FCCID.CO- FCC ID Database
HomeCompaniesEquipment ClassesSearch

© 2026 FCC ID Database. All rights reserved.

AboutContactData sourced from FCC public records
  1. Home/
  2. Shenzhen Veidoo Digital Vision Co.,Ltd/
  3. 2BGU6-E60

2BGU6-E60eBook Reader

Shenzhen Veidoo Digital Vision Co.,Ltd

Application Details

Equipment Class
DTS - Digital Transmission System
Date of Grant
Sep 17, 2026
Application Purpose
Original Equipment
Equipment Note
eBook Reader
Frequency Range
2402.00000000 - 2480.00000000
Company
Shenzhen Veidoo Digital Vision Co.,Ltd
Country
China

Documents & Files

Select a file to view

Attestation Statements

↗
↗
↗

Cover Letter(s)

↗
↗
↗

ID Label/Location Info

↗

RF Exposure Info

↗
↗
↗

Test Report

↗
↗
↗
↗
↗

Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

ShenzhenVeidooDigitalVisionCo.,Ltd 4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet,LonggangDistrict, Shenzhen,China Date:2026-09-07 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA FCCID:2BGU6-E60 ApplicantFRN:0038853578 USAgent–AttestationStatement/Part2.911(d)(7) ShenzhenVeidooDigitalVisionCo.,Ltdcertifiesthat,asof2026-09-07,wehavedesignated FCCUSAgent,LLCtoacceptserviceofprocessonourbehalfforFCCID:2BGU6-E60. ShenzhenVeidooDigitalVisionCo.,Ltd,acceptstomaintainanagentofserviceofprocessin theUnitedStatesfornolessthanoneyearaftereitherthegranteehaspermanentlyterminated allmarketingandimportationoftheapplicableequipmentwithintheU.S.,ortheconclusionof anyCommission-relatedadministrativeorjudicialproceedinginvolvingtheequipment, whicheverislater. FCCUSAgent,LLC,acceptsasofthedateofthefilingofthisapplication,theobligationof beingthedesignatedagentforthepurposeofacceptingserviceofprocessonbehalfof ShenzhenVeidooDigitalVisionCo.,LtdforFCCID:2BGU6-E60. DesignatedAgentInformation: CompanyName:FCCUSAgent,LLC U.S.AgentFRN:0033402884 Address:3722IllinoisAvenue,SaintCharles,IL,60174,USA ContactPerson:TimPayne Phone:708-571-3148 Email:[email protected] Sincerely, Company:ShenzhenVeidooDigitalVision Co.,Ltd DesignatedAgent:FCCUSAgent,LLC CompanyRepresentative:ChaoWuDesignatedAgentRepresentative:TimPayne Signature: Signature:

Attestation Statements

ShenzhenVeidooDigitalVisionCo.,Ltd 4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet,LonggangDistrict, Shenzhen,China Rev2026-04-24 Date:2026-09-04 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA Ref:AttestationStatementsPart2.911(d)(5)(i)andPart2.911(d)(5)(ii) FCCID:2BGU6-E60 Part2.911(d)(5)(i) ShenzhenVeidooDigitalVisionCo.,Ltdcertifiesthattheequipmentforwhichauthorizationissoughtisnot “covered”equipmentanddoesnotcontainanti-virussoftwareorcybersecuritysoftwareprohibitedfrom receivinganequipmentauthorizationpursuantto47CFR2.903,KDB986446D01CoveredEquipment Guidance,andFCCCoveredList(www.fcc.gov/supplychain/coveredlist). Part2.911(d)(5)(ii) ShenzhenVeidooDigitalVisionCo.,Ltdcertifiesthat,asofthedateofthefilingoftheapplication,the applicantisnotidentifiedontheCoveredList(asaspecificallynamedentityoranyofitssubsidiariesor affiliates)asanentityproducing“covered”equipment. Sincerely, Signatory [ChaoWu,Manager]

Attestation Statements

ShenzhenVeidooDigitalVisionCo.,Ltd 4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet,LonggangDistrict, Shenzhen,China Rev2026-04-24 Date:2026-09-04 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA Ref:AttestationStatementsPart2.911(d)(5)(i)andPart2.911(d)(5)(ii) FCCID:2BGU6-E60 Part2.911(d)(5)(i) ShenzhenVeidooDigitalVisionCo.,Ltdcertifiesthattheequipmentforwhichauthorizationissoughtisnot “covered”equipmentanddoesnotcontainanti-virussoftwareorcybersecuritysoftwareprohibitedfrom receivinganequipmentauthorizationpursuantto47CFR2.903,KDB986446D01CoveredEquipment Guidance,andFCCCoveredList(www.fcc.gov/supplychain/coveredlist). Part2.911(d)(5)(ii) ShenzhenVeidooDigitalVisionCo.,Ltdcertifiesthat,asofthedateofthefilingoftheapplication,the applicantisnotidentifiedontheCoveredList(asaspecificallynamedentityoranyofitssubsidiariesor affiliates)asanentityproducing“covered”equipment. Sincerely, Signatory [ChaoWu,Manager]

Cover Letter(s)

ShenzhenVeidooDigitalVisionCo.,Ltd 4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet,LonggangDistrict,Shenzhen, China Date:2026-09-16 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCID:2BGU6-E60 ModelDeclarationLetter DearRegulatoryAuthority, Model(s):E5,E6,E7,E8,E9,E10,E12,E20,E30,E40,E50,E70,E80,E90,E88,E99aresametothemodel E60,thesemodelsaresamePCBLayout,Schematics,BOM.Weonlyprovidedifferentmodelnames,exterior colors,andouterpackagingtomeettherequirementsofdifferentmarkets. Sincerely, Signatory [chaowu,Manager]

Cover Letter(s)

ShenzhenVeidooDigitalVisionCo.,Ltd 4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet,LonggangDistrict, Shenzhen,China AgentAuthorization Company:ShenzhenVeidooDigitalVisionCo.,Ltd Address:4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet, LonggangDistrict,Shenzhen,China ProductName:eBookReader ModelNumber(s):E60,E5,E6,E7,E8,E9,E10,E12,E20,E30,E40,E50,E70,E80, E90,E88,E99 ProductDescription:eBookReader WeauthorizeMiCOMLabsInc.,575BoulderCourt,Pleasanton,California94566,USA, toactonourbehalfonallmattersconcerningthecertificationofabovenamed equipment. WedeclarethatMiCOMLabsInc.isallowedtoforwardallinformationrelatedtothe approvalandcertificationofequipmenttotheregulatoryagenciesasrequiredandto discussanyissuesconcerningtheapprovalapplication.Anyandallactscarriedoutby MiCOMLabsonourbehalfshallhavethesameeffectasactsofourown. Signature:Date:2026-09-04 Name:ChaoWu Title:Manager Company:ShenzhenVeidooDigitalVisionCo.,Ltd

Cover Letter(s)

ShenzhenVeidooDigitalVisionCo.,Ltd 4thFloor,Block6,SaituTechnologyPark,No.137BulanRoad,JihuaStreet,LonggangDistrict,Shenzhen,China Date:2026-09-04 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID:2BGU6-E60 ConfidentialityRequest Towhomitmayconcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,wearerequestingthe Commissiontowithholdthefollowingattachment(s)asconfidentialdocumentsfrompublicdisclosureindefinitely. ☒ BlockDiagram ☐ Tune-UpInformation ☒ OperationalDescription ☐ SecurityInformation ☒ Schematics ☐ SoftwareDefinedRadio(SDR)Information ☐ PartsList Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleasedtothepublic.The publicdisclosureofthesematerialsmaybeharmfultotheapplicantandprovideunjustifiedbenefitstoits competitors. Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulationsinTitle47CFR §2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthatbusinesssensitiveinformation remainsconfidentialuntiltheactualmarketingofnewlyauthorizeddevices,werequestShortTermConfidentiality ofthefollowingattachment(s); ☒ ExternalPhotos ☒ TestSetupPhotos ☒ InternalPhotos ☒ UserManual ☐For45days,pursuanttoPublicNoticeDA04-1705. or ☒For180dayspursuanttoKDB726920D01. TheapplicantunderstandsthatpursuanttoSection0.457oftheRules,disclosureofthisapplicationandall accompanyingdocumentationwillnotbemadebeforethedateoftheGrantforthisapplication. Sincerely, Signatory [Chaowu,Manager]

ID Label/Location Info

Reference No.: WTX26X06171673W001/002/003 Page 1 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2BGU6-E60 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1)This device may not cause harmful interference, and (2)This device must accept any interference received, including interference that may cause undesired operation. Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

RF Exposure Info

Reference No.: WTX26X06171673W005 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 4 Annex C. EUT Photos EUT View 1 EUT View 2 Reference No.: WTX26X06171673W005 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 4 Antenna View WIFI/Bluetooth Ant Reference No.: WTX26X06171673W005 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 4 Annex D. Test Setup Photos Body mode Exposure Conditions Test distance: 0mm Body Back Body Front Reference No.: WTX26X06171673W005 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 4 Body Left Body Top

RF Exposure Info

Page: 1/10 Ref : ACR.78.6.26.PAR.B Cancel and replace the report ACR.78.6.26.PAR.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD 1/F., ROOM 101, BUILDING 1, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD, BLOCK 70 BAO'AN DISTRICT, SHENZHEN, GUANGDONG, 518101 CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: 0725-EPGO-446 Calibrated at MVG 13 Rue du Zephyr 91140 Villejust - FRANCE Calibration date: 03/03/2026 Scope available on :https://a2la.org/ Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed at MVG, using the CALIPROBE test bench, for use with a MVG COMO SAR system only. The test results covered by accreditation are traceable to the International System of Units (SI). COMOSAR E-Field Probe Calibration Report            COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.6.26.PAR.B Page: 2/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Pedro Ruiz Technical Manager 3/18/2026 Checked & approved by: Pedro Ruiz Technical Manager 3/18/2026 Authorized by: Christophe Barrot Quality Manager Customer Name Distribution : WALTEK TESTING GROUP (SHENZHEN) CO., LTD Issue Name Date Modifications A Pedro Ruiz 3/18/2026 Initial release B Pedro Ruiz 04/10/2026 Update customer address              COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.6.26.PAR.B Page: 3/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Sensitivity _______________________________________________________________ 4 3.2 Linearity ________________________________________________________________ 4 3.3 Isotropy _________________________________________________________________ 5 3.4 Boundary Effect __________________________________________________________ 5 3.5 Probe Modulation Response _________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 6 5 Calibration Results ..................................................................................................... 6 5.1 Calibration in air __________________________________________________________ 6 5.2 Calibration in liquid _______________________________________________________ 7 6 Verification Results ................................................................................................... 8 7 List of Equipment ...................................................................................................... 9            COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.6.26.PAR.B Page: 4/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number 0725-EPGO-446 Product Condition (new / used) Used Frequency Range of Probe 0.15 GHz-7.5GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.248 M: Dipole 2: R2= 0.216 M: Dipole 3: R3=0.231 M: 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. Figure 1 – MVG COMOSAR Dosimetric E field Probe Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their effect. All calibrations / measurements performed meet the fore-mentioned standards. 3.1 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards for frequency range 600- 7500MHz and using the calorimeter cell method (transfer method) as outlined in the standards for frequency 150-450 MHz. 3.2 LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg.            COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.6.26.PAR.B Page: 5/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released…

Text truncated - open the document above for the full version.

RF Exposure Info

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 32 TEST REPORT Reference No. .................... : WTX26X06171673W005 FCC ID ................................ : 2BGU6-E60 Applicant ........................... : Shenzhen Veidoo Digital Vision Co.,Ltd Address ............................. : 4th Floor Block 6, Saitu Technology Park, No. 137 Bulan Road, Jihua Street, Longgang District, Shenzhen, China Manufacturer ..................... The same as Applicant Address ............................. The same as Applicant Product Name ................... : eBook Reader Model No.. .......................... : E60 Standards .......................... : FCC Part 2.1093, IEEE Std C95.1: 2019 IEEE C95.3: 2021 IEC/IEEE 62209-1528:2020 Date of Receipt sample .... : 2026-07-27 Date of Test........................ : 2026-07-27 to 2026-08-18 Date of Issue ..................... : 2026-08-18 Test Report Form No. ....... : WTX_Part2_1093W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Lily Yang /Project Engineer Jason Su/Manager Reference No.: WTX26X06171673W005 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 32 TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 4 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 4 1.2 Test Standards .................................................................................................................................................... 6 1.3 Test Methodology ................................................................................................................................................ 6 1.4 Test Facility ......................................................................................................................................................... 6 2. Summary of Test Results .......................................................................................................................................... 7 3. Specific Absorption Rate (SAR) ................................................................................................................................ 8 3.1 Introduction .......................................................................................................................................................... 8 3.2 SAR Definition ..................................................................................................................................................... 8 4. SAR Measurement System ........................................................................................................................................ 9 4.1 The Measurement System .................................................................................................................................. 9 4.2 Probe ................................................................................................................................................................... 9 4.3 Probe Calibration Process ................................................................................................................................. 11 4.4 Phantom ............................................................................................................................................................ 11 4.5 Device Holder .................................................................................................................................................... 12 4.6 Test Equipment List ........................................................................................................................................... 13 5. Tissue Simulating Liquids ....................................................................................................................................... 14 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 14 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 15 5.3 Tissue Calibration Result ................................................................................................................................... 16 6. SAR Measurement Evaluation ................................................................................................................................ 17 6.1 Purpose of System Performance Check ............................................................................................................ 17 6.2 System Setup .................................................................................................................................................... 17 6.3 Validation Results .............................................................................................................................................. 18 7. EUT Testing Position ............................................................................................................................................... 19 7.1 Body Position ...............................................................................................…

Text truncated - open the document above for the full version.

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 101 TEST REPORT Reference No. .................... : WTX26X06171673W001 FCC ID ................................ : 2BGU6-E60 Applicant ........................... : Shenzhen Veidoo Digital Vision Co.,Ltd Address ............................. : 4th Floor Block 6, Saitu Technology Park, No. 137 Bulan Road, Jihua Street, Longgang District, Shenzhen, China Manufacturer ..................... : The same as Applicant Address ............................. : The same as Applicant Product Name ................... : eBook Reader Model No... ......................... : E60 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : 2026-06-12 Date of Test........................ : 2026-06-25 to 2026-08-20 Date of Issue ..................... : 2026-08-21 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Dashan Chen/Project Engineer Jason Su/Manager Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 101 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................. 5 1.3 TEST METHODOLOGY ........................................................................................................................................... 5 1.4 TEST FACILITY ...................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................. 13 3.1 STANDARD APPLICABLE ..................................................................................................................................... 13 3.2 EVALUATION INFORMATION ................................................................................................................................ 13 4. POWER SPECTRAL DENSITY ........................................................................................................................... 14 4.1 STANDARD APPLICABLE ..................................................................................................................................... 14 4.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 14 4.3 TEST PROCEDURE .............................................................................................................................................. 14 4.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 14 5. DTS BANDWIDTH ................................................................................................................................................. 15 5.1 STANDARD APPLICABLE ..................................................................................................................................... 15 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 15 5.3 TEST PROCEDURE .............................................................................................................................................. 15 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 15 6. RF OUTPUT POWER ............................................................................................................................................ 16 6.1 STANDARD APPLICABLE ..................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 16 6.3 TEST PROCEDURE .............................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 16 7. FIELD STRENGTH OF SPURIOUS EMISSION…

Text truncated - open the document above for the full version.

Test Report

Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 72 of 101 11N20SISO-Ant1-2412-PASS 11N20SISO-Ant1-2437-PASS 11N20SISO-Ant1-2462-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 73 of 101 11N40SISO-Ant1-2422-PASS 11N40SISO-Ant1-2437-PASS 11N40SISO-Ant1-2452-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 74 of 101 11AX20SISO-Ant1-2412-PASS 11AX20SISO-Ant1-2437-PASS 11AX20SISO-Ant1-2462-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 75 of 101 11AX40SISO-Ant1-2422-PASS 11AX40SISO-Ant1-2437-PASS 11AX40SISO-Ant1-2452-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 76 of 101 Appendix F: Band edge measurements Test Result TestMode Antenna ChName Frequency[MHz] RefLevel[dBm] Result[dBm] Limit[dBm] Verdict 11B Ant1 Low 2412 8.37 -29.41 ≤-11.63 PASS 11B Ant1 High 2462 7.24 -46.91 ≤-12.76 PASS 11G Ant1 Low 2412 4.54 -22.24 ≤-15.46 PASS 11G Ant1 High 2462 3.24 -35.64 ≤-16.76 PASS 11N20SISO Ant1 Low 2412 5.66 -21.36 ≤-14.34 PASS 11N20SISO Ant1 High 2462 3.82 -33.21 ≤-16.18 PASS 11N40SISO Ant1 Low 2422 2.42 -21.34 ≤-17.58 PASS 11N40SISO Ant1 High 2452 2.98 -29.3 ≤-17.02 PASS 11AX20SISO Ant1 Low 2412 5.56 -20.35 ≤-14.44 PASS 11AX20SISO Ant1 High 2462 3.61 -32.82 ≤-16.39 PASS 11AX40SISO Ant1 Low 2422 3.13 -21.54 ≤-16.87 PASS 11AX40SISO Ant1 High 2452 3.01 -31.51 ≤-16.99 PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 77 of 101 Test Graphs 11B-Ant1-2412-PASS 11B-Ant1-2462-PASS 11G-Ant1-2412-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 78 of 101 11G-Ant1-2462-PASS 11N20SISO-Ant1-2412-PASS 11N20SISO-Ant1-2462-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 79 of 101 11N40SISO-Ant1-2422-PASS 11N40SISO-Ant1-2452-PASS 11AX20SISO-Ant1-2412-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 80 of 101 11AX20SISO-Ant1-2462-PASS 11AX40SISO-Ant1-2422-PASS 11AX40SISO-Ant1-2452-PASS Reference No.: WTX26X06171673W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 81 of 101 Appendix G: Conducted Spurious Emission Test Result TestMode Antenna Frequency[MHz] FreqRange [Mhz] RefLevel [dBm] Result [dBm] Limit [dBm] Verdict 11B Ant1 2412 30~1000 8.37 -59.25 ≤-11.63 PASS 11B Ant1 2412 1000~26500 8.37 -44.46 ≤-11.63 PASS 11B Ant1 2437 30~1000 7.32 -58.41 ≤-12.68 PASS 11B Ant1 2437 1000~26500 7.32 -44.68 ≤-12.68 PASS 11B Ant1 2462 30~1000 7.20 -58.66 ≤-12.8 PASS 11B Ant1 2462 1000~26500 7.20 -44.02 ≤-12.8 PASS 11G Ant1 2412 30~1000 4.54 -58.2 ≤-15.46 PASS 11G Ant1 2412 1000~26500 4.54 -44.04 ≤-15.46 PASS 11G Ant1 2437 30~1000 3.56 -58.74 ≤-16.44 PASS 11G Ant1 2437 1000~26500 3.56 -44.64 ≤-16.44 PASS 11G Ant1 2462 30~1000 3.24 -58.52 ≤-16.76 PASS 11G Ant1 2462 1000~26500 3.24 -44.53 ≤-16.76 PASS 11N20SISO Ant1 2412 30~1000 5.66 -58.97 ≤-14.34 PASS 11N20SISO Ant1 2412 1000~26500 5.66 -44.44 ≤-14.34 PASS 11N20SISO Ant1 2437 30~1000 3.58 -59.11 ≤-16.42 PASS 11N20SISO Ant1 2437 1000~26500 3.58 -43.78 ≤-16.42 PASS 11N20SISO Ant1 2462 30~1000 3.82 -59.21 ≤-16.18 PASS 11N20SISO Ant1 2462 1000~26500 3.82 -44 ≤-16.18 PASS 11N40SISO Ant1 2422 30~1000 2.42 -59.4 ≤-17.58 PASS 11N40SISO Ant1 2422 1000~26500 2.42 -44.21 ≤-17.58 PASS 11N40SISO Ant1 2437 30~1000 1.74 -58.99 ≤-18.26 PASS 11N40SISO Ant1 2437 1000~26500 1.74 -44.16 ≤-18.26 PASS 11N40SISO Ant1 2452 30~1000 2.98 -58.49 ≤-17.02 PASS 11N40SISO Ant1 2452 1000~26500 2.98 -44.36 ≤-17.02 PASS 11AX20SISO Ant1 2412 30~1000 5.56 -59.07 ≤-14.44 PASS 11AX20SISO Ant1 2412 1000~26500 5.56 -43.65 ≤-14…

Text truncated - open the document above for the full version.

Contact Information

Applicant

Chao Wu(Manager)
[email protected]Fax: 85225195

Technical Contact

FCC US Agent, LLCTim Payne
[email protected]

3722 Illinois Avenue, Saint Charles, · IL, 60174, Illinois, 60174 · United States

Test Firm

Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
[email protected]Fax: 86-755-33663309

Technical Specifications

#Rule PartsFrequency RangePower Output
115C2.40 GHz - 2.48 GHz1.50 mW
215C2.41 GHz - 2.46 GHz27.50 mW
Confidentiality
Long Term
Grant Notes
Output power listed is maximum conducted power. This device contains 20 and 40 MHz signal bandwidth. SAR compliance for body-worn operating configurations is limited to the specific configurations tested for this filing. Body-worn operations are restricted to belt-clips, holsters or similar accessories that have no metallic component in the assembly and must provide at least 0 mm separation between the device and the body of the user. End-users must be informed of the body-worn operating requirements for satisfying RF exposure compliance. The highest reported SAR for body-worn SAR accessory is 0.883 W/kg respectively.