2BEWX-SS200CAI Speaker

ZhejiangLingzhuTechnologyCo.,Ltd. FCCID : 2BEWX-SS200C POWEROF ATTORNEY Date:May19,2026 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD 21046 To WhomIt MayConcern: We,theundersigned,herebyauthorizeWaltekTestingGroupCo.,Ltd.(DevalQin ) on ourbehalf,to applyto theFederalCommunicationsCommissionon our equipment.Anyandallactscarriedoutby WaltekTestingGroupCo.,Ltd.(Deval Qin ) on ourbehalfshallhavethesameeffectas actsof ourown.This authorizationexpireson Dec.31,2026. Sincerely, zhejiangLingzhuTechnologyCo.,Ltd. Signature LinyunLi / Manager TypednameandTitle

Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 3 of 11 2. Photographs –Constructional Details 2.1. EUT – External View Model SS200-C FCC ID: 2BEWX-SS200C Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 4 of 11 Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 5 of 11 Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 6 of 11

Arial-Bold-8pt Arial-Regular-5pt SN为变量 SN获取来源: 通过PMS系统扫描模组上的SN获取 PET不干胶-打印机打印 SS200-C 48.5 mm 48.5 mm 4mm 5 mm 7 mm 3.0 mm S/N: ZR118061234567 Product Specification Model: SS200-C Power Input: DC 5V 2A FCC ID: 2BEWX-SS200C Manufacturer: Zhejiang Lingzhu Technology Co., Ltd Made in China AI Speaker S/N: ZR118061234567 Product Specification Model: SS200-C Power Input: DC 5V 2A FCC ID: 2BEWX-SS200C Manufacturer: Zhejiang Lingzhu Technology Co., Ltd Made in China AI Speaker 5.2 mm Label Location

Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 7 of 11 2.2. EUT – Internal View Model SS200-C FCC ID: 2BEWX-SS200C Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 8 of 11 Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 9 of 11 Wi-Fi/Bluetooth LEANT

Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 10 of 11 Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 11 of 11 = =====End====== Bluetooth LE/BluetoothANT

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 8 TEST REPORT Referen ce No. .................... : WTH26D05125401W006 FCC ID ................................ : 2BEWX-SS200C Applicant ............................ : Zhejiang Lingzhu Technology Co., Ltd. Address .............................. : Room 302, No 1 Building Huace Center, Xihu District, Hangzhou City, Zhejiang Province, China Manufacturer .................... : Zhejiang Lingzhu Technology Co., Ltd. Address ............................. : Room 302, No 1 Building Huace Center, Xihu District, Hangzhou City, Zhejiang Province, China Factory ............................... : SHENZHEN GIEC DIGITAL CO.,LTD Address ............................. : 1st & 3rd Building, No. 26 Puzai Road, Pingdi, Longgang District, Shenzhen, China. Product ............................... : AI Speaker Model(s). ............................ : SS200, SS200-C, SS200-D Standards........................... : FCC 47CFR Part 2 Subpart J Section 2.1091 Date of Receipt Sample .... : 2026-05-11 Date of Test ....................... : 2026-05-12 to 2026-06-11 Date of Issue ...................... : 2026-06-24 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Estel Qian / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTH26D05125401W006 Page 2 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2. Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2. CONTENTS ............................................................................................................................................... 2 3. REVISION HISTORY ................................................................................................................................. 3 4. GENERAL INFORMATION ....................................................................................................................... 4 4.1. GENERAL DESCRIPTION OF E.U.T.................................................................................................... 4 4.2. DETAILS OF E.U.T. ......................................................................................................................... 4 4.3. TEST FACILITY ................................................................................................................................ 5 4.4. SUBCONTRACTED ........................................................................................................................... 5 4.5. ABNORMALITIES FROM STANDARD CONDITIONS ................................................................................ 5 5. TEST SUMMARY ...................................................................................................................................... 6 6. RF EXPOSURE ......................................................................................................................................... 7 6.1. REQUIREMENTS .............................................................................................................................. 7 6.2. THE PROCEDURES / LIMIT ................................................................................................................ 7 6.3. MPE CALCULATION METHOD........................................................................................................... 8 6.4. RADIO FREQUENCY RADIATION EXPOSURE EVALUATION ................................................................... 8 Reference No.: WTH26D05125401W006 Page 3 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 3. Revision History Test Report No. Date of Receipt Sample Date of Test Date of Issue Purpose Comment Approved WTH26D05125401W006 2026-05-11 2026-05-12 to 2026-06-11 2026-06-24Original - Valid Reference No.: WTH26D05125401W006 Page 4 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4. General Information 4.1. General Description of E.U.T. Product: AI Speaker Model(s): SS200, SS200-C, SS200-D Model Description: Only the model names are different. The model SS200-C was tested in this report. Test Sample No.: 1-1/1 Bluetooth Version: Tuya Module: V5.4 JL Module: V6.0 Wi-Fi Specification: 2.4G-802.11b/g/ n(HT20/40)/ax(HE20/40) Hardware Version: DMSS200-CV1.3 Software Version: V2.6.0 4.2. Details of E.U.T. Operation Frequency: 2.4G Wi-Fi: 802.11b/g/n HT20/ax HE20: 2412~2462MHz 802.11n HT40/ax HE40: 2422~2452MHz Bluetooth LE/ Bluetooth: 2402~2480MHz Max. RF output power: Tuya Module: 2.4G Wi-Fi: 18.81dBm LE 125k: 4.78dBm, LE 500k: 4.78dBm, LE 1M: 6.92dBm JL Module: LE 1M: 7.86dBm, LE 2M: 8.14dBm Bluetooth: 9.05dBm Type of Modulation: 2.4G Wi-Fi: DSSS, OFDM, OFDMA Bluetooth LE: GFSK Bluetooth: GFSK, π/4DQPSK, 8DPSK Antenna installation: Tuya Module 2.4G Wi-Fi/ Bluetooth LE: FPC Antenna JL Module Bluetooth LE/ Bluetooth: PCB Antenna Antenna Gain: Tuya Module 2.4G Wi-Fi/ Bluetooth LE: 3.89dBi JL Module Bluetooth LE/ Bluetooth: -0.48dBi Note: #: The antenna gain is provided by the applicant, and the applicant should be responsible for its authenticity, WALTEK lab has not verified the authenticity of its information. Ratings: Input: DC 5V⎓2A Adapter: Model: DCT10W050200US-C1 Input: 100-240V~, 50/60Hz, 0.3A Output: 5.0V⎓2.0A Manufacturer: Zhuzhou Dachuan Electronic Technology Co.,Ltd. Reference No.: WTH26D05125401W006 Page 5 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4.3. Test Faci…

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Antenna Specification Item: Model No.: Ant. Type: Frequency Range: Max. Gain: Impedance: Date: Antenna Specification SS200-2.4G PCB Antenna 2400~2500MHz -0.48dBi 50Ω 2026 -4 -15 Antenna Dimensions Gain and Efficiency Freq Effi Gain (MHz) (%) (dBi) 2400 31.16 -0.6 2410 28.31 -0.48 2420 26.34 -0.49 2430 24.54 -0.72 2440 22.35 -1.18 2450 21.16 -1.76 2460 19.52 -2.4 2470 17.62 -3.45 2480 17.3 -3.71 2490 16.75 -3.91 2500 15.68 -4.58 Radiation Pattern

深圳市林荣科技有限公司 Page 1 样品承认书 Confirmationofproducts 公司名称：深圳市林荣科技有限公司 Designer：SHENZHENLINRONGTECHNOLOGYCO.,LTD 地址：深圳市龙华区大浪街道华荣路联建工业园1栋3楼 ADD：Floor3,building1,LianJianIndustrialPark,HuarongRoad,Dalangstreet,Longhua District,Shenzhen 客户名称 深圳市杰科数码有限公司 Customer 项目名称 SS200 版本 A.2 日期 2026-04-17 ProjectNameVersionDate 项目料号 34.13.02.015 客户料号 Customer NO. 1420401020 ProjectNO. 频段 2400~~2500MHz 备注 Notes 增加手撕位 FrequencyRange 设计 田秋奎王宇张海燕 DesignedBy 审核 解瑞洁 ApprovedBy 客户确认 Clients’Approval 深圳市林荣科技有限公司 Page2 Index 1.Specifications··················································································3 2.Electricspecifications········································································3 2-1Matchingcircuitdiagram································································3 3.VSWRTesting·················································································3 3-1Testingconnection···········································································3 3-2VSWR··························································································3 3-3Testingdata···················································································4 4.Testtheefficiencyoftheantenna.......................................................4 4-1Testingfield···················································································4 4-2Testingresults.........................................................................................5 5.Environmentaltreatment..................................................................................5 6.MechanicalDimensionDrawing·····························································6 7.MechanicalDimensionTestingreport······················································7 8、Packagingstandard..................................................................................................8 深圳市林荣科技有限公司 Page3 1、Specification Thisreportmainlyprovidesthetestingconditionsofvariouselectricandstructuralperformanceparameters forcellphoneantenna----SS200Picture1showstheantennadesignedbyLR. 2、Matchingcircuitdiagram 3、VSWRTesting 3.1Testingconnection TheVSWRtestingdevicesareconnectedinsequence:Agilent5071CNetworkAnalyzer→TestingCable→ Customer-providingDevices. 3.2VSWR ThefollowingtableexpressestheVSWRvalueofantenna’stwoedgesofitsfrequencyrange.With regardtotherelevantdiagramofVSWR SS200WIFIVSWR Frequency (MHz) 240024502500 VSWR 1.831.761.57 深圳市林荣科技有限公司 Page4 3.3Testingdata SS190antennaVSWR 2400MHz2450MHz2500MHz 4、TesttheefficiencyoftheantennaTesting 4.1Testingfield LRMicrowaveAnechoicChamber：testingfrequencyrangesfrom400MHzto6GHzandthe40cm diametersphericalquitezone,thechamberprovideslessthan－90dBreflectivityfrom400MHz—6GHz. 4.2Testingresults ThefollowingtableindicatesthetestingresultsrelatedtoPowerandSensitivityinMicrowaveAnechoic 深圳市林荣科技有限公司 Page5 Chamber，concerningtherelativediagram. 以下SS200天线无源数据： Freq(MHz)Gain(dBi)Efficiency(%) 2400 3.2567.84 2410 3.5368.92 2420 3.7070.22 2430 3.7770.24 2440 3.8370.38 2450 3.8971.00 2460 3.8470.73 2470 3.8471.49 2480 3.8072.15 2490 3.6571.38 2500 3.5371.68 以下SS200天线有源数据： WIFICHDataRate TPRTIS 11b 111 14.39-77.73 611 15.73-79.75 1111 15.73-81.54 11G 154 13.91-59.20 654 14.14-71.67 1154 14.44-71.84 11N 1MCS7 13.94-56.59 6MCS7 14.08-64.20 11MCS7 14.43-54.46 5、Environmentaltreatment Originalmachineenvironmentstatus 深圳市林荣科技有限公司 Page6 6、MechanicalDimensionDrawing 深圳市林荣科技有限公司 Page7 7.MechanicalDimensionTestingreport 深圳市林荣科技有限公司 Page8 8、Packagingstandard 包装说明：具体包装数量以实物为准，图片只显示包装的方式，并非此项目实物。 PackagingDescription:thespecificpackagingquantityissubjecttothephysicalobject.Thepictureonlyshows thewayofpackaging,notthephysicalobjectoftheproject 天线用PE袋包装 Thetopcoverboard,withPEfilmpackaging 防潮防水PET袋封装，放于纸箱内 MoistureproofwaterproofPETbagpackaging， Putinthecartons 纸箱用胶带封口 Cartonsealingwithducttape 包装箱整箱外观（） Casesappearance

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 78 TEST REPORT Re ference No. .................... : WTH26D05125401W005 FCC ID ................................ : 2BEWX-SS200C Applicant ............................ : Zhejiang Lingzhu Technology Co., Ltd. Address .............................. : Room 302, No 1 Building Huace Center, Xihu District, Hangzhou City, Zhejiang Province, China Manufacturer .................... : Zhejiang Lingzhu Technology Co., Ltd. Address .............................. : Room 302, No 1 Building Huace Center, Xihu District, Hangzhou City, Zhejiang Province, China Factory ............................... : SHENZHEN GIEC DIGITAL CO.,LTD Address ............................. : 1st & 3rd Building, No. 26 Puzai Road, Pingdi, Longgang District, Shenzhen, China. Product ............................... : AI Speaker Model(s). ............................ : SS200, SS200-C, SS200-D Standards........................... : FCC 47CFR Part 15.247 Date of Receipt Sample .... : 2026-05-11 Date of Test ....................... : 2026-06-01 to 2026-06-04 Date of Issue ...................... : 2026-06-24 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Estel Qian / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTH26D05125401W005 Page 2 of 78 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 CONTENTS ............................................................................................................................................... 2 3 REVISION HISTORY ................................................................................................................................. 4 4 GENERAL INFORMATION ....................................................................................................................... 5 4.1 GENERAL DESCRIPTION OF E.U.T. ....................................................................................................... 5 4.2 DETAILS OF E.U.T. .............................................................................................................................. 5 4.3 CHANNEL LIST ..................................................................................................................................... 6 4.4 TEST MODE ........................................................................................................................................ 6 4.5 TEST FACILITY .................................................................................................................................... 7 5 TEST SUMMARY ...................................................................................................................................... 8 6 EQUIPMENT USED DURING TEST ......................................................................................................... 9 6.1 EQUIPMENTS LIST ............................................................................................................................... 9 6.2 DESCRIPTION OF SUPPORT UNITS ...................................................................................................... 10 6.3 MEASUREMENT UNCERTAINTY ........................................................................................................... 10 7 CONDUCTED EMISSION ....................................................................................................................... 11 7.1 E.U.T. OPERATION ............................................................................................................................ 11 7.2 EUT SETUP ...................................................................................................................................... 11 7.3 MEASUREMENT DESCRIPTION ............................................................................................................ 11 7.4 CONDUCTED EMISSION TEST RESULT ................................................................................................ 12 8 RADIATED SPURIOUS EMISSIONS ..................................................................................................... 14 8.1 EUT OPERATION ............................................................................................................................... 14 8.2 TEST SETUP ..................................................................................................................................... 15 8.3 SPECTRUM ANALYZER SETUP ............................................................................................................ 16 8.4 TEST PROCEDURE ............................................................................................................................. 17 8.5 CORRECTED AMPLITUDE & MARGIN CALCULATION .............................................................................. 17 8.6 SUMMARY OF TEST RESULTS ............................................................................................................. 18 9 CONDUCTED SPURIOUS EMISSIONS ................................................................................................. 21 9.1 TEST PROCEDURE ............................................................................................................................. 21 9.2 TEST RESULT .......................................…

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Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 1 of 11 1. Test Setup photos Model SS200-C FCC ID: 2BEWX-SS200C 1.1 Photograph – Conducted Emission For Conducted Emission Test Site 1# 1.2 Photograph – Radiated Emissions For 9kHz-30MHz Test Site 2# Appendix-SS200-C-Photos Reference No.: WTH26D05125401W Page 2 of 11 For 30MHz-1000MHz Test Site 2# For Above 1 GHz Test Site 1#