB 10 dB / 10 dB / dB Mag dB Mag S11 S22 Trc3 Trc2 3 GHzStop2 GHzStartCh10 dBm Pwr 1 0 41 31 21 11 1 -9 -19 -29 -39 2.4GHz 2012 Chip Antenna: AAN2012F0P2G45 _______________________________________________________________________________________________________ Taping Specifications Reel and Taping Specification Reel Specification TYPE SIZE A ψB ψC ψD W ψM 2012 7” 5K/Reel 2.0±0.5 13.5±1.0 21±1.0 60±1.0 11.5±2.0 178±2.0 Tapping Specification Packaging Type A B W E F G H T ψD P Paper Type 20121.90±0.20 3.50±0.20 8.0±0.20 1.75±0.10 3.5±0.05 4.0±0.10 2.0±0.05 0.75±0.10 +0.10 1.50 -0 4.0±0.1 2.4GHz 2012 Chip Antenna: AAN2012F0P2G45 _______________________________________________________________________________________________________ Reliability Table Method 106 MIL-STD-202 specification. Fulfill the electrical No Visible Damage. 3. Measurement at 24 ± 2hrs after test condition. 2. Time: 500 ± 24 hours. 1. Humidity: 85% R.H., Temperature: 85 ± 2 °C. Bias Humidity Method 213 MIL-STD-202No Visible Damage. Waveform: Half-sine Velocity change: 15.4 ft/s Duration: 0.5ms Peak value: 1,500g’s mutually perpendicular axes of the test specimen (18 shocks) Three shocks in each direction shall be applied along the three Shock Mechanical Method 204 MIL-STD-202No Visible Damage. Hz. mounted within 2" from any secure point. Test from 10-2000 side and 2 secure points at corners of opposite sides. Parts Note: Use 8"X5" PCB .031" thick 7 secure points on, one long 5g's for 20 min., 12 cycles each of 3 orientationsVibration 4.10 IEC 60384-21/22No Visible Damage. Dipping time: 5 ± 0.5s Solder temperature: 260 ± 5°C. Preheating time: 1~2 min. Preheating temperature: 150 ± 10°C. (RSH) Resistance Soldering Heat 4.10 IEC 60384-21/22 area of bottom side. over 95% of the critical The solder should cover b. Dipping time: 3 ± 0.5s a. Temperature: 235 ± 5°C Dipping method: (SMD Bottom Side) Solderability 108 MIL-STD-202 specification. Fulfill the electrical No Visible Damage. 3. Measurement at 24 ± 2 hours after test. .°C2. Unpowered: 500hours @ T= -30 1. Initial measure: Spec: refer Initial spec. Storage Low Temperature 108 MIL-STD-202 specification. Fulfill the electrical No Visible Damage. 3. Measurement at 24 ± 2 hours after test. .°C2. Unpowered; 500hours @ T=+85 1. Initial measure: Spec: refer Initial spec. Exposure High Temperature JA104 JESD22 specification. Fulfill the electrical No Visible Damage. 3. Measurement at 24 ± 2Hours after test condition. ), Soak Mode=1 (2 Cycle/hours).°C to +85°C2. 100 Cycles (-30 1. Initial measure: Spec: refer Initial spec. Cycling Temperature 107 MIL-STD-202 specification. Fulfill the electrical No Visible Damage. 15 minutes at Upper category temperature. 15 minutes at Lower category temperature; ; 100 cycles;°C to +85°C-30 3. Rapid change of temperature test: 2. Initial measure: Spec: refer Initial spec. / 1 hr , then keep for 24 ± 1 hrs at room temp.°C50 ± 10 1. Preconditioning: Shock Thermal User Spec. specification Fulfill the electrical Characterization Electrical (Reference) Remark Ceramic Type Requirements ProcedureTest Item 2.4GHz 2012 Chip Antenna: AAN2012F0P2G45 _______________________________________________________________________________________________________ Revision History Revision Date Content 1 2015/8/20 New issue 2 2017/4/20 Update detail dimension on antenna layout 3 2018/3/1 Part number and coding rule updated JB100 JESD22 specification. In accordance with dimensions. equipment, capable of determining the actual specimen calipers, gauges, contour projectors, or other measuring Any applicable method using x10 magnification, micrometers, Dimension Physical 006 AEC-Q200 body/terminal junction. device body terminals and mechanical integrity of the for inspection of the greater may be employed Magnification of 20X or No Visible DamageForce of 1.8Kg for 60 seconds.Adhesion 005 No Visible Damage.AEC-Q200 2 mm. 2. Apply the load in direction of the arrow until bending reaches IR-Reflow. PCB Size (L:100 × W:40 × T:1.6mm) 1. Mounting method: (SMD) Flex Board 2.4GHz 2012 Chip Antenna: AAN2012F0P2G45

Shenzhen CTB Testing Technology Co., Ltd. Report No.:CTB230628021RFX Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 58 TEST REPORT Compiled by: Reviewed by: Approved by: Chen Zheng Arron Liu Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Product Name: Bluetooth Headset FCC ID: 2BBXN-D8 Trademark: N/A Model Number: D8, D6, D9, D10, D11, D12, D13, D15, D16, D18, Q11, L9, L19 Prepared For: Shenzhen Landiao Electronic Technology Co, LTD Address: 406 Xuda high-end Intelligent Manufacturing Industrial Park, Gushu Xiwai Park, Xixiang Street, Baoan District, Shenzhen, Guangdong Province Manufacturer: Shenzhen Landiao Electronic Technology Co, LTD Address: 406 Xuda high-end Intelligent Manufacturing Industrial Park, Gushu Xiwai Park, Xixiang Street, Baoan District, Shenzhen, Guangdong Province Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Jun. 19, 2023 Sample tested Date: Jun. 19, 2023 to Jun. 28, 2023 Issue Date: Jun. 28, 2023 Report No.: CTB230628021RFX Test Standards FCC Part15.247 ANSI C63.10:2013 Test Results PASS Remark: This is Bluetooth radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.:CTB230628021RFX Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 58 TABLE OF CONTENT Test Report Declaration Page 1. VERSION .......................................................................... 4 2. TEST SUMMARY ................................................................... 5 3. MEASUREMENT UNCERTAINTY ..................................................... 6 4. PRODUCT INFORMATION AND TEST SETUP .......................................... 7 4.1 Product Information .................................................................... 7 4.2 Test Setup Configuration ............................................................... 7 4.3 Support Equipment .................................................................... 7 4.4 Channel List .......................................................................... 8 4.5 Test Mode ............................................................................ 8 4.6 Test Environment ...................................................................... 8 5. TEST FACILITY AND TEST INSTRUMENT USED ....................................... 9 5.1 Test Facility ........................................................................... 9 5.2 Test Instrument Used .................................................................. 9 6. AC POWER LINE CONDUCTED EMISSION ............................................ 11 6.1 Block Diagram Of Test Setup .......................................................... 11 6.2 Limit ................................................................................ 11 6.3 Test procedure ....................................................................... 11 6.4 Test Result .......................................................................... 13 7. RADIATED SPURIOUS EMISSION ................................................... 15 7.1 Block Diagram Of Test Setup .......................................................... 15 7.2 Limit ................................................................................ 15 7.3 Test procedure ....................................................................... 16 7.4 Test Result .......................................................................... 17 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS .......................... 26 8.1 Block Diagram Of Test Setup .......................................................... 26 8.2 Limit ................................................................................ 26 8.3 Test procedure ....................................................................... 26 8.4 Test Result .......................................................................... 27 9. COUDUCTED PEAK OUTPUT POWER ............................................... 34 9.1 Block Diagram Of Test Setup .......................................................... 34 9.2 Limit ................................................................................ 34 9.3 Test procedure ....................................................................... 34 9.4 Test Result .......................................................................... 35 10. 20DB OCCUPIED BANDWIDTH...................................................... 39 10.1 Block Diagram Of Test Setup ......................................................... 39 10.2 Limit ............................................................................... 39 10.3 Test procedure ...................................................................... 39 10.4 Test Result ......................................................................... 39 11. CARRIERFREQUENCIES SEPARATION .............................................. 43 11.1 Block Diagram Of Test Setup ......................................................... 43 11.2 Limit ............................................................................... 43 11.3 Test procedure ...................................................................... 43 11.4 Test Result ......................................................................... 43 12. HOPPING CHANNEL NUMBER ....…

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Radiated Emission Below 1G Above 1G Conducted emissions