2BHDD-AQ67ALTOSP1F9All-in-One PCs

ALTOS COMPUTING INDIA PRIVATE LIMITED Date: 2024-07-12 To: Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 USA Ref: Attestation Statements Part 2.911(d)(5)(i) and Part 2.911(d)(5)(ii) Filing Re. KDB 986446 D01 FCC ID: 2BHDD-AQ67ALTOSP1F9 Dear Sir or Madam, [ALTOS COMPUTING INDIA PRIVATE LIMITED.] certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. We also certify that, [ALTOS COMPUTING INDIA PRIVATE LIMITED.] certifies that, as of the date of the filing of the application, the applicant [is not] identified on the Covered List (as a specifically named entity or any of its subsidiaries or affiliates) as an entity producing “covered” equipment . If you have any questions, please contact us. Sincerely, Contact name: H. Aneesudheen Signature: Company name: ALTOS COMPUTING INDIA PRIVATE LIMITED Address: 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India E-mail: [email protected] Tel: +91-80-4070 8700

ALTOS COMPUTING INDIA PRIVATE LIMITED Date (07/12/2024) TUV SUD BABT UNLIMITED TCB Octagon House, Segensworth North, Fareham, Hampshire, PO15 5RL, United Kingdom Dear Sir or Madam, We, ALTOS COMPUTING INDIA PRIVATE LIMITED 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India hereby authorize TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong 518052, China Joe Gu Phone: +86 755 3332 3298 e-mail: [email protected] to act as our agent in all matters relating to applications for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that neither we nor any party to this application are subject to denial of U.S Federal benefits, which include FCC benefits, pursuant to section 5301 of Anti-Drug Abuse Act of 1988, U.S.C 862 because of conviction for possession or distribution of controlled substance. This authorization is application to product: Type of equipment: All-in-One PCs Model name: Altos BrainSphere P1 F9 FCC ID: 2BHDD-AQ67ALTOSP1F9 This authorization expires one year from the current date. Sincerely, Contact name: H. Aneesudheen Signature: Company name: ALTOS COMPUTING INDIA PRIVATE LIMITED Address: 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India E-mail: [email protected] Tel: +91-80-4070 8700

ALTOS COMPUTING INDIA PRIVATE LIMITED Date (07/12/2024) Federal Communications Commission Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 Confidentiality Request FCC ID: 2BHDD-AQ67ALTOSP1F9 Pursuant to Sections 0.457(d)(1)(ii) and 0.459 of the Commission’s Rules, ALTOS COMPUTING INDIA PRIVATE LIMITED hereby requests permanent confidential treatment of information accompanying this application as outlined below: ⚫ Schematics/PCB Layout ⚫ Bill of Materials/Parts List ⚫ Block Diagrams ⚫ Operational Description ⚫ Tune Up Procedure ALTOS COMPUTING INDIA PRIVATE LIMITED. also hereby requests short-term confidential treatment of information accompanying this application as outlined below for a period of 180 days: ⚫ Internal Photos ⚫ External Photos ⚫ User Manual ⚫ Test Set-up Photographs The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these matters might be harmful to the Applicant and provide unjustified benefits to its competitors. The Applicant understands that pursuant to Rule 0.457(d)(1)(ii), disclosure of this Application and all accompanying materials will not be made before the date of the Grant for this Application. Yours sincerely, Signature: Contact name: H. Aneesudheen Signature: Company name: ALTOS COMPUTING INDIA PRIVATE LIMITED Address: 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India E-mail: [email protected] Tel: +91-80-4070 8700

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 75 TEST REPORT Reference No. .................... : WTX24X06142613W FCC ID ................................ : 2BHDD-AQ67ALTOSP1F9 Applicant ........................... : ALTOS COMPUTING INDIA PRIVATE LIMITED Address ............................. : 6th Floor, No.13, Embassy Heights, Magrath Road, Karnataka, Bengaluru 560025, INDIA Manufacturer ..................... ALTOS COMPUTING INDIA PRIVATE LIMITED Address ............................. 6th Floor, No.13, Embassy Heights, Magrath Road, Karnataka, Bengaluru 560025, INDIA Product Name ................... : All-in-One PCs Model No.. .......................... : Altos BrainSphere P1 F9 Standards .......................... : FCC Part 2.1093, IEEE Std C95.1: 2019 IEEE Std C95.3: 2002 + Rev. 2008 IEC/IEEE 62209-1528 Ed. 1.0 (2020-10) Date of Receipt sample .... : 2024-06-19 Date of Test........................ : 2024-06-19 to 2024-06-28 Date of Issue ..................... : 2024-06-28 Test Report Form No. ....... : WTX_Part2_1093W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jack Sun Jason Su Reference No.: WTX24X06142613W Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 75 TABLE OF CONTENTS \1. General Information .................................................................................................................................................. 4 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 4 1.2 Test Standards .................................................................................................................................................... 6 1.3 Test Methodology ................................................................................................................................................ 6 1.4 Test Facility ......................................................................................................................................................... 6 2. Summary of Test Results .......................................................................................................................................... 7 3. Specific Absorption Rate (SAR) ................................................................................................................................ 8 3.1 Introduction .......................................................................................................................................................... 8 3.2 SAR Definition ..................................................................................................................................................... 8 4. SAR Measurement System ........................................................................................................................................ 9 4.1 The Measurement System .................................................................................................................................. 9 4.2 Probe ................................................................................................................................................................... 9 4.3 Probe Calibration Process ................................................................................................................................. 11 4.4 Phantom ............................................................................................................................................................ 11 4.5 Device Holder .................................................................................................................................................... 12 4.6 Test Equipment List ........................................................................................................................................... 13 5. Tissue Simulating Liquids ....................................................................................................................................... 14 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 14 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 15 5.3 Tissue Calibration Result ................................................................................................................................... 16 6. SAR Measurement Evaluation ................................................................................................................................ 17 6.1 Purpose of System Performance Check ............................................................................................................ 17 6.2 System Setup .................................................................................................................................................... 17 6.3 Validation Results .............................................................................................................................................. 18 7. EUT Testing Position ............................................................................................................................................... 19 7.1 Body Position .................…

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COMOSAR E-Field Probe Calibration Report Ref: ACR.197.12.23.BES.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD 1庙、.，ROOM 101, BUILDING 1, HONGWEI INDUSTRIAL PARK‘LIUXIAN 2ND ROAD‘BLOCK70 BAO' AN DISTRICT, SHENZHEN, GUANGDONG , CIDNA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 18/21 EPG0356 Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Il'oise -295 avenue Alexis de Rocholl 29280 PLOUZANE -FRANCE Calibration date: 07/07/2023 dI;;2%ωkω 二三〉七二乞3三-τ......吃Z ~事三五2句P L。τ二号飞~..;~型L...... 〈久/，飞.\.~，.~ .".... "，川AJZ丽丽在 Accreditations #2-6789 Scope available 011 ~坠应些丘坐立 Thc usc of thc Cofl'l1c bl'and and thc acc，'εditation I'CfCl'fnCfS is pl'ohibited fl'om ally "Clll'oductioll, SU111111αry: This document presents the method and results from an accredited COMOSAR E-Field Probe calibration performed at MVG, using the CALIPROBE t巳stbench, for use with a MVG COMOSAR system only. The test results covered by accreditation are traceable to the International System of Units (SI), Pαge: 1/11 Prepαred by.' Checked by.' Approved by : Issue A COMOSAR E-FIELD PROBE CALIllRATION REPORT Nαme Function Jérδme Le Gall Measurement Responsible Jérôme Luc Yann Toutain Distribution .' Technical Manager Laboratory Director Customer Name Waltek Testing Group (Shenzhen) Co. , Ltd Dafe 7/7/2023 7 /7/2023 7 /7/2023 Ref: ACR.197.12.23.BES.A SÌJ!l1ature < ?若7 7山市ιmtrlAl Signature Ya n n numérique de Yann Toutain ID Toutain ID Date:2023.07.07 08:53:35 +01 '00' Name Date Modi[ìcafiol1s JérδmeLuc 7/7/2023 lnitial release Page: 2/11 TellψlrtttLA CR.DDD.N.YXAJVCB.ISSUE-COAIOSAR Probe vI ηlis doc1Imel1l slwlll10l be repl'Od1lced.由cepl川f1l1101' il1 parl. lI'ilh01l1lhe lI'rillel1 appl'Ovall叭.fVG.The il1formaliol1 cOl1lail1ed hereil1 isωbe 1Ised ol1ly f or Ihe pwpose.for lI'hich il is s1lb川ifledal1d is 110110 be released川lI'holeorparl川的oulll'rillel1appl'Ol'all扩MVG COMOSAR E-FIELD PROBE CALlBRA TION REPORT Ref: ACR.197.12.23.BES.A TABLE OF CONTENTS Oevice Under Test ........................................ .............................................................4 2 Product Description ............ .......................................................................................4 2.1 General Information 4 3 Measurement Method ........川..... 川.......川........ .......川.......川.......川........ ...... .. .......川.......川.......川........ ...... .. .......川.......川........ .......川........ .......川........ .......川.......川.......川........ .......川........ ...... .. ...... .. .......川........ ...... .. ...... .. .......川.......川........ ...... .. ...... .. .......川........ .......川.......川........ ...... .. ...... .. .......川........ .......川.......川........ ...... .. ...... .. ...... .. ...... .. .......川........ .......川........ ...... .. .......川.......川.......川........ .......川.......川........ .......川........ .......川.......川........ ...... .. ...... .. ...... .. .......川........ ...... .. .......川.......川.......川........ ...... .. .......川........ .......川.......川.......川........ ...... .. .......川........ ...... .. .....4 3.1 Linearity 4 3.2 Sensitivity 5 3.3 Lower Detection Limit 5 3 .4 Isotropy 5 3.1 Boundary Effect 5 4 Measurement Uncertainty....... . ..................................................................................6 5 Calibration Measurement Reslllts .. ............................................................................ 6 5.1 Sensitivity in air 5.2 Linearity 5.3 Sensitivity in liqllid 5.4 Isotropy rO 叮 foony 6 List ofEqllipn1ent ..................................... ...............................................................10 Pα'ge: 3/ /1 TemplalιACR.DDD.N. Y}~II1VGB.ISSUιCOilIOSAR Prabe 1'1 This dOClflllell1 shallllOl be reprodllced. excepl ill f llll Or ill parl. lI'ilholll Ihe川.illellapprol'Ol 0/ MVG. The iliforlllalioll cOlllailled hereill is 10 be IIsed olll)'for Ihe pwpose/or lI'hich it is SlIblllitted alld is 1101 1 0 be released ill1l'h ole o r parl 1I'ilholll 11'川Ilellapprol'ol (扩MVG. COMO SAR E-FIELD PROBE C ALIBRATION REPORT Ref: ACR. 197. 12.23.BES.A 1 DEVICE UNDER TEST Oevice Under Test Device Type COMOSAR DOSI1\咀~TRICE FIELD PROBE Manu也cturer MVG Model SSE2 Serial Number SN 18/21 EPG0356 Product Condition (new / used) New Frequency Range of Probe 0.15 GHz-6GHz Resistance ofThree Dipoles at Connector Dipole 1: Rl=0.221 MQ Dipole 2: R2=0.197 MQ Dipole 3: R3=0.195 MQ 2 PRODUCT DESCRIPTION 2.1 GENERAL INFOR.r..ι生TION MVG's COMOSAR E fteld Probes are built in accordance to the IEEE 1528, FCC KDB865664 DO 1, CENELEC EN62209 and CEI/IEC 62209 standards. Figure 1 -JvIVG COMOSA R Dosimel.ric E卢eldDipole Probe Length 330mm Length of Individual Dipoles 2mm Maximum external diameter 8mm Probe Tip External Diameter 2.5mm Distance between dipoles / probe extremity lmm 3 MEASUREMENT METHOD The IEEE 1528, FCC KDB865664 DOI, CENELEC EN62209 and CEIIIEC 62209 standards provide recommended practices for the probe calibrations , including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1 LlNEARITY The evaluation of the linearity was done in白.'eespace using the waveguide, performing a power sweep to cover the SAR range 0. 01 W /kg to I OOW /kg. Page: 4/11 Tel1lplatιACR.DDD.N. YY.fI1VGB.lSSUE二COiHOSARProbe叶 This doclIlllel1l sholll1ol be reprodllced. excepl ill[1I11 01' il1 parl. 11'ilhollllhe lI'r i/lel1 opp ro1'O/ o[ MVG. The il1[orlllOliol1 COI1Iαilled hereil1 is 10 be IIsed 0 11/)'[01' Ihe plllpose[orll'hich il is Sl削li/ledal1d is 110110 be 阿/easedil1l1'ho/e 01' parlll'il/101I1呐illel1apprOl'a / o[MVG COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.197. 12.23.BES.A 3.2 SENSITIVITY The sensitiv川it印yt臼actorsof the th阳ueedi怡po叶le臼swe町redete创rm and tiss饥sues剑1mη111川l川la创川tingliqu川id均)u山singwavegu山idesas outlined in the standards. 3 .3 LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurem…

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Report Number: 68.950.24.0554.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 1 of 50 FCC - TEST REPORT Report Number : 68.950.24.0554.01 Date of Issue: 2024-07-17 Model : Altos BrainSphere P1 F9 Product Type : All-in-One PCs Applicant : ALTOS COMPUTING INDIA PRIVATE LIMITED Address : 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India Manufacturer : ALTOS COMPUTING INDIA PRIVATE LIMITED Address : 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India Test Result : ◼ Positive  Negative Total pages including Appendices : 50 Any use for advertising purposes must be granted in writing. This technical report may only be quoted in full. This report is the result of a single examination of the object in question and is not generally applicable evaluation of the quality of other products in regular production. For further details, please see testing and certification regulation, chapter A-3.4. Report Number: 68.950.24.0554.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 2 of 50 1 Table of Contents 1 Table of Contents ..................................................................................................................................................2 2 Details about the Test Laboratory .........................................................................................................................3 3 Description of the Equipment Under Test .............................................................................................................4 4 Summary of Test Standards .................................................................................................................................5 5 Summary of Test Results ......................................................................................................................................6 6 General Remarks ..................................................................................................................................................7 7 Test Setups ...........................................................................................................................................................8 8 Systems Test Configuration ............................................................................................................................... 10 9 Technical Requirement ...................................................................................................................................... 11 9.1 Conducted Emission .................................................................................................................................. 11 9.2 Conducted Output Power ........................................................................................................................... 14 9.3 Power Spectral Density .............................................................................................................................. 18 9.4 6 dB Bandwidth and 99% Occupied Bandwidth ......................................................................................... 21 9.5 Spurious RF Conducted Emissions ........................................................................................................... 26 9.6 Band Edge .................................................................................................................................................. 32 9.7 Spurious Radiated Emissions for Transmitter ............................................................................................ 38 10 Test Equipment List ........................................................................................................................................ 48 11 System Measurement Uncertainty ................................................................................................................. 50 Report Number: 68.950.24.0554.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 3 of 50 2 Details about the Test Laboratory Details about the Test Laboratory Test Site 1 Company name: TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12&13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen City, 518052, P. R. China Telephone: 86 755 8828 6998 Fax: 86 755 828 5299 FCC Registration No.: 514049 FCC Designation No.: CN5009 Report Number: 68.950.24.0554.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 4 of 50 3 Description of the Equipment Under Test Product: All-in-One PCs Model no.: Altos BrainSphere P1 F9 FCC ID: 2BHDD-AQ67ALTOSP1F9 Rating: 19VDC, 7.9A (powered by adapter) Accessories: Adapter Model: HKA15019079-6C Input: 100-240VAC 50/60Hz, 2.0A, Output: 19VDC, 7.9A Manufacturer: Shenzhen Huntkey Electric Co., Ltd. RF Transmission Frequency: 2402MHz-2480MHz No. of Operated Channel: 40 Modulation: GFSK Antenna Type: Internal Antenna Antenna Gain: 3.41dBi max for 2.4GHz Ant1 Description of the EUT: The Equipment Under Test (EUT) is an All-in-One PCs supports Bluetooth Low Energy / Bluetoot…

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Photo Electrical Properties Frequency 2400~2500;5150-5850MHz Impedance 50 Ohm Nominal VSWR 2.0MAX Radiation Omni-directional Polarization Vertical Linear Gain (Peak) 3dBi Conn IPEX-4L端子 Physical Properties Antenna Material PCB Cable Type OD1.13 RF CABLE Operating Temp. -40 ~ +80 ̊C Storage Temp. -45 ~ +85 ̊C Cable Color BLACK 产品规格概述 1 2 E 4 3 DATE:2019-06-19 TITLE SCALE: 1/1 DRAWED S.H P/NO TOLERANCE UNLESS OTHERWISE SPECIFIED ANGLES ±0.5°X.X ±0.5X.XX ±0.2 UNIT:mm SHEET: 1/1 CHECKED APPROVED SIZE A4 PART NO CUSTOMER XX. ±5.0X. ±2.0 6 7 8 A 5 4 2 3 1 A B B BECD 8 7 6 4 5 Jammy SY-W4PE8165B400C-L01 Patrick Jerry BBBCD ROHS DONGGUAN SEYA ELECTRONIC COMMUNICATION CO.,LTD 东 莞 市 仕 研 电 子 通 讯 有 限 公 司 SEYA REV. CONTENT DATE A 首次发行 2018-12-01 1.0 4.0 2.5 PCB STRIPPING DIM'S 2.4-5.8GHz WIFI ANTENNA 重点： 1.裁线尺寸：400.0mm 2. 为重点检验尺寸 3.外观不可损伤，PCB不可有破损、掉漆露铜等现象。 备注： 1.线材为RF1.13黑色线材，特性阻抗为50 Ohm网络测试： 测试频段：2.4~2.5;5.15-5.85Ghz VSWR:2.0MAX GAIN:3dBi 2 2 NO. 1 Finished Q'ty 天线 PCB ，表面附黑油， SIZE:35.5 * 20.0 * T0.8mm Name 1PC1PC PCB10362A-SY8165 3 1PC Ø 1.13mm Coaxial Cable 同轴线（黑色） ;L=400.0mm COA11301B TER10010A.P01 4L 代 I-PEX 端子 Ø1.13mm Coaxial Cable 专用 1.1 0.5 1.1 IPEX STRIPPING DIM'S Ø 1.13mm Cable Color:Black 1 400.0±3.0 3 20.0±0.3 35.5±0.3 4 4 1PC EVA10109A EVA 泡棉双面背胶 ,SIZE:37.5 * 20.0*20.0mm EVA 泡棉双面背胶 ,SIZE:37.5 * 20.0*20.0mm 4 W=20.0 T=20.0 37.5 5 5 1PC TUB10024A.P01 透明保护套管 Ø 1.5 FOR 4L 端子 B 增加保护套管 2019-06-19 B B 15.3.02.2052011-546 网络测试 GAIN测试

Photo Electrical Properties Frequency 2400~2500;5150-5850MHz Impedance 50 Ohm Nominal VSWR 2.0MAX Radiation Omni-directional Polarization Vertical Linear Gain (Peak) 3dBi Conn IPEX-4L端子 Physical Properties Antenna Material PCB Cable Type OD1.13 RF CABLE Operating Temp. -40 ~ +80 ̊C Storage Temp. -45 ~ +85 ̊C Cable Color GRAY 产品规格概述 1 2 E 4 3 DATE:2019-06-19 TITLE SCALE: 1/1 DRAWED S.H P/NO TOLERANCE UNLESS OTHERWISE SPECIFIED ANGLES ±0.5°X.X ±0.5X.XX ±0.2 UNIT:mm SHEET: 1/1 CHECKED APPROVED SIZE A4 PART NO CUSTOMER XX. ±5.0X. ±2.0 6 7 8 A 5 4 2 3 1 A B B BECD 8 7 6 4 5 Jammy SY-W4PE8165G400C-L01 Patrick Jerry BBBCD ROHS DONGGUAN SEYA ELECTRONIC COMMUNICATION CO.,LTD 东 莞 市 仕 研 电 子 通 讯 有 限 公 司 SEYA REV. CONTENT DATE A 首次发行 2018-12-01 1.0 4.0 2.5 PCB STRIPPING DIM'S 2.4-5.8GHz WIFI ANTENNA 重点： 1.裁线尺寸：400.0mm 2. 为重点检验尺寸 3.外观不可损伤，PCB不可有破损、掉漆露铜等现象。 备注： 1.线材为RF1.13灰色线材，特性阻抗为50 Ohm网络测试： 测试频段：2.4~2.5;5.15-5.85Ghz VSWR:2.0MAX GAIN:3dBi 2 2 NO. 1 Finished Q'ty 天线 PCB ，表面附黑油， SIZE:35.5 * 20.0 * T0.8mm Name 1PC1PC PCB10362A-SY8165 3 1PC Ø 1.13mm Coaxial Cable 同轴线（灰色） ;L=400.0mm COA11301A TER10010A.P01 4L 代 I-PEX 端子 Ø1.13mm Coaxial Cable 专用 1.1 0.5 1.1 IPEX STRIPPING DIM'S Ø 1.13mm Cable Color:Gray 1 400.0±3.0 3 35.5±0.3 4 4 1PC EVA10109A EVA 泡棉双面背胶 ,SIZE:37.5 * 20.0*20.0mm EVA 泡棉双面背胶 ,SIZE:37.5 * 20.0*20.0mm 4 L=37.5 W=20.0 T=20.0 5 B B 增加保护套管 2019-06-19 20.0±0.3 5 1PC EVA10109A 透明保护套管 Ø 1.5 FOR 4L 端子 B 15.3.03.0019701-546 网络测试 GAIN测试

Report Number: 68.950.24.0555.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 1 of 99 FCC - TEST REPORT Report Number : 68.950.24.0555.01 Date of Issue: 2024-07-17 Model : Altos BrainSphere P1 F9 Product Type : All-in-One PCs Applicant : ALTOS COMPUTING INDIA PRIVATE LIMITED Address : 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India Manufacturer : ALTOS COMPUTING INDIA PRIVATE LIMITED Address : 6th Floor, No. 13, Embassy Heights, Magrath Road, Karnataka, Bengaluru, 560025, India Test Result : ◼ Positive  Negative Total pages including Appendices : 99 Any use for advertising purposes must be granted in writing. This technical report may only be quoted in full. This report is the result of a single examination of the object in question and is not generally applicable evaluation of the quality of other products in regular production. For further details, please see testing and certification regulation, chapter A-3.4. Report Number: 68.950.24.0555.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 2 of 99 1 Table of Contents 1 Table of Contents ..................................................................................................................................................2 2 Details about the Test Laboratory .........................................................................................................................3 3 Description of the Equipment Under Test .............................................................................................................4 4 Summary of Test Standards .................................................................................................................................5 5 Summary of Test Results ......................................................................................................................................6 6 General Remarks ..................................................................................................................................................7 7 Test Setups ...........................................................................................................................................................8 8 Systems Test Configuration ............................................................................................................................... 10 9 Technical Requirement ...................................................................................................................................... 11 9.1 Conducted Emission .................................................................................................................................. 11 9.2 Conducted Output Power ........................................................................................................................... 14 9.3 6dB Bandwidth ........................................................................................................................................... 17 9.4 Power Spectral Density .............................................................................................................................. 44 9.5 Spurious RF Conducted Emissions ........................................................................................................... 62 9.6 Band Edge Testing ..................................................................................................................................... 76 9.7 Spurious Radiated Emissions for Transmitter ............................................................................................ 86 10 Test Equipment List ............................................................................................................................................ 97 11 System Measurement Uncertainty ................................................................................................................. 99 Report Number: 68.950.24.0555.01 EMC_SZ_FR_23.03 FCC Release 2023-12-01 TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12 & 13, Zhiheng Wisdomland Business Park, Guankou Erlu, Nantou, Nanshan District, Shenzhen, Guangdong, China Tel. +86 755 8828 6998, Fax: +86 755 8828 5299 Page 3 of 99 2 Details about the Test Laboratory Details about the Test Laboratory Test Site 1 Company name: TÜV SÜD Certification and Testing (China) Co., Ltd. Shenzhen Branch Building 12&13, Zhiheng Wisdomlan…

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