2BEPN-M47LTE MiFi Router

WEWINS TECHNOLOGY LIMITED Date: Jan. 30, 2024 Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: 2BEPN-M47 Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Exhibit Type File Name Long-term confidentiality: Schematics Block Diagram Operational Description Schematics.pdf Block Diagram.pdf Operational Description.pdf Short-term confidentiality: User’s Manual External Photos Internal Photos Setup photos User’s Manual.pdf External Photos.pdf Internal Photos.pdf Setup photos.pdf Short-term confidentiality days: 180 days. The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, WEWINS TECHNOLOGY LIMITED Signature Danjun Deng / Quality Assurance Manager Typed name and Title

WE WIN S TE CHN OLO GY L IMI TED Date: 3/12/24 To: Fed era l Co mmu nic ati ons Com miss ion 743 5 Oa kla nd M ill s Roa d Co lum bia , MD To W hom It M ay C onc ern : We,WEW INS TEC HNO LO GY L IMI TED ., s tat e th at o ur d evi ce,FCC ID : 2B EPN -M4 7, h as a bat ter y, but the bat te ry w ill not be p lac ed i n th e ba tte ry com par tme nt w hen del ive ry, the la bel is v isible to th e us ers as t hey pur cha se t he p rod uct s an d in sta ll t he b att ery . Th e ba ck co ver can be m ove d away, there is not enough space to place FCC ID label in surface of products, so the label has to be p lac ed i n ba tte ry c omp art men t. Si nce rel y, Signature Danjun Deng Quality Assurance Manager WEWINS TECHNOLOGY LIMITED

Reference No.: WTD24D01019167W005 Page 132 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 133 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 134 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 135 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 136 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 137 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 138 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 139 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 140 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 141 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 142 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 143 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 144 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 145 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 146 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 147 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 148 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 149 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 150 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 151 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 152 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 153 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 154 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 155 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 156 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 157 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 158 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 159 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 160 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 161 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 162 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 163 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 164 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 16 SAR System Photos Liquid depth ≥ 15cm Reference No.: WTD24D01019167W005 Page 165 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 17 Setup Photos Note: Please refer to appendix: Appendix-M47-Photos. 18 EUT Photos Note: Please refer to appendix: Appendix-M47-Photos. ======End of Report======

Reference No.: WTD24D01019167W005 Page 102 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 103 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 104 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 105 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 106 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 107 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 108 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 109 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 110 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 111 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 112 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 113 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 114 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 115 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 116 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 117 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 118 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 119 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 120 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 121 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 122 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 123 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 124 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 125 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 126 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 127 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 128 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 129 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 130 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Reference No.: WTD24D01019167W005 Page 131 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 165 SAR TEST REPORT Reference No. ................... : WTD24D01019167W005 FCC ID ................................ : 2BEPN-M47 Applicant ........................... : WEWINS TECHNOLOGY LIMITED Address ............................. : Room 1003, 10/F, Tower 1, Lippo Centre, 89 Queensway, Admiralty, Hong Kong Manufacturer .................... : WEWINS TECHNOLOGY LIMITED Address ............................. : Room 1003, 10/F, Tower 1, Lippo Centre, 89 Queensway, Admiralty, Hong Kong Product .............................. : LTE MiFi Router Model(s).. ........................... : M47 Standards .......................... : FCC 47 CFR Part2(2.1093) IEEE Std. C95.1-2019 IEC/IEEE 62209-1528:2020 Date of Receipt sample .... : 2024-01-26 Date of Test ....................... : 2024-02-26 to2024-03-12 Date of Issue ..................... : 2024-03-18 Test Result ........................ : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: James Cheng / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTD24D01019167W005 Page 2 of 165 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 CONTENTS ............................................................................................................................................... 2 3 REVISION HISTORY ................................................................................................................................. 3 4 GENERAL INFORMATION ....................................................................................................................... 4 4.1 GENERAL DESCRIPTION OF E.U.T. ....................................................................................................... 4 4.2 DETAILS OF E.U.T. ............................................................................................................................. 4 4.3 TEST FACILITY .................................................................................................................................... 5 5 EQUIPMENT USED DURING TEST ......................................................................................................... 6 5.1 EQUIPMENT LIST ................................................................................................................................. 6 6 SAR INTRODUCTION............................................................................................................................... 7 6.1 INTRODUCTION .................................................................................................................................... 7 6.2 SAR DEFINITION ................................................................................................................................. 7 7 SAR MEASUREMENT SETUP ................................................................................................................. 8 8 EXPOSURE LIMIT .................................................................................................................................. 17 9 SYSTEM AND LIQUID VALIDATION ..................................................................................................... 18 9.1 SYSTEM VALIDATION .......................................................................................................................... 18 9.2 LIQUID VALIDATION ............................................................................................................................. 20 10 TYPE A MEASUREMENT UNCERTAINTY............................................................................................ 28 11 OUTPUT POWER VERIFICATION ......................................................................................................... 31 11.1 TEST CONDITION........................................................................................................................... 31 11.2 TEST PROCEDURES ...................................................................................................................... 31 11.3 TEST RESULT ............................................................................................................................... 32 12 EXPOSURE CONDITIONS CONSIDERATION ...................................................................................... 64 12.1 EUT ANTENNA LOCATION .............................................................................................................. 64 12.2 TEST POSITION CONSIDERATION .................................................................................................... 64 13 SAR TEST RESULTS ............................................................................................................................. 65 13.1 TEST CONDITION........................................................................................................................... 65 13.2 GENERALLY TEST PROCEDURES .................................................................................................... 65 13.3 SAR SUMMARY TEST RESULT ....................................................................................................... 66 14 SAR MEASUREMENT REFERENCE .................................................................................................... 76 14.1 REFERENCES ..........…

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We-Wins Wireless Antenna specification M47 PCB onboard antenna M47 on-board PCB antenna Production Date Date: February 4, 2024 确认栏 Confirmation of user： Designed by 拟制 Reviewed by 审核 Approved by 批准 刘东山 崔岑 周向阳 We-Wins Wireless Test Equipment Chamber We-Wins Wireless Item Describe Input impedance 50Ω VSWR ＜2.5 Main antenna efficiency 4G LTE B2: ‐1.8dB B4: ‐1.7dB B5: ‐2.0dB B12: ‐6.5dB B13: ‐5.5dB B66: ‐1.7dB Diversity antenna efficiency 4G LTE B2: ‐2.1dB B4: ‐1.9dB B5: ‐2.5dB B12: ‐6.8dB B13: ‐6dB B66: ‐1.9dB WiFi antenna efficiency 2.4G: ‐1.8dB Main antenna Gain 4G LTE B2: 3.1dBi B4: 3.2dBi B5: 2.6dBi B12: ‐1dBi B13: ‐0.8dBi B66: 3.2dBi Diversity antenna Gain 4G LTE B2: 2.9dBi B4: 3.1dBi B5: 1.6dBi B12: ‐1.2dBi B13: ‐1dBi B66: 3.1dBi WiFi antenna Gain 2.4G: 2.8dBi Polarization Linear Polarization We-Wins Wireless Antenna Shape Frequency/Type 700‐960MHz 1710‐2690MHz PCB 700‐960MHz 1710‐2690MHz PCB 2400‐2500MHz PCB We-Wins Wireless Main Antenna We-Wins Wireless We-Wins Wireless We-Wins Wireless Diversity Antenna We-Wins Wireless We-Wins Wireless We-Wins Wireless WiFi Antenna We-Wins Wireless

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 85 TEST REPORT Referen ce No. .................... : WTD24D01019167W002 FCC ID ................................ : 2BEPN-M47 Applicant ............................ : WEWINS TECHNOLOGY LIMITED Address .............................. : Room 1003, 10/F, Tower 1, Lippo Centre, 89 Queensway, Admiralty, Hon g Kong Manufacturer .................... : WEWINS TECHNOLOGY LIMITED Address .............................. : Room 1003, 10/F, Tower 1, Lippo Centre, 89 Queensway, Admiralty, Hon g Kong Product ............................... : LTE MiFi Router Model(s). ............................ : M47 Standards........................... : FCC 47CFR Part 15.247 Date of Receipt sample .... : 2024-01-26 Date of Test ....................... : 2024-02-19 to 2024-03-12 Date of Issue ...................... : 2024-03-18 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: James Cheng / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTD24D01019167W002 Page 2 of 85 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 CONTENTS ............................................................................................................................................... 2 3 REVISION HISTORY ................................................................................................................................. 4 4 GENERAL INFORMATION ....................................................................................................................... 5 4.1 GENERAL DESCRIPTION OF E.U.T. ....................................................................................................... 5 4.2 DETAILS OF E.U.T. .............................................................................................................................. 5 4.3 CHANNEL LIST ..................................................................................................................................... 5 4.4 TEST FACILITY .................................................................................................................................... 6 4.5 SUBCONTRACTED ................................................................................................................................ 6 4.6 ABNORMALITIES FROM STANDARD CONDITIONS .................................................................................... 6 4.7 TEST MODE ........................................................................................................................................ 7 5 TEST SUMMARY ...................................................................................................................................... 8 6 EQUIPMENT USED DURING TEST ......................................................................................................... 9 6.1 EQUIPMENTS LIST ............................................................................................................................... 9 6.2 DESCRIPTION OF SUPPORT UNITS ...................................................................................................... 10 6.3 MEASUREMENT UNCERTAINTY ........................................................................................................... 10 6.4 TEST EQUIPMENT CALIBRATION ......................................................................................................... 10 7 DUTY CYCLE .......................................................................................................................................... 11 8 CONDUCTED EMISSION ....................................................................................................................... 14 8.1 E.U.T. OPERATION ............................................................................................................................ 14 8.2 EUT SETUP ...................................................................................................................................... 14 8.3 MEASUREMENT DESCRIPTION ............................................................................................................ 14 8.4 CONDUCTED EMISSION TEST RESULT ................................................................................................ 15 9 RADIATED EMISSIONS ......................................................................................................................... 17 9.1 EUT OPERATION ............................................................................................................................... 17 9.2 TEST SETUP ..................................................................................................................................... 18 9.3 SPECTRUM ANALYZER SETUP ............................................................................................................ 19 9.4 TEST PROCEDURE ............................................................................................................................. 20 9.5 CORRECTED AMPLITUDE & MARGIN CALCULATION .............................................................................. 20 9.6 SUMMARY OF TEST RESULTS ............................................................................................................. 21 10 CONDUCTED SPURIOU…

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