2BEOA-K30Al Smart Translator Pen(Scan translator pen)

Shenzhen Kuge Times Technology Co., Ltd.

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Application Details

Equipment Class: DTS - Digital Transmission System
Date of Grant: Jan 01, 2025
Application Purpose: Original Equipment
Equipment Note: Al Smart Translator Pen(Scan translator pen)
Frequency Range: 2402.00000000 - 2480.00000000
Company: Shenzhen Kuge Times Technology Co., Ltd.
Country: China

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Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions:(1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. The device has evaluated to meet general RF exposure requirement. The device can be used be in portable exposure without restriction.

Test Report

承認書 SPECIFICATION FOR APPROVAL 客戶名稱 CUSTOMER ：客戶料號 CUSTOMER’S P/N ：料號 PART NUMBER ： WAN3216F245W36 規格 DESCRIPTION ： Chip Antenna 3216 M-Ant 2.45G Type 36 版本 VERSION ： V2.5 日期 ISSUE DATE ： 2022/01/05 客戶承認 CUSTOMER APPROVED 工程部 R&D CENTER 承認 APPROVAL 確認 CHECKED 製作 DRAWN Ray Tennyson Snow 萬誠科技股份有限公司 OneWave Electronic Co., Ltd. 112台北市北投區立功街151號1樓 1F, No. 151, Li Gong Street, Beitou District, Taipei City 112, Taiwan 電話: (02) 2898-2220 TEL: +886 2 2898-2220 傳真: (02) 2898-5055 FAX: +886 2 2898-5055 ONEWAVE TECHNOLOGY CO., LTD. 2/11 3216 Chip antenna For Bluetooth / WLAN Applications Dimension (mm) L 3.23 ± 0.20 W 1.66 ± 0.20 T 1.23 ± 0.20 P/N: WAN3216F245W36 ONEWAVE TECHNOLOGY CO., LTD. 3/11 Part Number Information WAN 3216 F 245 W 36 A B C D E F A Product Series Antenna B Dimension L x W 3.2X1.6mm (+-0.2mm) C Material High K material D Working Frequency 2.4 ~ 2.5GHz E Feeding mode Monopole & Single Feeding F Antenna type Type = 36 1. Electrical Specification Remark : Bandwidth & Peak Gain was measured under evaluation board of next page Specification Part Number WAN3216F245W36 Central Frequency 2450 MHz Bandwidth 100 (Min.) MHz Return Loss -6.5 (Max) dB Peak Gain 2.71 dBi Impedance 50 Ohm Operating Temperature -40～+110 °C Maximum Power 4 W Resistance to Soldering Heats 10 ( @ 260°C) sec. Polarization Linear Azimuth Beamwidth Omni-directional Termination Cu / Sn (Leadless) ONEWAVE TECHNOLOGY CO., LTD. 4/11 2. Recommended PCB Pattern 1.Evaluation Board Dimension 2.Evaluation Board Dimension (若淨空區夠大，建議使用此Layout，效能較佳) Unit : mm Suggested Matching Circuit 重要資訊 : 匹配元件建議使用精準度高的電感±0.1~0.3nH、電容±0.1pF ONEWAVE TECHNOLOGY CO., LTD. 5/11 1.Layout Dimensions in Clearance area(Size=5.2*5.0mm) 50 ohm transmission Line Matching Circuit 2.Layout Dimensions in Clearance area(Size=8.2*5.0mm) (若淨空區夠大，建議使用此Layout，效能較佳) 50 ohm transmission Line Matching Circuit FootPrint (Unit : mm) ONEWAVE TECHNOLOGY CO., LTD. 6/11 3. Measurement Results Return Loss ONEWAVE TECHNOLOGY CO., LTD. 7/11 Radiation Pattern Efficiency Peak Gain Directivity 2400MHz 55.21 % 1.45 dBi 5.32 dBi 2450MHz 66.45 % 2.71 dBi 5.21 dBi 2500MHz 57.53 % 1.98 dBi 5.29 dBi Chamber Coordinate System X Z Y ONEWAVE TECHNOLOGY CO., LTD. 8/11 4.Reliability and Test Condictions ITEM REQUIREMENTS TEST CONDITION Solderability 1. Wetting shall exceed 90% coverage 2. No visible mechanical damage Pre-heating temperature:150°C/60sec. Solder temperature:230±5°C Duration:4±1sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Solder heat Resistance 1. No visible mechanical damage 2. Central Freq. change :within ± 6% 10 ± 0.5 sec. 60 sec . . T E M P ( °C ) 150 °C 2 6 0 °C Pre-heating temperature:150°C/60sec. Solder temperature:260±5°C Duration:10±0.5sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Component Adhesion (Push test) 1. No visible mechanical damage The device should be reflow soldered(230±5°C for 10sec.) to a tinned copper substrate A dynometer force gauge should be applied the side of the component. The device must with-ST-F 0.5 Kg without failure of the termination attached to component. Component Adhesion (Pull test) 1. No visible mechanical damage Insert 10cm wire into the remaining open eye bend ,the ends of even wire lengths upward and wind together. Terminal shall not be remarkably damaged. Thermal shock 1. No visible mechanical damage 2. Central Freq. change :within ±6% Phase Temperature(°C) Time(min) 1 +110±5°C 30±3 2 Room Temperature Within 3sec 3 -40±2°C 30±3 4 Room Temperature Within 3sec +110°C=>30±3min -40°C=>30±3min Test cycle:10 cycles The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to High Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: +110±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to Low Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature:-40±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Humidity 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 40±2°C Humidity: 90% to 95% RH Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. 4±1 sec. 60sec TEMP (°C) 150°C 230°C ONEWAVE TECHNOLOGY CO., LTD. 9/11 5.Soldering and Mounting Mildly activated rosin fluxes are preferred. The minimum amount of solder can lead to damage from the stresses caused by the difference in coefficients of expansion between solder, chip and substrate. The terminations are suitable for all wave and re-flow soldering systems. If hand soldering cannot be avoided, the preferred technique is the utilization of hot air soldering tools. Recommended temperature profiles for re-flow soldering in Figure 1. Products attachment with a soldering iron is discouraged due to the inherent process control limitations. In the event that a soldering iron must be employed the following precautions are recommended. ‧Preheat circuit and products to 150°C ‧Never contact the ceramic with the iron tip ‧Use a 20 watt soldering iron with tip diameter of 1.0mm ‧280°C tip temperature (max) ‧1.0mm tip diameter (max) ‧Limit soldering time to 3 sec. SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) 60~120 s 10s max. 30~60s 250~260 230 180 150 TIME(sec.) Reflow Soldering SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) within 3s Gradual cooling 150 TIME(sec.) Iron Soldering Over 60s 350 300 ONEWAVE TECHNOLOGY CO., LTD. 10/11 6.Packaging Information ◆ Tape Specification: W Ao Bo Ko P F E D D1 Po P2 t 8.0 ±0.30 1.80 ±0.05 3.51 ±0.10 1.59 ±0.10 4.00 ±0.05 3.50 ±0.05 1.75 ±0.10 1.50 ±0.10 0.00 ±0.10 4.00 ±0.10 2.00 ±0.05 0.25 ±0.05 ◆ Reel Specification: (7’’, Φ180 mm) Tape Width(mm) A(mm) B(mm) C(mm) D(mm) Chip/Reel(pcs) 8 9.0±0.5 60±2…

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Test Report

Page28of51 Power_Spectral_Density_NVNT_ANT1_802_11n(HT20)_2462 Power_Spectral_Density_NVNT_ANT1_802_11n(HT40)_2422 Page29of51 Power_Spectral_Density_NVNT_ANT1_802_11n(HT40)_2437 Power_Spectral_Density_NVNT_ANT1_802_11n(HT40)_2452 Page30of51 Page31of51 6.Bandedge ConditionAntennaModulation TX_Frequency (MHz) Max. Mark_frequency(MHz) Spurious level(dBm) limit(dBm)Result NVNTANT1802.11b2412.002399.936-35.434-14.405Pass NVNTANT1802.11b2462.002486.320-55.465-15.404Pass NVNTANT1802.11g2412.002399.264-25.433-17.587Pass NVNTANT1802.11g2462.002483.584-44.572-22.321Pass NVNTANT1802.11n(HT20)2412.002399.712-31.705-21.965Pass NVNTANT1802.11n(HT20)2462.002483.584-40.172-22.504Pass NVNTANT1802.11n(HT40)2422.002399.760-38.200-25.844Pass NVNTANT1802.11n(HT40)2452.002484.496-42.284-25.041Pass 1_Reference_Level_NVNT_ANT1_802_11b_2412 2_Bandedge_NVNT_ANT1_802_11b_2412 1_Reference_Level_NVNT_ANT1_802_11b_2462 Page32of51 2_Bandedge_NVNT_ANT1_802_11b_2462 1_Reference_Level_NVNT_ANT1_802_11g_2412 Page33of51 2_Bandedge_NVNT_ANT1_802_11g_2412 1_Reference_Level_NVNT_ANT1_802_11g_2462 Page34of51 2_Bandedge_NVNT_ANT1_802_11g_2462 1_Reference_Level_NVNT_ANT1_802_11n(HT20)_2412 Page35of51 2_Bandedge_NVNT_ANT1_802_11n(HT20)_2412 1_Reference_Level_NVNT_ANT1_802_11n(HT20)_2462 Page36of51 2_Bandedge_NVNT_ANT1_802_11n(HT20)_2462 1_Reference_Level_NVNT_ANT1_802_11n(HT40)_2422 Page37of51 2_Bandedge_NVNT_ANT1_802_11n(HT40)_2422 1_Reference_Level_NVNT_ANT1_802_11n(HT40)_2452 Page38of51 2_Bandedge_NVNT_ANT1_802_11n(HT40)_2452 Page39of51 7.SpuriousEmission ConditionAntennaModulation TX_Frequency (MHz) Max. Mark_frequency(MHz) Spurious level(dBm) limit(dBm)Result NVNTANT1802.11b2412.0024985.018-40.590-14.405Pass NVNTANT1802.11b2437.0024995.006-43.302-16.298Pass NVNTANT1802.11b2462.0024323.313-47.278-15.404Pass NVNTANT1802.11g2412.0025000.000-44.452-17.587Pass NVNTANT1802.11g2437.0024902.617-54.665-23.995Pass NVNTANT1802.11g2462.00704.190-43.490-22.321Pass NVNTANT1802.11n(HT20)2412.0024538.055-48.390-21.965Pass NVNTANT1802.11n(HT20)2437.0024945.066-50.050-24.054Pass NVNTANT1802.11n(HT20)2462.0024438.175-48.726-22.504Pass NVNTANT1802.11n(HT40)2422.0024957.551-57.292-25.844Pass NVNTANT1802.11n(HT40)2437.0024987.515-53.445-26.529Pass NVNTANT1802.11n(HT40)2452.0024897.623-56.976-25.041Pass 1_Reference_Level_NVNT_ANT1_802_11b_2412 2_Spurious_Emission_NVNT_ANT1_802_11b_2412 Page40of51 1_Reference_Level_NVNT_ANT1_802_11b_2437 2_Spurious_Emission_NVNT_ANT1_802_11b_2437 Page41of51 1_Reference_Level_NVNT_ANT1_802_11b_2462 2_Spurious_Emission_NVNT_ANT1_802_11b_2462 Page42of51 1_Reference_Level_NVNT_ANT1_802_11g_2412 2_Spurious_Emission_NVNT_ANT1_802_11g_2412 Page43of51 1_Reference_Level_NVNT_ANT1_802_11g_2437 2_Spurious_Emission_NVNT_ANT1_802_11g_2437 Page44of51 1_Reference_Level_NVNT_ANT1_802_11g_2462 2_Spurious_Emission_NVNT_ANT1_802_11g_2462 Page45of51 1_Reference_Level_NVNT_ANT1_802_11n(HT20)_2412 2_Spurious_Emission_NVNT_ANT1_802_11n(HT20)_2412 Page46of51 1_Reference_Level_NVNT_ANT1_802_11n(HT20)_2437 2_Spurious_Emission_NVNT_ANT1_802_11n(HT20)_2437 Page47of51 1_Reference_Level_NVNT_ANT1_802_11n(HT20)_2462 2_Spurious_Emission_NVNT_ANT1_802_11n(HT20)_2462 Page48of51 1_Reference_Level_NVNT_ANT1_802_11n(HT40)_2422 2_Spurious_Emission_NVNT_ANT1_802_11n(HT40)_2422 Page49of51 1_Reference_Level_NVNT_ANT1_802_11n(HT40)_2437 2_Spurious_Emission_NVNT_ANT1_802_11n(HT40)_2437 Page50of51 1_Reference_Level_NVNT_ANT1_802_11n(HT40)_2452 2_Spurious_Emission_NVNT_ANT1_802_11n(HT40)_2452 Page51of51

Test Report

TableofContents 1.-6dBBandwidth............................................................................................................................................................2 2.99%OccupiedBandwidth............................................................................................................................................9 3.DutyCycle...................................................................................................................................................................16 4.MAX.OutputPower...................................................................................................................................................23 5.PowerSpectralDensity...............................................................................................................................................24 6.Bandedge....................................................................................................................................................................31 7.SpuriousEmission.......................................................................................................................................................39 Page2of51 241128FCCIDWIFI2.4 FCC_2.4G_WIFI(Part15.247)TestData 1.-6dBBandwidth ConditionAntennaModulationFrequency(MHz)-6dBBW(MHz)limit(kHz)Result NVNTANT1802.11b2412.009.17500Pass NVNTANT1802.11b2437.009.16500Pass NVNTANT1802.11b2462.009.19500Pass NVNTANT1802.11g2412.0016.42500Pass NVNTANT1802.11g2437.0016.48500Pass NVNTANT1802.11g2462.0016.41500Pass NVNTANT1802.11n(HT20)2412.0017.43500Pass NVNTANT1802.11n(HT20)2437.0017.32500Pass NVNTANT1802.11n(HT20)2462.0017.50500Pass NVNTANT1802.11n(HT40)2422.0035.99500Pass NVNTANT1802.11n(HT40)2437.0035.82500Pass NVNTANT1802.11n(HT40)2452.0036.01500Pass -6dB_Bandwidth_NVNT_ANT1_802_11b_2412 -6dB_Bandwidth_NVNT_ANT1_802_11b_2437 Page3of51 -6dB_Bandwidth_NVNT_ANT1_802_11b_2462 -6dB_Bandwidth_NVNT_ANT1_802_11g_2412 Page4of51 -6dB_Bandwidth_NVNT_ANT1_802_11g_2437 -6dB_Bandwidth_NVNT_ANT1_802_11g_2462 Page5of51 -6dB_Bandwidth_NVNT_ANT1_802_11n(HT20)_2412 -6dB_Bandwidth_NVNT_ANT1_802_11n(HT20)_2437 Page6of51 -6dB_Bandwidth_NVNT_ANT1_802_11n(HT20)_2462 -6dB_Bandwidth_NVNT_ANT1_802_11n(HT40)_2422 Page7of51 -6dB_Bandwidth_NVNT_ANT1_802_11n(HT40)_2437 -6dB_Bandwidth_NVNT_ANT1_802_11n(HT40)_2452 Page8of51 Page9of51 2.99%OccupiedBandwidth ConditionAntennaModulationFrequency(MHz)99%%BW(MHz) NVNTANT1802.11b2412.0012.007 NVNTANT1802.11b2437.0011.916 NVNTANT1802.11b2462.0012.382 NVNTANT1802.11g2412.0017.745 NVNTANT1802.11g2437.0017.078 NVNTANT1802.11g2462.0017.145 NVNTANT1802.11n(HT20)2412.0017.745 NVNTANT1802.11n(HT20)2437.0017.827 NVNTANT1802.11n(HT20)2462.0017.871 NVNTANT1802.11n(HT40)2422.0036.285 NVNTANT1802.11n(HT40)2437.0036.302 NVNTANT1802.11n(HT40)2452.0036.517 99%_Occupied_Bandwidth_NVNT_ANT1_802_11b_2412 99%_Occupied_Bandwidth_NVNT_ANT1_802_11b_2437 Page10of51 99%_Occupied_Bandwidth_NVNT_ANT1_802_11b_2462 99%_Occupied_Bandwidth_NVNT_ANT1_802_11g_2412 Page11of51 99%_Occupied_Bandwidth_NVNT_ANT1_802_11g_2437 99%_Occupied_Bandwidth_NVNT_ANT1_802_11g_2462 Page12of51 99%_Occupied_Bandwidth_NVNT_ANT1_802_11n(HT20)_2412 99%_Occupied_Bandwidth_NVNT_ANT1_802_11n(HT20)_2437 Page13of51 99%_Occupied_Bandwidth_NVNT_ANT1_802_11n(HT20)_2462 99%_Occupied_Bandwidth_NVNT_ANT1_802_11n(HT40)_2422 Page14of51 99%_Occupied_Bandwidth_NVNT_ANT1_802_11n(HT40)_2437 99%_Occupied_Bandwidth_NVNT_ANT1_802_11n(HT40)_2452 Page15of51 Page16of51 3.DutyCycle ConditionAntennaModulationFrequency(MHz)Dutycycle(%)Dutyfactor(dB) NVNTANT1802.11b2412.0098.360.00 NVNTANT1802.11b2437.0098.600.00 NVNTANT1802.11b2462.0098.600.00 NVNTANT1802.11g2412.0090.910.41 NVNTANT1802.11g2437.0090.910.41 NVNTANT1802.11g2462.0092.210.35 NVNTANT1802.11n(HT20)2412.0090.910.41 NVNTANT1802.11n(HT20)2437.0090.910.41 NVNTANT1802.11n(HT20)2462.0090.910.41 NVNTANT1802.11n(HT40)2422.0078.381.06 NVNTANT1802.11n(HT40)2437.0081.080.91 NVNTANT1802.11n(HT40)2452.0083.780.77 Duty_Cycle_NVNT_ANT1_802_11b_2412 Duty_Cycle_NVNT_ANT1_802_11b_2437 Page17of51 Duty_Cycle_NVNT_ANT1_802_11b_2462 Duty_Cycle_NVNT_ANT1_802_11g_2412 Page18of51 Duty_Cycle_NVNT_ANT1_802_11g_2437 Duty_Cycle_NVNT_ANT1_802_11g_2462 Page19of51 Duty_Cycle_NVNT_ANT1_802_11n(HT20)_2412 Duty_Cycle_NVNT_ANT1_802_11n(HT20)_2437 Page20of51 Duty_Cycle_NVNT_ANT1_802_11n(HT20)_2462 Duty_Cycle_NVNT_ANT1_802_11n(HT40)_2422 Page21of51 Duty_Cycle_NVNT_ANT1_802_11n(HT40)_2437 Duty_Cycle_NVNT_ANT1_802_11n(HT40)_2452 Page22of51 Page23of51 4.MAX.OutputPower ConditionAntennaModulation Frequency (MHz) Detector Conducted Power(dBm) limit(dBm)Result NVNTANT1802.11b2412.00Peak8.9630Pass NVNTANT1802.11b2437.00Peak8.6830Pass NVNTANT1802.11b2462.00Peak8.9430Pass NVNTANT1802.11g2412.00Peak7.6030Pass NVNTANT1802.11g2437.00Peak7.0030Pass NVNTANT1802.11g2462.00Peak7.4130Pass NVNTANT1802.11n(HT20)2412.00Peak7.5330Pass NVNTANT1802.11n(HT20)2437.00Peak7.9730Pass NVNTANT1802.11n(HT20)2462.00Peak7.3430Pass NVNTANT1802.11n(HT40)2422.00Peak7.0630Pass NVNTANT1802.11n(HT40)2437.00Peak7.0630Pass NVNTANT1802.11n(HT40)2452.00Peak7.5330Pass Page24of51 5.PowerSpectralDensity Conditio n Antenn a Modulation Frequenc y(MHz) SA_PSD(dBm/30kH z) Duty factor(dB ) RB factor(dB ) PSD(dBm/3kHz ) limit(dBm/3kHz ) Resul t NVNTANT1802.11b2412.001.46N/A-10.00-8.548Pass NVNTANT1802.11b2437.00-0.56N/A-10.00-10.568Pass NVNTANT1802.11b2462.000.93N/A-10.00-9.078Pass NVNTANT1802.11g2412.00-1.55N/A-10.00-11.558Pass NVNTANT1802.11g2437.00-7.97N/A-10.00-17.978Pass NVNTANT1802.11g2462.00-6.22N/A-10.00-16.228Pass NVNTANT1 802.11n(HT20 ) 2412.00-6.87N/A-10.00-16.878Pass NVNTANT1 802.11n(HT20 ) 2437.00-8.48N/A-10.00-18.488Pass NVNTANT1 802.11n(HT20 ) 2462.00-7.10N/A-10.00-17.108Pass NVNTANT1 802.11n(HT40 ) 2422.00-10.12N/A-10.00-20.128Pass NVNTANT1 802.11n(HT40 ) 2437.00-11.04N/A-10.00-21.048Pass NVNTANT1 802.11n(HT40 ) 2452.00-9.98N/A-10.00-19.988Pass Power_Spectral_Density_NVNT_ANT1_802_11b_2412 Power_Spectral_Density_NVNT_ANT1_802_11b_2437 …

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Test Report

FCCTESTREPORT FCCID:2BEOA-K30 Product: AlSmartTranslatorPen （ Scantranslatorpen ） ModelName:K30,K3,K30,K300,K555,K368,K288 Brand:N/A ReportNo.:NCT240461330XE1-1 Preparedfor ShenzhenKugeTimesTechnologyCo.,Ltd. 1002,ComplexBuildingC6,HengfengIndustrialCity,No.739,ZhoushiRoad,Hezhou CommunityHangchengStreet,BaoanDistrict,Shenzhen,China Preparedby ShenzhenNCTTestingTechnologyCo.,Ltd. A101&2FB2,Fuqiao6thArea,XintianCommunity,FuhaiStreet,BaoanDistrict, Shenzhen,People’sRepublicofChina TEL:400-8868-419 FAX:86-755-27790922 ReportNo.:NCT240461330XE1-1 Page2of35 Hotline:400-8868-419Fax:86-755-27790922http://www.ncttesting.cn 1TESTRESULTCERTIFICATION Applicant:ShenzhenKugeTimesTechnologyCo.,Ltd. Address: 1002,ComplexBuildingC6,HengfengIndustrialCity,No.739,ZhoushiRoad,Hezhou CommunityHangchengStreet,BaoanDistrict,Shenzhen,China Manufacturer:ShenzhenKugeTimesTechnologyCo.,Ltd. Address: 1002,ComplexBuildingC6,HengfengIndustrialCity,No.739,ZhoushiRoad,Hezhou CommunityHangchengStreet,BaoanDistrict,Shenzhen,China Productname: AlSmartTranslatorPen（Scantranslatorpen） Modelname:K30,K3,K30,K300,K555,K368,K288 Standards:FCCCFR47Part15Section15.247 Testprocedure:ANSIC63.10:2020 Dateoftest:Nov.13,2024toDec.03,2024 DateofIssue:Dec.03,2024 ThisdevicedescribedabovehasbeentestedbyNCT,andthetestresultsshowthattheequipmentunder test(EUT)isincompliancewiththeFCCrequirements.Anditisapplicableonlytothetestedsample identifiedinthereport. Thisreportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofNCT,thisdocumentmaybe alteredorrevisedbyNCT,personalonly,andshallbenotedintherevisionofthedocument. TestEngineer: KevenWu/Engineer TechnicalManager: HenryWang/Manager ReportNo.:NCT240461330XE1-1 Page3of35 Hotline:400-8868-419Fax:86-755-27790922http://www.ncttesting.cn Contents Page 1TESTRESULTCERTIFICATION...............................................................................................................................2 2TESTSUMMARY..........................................................................................................................................................5 3GENERALINFORMATION..........................................................................................................................................6 3.1GENERALDESCRIPTIONOFE.U.T.....................................................................................................................6 3.2CHANNELLIST.....................................................................................................................................................7 3.3TESTSITE............................................................................................................................................................8 3.4TESTSETUPCONFIGURATION............................................................................................................................8 3.5TESTMODE.........................................................................................................................................................9 4EQUIPMENTDURINGTEST....................................................................................................................................10 4.1EQUIPMENTSLIST.............................................................................................................................................10 4.2MEASUREMENTUNCERTAINTY.........................................................................................................................12 4.3DESCRIPTIONOFSUPPORTUNITS...................................................................................................................12 5CONDUCTEDEMISSION..........................................................................................................................................13 5.1E.U.T.OPERATION............................................................................................................................................13 5.2EUTSETUP.......................................................................................................................................................13 5.3TESTSET-UP(BLOCKDIAGRAMOFCONFIGURATION).................................................................................14 5.4MEASUREMENTPROCEDURE............................................................................................................................14 5.5CONDUCTEDEMISSIONLIMIT...........................................................................................................................14 5.6MEASUREMENTDESCRIPTION..........................................................................................................................14 5.7CONDUCTEDEMISSIONTESTRESULT.............................................................................................................14 6RADIATEDSPURIOUSEMISSIONS......................................................................................................................17 6.1EUTOPERATION...............................................................................................................................................17 6.2TESTSETUP......................................................................................................................................................18 6.3SPECTRUMANALYZERSETUP..........................................................................................................................19 6.4TESTPROCEDURE.............................................................................................................................................20 6.5SUMMARYOFTESTRESULTS...........................................................................................................................21 7CONDUCTBANDEDGEANDSPURIOUSEMISSIONSMEASUREMENT....................................................30 7.1TESTPROCEDURE............................................................................…

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Test Report

TESTREPORT FCCID:2BEOA-K30 Product: AlSmartTranslatorPen （ Scantranslatorpen ） ModelName:K30,K3,K30,K300,K555,K368,K288 Brand:/ ReportNo.:NCT240461330XE1-1 Preparedfor ShenzhenKugeTimesTechnologyCo.,Ltd. 1002,ComplexBuildingC6,HengfengIndustrialCity,No.739,ZhoushiRoad,Hezhou CommunityHangchengStreet,BaoanDistrict,Shenzhen,China Preparedby ShenzhenNCTTestingTechnologyCo.,Ltd. A101&2FB2,Fuqiao6thArea,XintianCommunity,FuhaiStreet,BaoanDistrict, Shenzhen,People’sRepublicofChina TEL:400-8868-419 ReportNo.:NCT240461330XE1-1 Page2of34 Hotline:400-8868-419Fax:86-755-27790922http://www.ncttesting.cn 1TESTRESULTCERTIFICATION Applicant’sname: ShenzhenKugeTimesTechnologyCo.,Ltd. Address: 1002,ComplexBuildingC6,HengfengIndustrialCity,No.739,ZhoushiRoad, HezhouCommunityHangchengStreet,BaoanDistrict,Shenzhen,China Manufacture'sname: ShenzhenKugeTimesTechnologyCo.,Ltd. Address: 1002,ComplexBuildingC6,HengfengIndustrialCity,No.739,ZhoushiRoad, HezhouCommunityHangchengStreet,BaoanDistrict,Shenzhen,China Productname: AlSmartTranslatorPen（Scantranslatorpen） Modelname: K30,K3,K30,K300,K555,K368,K288 Standards: FCCCFR47Part15Section15.247 Testprocedure: ANSIC63.10:2020 Dateoftest: Nov.13,2024toDec.03,2024 DateofIssue: Dec.03,2024 ThisdevicedescribedabovehasbeentestedbyNCT,andthetestresultsshowthatthe equipmentundertest(EUT)isincompliancewiththeFCCrequirements.Anditisapplicableonly tothetestedsampleidentifiedinthereport. Thisreportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofNCT,this documentmaybealteredorrevisedbyNCT,personalonly,andshallbenotedintherevisionof thedocument. TestEngineer: KevenWu/Engineer TechnicalManager: HenryWang/Manager ReportNo.:NCT240461330XE1-1 Page3of34 Hotline:400-8868-419Fax:86-755-27790922http://www.ncttesting.cn Contents Page 1TESTRESULTCERTIFICATION...............................................................................................................................2 2TESTSUMMARY..........................................................................................................................................................5 2.1TESTSITE............................................................................................................................................................6 3GENERALINFORMATION..........................................................................................................................................7 3.1GENERALDESCRIPTIONOFE.U.T.....................................................................................................................7 3.2CHANNELLIST.....................................................................................................................................................8 3.3TESTSETUPCONFIGURATION............................................................................................................................9 3.4TESTCONFIGURATION.........................................................................................................................................9 4EQUIPMENTDURINGTEST....................................................................................................................................10 4.1EQUIPMENTSLIST.............................................................................................................................................10 4.2MEASUREMENTUNCERTAINTY.........................................................................................................................12 4.3DESCRIPTIONOFSUPPORTUNITS...................................................................................................................12 5CONDUCTEDEMISSION..........................................................................................................................................13 5.1E.U.T.OPERATION............................................................................................................................................13 5.2EUTSETUP.......................................................................................................................................................13 5.3TESTSET-UP(BLOCKDIAGRAMOFCONFIGURATION).................................................................................14 5.4MEASUREMENTPROCEDURE.....................................................................................…

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