2BCAA-J08Wireless Headphones

� UI8 06 � � UIUI 06 � 鲍勃和蒂姆系列耳机套装 说明书 m院可 •· 为早眺电：将耳机放入充电仓，合上盖子，充电 仓亮红灯，自动进入充电状态。 •· 为充电仓充电：充电时，充电仓指示灯／显示屏闪烁， 充电完成 ， 指示灯／显示屏长亮 。 查看电量 •· 耳机电量：耳机连接手机后，可在手机状态栏查看 耳机电量。 注意：手机状态栏仅显示两只耳机的电量，部分手机 可能不支持。 ．充电仓电昼：将耳机放入充电仓，充电仓合盖时； ＠充电仓指示灯常亮约 1 0 秒／显示屏显示 100%, 表示电量充足 ； ＠充电仓 指示灯闪烁或不亮 ，显示 屏 显示低数值 表示电量低，需及时充电。 匹 ．连接新设备 講耳机开机，耳机等待连接。 ＠开启设备蓝牙，搜索并连接该耳机蓝牙名(J08)。 ｀连接中断 当设备关闭蓝牙或超出耳机连接范围时，耳机自动进 入等待连接的状态；若5分钟内未连接到任何设备， 耳机自动关机。 ｀自动回连 打开充电盒，耳机在充电仓中，（或拿出再放入充电 仓），将自动回连最近 一 次连接过的蓝牙设备。 提示：若耳机不能与设备自动回连，需在设备的蓝牙 界面进行手动连接。 产品操作说明 ＿ 开机 关机 音量加减 上下牲 涽放l哲淳拨号 接电话 拒绝电话 s,n功能 耳机配对 打开充电仓（或将耳机提起再放入充电 仓），耳机自动开机。长按耳机触摸键 2S, 手动开机。 耳机放回充电仓，充电仓合签，耳机自 动断连并进入休眠状态。长按耳机触摸 键ss, 手动关机。 三击右边为加，三击左边为减 双击左边为上 一 曲双击右边为下 一 曲 单击 来电时单击 来电时长按两秒 长按2秒郎 — 声 耳机出仓自动氏对 花（戏届呈 e 中国制造 MADE IN CHINA 产品型号： J08 授权商 ： 深圳市亿觅科技有限公司 蓝牙版本： V5.4 制造商 ： 深圳市亿觅科技有限公司 蓝牙传输距离： IOM 地址 ： 深圳市南山区粤海街道滨海社区 耳机电池容量： 25mAh 海天一路11、13、15号 充电盒容量： 250mAh 深圳市软件产业 基地5栋C座20 5-7 充电时间：l 一 2 小时 通话时间： 4- 5 小时 用户姓名： 联系电话： 购买日期： 保修原因： 保修卡 其它信息： 本产品严格执行国家三包政策 我们格优先处理信总完整的保修用户，所以为了 毙更快的进行售后保障，清一定详细填写此卡片 产品最终解释权归本公苛所有 谓善保管质保卡，我们将以质保卡为保修凭证 ` ► I 69.937 mm 』 i 350mm EMIE HEADPHONE SET headset manual Use charging 1.Charge the TWS: put the speaker's ear into the charging chamber, close the cover, the charging chamber will light up red, and it will automatically enter the charging state 2.Charging the case: When charging, the red indicator light /display screen flashes, the charging is complete, and the indicator light/display screen stays on. Check power earphone power: After the earphone is connected to the phone, you can check the earphone power in the phone status bar. The case power:Put the earphone into the charging case, and when the charging case is closed The charging compartment indicator light stays on for about 10 seconds/the display screen shows 100%, indicating that the battery is sufficient; the indicator light on the charging case flashes or is off, and the display shows a low value, it indicates that the battery is low and needs to be charged p romptly. Connect the new device Turn on the earphone and wait for connection. Turn on the device Bluetooth, search and connect the earphone Bluetooth name (JQ8 l . Connection interrupted When the device turns off Bluetooth or the earphone connection range is exceeded, the earphone will automatically enter the status of waiting for connection. If no device is connected within 5 minutes, the earphone will automatically turn off. Product Operating Instructions Power on: open the charging case, the earphone will power on automatically, long press the earphone touch key for 25, and power on manually, Power off: put the earphone back into the charging case, close the charging case, and the earphone will automatically disconnect and enter the sleep state. Press and hold the earphone touch key for Ss to manually turn off the earphone. Volume increase or decrease: three clicks on the right side means increase, and three clicks on the left side means decrease Up and down music: Double click the left for the previous music, double click the right for the next music Play/pause : 1 Click Answer the call: click when calling Reject call: press for two seconds SIRI function: press for 2 seconds and beep Earphone pairing: automatic pairing of earphone out of case. �cE: 坐呈 0 中国制造 MADE IN CHINA Product Model:JOB Wi reless version: VS.4 Wireless Distance: lOM Earphone ba ttery capacity: 25mAh Battery capacity: 250mAh Charging time: 1-2 hours Talk time: 4-5 hours Shenzhen E rnie Technology Co., Ltd. Room 205-7, Building SC, Shenzhen Software Industry Base, Binhai Community, Yuehai Subdistrict, Na nshan District, Shenzhen, Guangdong Province, China ` ► I 69.937 mm 』 i 350mm FCC Warning This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Any Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -Reorient or relocate the receiving antenna. -Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or an experienced radio/TV technician for help. The device has been evaluated to meet general RF exposure requirement. The device can be used in portable exposure condition without restriction.

LocalRepresentativeLetter ForCertificationServiceintheUSA FederalCommunicationsCommission EquipmentAuthorizationDivision,ApplicationProcessingBranch 7435OaklandMillsRoad Columbia,MD21048 Towhomitmayconcern PursuanttoSection2.911(d)(7),oftheCommission’sRules(47C.F.R.)weattestasfollowsfor theproductlistedbelow: FCCIDModelname 2BCAA-J08J08,J01,J02,J03,J04,J05,J06,J07,J09,J10, J11,J12,J13,J14,J15,J16,J17,J18,J19,J20 Weherebyacknowledgeasfollows: i.bothsigneesconfirmthatthepointofcontactacceptsresponsibilitytoactasaUS- AmericanRepresentativeonbehalfoftheapplicant ii.thepointofcontactprovidesthephysicalU.S.addressandemailaslistedbelow iii.bothpartiesmaintaintherequirementsofthisagreementfornolessthanoneyear afterthegranteehasterminatedallmarketingandimportationortheconclusionof anyCommission-relatedproceedinginvolvingtheequipment. iv.Anexpirationdateforthisletterdoesnotexist.IncasetheU.S.agentchanges,the granteeisobligatedtonotifytheFCCwithin30daysviathegrantingTCB. US-AmericanPointofContactApplicant/ApprovalHolder SignatureDate:2026-1-29SignatureDate:2026-1-29 CompanyName:GLOCERTSTECHNOLOGYINCShenzhenEmieTechnology Co,Ltd FRN:00363397370033918798 ContactName:HuiyingFanMinXiong Address:19784SUNKISSEDRIDGEDR, RIVERSIDE,CA92507UnitedStates No.3609BaishiRoad,High-tech ZoneCommunity,YuehaiStreet, NanshanDistrict,Shenzhen, China Phone:(626)588-8039+8615019468498 Email:[email protected]@newme.cc

Page 1 of 5FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China External Photos Photo 1 Photo 2 Page 2 of 5FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 3 Photo 4 Page 3 of 5FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 5 Photo 6 Page 4 of 5FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 7 Photo 8 Page 5 of 5FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 9 Photo 10 ------End------

Label FCCID:2BCAA-J08

Page 1 of 4FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Internal Photos Photo 1 Photo 2 Page 2 of 4FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 3 Photo 4 BT AntennaBT Antenna Page 3 of 4FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 5 Photo 6 Page 4 of 4FCC ID: 2BCAA-J08 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 7 Photo 8 ------End------

Page1of8ReportNo.:AiTDG-260119003W2 Note:Thisdevicehasbeentestedandfoundtocomplywiththestandard(s)listed,thistestreportmerelycorrespondstothe testsample.Itisnotpermittedtocopyextractsofthesetestresultwithoutthewrittenpermissionofthetestlaboratory.This reportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofDongguanYaxu(AiT)TechnologyLimited.Ifthere isaneedtoalterorrevisethisdocument,therightbelongstoDongguanYaxu(AiT)TechnologyLimited,anditshouldgivea priorwrittennoticeoftherevisiondocument.Thistestreportmustnotbeusedbytheclienttoclaimproductendorsement. DongguanYaxu(AiT)TechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,HepingCommunity,FuhaiStreet,Bao'anDistrict,Shenzhen, Guangdong,China. RFExposureevaluation ProductName: WirelessHeadphones BrandName: N/A Model: J08 SeriesModel: J01,J02,J03,J04,J05,J06,J07,J09,J10,J11,J12,J13,J14,J15,J16, J17,J18,J19,J20 FCCID: 2BCAA-J08 Applicant: ShenzhenEmieTechnologyCo,Ltd Address: No.3609BaishiRoad,High-techZoneCommunity,YuehaiStreet, NanshanDistrict,Shenzhen,China Manufacturer: ShenzhenEmieTechnologyCo,Ltd Address: No.3609BaishiRoad,High-techZoneCommunity,YuehaiStreet, NanshanDistrict,Shenzhen,China Standard(s): 47CFR§1.1310,47CFR§2.1093 KDB447498D01GeneralRFExposureGuidancev06 DateofReceipt: Jan.19,2026 DateofTest: Jan.19,2026~Jan.26,2026 IssuedDate: Jan.27,2026 IssuedBy: GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,HepingCommunity,FuhaiStreet, Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-769-82020499Fax.:+86-769-82020495 Reviewedby:Approvedby: Aalen.YeAllenWang Page 2 of 8 ReportNo.:AiTDG-260119003W2 ReportReviseRecord ReportVersionIssuedDateNotes V1.0Jan.27,2026InitialRelease Page 3 of 8 ReportNo.:AiTDG-260119003W2 Contents 1GENERALINFORMATION.............................................................................................................................................4 1.1ENVIRONMENTALCONDITIONS........................................................................................................................................4 1.2GENERALDESCRIPTIONOFEUT......................................................................................................................................4 1.3TESTFACILITY...............................................................................................................................................................5 1.4MEASUREMENTUNCERTAINTY........................................................................................................................................6 2METHODOFMEASUREMENT......................................................................................................................................7 2.1APPLICABLESTANDARD.................................................................................................................................................7 2.2EVALUATIONMETHODANDLIMIT...................................................................................................................................7 2.3MANUFACTURINGTOLERANCE........................................................................................................................................8 2.4EVALUATIONRESULT......................................................................................................................................................8 2.5CONCLUSION................................................................................................................................................................8 Page 4 of 8 ReportNo.:AiTDG-260119003W2 1GENERALINFORMATION 1.1Environmentalconditions Duringthemeasurementtheenvironmentalconditionswerewithinthelistedranges: NormalTemperature:25°C RelativeHumidity:55% AirPressure:101kPa 1.2GeneralDescriptionofEUT ProductName: WirelessHeadphones Model/Type reference: J08 SerialModel: J01,J02,J03,J04,J05,J06,J07,J09,J10,J11,J12,J13,J14,J15,J16, J17,J18,J19,J20 PowerSupply: ChargingCase: Input:USBDC5.0V 3.7Vby250mAhRechargeableLi-ionBattery Earphones: 3.7Vby25mAhRechargeableLi-ionBattery Hardwareversion.:N/A Softwareversion.:N/A Testsample(s)ID:AiTDG-260119003-1 BT: Modulation:GFSK,π/4-DQPSK,8-DPSK Operationfrequency:2402MHz-2480MHz Channelnumber:79Channels Channelseparation:1MHz Antennatype:ChipAntenna Antennagain:2.7dBi Remark:TheaboveDUT'sinformationwasdeclaredbymanufacturer.Formoredetailedfeatures description,pleaserefertothemanufacturer’sspecificationsortheUser'sManual. Page 5 of 8 ReportNo.:AiTDG-260119003W2 1.3TestFacility TestLaboratory: GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,HepingCommunity,FuhaiStreet,Bao'an District,Shenzhen,Guangdong,China Thetestfacilityisrecognized,certifiedoraccreditedbythefollowingorganizations: FCC-RegistrationNo.:251906DesignationNumber:CN1376 GuangdongAsiaHongkeTestTechnologyLimitedhasbeenregisteredandfullydescribedinareport filedwiththe(FCC)FederalCommunicationsCommission.TheacceptanceletterfromtheFCCis maintainedinourfiles. IC-RegistrationNo.:31737CABidentifier:CN0165 The3mSemi-anechoicchamberofGuangdongAsiaHongkeTestTechnologyLimitedhasbeen registeredbyCertificationandEngineeringBureauofIndustryCanadaforradioequipmenttestingwith RegistrationNo.:31737 A2LA-LabCert.No.:7133.01 GuangdongAsiaHongkeTestTechnologyLimitedhasbeenaccreditedbyA2LAfortechnical competenceinthefieldofelectricaltesting,andprovedtobeincompliancewithISO/IEC17025:2017 GeneralRequirementsfortheCompetenceofTestingandCalibrationLaboratoriesandanyadditional programrequirementsintheidentifiedfieldoftesting. Page 6 of 8 ReportNo.:AiTDG-260119003W2 1.4Measurementuncertainty Thedataandresultsreferencedinthisdocumentaretrueandaccurate.Thereaderiscautionedthat theremaybeerrorswithinthecalibrationlimitsoftheequipmentandfacilities.Themeasurement uncertaintywascalculatedforallmeasurementslistedinthistestreportaccordingtoCISPR16- 4“Specificationforradiodisturbanceandimmunitymeasuringa…

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Page 1 of 38Report No.: AiTDG-260119003W1 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China TEST REPORT Client Information: Applicant:Shenzhen Emie Technology Co,Ltd Applicant add.: No. 3609 Baishi Road, High-tech Zone Community, Yuehai Street, Nanshan District, Shenzhen, China Manufacturer:Shenzhen Emie Technology Co,Ltd Manufacturer add.: No. 3609 Baishi Road, High-tech Zone Community, Yuehai Street, Nanshan District, Shenzhen, China Product Information: Product Name:Wireless Headphones Model No.: J08, J01, J02, J03, J04, J05, J06, J07, J09, J10, J11, J12, J13, J14, J15, J16, J17, J18, J19, J20 Brand Name:N/A FCC ID: 2BCAA-J08 Applicable standards: FCC CFR Title 47 Part 15 Subpart C Section 15.247 Prepared By: Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Tel.: +86 0755-230967639Fax.: +86 0755-230967639 Date of Receipt: Jan. 19, 2026Date of Test: Jan. 19, 2026~Jan. 26, 2026 Date of Issue:Jan. 27, 2026Test Result: Pass This device described above has been tested by Guangdong Asia Hongke Test Technology Limited and the test results show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is applicable only to the tested sample identified in the report. Note: This report shall not be reproduced except in full, without the written approval of Guangdong Asia Hongke Test Technology Limited, this document may be altered or revised by Guangdong Asia Hongke Test Technology Limited, personal only, and shall be noted in the revision of the document. This test report must not be used by the client to claim product endorsement. Reviewed by:Approved by: Aalen.YeAllen Wang Page 2 of 38Report No.: AiTDG-260119003W1 Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China 1 Contents Page COVER PAGE 1 CONTENTS......................................................................................................................................................................2 2 TEST SUMMARY............................................................................................................................................................4 2.1Statement of the Measurement Uncertainty................................................................................ 4 2.2Measurement Uncertainty............................................................................................................ 4 3 TEST FACILITY..............................................................................................................................................................5 3.1Deviation from standard............................................................................................................... 5 3.2Abnormalities from standard conditions.......................................................................................5 3.3Test Location.................................................................................................................................5 4 GENERAL INFORMATION...........................................................................................................................................6 4.1Test frequencies............................................................................................................................7 4.2EUT Peripheral List.......................................................................................................................8 4.3Test Peripheral List.......................................................................................................................8 4.4TEST METHODOLOGY...............................................................................................................9 4.5Description of Test Modes..........................................................................................................10 5 EQUIPMENT USED DURING TEST.........................................................................................................................11 6 TEST RESULTS AND MEASUREMENT DATA.....................................................................................................11 6.1Antenna requirement..................................................................................................................13 6.2Peak Power Measurement.........................................................................................................14 6.3Frequency Separation and 20 dB Bandwidth............................................................................15 6.4Number of Hopping Frequency..................................................................................................17 6.5Time of Occupancy (Dwell Time)............................................................................................... 18 6.6Conducted Spurious Emissions and Band Edges Test............................................................. 20 6.7Restrict-band Band-edge Measurements..................................................................................22 6.8Radiated Emissions Measurement............................................................................................ 24 6.9Conducted Emissions.................................................................................................................34 6.10 Pseudorandom frequency hopping sequence...........................................................................37 7 TEST SETUP PHOTOGRAPHS OF EUT.................................................................................................................38 8 EXTERNAL PHOTOGRAPHS OF EUT......................................…

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2.4GHz 2012 Chip Antenna: RANT0805F245S5 _ Application: WLAN, 802.11b/g, Bluetooth, WLAN, etc... Features SMD, high reliability, ultra Impact, Omni-directional... Part number Information RANT0805F245S5 (A)(B)(C)(D)(E)(F) Electrical Specification Dimension and Terminal Configuration No.Terminal Name 1Feeding/GNG 2GND/Feeding (A)Product TypeChip Antenna (B) Size Code 1.6x0.8mm( ± 0.1mm) (C) MaterialHigh K material (D) Frequency2.4 ~ 2.5GHz (E) Feeding modePIFA & Single Feeding (F) Antenna typeType=5 Working Frequency Range2400 ~2500 MHz Bandwidth120 MHz (Min.) Peak Gain2.7 dBi (Typ.) Impedance50 Ohm Return loss10 dB ( Min) PolarizationLinear Azimuth BeamwidthOmni-directional Operation Temperature(°C)-40 ~85°C Resistance to Soldering Heats 10sec. ( @ 280°C) TerminationNi / Au (Leadless) Dimension (mm) L 2.00±0.10 W 1.20±0.10 T 0.45±0.10 Manufacturer:RAIN International Technology Co., Ltd. Address: Building F, 709, Yuxing Technology Industrial Park, Nanchang Third Industrial Zone, Xiangxiang Sub-district, Bao'an District, Shenzhen City 2.4GHz2012 Chip Antenna:RANT 0805 F245 S5 _ 1 EvaluationBoardReference PCB DimensionUnit :mm ReturnLoss & Radiation 0805 footprint (ANT) 0805 footprint (ANT) 0805 footprint (ANT) 0805 footprint (ANT) 0805 footprint (ANT) 0805 footprint (ANT) 0805 footprint (ANT) 0805 footprint (ANT) 2.4GHz2012 Chip Antenna:RANT 0805 F245 S5 _ 2.4GHz2012 Chip Antenna:RANT 0805 F245 S5 _ TapingSpecifications Reel and TapingSpecification Reel Specification TYPESIZEABCD 16087”4K/Reel 4.0±0.5 4.0 ±213.5 ±0.5178 ±2 TappingSpecification PackagingTypeABWEFGHTψDP PaperType1608 1.90±0.203.50±0.208.0±0.201.75±0.103.5±0.054.0±0.102.0±0.050.75±0.10 1.50±0.10 4.0±0.1 2.4GHz2012 Chip Antenna:RANT 0805 F245 S5 _ ReliabilityTable Test ItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfillthe electrical specification UserSpec. Thermal Shock 1. Preconditioning: 50 ± 10°C/ 1 hr , then keepfor 24 ± 1 hrs at roomtemp. 2. Initialmeasure:Spec:refer Initialspec. 3. Rapidchangeof temperaturetest: -30°Cto +85°C; 100 cycles; 15 minutesat Lowercategorytemperature; 15 minutesat Uppercategorytemperature. No VisibleDamage. Fulfillthe electrical specification. MIL-STD-202 107 Temperature Cycling 1. Initialmeasure:Spec:refer Initialspec. 2. 100 Cycles(-30°Cto +85°C), SoakMode=1(2 Cycle/hours). 3. Measurementat 24 ± 2Hoursafter test condition. No VisibleDamage. Fulfillthe electrical specification. JESD22 JA104 High Temperature Exposure 1. Initialmeasure:Spec:refer Initialspec. 2. Unpowered;500hours@ T=+85°C. 3. Measurementat 24 ± 2 hoursafter test. No VisibleDamage. Fulfillthe electrical specification. MIL-STD-202 108 Low Temperature Storage 1. Initialmeasure:Spec:refer Initialspec. 2. Unpowered:500hours@ T= -30°C. 3. Measurementat 24 ± 2 hoursafter test. No VisibleDamage. Fulfillthe electrical specification. MIL-STD-202 108 Solderability (SMD BottomSide) Dippingmethod: a. Temperature:235 ±5°C b. Dippingtime:3 ±0.5s The soldershouldcover over 95% of the critical area of bottomside. IEC 60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150 ± 10 °C. Preheatingtime:1~2 min. Soldertemperature:260 ± 5°C. Dippingtime:5 ± 0.5s No VisibleDamage.IEC 60384-21/22 4.10 Vibration5g's for 20 min.,12 cycleseachof 3 orientations Note:Use 8"X5"PCB .031"thick 7 securepointson, one long side and 2 securepointsat cornersof oppositesides.Parts mountedwithin2" from any securepoint.Test from 10-2000 Hz. No VisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksin eachdirectionshall be appliedalongthe three mutuallyperpendicularaxesof the test specimen(18 shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4 ft/s Waveform:Half-sine No VisibleDamage.MIL-STD-202 Method213 Humidity Bias 1. Humidity:85% R.H.,Temperature:85 ± 2 °C. 2. Time:500 ± 24 hours. 3. Measurementat 24 ± 2hrs after test condition. No VisibleDamage. Fulfillthe electrical specification. MIL-STD-202 Method106 2.4GHz2012ChipAntenna:RANT0805F245S5 _ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds. NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12019/03/01NewDatasheet 22020/02/22Add2Dradiationcharacteristic

Guangdong Asia Hongke Test Technology Limited Report No.: AiTDG-260119003W1 FCC ID: 2BCAA-J08 Page 1 of 61 Appendix A RF Test Data for BT(BDR/EDR) (Conducted Measurement) Product Name: Wireless Headphones Trade Mark: N/A Test Model: J08 Environmental Conditions Temperature: 24.6  C Relative Humidity:52.4% ATM Pressure:100.0 kPa Test Engineer:Emiya Lin Supervised by:Simba Huang Guangdong Asia Hongke Test Technology Limited Report No.: AiTDG-260119003W1 FCC ID: 2BCAA-J08 Page 2 of 61 Contents Page COVER PAGE 1 Duty Cycle........................................................................................................................................................................................ 3 1.1Test Result............................................................................................................................................................................3 1.2Test Graphs...........................................................................................................................................................................4 2 Maximum Conducted Peak Output Power........................................................................................................................................ 9 2.1Test Result............................................................................................................................................................................9 2.2Test Graphs.........................................................................................................................................................................10 3 20dB Bandwidth..............................................................................................................................................................................15 3.1Test Result..........................................................................................................................................................................15 3.2Test Graphs.........................................................................................................................................................................16 4 Carrier Frequency Separation.........................................................................................................................................................21 4.1Test Result..........................................................................................................................................................................21 4.2Test Graphs.........................................................................................................................................................................22 5 Hopping Channel Number...............................................................................................................................................................24 5.1Test Result..........................................................................................................................................................................24 5.2Test Graphs.........................................................................................................................................................................25 6 Dwell Time...................................................................................................................................................................................... 27 6.1Test Result..........................................................................................................................................................................27 6.2Test Graphs.........................................................................................................................................................................28 7 RF Conducted Spurious Emissions.................................................................................................................................................31 7.1Test Result..........................................................................................................................................................................31 7.2Test Graphs......................................................................................................................................…

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