2BDCZ-D02short video remote controller

(Dongguan Tianrui Electronic Technology Co., Ltd) (October 27, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for (FCC ID: 2BDCZ-D02) [Dongguan Tianrui Electronic Technology Co., Ltd] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. Sincerely, (Applicant signature) (Applicant printed name) Danni Wu (Dongguan Tianrui Electronic Technology Co., Ltd) (October 27, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for (FCC ID: 2BDCZ-D02) [Dongguan Tianrui Electronic Technology Co., Ltd] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, (Applicant signature) (Applicant printed name) Danni Wu

Shenzhen LESHI Video Technology Co.,Ltd Model Difference Data：October 27, 2023 Product description: short video remote controller Model name: D02, D02Pro, D03, D03Pro, D05, D05Pro, D06, D06Pro, D07, D07Pro Trade Name: N/A FCC ID: 2BDCZ-D02 All the model are the same circuit and RF module, except model names . Regards Sincerely Client’s signature : Client’s name / title : Danni Wu（general manager） Contact information / address：1003, Building 3, Longjing Garden, No. 10, Shipai Park South Road, Shipai Town, Dongguan City, Guangdong Province

Dongguan Tianrui Electronic Technology Co., Ltd (October 27, 2023) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen CTB Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: Danni Wu Title: general manager

Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 4 Model: D02 External Photos Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 4 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 3 of 4 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 4 of 4

FCC ID LABEL: Label Location: FCC ID: 2BDCZ-D02 Model No.: D02

Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 4 Model: D02 Internal Photos Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 4 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 3 of 4 ANT Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 4 of 4

Shenzhen CTB Testing Co., Ltd. FCC ID: 2BDCZ-D02 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. BLE:1M Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 -2.814 0.52 -2±1 -1.00 0.79 <5 0.24622 3.00 YES 2.44 -2.8 0.52 -2±1 -1.00 0.79 <5 0.24816 3.00 YES 2.480 -2.731 0.53 -2±1 -1.00 0.79 <5 0.25018 3.00 YES GFSK 2M: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 -2.908 0.51 -2±1 -1.00 0.79 <5 0.24622 3.00 YES 2.44 -2.801 0.52 -2±1 -1.00 0.79 <5 0.24816 3.00 YES 2.480 -2.705 0.54 -2±1 -1.00 0.79 <5 0.25018 3.00 YES GFSK Conclusion: For the max result : 0.25018≤ FCC Limit 3.0 for 1g SAR.

2.4GHz 3216 Chip Antenna: AAN3216F3P2G45 ______________________________________________________________________________________________________ Application: WLAN, 802.11b/g, Bluetooth, etc... Features SMD, high reliability, ultra Impact, Omni-directional... Part number AAN 3216 - F3 P 2G45 (1) (2) (3) (4) (5) (1)Product Type Chip Antenna (2)Size Code 3.2x1.6mm (3)Type Code F3 (4)Packing Paper Tape (5)Frequency 2.45GHz Electrical Specification W orking Frequency Range 2400 ~2484 MHz Peak Gain 0.8 dBi (Typ.) Impedance 50 Ohm Return loss 10 dB ( Min) Polarization Linear Azimuth Beamwidth Omni-directional Operation Temperature(°C) -40 ~85°C The specification is defined on EVB. Dimension and Terminal Configuration Dimension (mm) No. Terminal Name L 3.15+-0.15 1 Feeding point W 1.55+-0.15 2 GND T 0.50+-0.10 A 0.35+-0.10 2.4GHz 3216 Chip Antenna: AAN3216F3P2G45 ______________________________________________________________________________________________________ Evaluation Board Reference PCB Dimension Antenna Layout Reference unit :mm Electrical Characteristics Return Loss & Radiation Return Loss Frequency (MHz) S11 (dB) 2400 -11.0 2442 -20.2 2484 -10.6 Radiation 2.4GHz 3216 Chip Antenna: AAN3216F3P2G45 ______________________________________________________________________________________________________ Taping Specifications Reel and Taping Specification Reel Specification TYPE SIZE A ψB ψC ψD W ψM 3216 7” 5K/Reel 2.0±0.5 13.5±1.0 21±1.0 60±1.0 11.5±2.0 178±2.0 Tapping Specification Packaging Type A B W E F G H T ψD P Paper Type 3216 1.90±0.20 3.50±0.20 8.0±0.20 1.75±0.10 3.5±0.05 4.0±0.10 2.0±0.05 0.75±0.10 +0.10 1.50 -0 4.0±0.1 2.4GHz 3216 Chip Antenna: AAN3216F3P2G45 ______________________________________________________________________________________________________ Reliability Table Test ItemProcedure Requirements Ceramic Type Remark (Reference) Electrical Characterization Fulfill the electrical specification User Spec. Thermal Shock 1. Preconditioning: 50 ± 10°C / 1 hr , then keep for 24 ± 1 hrs at room temp. 2. Initial measure: Spec: refer Initial spec. 3. Rapid change of temperature test: -30°C to +85°C; 100 cycles; 15 minutes at Lower category temperature; 15 minutes at Upper category temperature. No Visible Damage. Fulfill the electrical specification. MIL-STD-202 107 Temperature Cycling 1. Initial measure: Spec: refer Initial spec. 2. 100 Cycles (-30°C to +85°C), Soak Mode=1 (2 Cycle/hours). 3. Measurement at 24 ± 2Hours after test condition. No Visible Damage. Fulfill the electrical specification. JESD22 JA104 High Temperature Exposure 1. Initial measure: Spec: refer Initial spec. 2. Unpowered; 500hours @ T=+85°C. 3. Measurement at 24 ± 2 hours after test. No Visible Damage. Fulfill the electrical specification. MIL-STD-202 108 Low Temperature Storage 1. Initial measure: Spec: refer Initial spec. 2. Unpowered: 500hours @ T= -30°C. 3. Measurement at 24 ± 2 hours after test. No Visible Damage. Fulfill the electrical specification. MIL-STD-202 108 Solderability (SMD Bottom Side) Dipping method: a. Temperature: 235 ± 5°C b. Dipping time: 3 ± 0.5s The solder should cover over 95% of the critical area of bottom side. IEC 60384-21/22 4.10 Soldering Heat Resistance (RSH) Preheating temperature: 150 ± 10°C. Preheating time: 1~2 min. Solder temperature: 260 ± 5°C. Dipping time: 5 ± 0.5s No Visible Damage.IEC 60384-21/22 4.10 Vibration5g's for 20 min., 12 cycles each of 3 orientations Note: Use 8"X5" PCB .031" thick 7 secure points on, one long side and 2 secure points at corners of opposite sides. Parts mounted within 2" from any secure point. Test from 10-2000 Hz. No Visible Damage.MIL-STD-202 Method 204 Mechanical Shock Three shocks in each direction shall be applied along the three mutually perpendicular axes of the test specimen (18 shocks) Peak value: 1,500g’s Duration: 0.5ms Velocity change: 15.4 ft/s Waveform: Half-sine No Visible Damage.MIL-STD-202 Method 213 Humidity Bias 1. Humidity: 85% R.H., Temperature: 85 ± 2 °C. 2. Time: 500 ± 24 hours. 3. Measurement at 24 ± 2hrs after test condition. No Visible Damage. Fulfill the electrical specification. MIL-STD-202 Method 106 2.4GHz 3216 Chip Antenna: AAN3216F3P2G45 ______________________________________________________________________________________________________ Revision History Revision Date Content 1 2019/6/20 New issue Board Flex (SMD) 1. Mounting method: IR-Reflow. PCB Size (L:100 × W:40 × T:1.6mm) 2. Apply the load in direction of the arrow until bending reaches 2 mm. No Visible Damage.AEC-Q200 005 AdhesionForce of 1.8Kg for 60 seconds.No Visible Damage Magnification of 20X or greater may be employed for inspection of the mechanical integrity of the device body terminals and body/terminal junction. AEC-Q200 006 Physical Dimension Any applicable method using x10 magnification, micrometers, calipers, gauges, contour projectors, or other measuring equipment, capable of determining the actual specimen dimensions. In accordance with specification. JESD22 JB100

TEST REPORT Compiled by: Reviewed by: Approved by: Zhou Kui Arron Liu Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Product Name: short video remote controller FCC ID: 2BDCZ-D02 Trademark: N/A Model Number: D02, D02Pro, D03, D03Pro, D05, D05Pro, D06, D06Pro, D07, D07Pro Prepared For: Dongguan Tianrui Electronic Technology Co., Ltd Address: 1003, Building 3, Longjing Garden, No. 10, Shipai Park South Road, Shipai Town, Dongguan City, Guangdong Province Manufacturer: Dongguan Tianrui Electronic Technology Co., Ltd Address: 1003, Building 3, Longjing Garden, No. 10, Shipai Park South Road, Shipai Town, Dongguan City, Guangdong Province Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Oct. 11, 2023 Sample tested Date: Oct. 11, 2023 to Oct. 24, 2023 Issue Date: Oct. 24, 2023 Report No.: CTB231024056RFX Test Standards FCC Part15.247 ANSI C63.10:2013 Test Results PASS Remark: This is Bluetooth radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB231024056RFX Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 40 TABLE OF CONTENT Test Report Declaration Page 1. VERSION ........................................................................................................................................ 3 2. TEST SUMMARY ........................................................................................................................... 4 3. MEASUREMENT UNCERTAINTY ................................................................................................. 5 4. PRODUCT INFORMATION AND TEST SETUP ............................................................................ 6 4.1 Product Information .......................................................................................................................... 6 4.2 Test Setup Configuration .................................................................................................................. 6 4.3 Support Equipment........................................................................................................................... 6 4.4 Channel List ..................................................................................................................................... 7 4.5 Test Mode ........................................................................................................................................ 7 4.6 Test Environment ............................................................................................................................. 7 5. TEST FACILITY AND TEST INSTRUMENT USED ....................................................................... 8 5.1 Test Facility ...................................................................................................................................... 8 5.2 Test Instrument Used ....................................................................................................................... 8 6. AC POWER LINE CONDUCTED EMISSION ................................................................................ 10 6.1 Block Diagram Of Test Setup ......................................................................................................... 10 6.2 Limit ................................................................................................................................................ 10 6.3 Test procedure ............................................................................................................................... 10 6.4 Test Result ..................................................................................................................................... 12 7. RADIATED SPURIOUS EMISSION ............................................................................................. 14 7.1 Block Diagram Of Test Setup ......................................................................................................... 14 7.2 Limit ................................................................................................................................................ 14 7.3 Test procedure ............................................................................................................................... 15 7.4 Test Result ..................................................................................................................................... 16 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS ............................................... 23 8.1 Block Diagram Of Test Setup ......................................................................................................... 23 8.2 Limit ................................................................................................................................................ 23 8.3 Test procedure ............................................................................................................................... 23 8.4 Test Result ..................................................................................................................................... 24 9. COUDUCTED OUTPUT POWER ................................................................................................. 28 9.…

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Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 2 Model: D02 Radiated Emission Below 1G Above 1G Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 2 Conducted emissions