2BDXN-BASEAYN Thor

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Date:2025-12-10 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 Ref:AttestationStatementsPart2.911(d)(5)(i)Filing FCCID:2BDXN-BASE ToWhomItMayConcern: ShenzhenAYNTechnologiesCO.,Ltdcertifiesthattheequipmentforwhichauthorizationissoughtisnot “covered”equipmentprohibitedfromreceivinganequipmentauthorizationpursuanttosection2.903ofthe FCCrules. ShenzhenAYNTechnologiesCO.,Ltdcertifiesthattheequipmentforwhichauthorizationissoughtdoesnot includecybersecurityoranti-virussoftwareproducedorprovidedbyKasperskyLab,Inc.oranyofits successorsandassignees,includingequipmentwithintegratedKasperskyLab,Inc.(oranyofitssuccessors andassignees)cybersecurityoranti-virussoftwarepursuanttoDA-24-886andKDB986446D01Covered EquipmentGuidancesectionB(2a). Deviceisinherentlycompliantbasedonhardwarelimitationsorsoftwarecontrols. or ASoftwareBillofMaterials(SBOM)isprovidedtotheTCBforreview,and Theend-userorthirdpartiescannotinstalladditionalsoftwareonthisdevice. Sincerely, Signatory [NicoeChen,Manager]

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Date:2025-12-10 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA Ref:AttestationStatementsPart2.911(d)(5)(ii)Filing FCCID:2BDXN-BASE ToWhomItMayConcern: ShenzhenAYNTechnologiesCO.,Ltdcertifiesthat,asofthedateofthefilingoftheapplication,theapplicant isnotidentifiedontheCoveredList(asaspecificallynamedentityoranyofitssubsidiariesoraffiliates)asan entityproducing“covered”equipment. Sincerely, Signatory [NicoeChen,Manager]

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Date:2025-12-10 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA FCCID:2BDXN-BASE ApplicantFRN:0033821810 USAgent–AttestationStatement/Part2.911(d)(7) ShenzhenAYNTechnologiesCO.,Ltdcertifiesthat,asof2025-12-10,wehavedesignated FCCUSAgent,LLCtoacceptserviceofprocessonourbehalfforFCCID:2BDXN-BASE. ShenzhenAYNTechnologiesCO.,Ltd,acceptstomaintainanagentofserviceofprocessin theUnitedStatesfornolessthanoneyearaftereitherthegranteehaspermanentlyterminated allmarketingandimportationoftheapplicableequipmentwithintheU.S.,ortheconclusionof anyCommission-relatedadministrativeorjudicialproceedinginvolvingtheequipment, whicheverislater. FCCUSAgent,LLC,acceptsasofthedateofthefilingofthisapplication,theobligationof beingthedesignatedagentforthepurposeofacceptingserviceofprocessonbehalfof ShenzhenAYNTechnologiesCO.,LtdforFCCID:2BDXN-BASE. DesignatedAgentInformation: CompanyName:FCCUSAgent,LLC U.S.AgentFRN:0033402884 Address:3722IllinoisAvenue,SaintCharles,IL,60174,USA ContactPerson:TimPayne Phone:708-571-3148 Email:[email protected] Sincerely, Company:ShenzhenAYNTechnologies CO.,Ltd DesignatedAgent:FCCUSAgent,LLC CompanyRepresentative:NicoeChenDesignatedAgentRepresentative:TimPayne Signature:Signature:

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun ， Bao'an,Shenzhen,China AgentAuthorization Company:ShenzhenAYNTechnologiesCO.,Ltd Address:410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovation Park,Zone71,XingdongCommun ， Bao'an,Shenzhen,China ProductName:AYNThor ModelNumber(s):Base,Lite,Pro,Max ProductDescription:AYNThor WeauthorizeMiCOMLabsInc.,575BoulderCourt,Pleasanton,California94566,USA, toactonourbehalfonallmattersconcerningthecertificationofabovenamed equipment. WedeclarethatMiCOMLabsInc.isallowedtoforwardallinformationrelatedtothe approvalandcertificationofequipmenttotheregulatoryagenciesasrequiredandto discussanyissuesconcerningtheapprovalapplication.Anyandallactscarriedoutby MiCOMLabsonourbehalfshallhavethesameeffectasactsofourown. Signature:Date:2025-12-10 Name:NicoeChen Title:Manager Company:ShenzhenAYNTechnologiesCO.,Ltd

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Date:2025-12-10 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID:2BDXN-BASE ConfidentialityRequest Towhomitmayconcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,wearerequestingthe Commissiontowithholdthefollowingattachment(s)asconfidentialdocumentsfrompublicdisclosureindefinitely. ☒ BlockDiagram ☐ Tune-UpInformation ☒ OperationalDescription,SBOM ☐ SecurityInformation ☒ Schematics ☐ SoftwareDefinedRadio(SDR)Information ☒ PartsList Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleasedtothepublic.The publicdisclosureofthesematerialsmaybeharmfultotheapplicantandprovideunjustifiedbenefitstoits competitors. Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulationsinTitle47CFR §2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthatbusinesssensitiveinformation remainsconfidentialuntiltheactualmarketingofnewlyauthorizeddevices,werequestShortTermConfidentiality ofthefollowingattachment(s); ☒ ExternalPhotos ☒ TestSetupPhotos ☒ InternalPhotos ☒ UserManual ☐For45days,pursuanttoPublicNoticeDA04-1705. or ☒For180dayspursuanttoKDB726920D01. TheapplicantunderstandsthatpursuanttoSection0.457oftheRules,disclosureofthisapplicationandall accompanyingdocumentationwillnotbemadebeforethedateoftheGrantforthisapplication. ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Sincerely, Signatory [NicoeChen,Manager]

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Date:2025-12-10 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID:2BDXN-BASE POWEROFATTORNEY ToWhomItMayConcern: We,theundersigned,herebyauthorizeWaltekTestingGroup(Shenzhen)Co.,Ltd.JandySoonourbehalf,to applytotheFederalCommunicationsCommissiononourequipment.AnyandallactscarriedoutbyWaltek TestingGroup(Shenzhen)Co.,Ltd.JandySoonourbehalfshallhavethesameeffectasactsofourown. ThisistoadvisethatweareinfullcompliancewiththeAnti-DrugAbuseAct.We,ShenzhenAYNTechnologies CO.,LtdarenotsubjecttoadenialoffederalbenefitspursuanttoSection5301oftheAnti-DrugActof1988,21 USC853a,andnopartytotheapplicationissubjecttoadenialoffederalbenefitspursuanttothatsection. Sincerely, Signatory [NicoeChen,Manager]

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China ResponsibilityDeclarationLetterv1.0 ResponsibilityDeclarationLetter Companyname:ShenzhenAYNTechnologiesCO.,Ltd Address:410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovation Park,Zone71,XingdongCommun，Bao'an,Shenzhen,China ProductName:AYNThor FCCID:2BDXN-BASE Model(s):Base,Lite,Pro,Max We,ShenzhenAYNTechnologiesCO.,Ltd.herebyacknowledgethatalltheproduct information(includingalloriginal,drafted,ormodifieddocuments)providedtothe TCBeitherbyusorouragentorrepresentative(s)forthepurposesofFCC certificationwillmeetFCCregulationsandrequirements;andthatanymodifications orchangesmadeasaresultofTCBreviewofthedocumentswillbeformally implementedintothemanufacturingprocessandproductdocumentationshippedwith equipment.Wealsoconfirmthatallinformationprovidedislegitimateanddoesnot containanyfalsecontentsuchasforgery,fabrication,alteration,tamperingand concealment. Weassumealleconomicandlegalresponsibilitiesinmattersthatmayariseasa resultofdisclosureonsampleproductsandassociatedproductdocumentation providedforproductcertificationthatmaysubsequentlybefoundtobea mis-representationofthefinalproductandaccompanyingdocumentationwhen produced,marketed,orsoldintheUnitedStates,Canada,oranywhereintheworld. Yoursincerely, Name:NicoeChenDate:2025-12-10 TitleandCompanyname:Manager,ShenzhenAYNTechnologiesCO.,Ltd SignatureofFCCgrantholder(IncludeTitle,Companyname,date,andofficialcompanystamp):

ShenzhenAYNTechnologiesCO.,Ltd 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovationPark,Zone71,Xingdong Commun，Bao'an,Shenzhen,China Date:2025-12-10 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 SUBJECT:FCCApplicationforFCCID:2BDXN-BASE ToWhomItMayConcern: I,theundersigned,herebystatesthisequipmenthasbeentestedandfoundtocomplywiththelimitsfora ClassBdigitaldevice,pursuanttopart15oftheFCCRules,andwillapplytheSupplier'sDeclarationof ConformityproceduretotheclassBdevice.IunderstandthefollowingFCCrequirements: 1.DevicessubjecttotheSDoCprocedurearerequiredtobetestedtoshowcompliancewiththeFCC technicalregulationsbyarecognizedaccreditedtestinglaboratory.Thetestinglaboratorymustbe accreditedbyaCommissionapprovedaccreditationbodyordesignatedunderthetermsofa government-to-governmentMutualRecognitionAgreement(MRA).Alistingofthoseaccreditedtesting laboratoriesthathavebeenrecognizedbytheCommissionispublishedontheFCCWebpage: https://apps.fcc.gov/oetcf/eas/reports/TestFirmSearch.cfm(Selectthe"accredited"optiontosearchfor FCCrecognizedaccreditedtestfirms.) 2.Pt2.1077containsthelistofinformationthatmustbeincludedintheSupplier'sDeclarationof Conformity,whichmustbesuppliedwitheachproductsold.TheSDoCcomplianceinfoshallbeincluded intheUser’sManualorasaseparatesheet.Theinfomustcontainthename,address,andphone numberoftheresponsibleparty,whichmustbelocatedwithintheUnitedStates.Accordingto 2.909(b),theresponsiblepartyiseithertheManufactureroriftheproductisimportedtheImporter. Sincerely, Signatory [NicoeChen,Manager]

ReferenceNo.:WTX25X10275169WPage1of17 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT1-PRODUCTLABELING ProposedFCCIDLabelFormat FCCID:2BDXN-BASE Thisdevicecomplieswithpart15oftheFCCRules. Operationissubjecttothefollowingtwoconditions: (1)Thisdevicemaynotcauseharmfulinterference,and (2)Thisdevicemustacceptanyinterferencereceived, includinginterferencethatmaycauseundesiredoperation. Specifications:Thelabelshallbesecurelyaffixedtoapermanentlyattachedpartofthedevice,inalocation whereitisvisibleoreasilyaccessibletotheuser,andshallnotbereadilydetachable.Thelabelshallbe sufficientlydurabletoremainfullylegibleandintactonthedeviceinallnormalconditionsofusethroughout thedevice’sexpectedlifetime. ProposedLabelLocationonEUT FCCIDLabel Location

WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 35 TESTREPORT ReferenceNo.......................: WTX25X10275169W005 FCCID....................................:2BDXN-BASE Applicant...............................:ShenzhenAYNTechnologiesCo.,Ltd Address.................................: 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovation Park,Zone71,XingdongCommunity,Bao'an,Shenzhen,China Manufacturer........................ThesameasApplicant Address.................................ThesameasApplicant ProductName......................:AYNThor ModelNo...............................:Base Standards .............................. : FCCPart2.1093, IEEEStdC95.1:2019 IEEEC95.3:2021 DateofReceiptsample.....:2025-10-20 DateofTest...........................:2025-11-03to2025-11-27 DateofIssue ........................ :2025-11-28 TestReportFormNo.......... :WTX_Part2_1093W TestResult............................:Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbereproduced, exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithoutspecific stampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: LilyYang/ProjectEngineerJasonSu/Manager ReferenceNo.:WTX25X10275169W005 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 35 TABLEOFCONTENTS 1.GeneralInformation........................................................................................................................................................4 1.1ProductDescriptionforEquipmentUnderTest(EUT).............................................................................................4 1.2TestStandards.........................................................................................................................................................6 1.3TestMethodology....................................................................................................................................................6 1.4TestFacility..............................................................................................................................................................6 2.SummaryofTestResults...............................................................................................................................................7 3.SpecificAbsorptionRate(SAR)....................................................................................................................................8 3.1Introduction..............................................................................................................................................................8 3.2SARDefinition..........................................................................................................................................................8 4.SARMeasurementSystem............................................................................................................................................9 4.1TheMeasurementSystem.......................................................................................................................................9 4.2Probe.......................................................................................................................................................................9 4.3ProbeCalibrationProcess.....................................................................................................................................11 4.4Phantom.................................................................................................................................................................11 4.5DeviceHolder........................................................................................................................................................12 4.6TestEquipmentList...............................................................................................................................................13 5.TissueSimulatingLiquids...........................................................................................................................................14 5.1CompositionofTissueSimulatingLiquid...............................................................................................................14 5.2TissueDielectricParametersforHeadandBodyPhantoms.................................................................................15 5.3TissueCalibrationResult.......................................................................................................................................16 6.SARMeasurementEvaluation.....................................................................................................................................17 6.1PurposeofSystemPerformanceCheck................................................................................................................17 6.2SystemSetup.........................................................................................................................................................17 6.3ValidationResults..................................................................................................................................................18 7.EUTTestingPosition....................................................................................................................................................19 7.1BodyPosition.........................................................................................................................................................19 7.2EUTAntennaPosition...................................................................................…

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Page: 1/10 Ref : ACR.49.6.25.BES.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD 1/F., ROOM 101, BUILDING 1, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD, BLOCK 70 BAO'AN DISTRICT, SHENZHEN, GUANGDONG, 518101 CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: 0725-EPGO-446 Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Iroise – 295 avenue Alexis de Rochon 29280 PLOUZANE - FRANCE Calibration date: 02/12/2025 Accreditations #2-6789 Scope available on www.cofrac.fr The use of the Cofrac brand and the accreditation references is prohibited from any reproduction. Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed at MVG, using the CALIPROBE test bench, for use with a MVG COMO SAR system only. The test results covered by accreditation are traceable to the International System of Units (SI). COMOSAR E-Field Probe Calibration Report 


          COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 2/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Pedro Ruiz Technical Manager 02/18/2025 Checked & approved by: Pedro Ruiz Technical Manager 02/18/2025 Authorized by: Geraldine Toutain Quality Manager Customer Name Distribution : WALTEK TESTING GROUP (SHENZHEN) CO., LTD Issue Name Date Modifications A Pedro Ruiz 2/18/2025 Initial release 


          

 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 3/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Sensitivity _______________________________________________________________ 4 3.2 Linearity ________________________________________________________________ 5 3.3 Isotropy _________________________________________________________________ 5 3.4 Boundary Effect __________________________________________________________ 5 3.5 Probe Modulation Response _________________________________________________ 6 4 Measurement Uncertainty .......................................................................................... 6 5 Calibration Results ..................................................................................................... 6 5.1 Calibration in air __________________________________________________________ 6 5.2 Calibration in liquid _______________________________________________________ 7 6 Verification Results ................................................................................................... 8 7 List of Equipment ...................................................................................................... 9 


          COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 4/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number 0725-EPGO-446 Product Condition (new / used) New Frequency Range of Probe 0.15 GHz-7.5GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.248 M: Dipole 2: R2= 0.215 M: Dipole 3: R3=0.224 M: 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. Figure 1 – MVG COMOSAR Dosimetric E field Probe Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their effect. All calibrations / measurements performed meet the fore-mentioned standards. 3.1 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards for frequency range 600- 7500MHz and using the calorimeter cell method (transfer method) as outlined in the standards for frequency 150-450 MHz. 


          COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 5/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2 LINEARITY The evaluatio…

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WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 50 TESTREPORT ReferenceNo.......................:WTX25X10275169W003 FCCID....................................:2BDXN-BASE Applicant...............................:ShenzhenAYNTechnologiesCo.,Ltd Address.................................: 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovation Park,Zone71,XingdongCommunity,Bao'an,Shenzhen,China Manufacturer........................:ThesameasApplicant Address.................................:ThesameasApplicant ProductName......................:AYNThor ModelNo...............................:Base Standards..............................:FCCPart15.247 DateofReceiptsample.....:2025-10-20 DateofTest...........................:2025-11-03to2025-11-13 DateofIssue........................:2025-11-28 TestReportFormNo.......... : WTX_Part15_247W TestResult............................:Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbe reproduced,exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithout specificstampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: TrisLi/ProjectEngineerJasonSu/Manager ReferenceNo.:WTX25X10275169W003 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 50 TABLEOFCONTENTS 1.GENERALINFORMATION........................................................................................................................................4 1.1PRODUCTDESCRIPTIONFOREQUIPMENTUNDERTEST(EUT)............................................................................4 1.2TESTSTANDARDS.....................................................................................................................................................5 1.3TESTMETHODOLOGY...............................................................................................................................................5 1.4TESTFACILITY..........................................................................................................................................................5 1.5EUTSETUPANDTESTMODE.................................................................................................................................6 1.6MEASUREMENTUNCERTAINTY.................................................................................................................................7 1.7TESTEQUIPMENTLISTANDDETAILS......................................................................................................................8 2.SUMMARYOFTESTRESULTS.............................................................................................................................12 3.ANTENNAREQUIREMENT.....................................................................................................................................13 3.1STANDARDAPPLICABLE.........................................................................................................................................13 3.2EVALUATIONINFORMATION....................................................................................................................................13 4.POWERSPECTRALDENSITY...............................................................................................................................14 4.1STANDARDAPPLICABLE.........................................................................................................................................14 4.2TESTSETUPBLOCKDIAGRAM...............................................................................................................................14 4.3TESTPROCEDURE..................................................................................................................................................14 4.4SUMMARYOFTESTRESULTS/PLOTS....................................................................................................................14 5.DTSBANDWIDTH......................................................................................................................................................15 5.1STANDARDAPPLICABLE.........................................................................................................................................15 5.2TESTSETUPBLOCKDIAGRAM...............................................................................................................................15 5.3TESTPROCEDURE..................................................................................................................................................15 5.4SUMMARYOFTESTRESULTS/PLOTS....................................................................................................................15 6.RFOUTPUTPOWER................................................................................................................................................16 6.1STANDARDAPPLICABLE.........................................................................................................................................16 6.2TESTSETUPBLOCKDIAGRAM...............................................................................................................................16 6.3TESTPROCEDURE..................................................................................................................................................16 6.4SUMMARYOFTESTRESULTS/PLOTS....................................................................................................................16 7.FIELDSTRENGTHOFSPURIOUSEMISSIONS.................................................................................................17 7.1STANDARDAPPLICABLE............................................…

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WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 91 TESTREPORT ReferenceNo.......................:WTX25X10275169W001 FCCID....................................:2BDXN-BASE Applicant...............................:ShenzhenAYNTechnologiesCo.,Ltd Address.................................: 410,BuildingA,JiazhaoyeXingdongScienceandTechnologyInnovation Park,Zone71,XingdongCommunity,Bao'an,Shenzhen,China Manufacturer........................:ThesameasApplicant Address.................................:ThesameasApplicant ProductName......................:AYNThor ModelNo...............................:Base Standards..............................:FCCPart15.247 DateofReceiptsample.....:2025-10-20 DateofTest...........................:2025-11-03to2025-12-19 DateofIssue........................:2025-12-19 TestReportFormNo.......... : WTX_Part15_247W TestResult............................:Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbe reproduced,exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithout specificstampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.…

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