2BEAX-AC-CFL020ACeiling Fan with Light

Reference No.: WTX24X01019554W Page 2 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX24X01019554W Page 3 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX24X01019554W Page 4 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6

Reference No.: WTX24X01019554W Page 1 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX24X01019554W Page 5 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX24X01019554W Page 6 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX24X01019554W Page 7 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View 2.4GHz Antenna

1. RF Exposure Requirements 1.1 General Information Client Information Applicant: Shenzhen Musheng Technology Co., Ltd. Address of applicant: 808, 8F, YongChang Building, No.43 Lixin Road, Nanwan Street, LongGang District, Shenzhen, China Manufacturer: Shenzhen Musheng Technology Co., Ltd. Address of manufacturer: 808, 8F, YongChang Building, No.43 Lixin Road, Nanwan Street, LongGang District, Shenzhen, China General Description of EUT: Product Name: Ceiling Fan with Light Trade Name: AONCIA Model No.: AC-CFL020-A Adding Model(s): AC-CFL020-B, AC-CFL022-A, AC-CFL022-B, AC-CFL023-A, AC-CFL023-B Rated Voltage: DC 3.0V FCC ID: 2BEAX-AC-CFL020A Equipment Type: Mobile device Technical Characteristics of EUT: Frequency Range: 2402-2480MHz RF Output Power: -13.73dBm (Conducted) Type of Modulation: GFSK Quantity of Channels: 40 Channel Separation: 2MHz Type of Antenna: PCB Antenna Antenna Gain: -0.65dBi 1.2 RF Exposure Exemption According to §1.1307(b)(3) and KDB 447498 D04 Interim General RF Exposure Guidance v01, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. Option A: FCC Rule Part 1.1307 (b)(3)(i)(A):The available maximum time-averaged power is no more than 1mW, regardless of separation distance. Option B: FCC Rule Part 1.1307 (b)(3)(i)(B): The available maximum time-averaged power or effective radiated power (ERP), whichever is greater, is less than or equal to the threshold P th (mW) described in the following formula. P th is given by: Option C: FCC Rule Part 1.1307 (b)(3)(i)(C): The minimum separation distance (R in meters) from the body of a nearby person for the frequency (f in MHz) at which the source operates, the ERP (watts) is no more than the calculated value prescribed for that frequency. R must be at least λ/2π, where λ is the free-space operating wavelength in meters. Single RF Sources Subject to Routine Environmental Evaluation RF Source frequency (MHz) Threshold ERP (watts) 0.3-1.34 1,920 R 2 1.34-30 3,450 R 2 /f 2 30-300 3.83 R 2 300-1,500 0.0128 R 2 f 1,500-100,000 19.2R 2 For Multiple RF sources: FCC Rule Part 1.1307(b)(3)(ii): (A) The available maximum time-averaged power of each source is no more than 1 mW and there is a separation distance of two centimeters between any portion of a radiating structure operating and the nearest portion of any other radiating structure in the same device, except if the sum of multiple sources is less than 1 mW during the time-averaging period, in which case they may be treated as a single source (separation is not required). (B) In the case of fixed RF sources operating in the same time-averaging period, or of multiple mobile or portable RF sources within a device operating in the same time averaging period, if the sum of the fractional contributions to the applicable thresholds is less than or equal to 1 as indicated in the following equation. 1.3 Calculated Result Radio Access Technology Prediction Frequency Output Power Antenna Gain Duty Cycle Tune-Up Time-Averaged Power ERP (MHz) (dBm) (dBi) (%) (dBm) (dBm) SRD 2402 -13.73 -0.65 100 -13.00 -15.80 Frequency Option Min. Distance Max. Power Exposure Limit Ratio Result (MHz) (cm) (dBm) (mW) (mW) Pass/Fail 2402 B 0.5 -13.00 0.05 2.788 0.02 Pass Note: 1. Time-Averaged Power=Output Power * Duty Cycle; ERP= Time-Averaged Power+ Antenna gain-2.15dB 2. Option A, B and C refers as clause 1.2. 3. For option B, Max (time-averaged power, effective radiated power (ERP)) converts to Max. Power. For option C, ERP converts to Max. Power; 4. For option B, P th (mW) converts to Exposure Limit (mW); For option C, ERP (W) converts to Exposure Limit (mW). 5. Ratio= Tune-Up ERP (mW)/ Exposure Limit (mW) Mode for Simultaneous Multi-band Transmission: Radio Access Technology Ratio 1 Ratio 2 Simultaneous Ratio Limit Result Pass/Fail -- -- -- -- -- -- Result: Pass

NOTE:ThisdocumentisissuedbyShenzhenMorlabCommunicationsTechnologyCo.,Ltd.,thetestreportshallnotbereproducedexceptin fullwithoutpriorwrittenpermissionofthecompany.Thetestresultsapplyonlytotheparticularsample(s)testedandtothespecifictestscarried outwhichisavailableonrequestforvalidationandinformationconfirmedatourwebsite. MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.,FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page1of 10 REPORTNo.：SZ24020143E01A TESTREPORT APPLICANT:ZhongshanXingliElectricalApplianceFactory PRODUCTNAME:2.4Gremotecontrol MODELNAME:FAN-Light-C2.4GA TRADENAME: BRANDNAME:AONCIA STANDARD(S):IEEEStd149-2021 RECEIPTDATE:2024-02-27 TESTDATE:2024-02-28 ISSUEDATE:2024-03-12 Editedby: FangJinshan(Rapporteur) Approvedby: ChiShide(Supervisor) MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page2of10 REPORTNo.：SZ24020143E01A DIRECTORY 1.TechnicalInformation ........................................................................................................3 1.1.ApplicantandManufacturerInformation ....................................................................3 1.2.EquipmentUnderTest(EUT)Description...................................................................3 2.TestResults........................................................................................................................4 2.1.AppliedReferenceDocuments.....................................................................................4 2.2.TestConditions...............................................................................................................4 2.3.MeasurementUncertainty.............................................................................................4 2.4.TestResultslists.............................................................................................................5 AnnexATestSetupPhotos..................................................................................................6 AnnexBFigures .....................................................................................................................7 1.2DRadiationPattern .........................................................................................................7 2.3DRadiationPattern .........................................................................................................8 AnnexCGeneralInformation .............................................................................................10 1.1IdentificationoftheResponsibleTestingLaboratory ..............................................10 1.2IdentificationoftheResponsibleTestingLocation..................................................10 1.3TestEquipmentsUtilized..............................................................................................10 1.4TestSoftwareUtilized....................................................................................................10 AnnexDEUTPhotos ChangeHistory VersionDateReasonforchange 1.02024-03-12Firstedition TheoriginalreportSZ24020143E01isreplacedbythisreportSZ24020143E01A. MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page3of10 REPORTNo.：SZ24020143E01A 1.TechnicalInformation Note:Providebyapplicant. 1.1.ApplicantandManufacturerInformation Applicant: ZhongshanXingliElectricalApplianceFactory ApplicantAddress: No.5,3rdStreet,ShengfengDongpaiWestRoad,XiaolanTown, ZhongshanCity Manufacturer: ZhongshanXingliElectricalApplianceFactory ManufacturerAddress: No.5,3rdStreet,ShengfengDongpaiWestRoad,XiaolanTown, ZhongshanCity 1.2.EquipmentUnderTest(EUT)Description WirelessTypeN/A Frequency2400MHz-2500MHz IMEIN/A AntennatypePCBantenna SampleNo.1# Dimensions: MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page4of10 REPORTNo.：SZ24020143E01A 2.TestResults 2.1.AppliedReferenceDocuments Leadingreferencedocumentsfortesting: No.IdentityDocumentTitle 1IEEEStd149-2021 IEEERecommendedPracticeforAntenna Measurements 2.2.TestConditions TestEnvironmentConditions ： RelativeHumidity(%):25-75 Temperature(°C):10-30 2.3.MeasurementUncertainty Theuncertaintyiscalculatedusingthemethodssuggestedinthe“GuidetotheExpressionof UncertaintyinMeasurement”(GUM)publishedbyISO.Whenthetestresultisacriticalvalue,we willusethemeasurementuncertaintygivethejudgmentresultbasedonthe95%Confidence intervals. MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page5of10 REPORTNo.：SZ24020143E01A 2.4.TestResultslists 2.4.1.Gain Frequency (MHz) Gain(dBi) 2400-0.76 2410-0.74 2420-0.68 2430-0.65 2440-0.66 2450-0.67 2460-0.88 2470-1.10 2480-1.18 2490-1.36 2500-1.45 MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page6of10 REPORTNo.：SZ24020143E01A AnnexATestSetupPhotos MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:…

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MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.,FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page1of 6 REPORTNo.：SZ24020143E01A AnnexDEUTPhotos 1.Testenvironment MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page2of6 REPORTNo.：SZ24020143E01A 2.EUT MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page3of6 REPORTNo.：SZ24020143E01A MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page4of6 REPORTNo.：SZ24020143E01A MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page5of6 REPORTNo.：SZ24020143E01A MORLAB ShenzhenMorlabCommunicationsTechnologyCo.,Ltd.FL.1-3,BuildingA, FeiYangSciencePark,No.8LongChangRoad,Block67,BaoAnDistrict, ShenZhen,GuangDongProvince,P.R.China Tel:86-755-36698555Fax:86-755-36698525 Http://www.morlab.cnE-mail:[email protected] Page6of6 REPORTNo.：SZ24020143E01A

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 35 TEST REPORT Reference No. ....................: WTX24X01019554W FCC ID ............................... .: 2BEAX-AC-CFL020A Applicant .......................... .: Shenzhen Musheng Technology Co., Ltd. Address ............................ .: 808, 8F, YongChang Building, No.43 Lixin Road, Nanwan Street, LongGang District, Shenzhen, China Manufacturer .................... .: The same as Applicant Address ............................ .: The same as Applicant Product Name .................. .: Ceiling Fan with Light Model No... ........................ .: AC-CFL020-A Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: 2024-01-24 Date of Test....................... .: 2024-01-24 to 2024-02-24 Date of Issue .................... .: 2024-02-24 Test Report Form No. ...... . : WTX_Part 15_247W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Jason Su Reference No.: WTX24X01019554W Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 35 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................. 5 1.3 TEST METHODOLOGY ........................................................................................................................................... 5 1.4 TEST FACILITY ...................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 11 3. ANTENNA REQUIREMENT ................................................................................................................................. 12 3.1 STANDARD APPLICABLE ..................................................................................................................................... 12 3.2 EVALUATION INFORMATION ................................................................................................................................ 12 4. POWER SPECTRAL DENSITY ........................................................................................................................... 13 4.1 STANDARD APPLICABLE ..................................................................................................................................... 13 4.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 13 4.3 TEST PROCEDURE .............................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 13 5. 6DB BANDWIDTH ................................................................................................................................................. 14 5.1 STANDARD APPLICABLE ..................................................................................................................................... 14 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 14 5.3 TEST PROCEDURE .............................................................................................................................................. 14 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 14 6. RF OUTPUT POWER ............................................................................................................................................ 15 6.1 STANDARD APPLICABLE ..................................................................................................................................... 15 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 15 6.3 TEST PROCEDURE .............................................................................................................................................. 15 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 15 7. FIELD STRENGTH OF SPURIOUS EMISSIONS ........................…

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Reference No.: WTX24X01019554W Page 8 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTX24X01019554W Page 9 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (1GHz to 18GHz) Radiation Emission Test Setup (Above 18GHz) Reference No.: WTX24X01019554W Page 10 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ***** END OF REPORT *****