2BESC-HT6903SX7Wwireless charge table lamp

Reference No.: WTN25X12351064W Page 1 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 12 TEST REPORT Reference No. ................... .: WTN25X12351064W002 FCC ID ............................... .: 2BESC-HT6903SX7W Applicant .......................... .: ZHEJIANG TOPMB ELECTRICAL LIGHTING CO.,LTD Address ............................ .: No. 273, Yuexiu Middle Road, Caoe Street, Shangyu District,Shaoxing,Zhejiang, China Manufacturer .................... .: The same as Applicant Address ............................ .: The same as Applicant Product Name .................. .: wireless charge table lamp Model No... ........................ .: HT6903SX 7W DIM+CCT Standards ......................... .: KDB 680106 D01 V04 Date of Receipt sample ... .: 2025-12-30 Date of Test....................... .: 2026-01-06 to 2026-01-21 Date of Issue .................... .: 2026-01-21 Test Report Form No. ...... . : WTX_KDB 680106_D01_V04W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Gala Wang/Project Engineer Jason Su/Manager Reference No.: WTN25X12351064W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 12 TABLE OF CONTENTS 1. GENERAL INFORMATION ..................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) .................................................................................. 4 1.2 AUXILIARY EQUIPMENT LIST AND DETAILS .............................................................................................................. 5 1.3 TEST EQUIPMENT LIST AND DETAILS ........................................................................................................................ 6 2. RF EXPOSURE TEST REPORT ............................................................................................................................... 7 2.1 STANDARD APPLICABLE ............................................................................................................................................ 7 2.2 TEST CONDITIONS ..................................................................................................................................................... 7 2.3 TEST PROCEDURE ...................................................................................................................................................... 8 2.4 TEST RESULT............................................................................................................................................................. 9 2.5 MEASUREMENT UNCERTAINTY ............................................................................................................................... 11 APPENDIX PHOTOGRAPHS ...................................................................................................................................... 12 Reference No.: WTN25X12351064W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 12 Report version Version No. Date of issue Description Rev.00 2026-01-21 Original / / / Reference No.: WTN25X12351064W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 12 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) General Description of EUT Product Name: wireless charge table lamp Trade Name: / Model No.: HT6903SX 7W DIM+CCT Adding Model(s): / Power Adapter: RSS1006-240120-W2-B Input: 100-240V ~ 50/60Hz 1.4A Output: DC12V 2.0A Output Power: 24W Battery Capacity / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Frequency Range: 112-205kHz Modulation Type: / Antenna Type: Coil Antenna Antenna Gain 0dBi Rated Voltage: Input: DC 12V Rated Current: Input: 2A Rated Power: Wireless charge: 7W Note The Antenna Gain is provided by the customer and can affect the validity of results. Reference No.: WTN25X12351064W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 5 of 12 1.2 Auxiliary Equipment List and Details Auxiliary Equipment List and Details Description Manufacturer Model Serial Number / / / / EUT Cable List and Details Cable Description Length (M) Shielded/Unshielded With Core/Without Core DC Cable 1.8 Unshielded Without Ferrite Reference No.: WTN25X12351064W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 6 of 12 1.3 Test Equipment List and Details Description Manufacturer Model Serial No. Cal Date Due Date ELECTRIC AND MAGNETIC FIELD ANALYZER Narda EHP-200AC 180ZX10226 2025-03-07 2026-03-06 Note: The deviation response is 0.8dB. Reference No.: WTN25X12351064W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 7 of 12 2. RF Exposure Test Report 2.1 Standard Applicable According to§1.1310 system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. 2.2 Test Conditions Test Mode Description Remark Power Supply Mode TM1 Wireless Charging Input: DC 12V Wireless charging: output 7W DC 12V-2A Note: The EUT was tested with empty load, half load, and full load, and recorded the worst mode (full load) data in the report. Measurement Distance: 15 cm and 20 cm Reference No.: WTN25X12351064W002 Waltek Testing Gr…

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一 、 DIME N S I O N : ( m m C o i l s p e c i f i c a t i o n ) A 1 6 ± 2 B 3 ± 2 20 . 5 ± 0 . 5 C 4 2 . 5 ± 1 D 49 . 5 ± 0 . 5 E H 2 . 5 ± 0 . 3 二 NOTE 1 . Intersection line ; 2. The lead position is wrap ped with 9mm (ref) width a nd height Temperature adhesive paper 1-2Ts; 3. The coil is attached with a round hard magnetic sheet with a groove, magnetic sheet size 49.5±0.5mm, inn er hole 5.3mm, with a thickness of 1.0±0.2mm. 、SCHEMATIC DIAGRAM: 、 F O N O . 三、WindingSpecification: C C Winding Directio T E R M I NA L n WIRE Silk-covered wire 0.08*105P W 1 S F 4 . ELECTRICALCHARACTERISTICS: TEMPERATURE:25±10°C T u r n s 1 0 T s ,RELATIVE HUMIDITY:65±20% T E ST E Q U IP M E TE R M I N IT E N O . M AL NTS T EST FRE Q U EN C S PE C IFI C A T I O N Y 1 2 3 IND . I N D . D C R 100 KH z / 1 . 0 V 1 00 K H z / 1 . 0 V 1 0 0 KH z / 1 . 0 100 K H z / 1 . 0 V 3.8uH±20%Single Line Circle 6 . 3uH ± 10%Magnetized sheet ≤ 53 m Q ≥ 7 5 V L C Z ME T ER 1 0 6 2 B L C Z METER 1 0 6 2 B L C Z M ET E R 5 0 2 B L C ZMETER 5 02 B QValue S - S - F S - F S - F F 4 Electrical characteristics Temperature:20 ±10°C,Humidity:65±20% 1 Summary ITE Coil Specification M ModelNam Coil e TERMINA Winding Specification TB1205QI-V5 PCBA-COIL : L Turns SF Silk-covered wire 0.08*105P 10Ts CCW Electrical Characteristics TERMINAL Manufacturer ShenzhenOJDTechnologyCo.,Ltd. Winding Wire Direction ITEMSPECIFICATIONTEST FREQUENCYTEST EQUIPMENTS IND . I N D . D C R QValue S - F S - F S - F S - F ≤53m 6.3uH±10% Magnetizedshee t Q 3.8uH±20%Single Line Circle 100KHz/1.0V ≥ 7 5 100KHz/1.0V 100KHz/1.0V 100KHz/1.0V LCZMETER1062B LCZMETER1062B LCZMETER502B LCZMETER502B Electrical TEMPERATURE:25±10°C, RELATIVE HUMIDITY:65±20% Characteristics 2 Basic Parameter 1.Input Voltage/Current:DC-5V 0.5V 500mA-2A; DC-12V600mA 2.Output Voltage/Current: 5V/1A 3.The Surface Temperature:50°C 5°C 4.Working Temperature:-20°C-60°C 5.Operation Frequency:112KHz-205KHz 6.Charging Distance:<=8mm 7.Efficiency:>=70%e 8.Relative Humidity:10%-80%

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 27 TEST REPORT Reference No. ................... .: WTN25X12351064W001 FCC ID ............................... .: 2BESC-HT6903SX7W Applicant .......................... .: ZHEJIANG TOPMB ELECTRICAL LIGHTING CO.,LTD Address ............................ .: No. 273, Yuexiu Middle Road, Caoe Street, Shangyu District,Shaoxing,Zhejiang, China Manufacturer .................... .: The same as Applicant Address ............................ .: The same as Applicant Product Name .................. .: wireless charge table lamp Model No... ........................ .: HT6903SX 7W DIM+CCT Standards ......................... .: FCC Part 15C Date of Receipt sample ... .: 2025-12-30 Date of Test....................... .: 2026-01-06 to 2026-01-21 Date of Issue .................... .: 2026-01-21 Test Report Form No. ...... . : WTX_Part 15CW Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Gala Wang/Project Engineer Jason Su/Manager Reference No.: WTN25X12351064W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 27 ABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND OPERATION MODE ...................................................................................................................... 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. RF EXPOSURE ....................................................................................................................................................... 13 3.1 STANDARD APPLICABLE ....................................................................................................................................... 13 3.2 TEST RESULT........................................................................................................................................................ 13 4. ANTENNA REQUIREMENT ................................................................................................................................ 14 4.1 STANDARD APPLICABLE ....................................................................................................................................... 14 4.2 EVALUATION INFORMATION ................................................................................................................................ 14 5. CONDUCTED EMISSIONS .................................................................................................................................. 15 5.1 TEST PROCEDURE ................................................................................................................................................. 15 5.2 BASIC TEST SETUP BLOCK DIAGRAM ................................................................................................................... 15 5.3 ENVIRONMENTAL CONDITIONS ............................................................................................................................ 15 5.4 TEST RECEIVER SETUP ......................................................................................................................................... 16 5.5 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 16 6. FIELD STRENGTH OF SPURIOUS EMISSIONS ............................................................................................. 19 6.1 STANDARD APPLICABLE ....................................................................................................................................... 19 6.2 TEST PROCEDURE ................................................................................................................................................. 19 6.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 20 6.4 ENVIRONMENTAL CONDITIONS ............................................................................................................................ 21 6. REFERENCE MEASUREMENT AT OPEN FIELD SITE ................................................................................................... 21 6.5 SUMMARY OF TEST…

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