2BHM7-REMO4TRemo Audio 4

eMoMo Technology (zheJiang) Co., Ltd Building 2, South ofYuedu East Road and East ofTianhuangping North Road, Dipu Street, Anji County, Huzlhou City, Zheiiang Province, 313300, China ·-----------一一一一会多多·-·-·····-··-······哺'...今.......争伞..................会....噜..晕伞伞..........售....................呻．．．．．．伞拿．．．．． Date 2026-04-27 FEDERAL COMMUNICATIONS COMMISSION AUTHORIZATION AND EVALUATION DIVISION 7435 OAKLAND MILLS ROAD COLUMBIA, MD 21046 SUBJECT: FCC Application for FCC ID: 2BHM7-REM04T Confidentiality Request To whom it may concern , Pursuant to the p「ovisionsof the Commission's rules Title 47 Sections§0.457 and§0.459, we are requesting the Commission to withhold the following attachment(s) as confidential documents的mpublic disclosure indefinitely. 口Tune-UpInformation 因 Block Diag「am 冈 Operational Description 因Schematics 口 P arts List 口SecurityInformation 口SoftwareDefined Radio (SOR) Information The above materials contain t「ade secrets and proprietary information not customarily「eleasedto the public. The public disclosure of these materials may be ha「mfulto the applicant and p「ovideunjustified benefits to its competitors. In additional to above mentioned documents, in o「de「to comply with the ma「keting「egulationsin Title 47 CFR §2.803 and the importation rules in Title 47 CFR§2.1204, while ensuring that business sensitive information remains confidential until the actual marketing of newly authorized devices, we request Short Term Confidentiality of the following attachment(s); 区ExternalPhotos因Test Setup Photos 区IInternal Photos 因UserManual 口Fo「45 days, pursuant to Public Notice DA 04-1705. 。「 因For 180 days pu「suantto KDB 726920 D01. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, 加妇 Signatory {Jun Guo, Product Manager]

Reference No.: WTX25X08220071W001 Page 1 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

RF Exposure Requirements Product Description: Remo Audio 4 Model No.: Remo4TV, Remo4TV07 FCC ID: 2BHM7-REMO4T According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] ꞏ [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 4.92dBm Tune-Up output power: 5.0dBm RF channel transmit frequency: 2402MHz Result: 0.98 Limit: 3.0 The exclusion thresholds is 0.98 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 71 TEST REPORT Reference No. ....................: WTX25X08220071W001 FCC ID ............................... .: 2BHM7-REMO4T Applicant .......................... .: eMoMo Technology (zheJiang) Co., Ltd Address ............................ .: Building 2, South of Yuedu East Road and East of Tianhuangping North Road, Dipu Street, Anji County, Huzhou City, Zheiiang Province, 313300, China Manufacturer .................... .: The same as Applicant Address ............................ .: The same as Applicant Product Name .................. .: Remo Audio 4 Model No... ........................ .: Remo4TV Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: 2025-08-18 Date of Test....................... .: 2025-08-21 to 2025-10-27 Date of Issue .................... .: 2025-11-05 Test Report Form No. ...... . : WTX_Part 15_247W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi/Project Engineer Jason Su/Manager Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 71 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY ...................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................. 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 14 3. ANTENNA REQUIREMENT ................................................................................................................................. 15 3.1 STANDARD APPLICABLE ..................................................................................................................................... 15 3.2 EVALUATION INFORMATION ................................................................................................................................ 15 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS .................................................................................... 16 4.1 STANDARD APPLICABLE ..................................................................................................................................... 16 4.2 FREQUENCY HOPPING SYSTEM ......................................................................................................................... 16 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE ............................................................................... 17 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION .................................................... 18 5.1 STANDARD APPLICABLE ..................................................................................................................................... 18 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 18 5.3 TEST PROCEDURE .............................................................................................................................................. 18 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 19 6. DWELL TIME OF HOPPING CHANNEL ........................................................................................................... 20 6.1 STANDARD APPLICABLE ..................................................................................................................................... 20 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 20 6.3 TEST PROCEDURE .............................................................................................................................................. 20 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 21 7. 20DB BANDWIDTH ............................................................................................................................................... 22 7.1 STANDARD APPLICABLE ...................................................................................................…

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Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 49 of 71 Test Graphs DH5-Ant1-Hop-PASS 2DH5-Ant1-Hop-PASS 3DH5-Ant1-Hop-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 50 of 71 Appendix D: Time of occupancy Test Result TestMode Antenna Frequency[MHz] BurstWidth [ms] TotalHops [Num] Result[s] Limit[s] Verdict DH5 Ant1 Hop 2.884 110 0.317 ≤0.4 PASS 2DH5 Ant1 Hop 2.891 120 0.347 ≤0.4 PASS 3DH5 Ant1 Hop 2.893 110 0.318 ≤0.4 PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 51 of 71 Test Graphs DH5-Ant1-Hop-PASS 2DH5-Ant1-Hop-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 52 of 71 3DH5-Ant1-Hop-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 53 of 71 Appendix E: Number of hopping channels Test Result TestMode Antenna Frequency[MHz] Result[Num] Limit[Num] Verdict DH5 Ant1 Hop 79 ≥15 PASS 2DH5 Ant1 Hop 79 ≥15 PASS 3DH5 Ant1 Hop 79 ≥15 PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 54 of 71 Test Graphs DH5-Ant1-Hop-PASS 2DH5-Ant1-Hop-PASS 3DH5-Ant1-Hop-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 55 of 71 Appendix F: Reference level measurement Test Result TestMode Antenna Freq(MHz) Max.Point[MHz] Result[dBm] DH5 Ant1 2402 2401.85 2.71 DH5 Ant1 2441 2441.15 1.52 DH5 Ant1 2480 2479.97 0.95 2DH5 Ant1 2402 2401.83 3.12 2DH5 Ant1 2441 2440.84 1.66 2DH5 Ant1 2480 2479.82 1.01 3DH5 Ant1 2402 2401.83 2.98 3DH5 Ant1 2441 2440.99 1.54 3DH5 Ant1 2480 2479.98 1.06 Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 56 of 71 Test Graphs DH5-Ant1-2402-PASS DH5-Ant1-2441-PASS DH5-Ant1-2480-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 57 of 71 2DH5-Ant1-2402-PASS 2DH5-Ant1-2441-PASS 2DH5-Ant1-2480-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 58 of 71 3DH5-Ant1-2402-PASS 3DH5-Ant1-2441-PASS 3DH5-Ant1-2480-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 59 of 71 Appendix G: Band edge measurements Test Result TestMode Antenna ChName Frequency[MHz] RefLevel [dBm] Result [dBm] Limit [dBm] Verdict DH5 Ant1 Low 2402 2.71 -42.73 ≤-17.29 PASS DH5 Ant1 High 2480 0.95 -46.56 ≤-19.05 PASS DH5 Ant1 Low Hop_2402 2.89 -43.52 ≤-17.11 PASS DH5 Ant1 High Hop_2480 0.76 -45.78 ≤-19.24 PASS 2DH5 Ant1 Low 2402 3.12 -42.27 ≤-16.88 PASS 2DH5 Ant1 High 2480 1.01 -46.98 ≤-18.99 PASS 2DH5 Ant1 Low Hop_2402 1.74 -44.16 ≤-18.26 PASS 2DH5 Ant1 High Hop_2480 1.07 -46.95 ≤-18.93 PASS 3DH5 Ant1 Low 2402 2.98 -43.07 ≤-17.02 PASS 3DH5 Ant1 High 2480 1.06 -46.8 ≤-18.94 PASS 3DH5 Ant1 Low Hop_2402 -0.59 -45.96 ≤-20.59 PASS 3DH5 Ant1 High Hop_2480 0.95 -44.91 ≤-19.05 PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 60 of 71 Test Graphs DH5-Ant1-2402-PASS DH5-Ant1-2480-PASS DH5-Ant1-Hop_2402-PASS

Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 61 of 71 DH5-Ant1-Hop_2480-PASS 2DH5-Ant1-2402-PASS 2DH5-Ant1-2480-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 62 of 71 2DH5-Ant1-Hop_2402-PASS 2DH5-Ant1-Hop_2480-PASS 3DH5-Ant1-2402-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 63 of 71 3DH5-Ant1-2480-PASS 3DH5-Ant1-Hop_2402-PASS 3DH5-Ant1-Hop_2480-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 64 of 71 Appendix H: Conducted Spurious Emission Test Result TestMode Antenna Frequency [MHz] FreqRange [MHz] RefLevel [dBm] Result [dBm] Limit [dBm] Verdict DH5 Ant1 2402 30~1000 2.71 -50.79 ≤-17.29 PASS DH5 Ant1 2402 1000~26500 2.71 -31.26 ≤-17.29 PASS DH5 Ant1 2441 30~1000 1.52 -51.05 ≤-18.48 PASS DH5 Ant1 2441 1000~26500 1.52 -31.54 ≤-18.48 PASS DH5 Ant1 2480 30~1000 0.95 -51.48 ≤-19.05 PASS DH5 Ant1 2480 1000~26500 0.95 -35.24 ≤-19.05 PASS 2DH5 Ant1 2402 30~1000 3.12 -50.94 ≤-16.88 PASS 2DH5 Ant1 2402 1000~26500 3.12 -36.11 ≤-16.88 PASS 2DH5 Ant1 2441 30~1000 1.66 -51.51 ≤-18.34 PASS 2DH5 Ant1 2441 1000~26500 1.66 -38.08 ≤-18.34 PASS 2DH5 Ant1 2480 30~1000 1.01 -50.6 ≤-18.99 PASS 2DH5 Ant1 2480 1000~26500 1.01 -40.42 ≤-18.99 PASS 3DH5 Ant1 2402 30~1000 2.98 -50.88 ≤-17.02 PASS 3DH5 Ant1 2402 1000~26500 2.98 -34.68 ≤-17.02 PASS 3DH5 Ant1 2441 30~1000 1.54 -50.83 ≤-18.46 PASS 3DH5 Ant1 2441 1000~26500 1.54 -35.89 ≤-18.46 PASS 3DH5 Ant1 2480 30~1000 1.06 -50.92 ≤-18.94 PASS 3DH5 Ant1 2480 1000~26500 1.06 -40.77 ≤-18.94 PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 65 of 71 Test Graphs DH5-Ant1-2402-30~1000-PASS DH5-Ant1-2402-1000~26500-PASS DH5-Ant1-2441-30~1000-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 66 of 71 DH5-Ant1-2441-1000~26500-PASS DH5-Ant1-2480-30~1000-PASS DH5-Ant1-2480-1000~26500-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 67 of 71 2DH5-Ant1-2402-30~1000-PASS 2DH5-Ant1-2402-1000~26500-PASS 2DH5-Ant1-2441-30~1000-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 68 of 71 2DH5-Ant1-2441-1000~26500-PASS 2DH5-Ant1-2480-30~1000-PASS 2DH5-Ant1-2480-1000~26500-PASS

Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 69 of 71 3DH5-Ant1-2402-30~1000-PASS 3DH5-Ant1-2402-1000~26500-PASS 3DH5-Ant1-2441-30~1000-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 70 of 71 3DH5-Ant1-2441-1000~26500-PASS 3DH5-Ant1-2480-30~1000-PASS 3DH5-Ant1-2480-1000~26500-PASS Reference No.: WTX25X08220071W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 71 of 71 APPENDIX PHOTOGRAPHS Please refer to “ANNEX” ***** END OF REPORT *****

N c v NOTE: This doc company. The te validation and in MORLA App PRO MO TRA BRA STA REC TES ISS cument is issue est results appl nformation confi AB SHENZ FL1-3, B Block67 plicant ODUCT NA ODEL NAM ADE NAM AND NAM ANDARD(S CEIPT DAT ST DATE SUE DATE ed by MORLAB y only to the pa rmed at our we ZHEN MORLAB COM Building A, FeiYang S 7, BaoAn District, She TE : AME : ME : E : ME : S) : ATE : : : B, the test repo articular sample bsite. MMUNICATIONS TEC Science Park, No.8 L enZhen , GuangDon EST SHANGHA MV_BP10 MV_BP10 MVSILICO MVSILICO ANSI/IEEE 2019-08-3 2019-09-0 2019-10-1 Edited Approved rt shall not be e(s) tested and CHNOLOGY Co., Ltd LongChang Road, g Province, P. R. Ch T RE AI MOUNT 0xx PCB An 0 ON ON E Std 149- 30 02 15 d by: by: reproduced exc to the specific d. ina Te l : 8 Http:/ RE EPOR TAIN VIEW ntenna -2008 Chi Sh Andy Yeh cept in full with tests carried o u 86-755-36698555 //www.morlab.cn EPORT No RT W SILICON ide(Rappo h(Technica out prior written ut which is avai Fax: 86-755-3669 E-mail: service@ o.：SZ190 CO,. LTD orteur) l Director) n permission of lable on reques 98525 @morlab.cn Page 1 of 1 080340E01 f the st for 4 1 MORLAB SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. FL1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 2 of 14 REPORT No.：SZ19080340E01 DIRECTORY 1. Technical Information ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 3 1.1. Manufacturer and Factory Information ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 3 1.2. Equipment Under Test (EUT) Description ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 3 2. Test Results ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 4 2.1. Applied Reference Documents ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 4 2.2. Test Conditions ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 4 2.3. Test Results lists ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 4 Annex A Photographs ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 6 Annex B Figures ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 7 1. 2D Radiation Pattern ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 7 2. 3D Radiation Pattern ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 9 3. Return Loss ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 10 4. VSWR ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 11 5. Input Impedance ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 11 Annex C Photographs ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 12 Annex D General Information ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 14 1.1 Identification of the Responsible Testing Laboratory ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 14 1.2 Identification of the Responsible Testing Location ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 14 1.3 Test Equipments Utilized ∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙∙ 14 Change History Version Date Reason for change 1.0 2019-10-15 First edition MORLAB SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. FL1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 3 of 14 REPORT No.：SZ19080340E01 1. Technical Information Note: Provide by manufacturer. 1.1. Manufacturer and Factory Information Applicant: SHANGHAI MOUNTAIN VIEW SILICON CO,. LTD Applicant Address: Suite 4C, Building 3, 1238 Zhangjiang Road, Pudong New District, Shanghai, China Manufacturer: SHANGHAI MOUNTAIN VIEW SILICON CO,. LTD Manufacturer Address: Suite 4C, Building 3, 1238 Zhangjiang Road, Pudong New District, Shanghai, China 1.2. Equipment Under Test (EUT) Description Wireless Type N/A Frequency N/A MORLAB SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. FL1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 4 of 14 REPORT No.：SZ19080340E01 2. Test Results 2.1. Applied Reference Documents Leading reference documents for testing: No. Identity Document Title 1 ANSI/IEEE Std 149-2008 IEEE Standard Test Procedures for Antennas 2.2. Test Conditions Test Environment Conditions： Relative Humidity: 25 ... 75 % Temperature: +10 °C to +30 °C 2.3. Test Results lists 2.3.1. Gain Frequency Gain(dBi) 2400MHz 2.81 2410MHz 2.74 2420MHz 3.38 2430MHz 2.73 2440MHz 1.01 2450MHz 1.26 2460MHz 1.50 2470MHz 1.49 2480MHz 1.42 2490MHz 0.36 2500MHz 0.33 MORLAB SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. FL1-3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, P. R. China Tel: 86-755-36698555 Fax: 86-755-36698525 Http://www.morlab.cn E-mail: [email protected] Page 5 of 14 REPORT No.：SZ19080340E01 2.3.2. Return Loss/VSWR/Input Impedance Frequency Return Loss (dB) VSWR Input Impedance(Ω) 240…

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1.9999 二上 4.9990 unit ：mm