2BFCX-C10Smart Pet Collar

Report No.: TCWA25070057801 Appendix D 1. Test Sample Photo 1: Front View Photo 2: Back View Report No.: TCWA25070057801 2. Test positions Photo 3: Front side 0mm Photo 4: Back side 0mm Photo 5: Left side 0mm Photo 6: Right side 0mm Photo 7: Top side 0mm Photo 8: Bottom side 0mm

Test Model：C10 Radiated Emissions AC Conducted Emission RF Conducted Emission

Page 1 of 42 Report No.: HK2506263445-1E FCC Test Report Test report On Behalf of Shenzhen Shire Star Electronic Technology Co., Ltd. For Smart Pet Collar Model No.: C10 FCC ID: 2BFCX-C10 Prepared For : Shenzhen Shire Star Electronic Technology Co., Ltd. 2nd Floor, Building F, Guanghao Industrial Park, Yunfeng Road, Longhua District, Shenzhen, China Prepared By : Shenzhen HUAK Testing Technology Co., Ltd. 1-2/F., Building B2, Junfeng Zhongcheng Zhizao Innovation Park, Heping, Fuhai Street, Bao’an District, Shenzhen, Guangdong, China Date of Test: Jun. 26, 2025 ~ Aug. 15, 2025 Date of Report: Aug. 15, 2025 Report Number: HK2506263445-1E Applica Address Manufa c Address Produc t Trade M Product Model a n Standar This pub the She source o and wil reprodu Date of T Date (s) Date of I Test Res nt’s name . .................. cturer's Nam .................. t descriptio ark: name .......... nd/or type re rds ............. blication ma enzhen HU of the mate l not assu ced materia Test ........... o f performa Issue .......... sult .............. T T A .................. .................. me ............. .................. on .................... eference .. .................. ay be repro AK Testing erial. Shenz ume liability al due to its ................... nce of tests ................... ................... Testing Eng Technical M Authorized S Test R : Shenzhe : 2nd Floo r Longhua : Shenzhe : 2nd Floo r Longhua N/A : Smart P e : C10 : 47 CFR F KDB 558 ANSI C6 oduced in w g Technolog zhen HUAK y for dama placement ................ : ................ : ................ : ................ : ineer Manager Signatory Page 2 of 42 Result Ce n Shire Star r, Building F, District, She n Shire Star r, Building F, District, She et Collar FCC Part 15 8074 D01 15 3.10: 2020 whole or in gy Co., Ltd K Testing Te ages result and contex Jun. 26, 2 Aug. 15, 2 Pass 2 ertificatio rElectronic T Guanghao enzhen, Chin rElectronic T Guanghao enzhen, Chin 5 Subpart C 5.247 Meas part for non d. is ackno echnology C ting from t xt. 2025 ~ Aug. 2025 Len Liao Sliver Wa Jason Zh o Rep on Technology C Industrial Pa na Technology C Industrial Pa na C 15.247 Guidance v n-commerci owledged as Co., Ltd. tak the reader' 15, 2025 o an ou port No.: HK2 Co., Ltd. ark, Yunfeng Co., Ltd. ark, Yunfeng v05r02 ial purpose s copyrigh t kes no resp s interpreta 2506263445 g Road, g Road, s as long a t owner an ponsibility fo ation of th 5-1E as nd or he Page 3 of 42 Report No.: HK2506263445-1E Contents Page 1 Test Summary ................................................................................................................................................ 5 1.1 Test Description ......................................................................................................................................... 5 1.2 Measurement Uncertainty ......................................................................................................................... 6 1.3 Information of the Test Laboratory ............................................................................................................ 6 2 General Information ....................................................................................................................................... 7 2.1 General Description of EUT ...................................................................................................................... 7 2.2 Description of Test Conditions .................................................................................................................. 9 2.3 Description of Test Setup ........................................................................................................................ 10 2.4 Description of Support Units .................................................................................................................... 11 3 Equipments List for All Test Items ............................................................................................................. 12 4 Test Result .................................................................................................................................................... 13 4.1 Antenna Requirement.............................................................................................................................. 13 4.2 AC Power Line Conducted Emission ...................................................................................................... 14 4.3 Radiated Emissions Measurement .......................................................................................................... 18 4.4 Maximum Peak Output Power Measurement ......................................................................................... 27 4.5 Power Spectral Density ........................................................................................................................... 28 4.6 6db Bandwidth ......................................................................................................................................... 31 4.7 Occupied Bandwidth ................................................................................................................................ 33 4.8 Band Edge ............................................................................................................................................... 34 4.9 Conducted Spurious Emissions .............................................................................................................. 36 5 Test Setup Photos of the EUT .................................................................................................................... 40 6 Photos of the EUT ........................................................................................................................................ 42 Page 4 of 42 Report No.: HK2506263445-1E ** Modified History ** Revision Description Issued Data Remark Revision 1.0 Initi…

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4th Floor, Building 3, No. 10 Yinyang Road, Zhangyang, Zhangmutou Town, Dongguan City 东莞市致研科 Dongguan Zhiyan Te 版本变 变更日期变更内容 科技有限公司 echnology Co., Ltd 变更记录 版本 变更人 批准人 2 东莞市致研科 Dongguan Zhiyan Te 序号内容 1. 承认书项目表(Index) 序号内容 - 承认书封面 - 版本变更记录 1承认书项目表1承认书项目表 2 试验设备和条件 3 样机结构说明件 4 图纸 5 TRP/TIS/3D图 6 苹果图 科技有限公司 chnology Co., Ltd 容页码容页码 1 2 33 件4 件5 7 8 9 3 东莞市致研科 Dongguan Zhiyan Te 2. 试验设备和条件(Test Eq 2.1．Network Analyzers : KEYS 2.2．Communications Test Set: 2.3．3D Chamber Test System: 科技有限公司 chnology Co., Ltd quipment & Conditions) SIGHTP5002A R&SCMW500 24探头测试系统 4 东莞市致研科 Dongguan Zhiyan Te 3. 样机结构说明件(Mecha 科技有限公司 chnology Co., Ltd anical instruction) BT天线位置 5 BT天线图纸： 555：效率 6：3D图

Sushi TOWE Wireless Testing (Shenzhen) Co., Ltd. Report No.: TCWA25070057801 Sushi TOWE Wireless Testing(Shenzhen) Co., Ltd. Email: [email protected] Tel.: +86-755-27212361 TOWE-QP-15-F05 Rev.1.1 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from TOWE. FCC SAR Test Report Applicant: Shenzhen Shire Star Electronic Technology Co., Ltd. EUT Description: Smart Pet Collar Model: C10 FCC ID: 2BFCX-C10 Standards: FCC 47CFR §2.1093 Date of Receipt: 2025/07/24 Date of Test: 2025/08/13 to 2025/08/15 Date of Issue: 2025/08/22 TOWE. tested the above equipment in accordance with the requirements set forth in the above standards. The test results show that the equipment tested is capable of demonstrating compliance with the requirements as documented in this report. the results documented in this report apply only the tested sample, under the conditions and modes of operation as described herein. It is the manufacturer's responsibility assure that additional production units of the model are manufactured with identical electrical and mechanical components. All sample tested were in good operating condition throughout the entire test program. Measurement Uncertainties are published for informational purposes only and were not taken into account unless noted otherwise. without written approval of TOWE, the test report shall not be reproduced except in full. Jim Huang Approved By: Jack Li Reviewed By: Page 2 / 52 Report No.: TCWA25070057801 Sushi TOWE Wireless Testing(Shenzhen) Co., Ltd. Email: [email protected] Tel.: +86-755-27212361 TOWE-QP-15-F05 Rev.1.1 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from TOWE. Revision History Rev. Issue Date Description Revised by 01 2025/08/22 Original Jack Li Page 3 / 52 Report No.: TCWA25070057801 Sushi TOWE Wireless Testing(Shenzhen) Co., Ltd. Email: [email protected] Tel.: +86-755-27212361 TOWE-QP-15-F05 Rev.1.1 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from TOWE. Table of Contents 1 Summary of Test Results .................................................................................................................................. 5 2 Guidance Applied ............................................................................................................................................... 6 3 Lab Information .................................................................................................................................................. 6 3.1 Testing Location ...................................................................................................................................................................... 6 3.2 Test Facility / Accreditations ................................................................................................................................................ 6 3.3 Ambient Condition .................................................................................................................................................................. 6 4 Client Information ............................................................................................................................................... 6 4.1 Applicant ................................................................................................................................................................................... 6 4.2 Manufacturer ............................................................................................................................................................................ 6 5 Product Information ........................................................................................................................................... 7 5.1 Antenna Locations (Front View) .......................................................................................................................................... 8 6 RF Exposure Limits ........................................................................................................................................... 9 7 Introduction ....................................................................................................................................................... 10 7.1 SAR Definition ........................................................................................................................................................................ 10 8 SAR Measurements System ........................................................................................................................... 11 8.1 The SAR Measurement Set-up ........................................................................................................................................... 11 8.2 Measurement procedure...................................................................................................................................................... 12 8.2.1 Power reference measurement ................................................................................................................................... 12 8.2.2 Area scan ....................................................................................................................................................................... 12 8.2.3 Zoom Scan .............................................................................................................................................…

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D750V3 SN 1231 Extended Dipole Calibrations Referring to KDB 865664, if dipoles are verified in return loss (<-20dB, within 20% of prior calibration), and in impedance (within 5 ohm of prior calibration), the annual calibration is not necessary, and the calibration interval can be extended. Dipole D750V3 (SN 1231) 750MHz Head Liquid Date of Measurement Return Loss(dB) Δ % Real Impedance (Ω) ΔΩ Imaginary Impedance (Ω) ΔΩ 2023-05-04 (Cal. Report) -28.015 / 53.859 / -1.4666 / 2024-05-03 (extended) -28.1463 0.47 53 0.859 3 4.4666 2025-05-02 (extended) -28.012 -0.01 54.79 0.931 -1.0467 0.4199 The return loss is < -20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data: 2024-05-03 Dipole Verification Data: 2025-05-02 D835V2 SN 4d302 Extended Dipole Calibrations Referring to KDB 865664, if dipoles are verified in return loss (<-20dB, within 20% of prior calibration), and in impedance (within 5 ohm of prior calibration), the annual calibration is not necessary, and the calibration interval can be extended. Dipole D835V2 (SN 4d302) 835MHz Head Liquid Date of Measurement Return Loss(dB) Δ % Real Impedance (Ω) ΔΩ Imaginary Impedance (Ω) ΔΩ 2023-02-06 (Cal. Report) -32.369 / 48.356 / -1.7042 / 2024-02-05 (extended) -30.2353 -6.59 47 1.356 0.99 2.6942 2025-02-04 (extended) -33.193 2.55 49.203 0.847 -0.73197 0.97223 The return loss is < -20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data: 2024-02-05 Dipole Verification Data: 2025-02-04 D1750V2 SN 1115 Extended Dipole Calibrations Referring to KDB 865664, if dipoles are verified in return loss (<-20dB, within 20% of prior calibration), and in impedance (within 5 ohm of prior calibration), the annual calibration is not necessary, and the calibration interval can be extended. Dipole D1750V2 (SN 1115) 1750MHz Head Liquid Date of Measurement Return Loss(dB) Δ % Real Impedance (Ω) ΔΩ Imaginary Impedance (Ω) ΔΩ 2023-03-23 (Cal. Report) -41.338 / 49.237 / -0.37589 / 2024-03-22 (extended) -40.3954 -2.28 50 0.763 -0.22 0.15589 2025-03-21 (extended) -41.478 0.34 50.035 0.798 -0.31808 0.05781 The return loss is < -20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data: 2024-03-22 Dipole Verification Data: 2025-03-21 D1950V3 SN 1266 Extended Dipole Calibrations Referring to KDB 865664, if dipoles are verified in return loss (<-20dB, within 20% of prior calibration), and in impedance (within 5 ohm of prior calibration), the annual calibration is not necessary, and the calibration interval can be extended. Dipole D1950V3 (SN 1266) 1950MHz Head Liquid Date of Measurement Return Loss(dB) Δ % Real Impedance (Ω) ΔΩ Imaginary Impedance (Ω) ΔΩ 2023-01-27 (Cal. Report) -34.034 / 48.35 / 1.0483 / 2024-01-26 (extended) -33.3734 -1.94 48 0.35 2 0.9517 2025-01-25 (extended) -34.929 2.63 48.889 0.539 1.1849 0.1366 The return loss is < -20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data: 2024-01-26 Dipole Verification Data: 2025-01-25

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Report No.: TCWA25070057801 Appendix C EX3DV4-SN 3624 EX3DV4-SN 7758 DAE4-SN 1846 D750V3-SN 1231 D835V2-SN 4d302 D1750V2-SN 1115 D1950V3-SN 1266

Report No.: TCWA25070057801 Appendix B LTE Band 2 LTE Band 5 LTE Band 12 LTE Band 13 LTE Band 66 LTE Band 71 Scans Setup Area ScanZoom Scan Grid Extents [mm]90.0 x 150.032.0 x 32.0 x 30.0 Grid Steps [mm]15.0 x 15.08.0 x 8.0 x 5.0 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-15, 19:202025-08-15, 19:28 psSAR1g [W/Kg]0.3380.362 psSAR10g [W/Kg]0.1700.177 Power Drift [dB]-0.02-0.09 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction M2/M1 [%]50.2 Dist 3dB Peak [mm]8.2 Test Laboratory: TOWE Lab Measurement Report for Device, FRONT, Band 2, LTE-FDD (SC-FDMA, 1 RB, 20 MHz, QPSK) RBPosition:Low AntennaCfg:SISO, Channel 18900 (1880.000 MHz) Device Under Test Properties ModelDimensions [mm] Device110.0 x 50.0 x 50.0 Exposure Conditions Phantom Section, TSLPosition, Test Distance [mm] BandGroup, UIDFrequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid FRONT, 0.00Band 2 LTE-FDD, 10169- CAF 1880.000, 189008.211.3540.4 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL1950EX3DV4 - SN3624, 2025-01-15DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]90.0 x 150.032.0 x 32.0 x 30.0 Grid Steps [mm]15.0 x 15.08.0 x 8.0 x 5.0 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-14, 13:512025-08-14, 13:58 psSAR1g [W/Kg]0.7010.717 psSAR10g [W/Kg]0.4290.353 Power Drift [dB]-0.03-0.14 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction M2/M1 [%]33.7 Dist 3dB Peak [mm]8.2 Test Laboratory: TOWE Lab Measurement Report for Device, FRONT, Band 5, LTE-FDD (SC-FDMA, 1 RB, 10 MHz, QPSK) RBPosition:Low AntennaCfg:SISO, Channel 20600 (844.000 MHz) Device Under Test Properties ModelDimensions [mm] Device110.0 x 50.0 x 50.0 Exposure Conditions Phantom Section, TSLPosition, Test Distance [mm] BandGroup, UIDFrequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid FRONT, 0.00Band 5 LTE-FDD, 10175- CAH 844.000, 206009.840.93443.1 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL835EX3DV4 - SN3624, 2025-01-15DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]90.0 x 150.032.0 x 32.0 x 30.0 Grid Steps [mm]15.0 x 15.08.0 x 8.0 x 5.0 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-13, 15:082025-08-13, 15:15 psSAR1g [W/Kg]0.3660.375 psSAR10g [W/Kg]0.2070.167 Power Drift [dB]-0.06-0.17 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction M2/M1 [%]31.9 Dist 3dB Peak [mm]8.4 Test Laboratory: TOWE Lab Measurement Report for Device, FRONT, Band 12, LTE-FDD (SC-FDMA, 1 RB, 10 MHz, QPSK) RBPosition:High AntennaCfg:SISO, Channel 23130 (711.000 MHz) Device Under Test Properties ModelDimensions [mm] Device110.0 x 50.0 x 50.0 Exposure Conditions Phantom Section, TSLPosition, Test Distance [mm] BandGroup, UIDFrequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid FRONT, 0.00Band 12 LTE-FDD, 10175- CAH 711.000, 231309.420.89742.5 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL750EX3DV4 - SN7758, 2024-09-12DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]90.0 x 150.032.0 x 32.0 x 30.0 Grid Steps [mm]15.0 x 15.08.0 x 8.0 x 5.0 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-13, 16:172025-08-13, 16:24 psSAR1g [W/Kg]0.3040.322 psSAR10g [W/Kg]0.1740.152 Power Drift [dB]-0.05-0.00 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction M2/M1 [%]32.9 Dist 3dB Peak [mm]8.8 Test Laboratory: TOWE Lab Measurement Report for Device, FRONT, Band 13, LTE-FDD (SC-FDMA, 1 RB, 10 MHz, QPSK) RBPosition:High AntennaCfg:SISO, Channel 23230 (782.000 MHz) Device Under Test Properties ModelDimensions [mm] Device110.0 x 50.0 x 50.0 Exposure Conditions Phantom Section, TSLPosition, Test Distance [mm] BandGroup, UIDFrequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid FRONT, 0.00Band 13 LTE-FDD, 10175- CAH 782.000, 232309.420.90242.2 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL750EX3DV4 - SN7758, 2024-09-12DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]90.0 x 150.032.0 x 32.0 x 30.0 Grid Steps [mm]15.0 x 15.08.0 x 8.0 x 5.0 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-15, 11:312025-08-15, 11:39 psSAR1g [W/Kg]0.2740.307 psSAR10g [W/Kg]0.1460.155 Power Drift [dB]0.010.00 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction M2/M1 [%]51.5 Dist 3dB Peak [mm]9.8 Test Laboratory: TOWE Lab Measurement Report for Device, FRONT, Band 66, LTE-FDD (SC-FDMA, 1 RB, 20 MHz, QPSK) RBPosition:Low AntennaCfg:SISO, Channel 132572 (1770.000 MHz) Device Under Test Properties ModelDimensions [mm] Device110.0 x 50.0 x 50.0 Exposure Conditions Phantom Section, TSLPosition, Test Distance [mm] BandGroup, UIDFrequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid F…

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Report No.: TCWA25070057801 Appendix A System Check 750 MHz Head System Check 835 MHz Head System Check 1750 MHz Head System Check 1950 MHz Head Scans Setup Area ScanZoom Scan Grid Extents [mm]40.0 x 90.032.0 x 32.0 x 30.0 Grid Steps [mm]10.0 x 15.06.0 x 6.0 x 1.5 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-13, 09:312025-08-13, 09:39 psSAR1g [W/Kg]0.9220.865 psSAR10g [W/Kg]0.6130.572 Power Drift [dB]-0.01-0.04 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction Test Laboratory: TOWE Lab System Performance Check Report Summary DipoleFrequency [MHz]TSLPower [dBm]Dev. 1g [%]Dev. 10g [%]Dev. Peak [%]Iso. Error [%] D750V3 - SN1231750.0HSL20.00.11.114.05.0 Exposure Conditions Phantom Section, TSLTest Distance [mm]BandGroup, UIDFrequency [MHz], Channel NumberConversion FactorTSL Conductivity [S/m]TSL Permittivity Flat, Head Simulating Liquid15CW, 0--750.000, 09.420.89242.4 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL750EX3DV4 - SN7758, 2024-09-12DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]40.0 x 90.032.0 x 32.0 x 30.0 Grid Steps [mm]10.0 x 15.06.0 x 6.0 x 1.5 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-14, 09:282025-08-14, 09:35 psSAR1g [W/Kg]1.031.01 psSAR10g [W/Kg]0.6840.662 Power Drift [dB]-0.08-0.05 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction Test Laboratory: TOWE Lab System Performance Check Report Summary DipoleFrequency [MHz]TSLPower [dBm]Dev. 1g [%]Dev. 10g [%]Dev. Peak [%]Iso. Error [%] D835V2 - SN4d302835.0HSL20.02.83.222.41.5 Exposure Conditions Phantom Section, TSLTest Distance [mm]BandGroup, UIDFrequency [MHz], Channel NumberConversion FactorTSL Conductivity [S/m]TSL Permittivity Flat, Head Simulating Liquid15CW, 0--835.000, 09.840.93043.1 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL835EX3DV4 - SN3624, 2025-01-15DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]40.0 x 90.032.0 x 32.0 x 30.0 Grid Steps [mm]10.0 x 15.06.0 x 6.0 x 1.5 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-15, 08:482025-08-15, 08:55 psSAR1g [W/Kg]3.823.74 psSAR10g [W/Kg]2.042.01 Power Drift [dB]-0.11-0.08 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction Test Laboratory: TOWE Lab System Performance Check Report Summary DipoleFrequency [MHz]TSLPower [dBm]Dev. 1g [%]Dev. 10g [%]Dev. Peak [%]Iso. Error [%] D1750V2 - SN11151750.0HSL20.01.53.29.91.9 Exposure Conditions Phantom Section, TSLTest Distance [mm]BandGroup, UIDFrequency [MHz], Channel NumberConversion FactorTSL Conductivity [S/m]TSL Permittivity Flat, Head Simulating Liquid10CW, 0--1750.000, 08.541.3639.7 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL1750EX3DV4 - SN3624, 2025-01-15DAE4ip Sn1846, 2024-12-10 Scans Setup Area ScanZoom Scan Grid Extents [mm]40.0 x 90.032.0 x 32.0 x 30.0 Grid Steps [mm]10.0 x 15.06.0 x 6.0 x 1.5 Sensor Surface [mm]3.01.4 Graded GridN/AYes Grading RatioN/A1.5 MAIAN/AN/A Surface DetectionVMS + 6pVMS + 6p Scan MethodMeasuredMeasured Measurement Results Area ScanZoom Scan Date2025-08-15, 09:352025-08-15, 09:41 psSAR1g [W/Kg]4.134.05 psSAR10g [W/Kg]2.122.09 Power Drift [dB]-0.10-0.05 Power ScalingDisabledDisabled Scaling Factor [dB] TSL CorrectionNo correctionNo correction Test Laboratory: TOWE Lab System Performance Check Report Summary DipoleFrequency [MHz]TSLPower [dBm]Dev. 1g [%]Dev. 10g [%]Dev. Peak [%]Iso. Error [%] D1950V3 - SN12661950.0HSL20.01.21.610.9-1.9 Exposure Conditions Phantom Section, TSLTest Distance [mm]BandGroup, UIDFrequency [MHz], Channel NumberConversion FactorTSL Conductivity [S/m]TSL Permittivity Flat, Head Simulating Liquid10CW, 0--1950.000, 08.211.3740.5 Hardware Setup PhantomTSLProbe, Calibration DateDAE, Calibration Date Twin-SAM V8.0 (30deg probe tilt) - 2168HSL1950EX3DV4 - SN3624, 2025-01-15DAE4ip Sn1846, 2024-12-10

FCC ID LABEL: Ca. 20mm x 10mm Label Location FCC ID: 2BFCX-C10

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