2BKBC-XFXK-A05-001VIAIM Nano+

VIAIM Nano+ Model/HVIN:XF-A01 FCC WarningThis device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.Any Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment.Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -Reorient or relocate the receiving antenna. -Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or an experienced radio/TV technician for help.The device has been evaluated to meet general RF exposure requirement.The device can be used in portable exposure condition without restriction. IC WarningThis device complies with Industry Canada’s licence-exempt RSSs. Operationis subject to the following two conditions:(1) This device may not cause interference; and(2) This device must accept any interference, including interference that maycause undesired operation of the device.The device has been evaluated to meet general RF exposure requirement.The device can be used in portable exposure condition without restriction.Cet appareil est conforme aux CNR exemptes de licence d'Industrie Canada .Son fonctionnement est soumis aux deux conditions suivantes :( 1 ) Ce dispositif ne peut causer d'interférences ; et( 2 ) Ce dispositif doit accepter toute interférence , y compris les interférencesqui peuvent causer un mauvais fonctionnement de l'appareil.Le dispositif a été con?u pour répondre à la demande générale deradioexposition.

Hong Kong Future lntelligent Technology Co., Ltd 2024.08.14 Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for 2BKBC-XFXK-A05-001 [Hong Kong Future lntelligent Technology Co., Ltd] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. Sincerely, Xiaolong Shen Hong Kong Future lntelligent Technology Co., Ltd 2024.08.14 Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for 2BKBC-XFXK-A05-001 [Hong Kong Future lntelligent Technology Co., Ltd] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, Xiaolong Shen

Attestation Statements 2024.08.14 TO: Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046, USA RE: Attestation Statements Part 2.911(d)(7) request for 2BKBC-XFXK-A05-001 (Hong Kong Future lntelligent Technology Co., Ltd), the undersigned, hereby authorize (AOGES CO., LIMITED) to act as our designated U.S. agent for service of process, (Hong Kong Future lntelligent Technology Co., Ltd) accepts to maintain an agent for no less than one year after the grantee has terminated all marketing and importation or the conclusion of any Commission-related proceeding involving the equipment. (AOGES CO., LIMITED) accepts the responsibility to act as designated U.S. agent for service of process. Applicant Information： Company name: Hong Kong Future lntelligent Technology Co., Ltd Contact Name: Xiaolong Shen Address: 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Telephone No: 15262352306 Email: [email protected] Signature U.S. Agent Information: Company Name: AOGES CO., LIMITED Address: 1624 Market St, Ste 226, #30327 Denver CO, 80202 USA FRN: 0033947847 Contact Name: XIAOYAN LAl Telephone No: +1 303 623 1940 Email: [email protected] Signature

Hong Kong Future lntelligent Technology Co., Ltd 2024-08-14 Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (VIAIM Nano+ / XF-A01 # AND 2BKBC- XFXK-A05-001#) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the • Schematics • Block diagram • Operation description required to be submitted with this application be permanently withheld from public review. These materials contain trade secrets and proprietary information and are not customarily released to the public. The public disclosure of this information might be harmful to the company and provide unjustified benefits to our competitors. Please contact me if there is any information you may need. Sincerely, Name: Xiaolong Shen

Hong Kong Future lntelligent Technology Co., Ltd 2024-08-14 Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen STS Test Services Co., Ltd) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Name: Xiaolong Shen

Page 1 of 7 Report No.: STS2407134 APPENDIX-PHOTOGRAPHS OF EUT CONSTRUCTIONAL DETAILS Model: XF-A01 Photo 1 Photo 2 Page 2 of 7 Report No.: STS2407134 Photo 3 Photo 4 Page 3 of 7 Report No.: STS2407134 Photo 5 Photo 6 Page 4 of 7 Report No.: STS2407134 Photo 7 Photo 8 Page 5 of 7 Report No.: STS2407134 Photo 9 Photo 10 Page 6 of 7 Report No.: STS2407134 Photo 11 Photo 12 Page 7 of 7 Report No.: STS2407134 Photo 13

Label VIAIM Nano+ VIAIM Inout:5V 0.6A Output:5V O.2A Changing Case Battery Capaclty: 500mAh 1.85Wh Model:XF- AO1 FCC ID:2BKBC-XFXK-A05-001 IC:32848-XFXKA05001 18.5mm 7mm A01

Page 1 of 2 Report No.: STS2407134 APPENDIX-PHOTOGRAPHS OF EUT CONSTRUCTIONAL DETAILS Model:XF-A01 Photo 1 Photo 2 BT/BLE Antenna Page 2 of 2 Report No.: STS2407134 Photo 3 Photo 4

The test results presented in this report relate only to the object tested. This report shall not be reproduced, except in full, without the written approval of the ShenZhen STS Test Services Co., Ltd. Radio Test Report Report No.: STS2407134H01 Issued for Hong Kong Future lntelligent Technology Co., Ltd 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Product Name: VIAIM Nano+ Brand Name: VIAIM Model Name: XF-A01 Series Model(s): N/A FCC ID: 2BKBC-XFXK-A05-001 Test Standards: FCC 47CFR §2.1093 Page 2 of 9 Report No.: STS2407134H01 TEST REPORT Applicant’s Name ................. : Hong Kong Future lntelligent Technology Co., Ltd Address ................................. : 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Manufacturer's Name ........... : Hong Kong Future lntelligent Technology Co., Ltd Address ................................. : 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Product Description Product Name ........................ : VIAIM Nano+ Brand Name .......................... : VIAIM Model Name .......................... : XF-A01 Series Model(s) ...................... : N/A Test Standards ..................... : FCC 47CFR §2.1093 447498 D04 Interim General RF Exposure Guidance v01 The test results presented in this report relate only to the object tested. This report shall not be reproduced, except in full, without the written approval of the ShenZhen STS Test Services Co., Ltd. Date of Test ........................................... : Date of receipt of test item ...................... : 17 July 2024 Date (s) of performance of tests ............. : 17 July 2024~04 Aug. 2024 Date of Issue .......................................... : 04 Aug. 2024 Test Result .............................................. : Pass Testing Engineer : (Aaron Bu) Technical Manager : (Chris Chen) Authorized Signatory : (Bovey Yang) Page 3 of 9 Report No.: STS2407134H01 TABLE OF CONTENTS 1. GENERAL INFORMATION 5 1.1 GENERAL DESCRIPTION OF THE EUT 5 1.2 TEST FACTORY 5 2. FCC 47CFR §2.1093 REQUIREMENT 6 2.1 TEST STANDARDS 6 2.2 LIMIT 6 2.3 TEST RESULT 9 Page 4 of 9 Report No.: STS2407134H01 Revision History Rev. Issue Date Report No. Effect Page Contents 00 04 Aug. 2024 STS2407134H01 ALL Initial Issue Page 5 of 9 Report No.: STS2407134H01 1. GENERAL INFORMATION 1.1 GENERAL DESCRIPTION OF THE EUT Product Name VIAIM Nano+ Brand Name VIAIM Model Name XF-A01 Series Model(s) N/A Model Difference N/A Product Description The EUT is VIAIM Nano+ Operation Frequency: 2402~2480 MHz Modulation Type: BLE:GFSK BT BR(1Mbps): GFSK BT EDR(2Mbps): π/4-DQPSK BT EDR(3Mbps): 8DPSK Antenna gain: 1.4dBi Antenna Designation: FPC Rating Input: DC 5V 0.6A Output: DC 5V 0.2A Battery Rated Voltage: 3.0V Charge Limit Voltage:4.4V Capacity: 60 mAh Hardware Version V2 Software Version V3.0.0.2 1.2 TEST FACTORY SHENZHEN STS TEST SERVICES CO., LTD Add. : 101, Building B, Zhuoke Science Park, No.190 Chongqing Road, ZhanChengShequ, Fuhai Sub-District, Bao’an District, Shenzhen, Guang Dong, China FCC test Firm Registration Number: 625569 IC test Firm Registration Number: 12108A A2LA Certificate No.: 4338.01 Page 6 of 9 Report No.: STS2407134H01 2. FCC 47CFR §2.1093 REQUIREMENT 2.1 TEST STANDARDS Follow the maximum permissible exposure (MPE) limits specified in 447498 D04 Interim General Radio Frequency Exposure Guidelines v01. The gain of the antenna used in the product was extracted from the supplied antenna data sheet and the maximum total power input to the antenna was also measured. Calculate the distance from the product to the MPE limit by the formula. 2.2 LIMIT For single RF sources (i.e., any single fixed RF source, mobile device, or portable device, as defined in paragraph (b)(2) of this section): A single RF source is exempt if: (A) The available maximum time-averaged power is no more than 1 mW, regardless of separation distance. This exemption may not be used in conjunction with other exemption criteria other than those in paragraph (b)(3)(ii)(A) of Part 1.1307. Medical implant devices may only use this exemption and that in paragraph (b)(3)(ii)(A); (B) Or the available maximum time-averaged power or effective radiated power (ERP), whichever is greater, is less than or equal to the threshold Pth (mW) described in the following formula. This method shall only be used at separation distances (cm) from 0.5 centimeters to 40 centimeters and at frequencies from 0.3 GHz to 6 GHz (inclusive). Pth is given by: Page 7 of 9 Report No.: STS2407134H01 (C) Or using below table and the minimum separation distance (R in meters) from the body of a nearby person for the frequency (f in MHz) at which the source operates, the ERP (watts) is no more than the calculated value prescribed for that frequency. For the exemption in Table 1 to apply, R must be at least λ/2π, where λ is the free-space operating wavelength in meters. If the ERP of a single RF source is not easily obtained, then the available maximum time-averaged power may be used in lieu of ERP if the physical dimensions of the radiating structure(s) do not exceed the electrical length of λ/4 or if the antenna gain is less than that of a half-wave dipole (1.64 linear value). RF Source frequency (MHz) Threshold ERP(watts) 0.3-1.34 1,920 R 2 . 1.34-30 3,450 R 2 /f 2 . 30-300 3.83 R 2 . 300-1,500 0.0128 R 2 f. 1,500-100,000 19.2R 2 . Page 8 of 9 Report No.: STS2407134H01 For multiple RF sources: Multiple RF sources are exempt if: (A) The available maximum time-averaged power of each source is no more than 1 mW and there is a separation distance of two centimeters between any portion of a radiating structure operating and the nearest portion of any other radiating structure in the same device, except if the sum of multiple sources is less than 1 mW during the time-averaging period, in which case they may be treated as a single source (separation is not required). This exemption may not be used in …

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PA Ant E3 E2 E1 PA Ant E3 E2 E1

The test results presented in this report relate only to the object tested. This report shall not be reproduced, except in full, without the written approval of the Shenzhen STS Test Services Co., Ltd. Radio Test Report Report No.:STS2407134W02 Issued for Hong Kong Future lntelligent Technology Co., Ltd 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Product Name: VIAIM Nano+ Brand Name: VIAIM Model Name: XF-A01 Series Model(s): N/A FCC ID: 2BKBC-XFXK-A05-001 Test Standards: FCC Part15.247 Page 2 of 158 Report No.: STS2407134W02 TEST REPORT Applicant’s Name ................. : Hong Kong Future lntelligent Technology Co., Ltd Address .................................. : 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Manufacturer's Name ........... : Hong Kong Future lntelligent Technology Co., Ltd Address .................................. : 7/F, Dawning House, 145 Connaught Road Central, Sheung Wan, Hong Kong, China Product Description Product Name ........................ : VIAIM Nano+ Brand Name ........................... : VIAIM Model Name ........................... : XF-A01 Series Model(s) .................... : N/A Test Standards...................... : FCC Part15.247 Test Procedure ....................... : ANSI C63.10-2020 This device described above has been tested by STS, the test results show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is applicable only to the tested sample identified in the report. The test results presented in this report relate only to the object tested. This report shall not be reproduced, except in full, without the written approval of the Shenzhen STS Test Services Co., Ltd. Date of Test ............................... : Date of receipt of test item ......... : 17 July 2024 Date (s) of performance of tests : 17 July 2024~04 Aug. 2024 Date of Issue ............................. : 04 Aug. 2024 Test Result ................................. : Pass Testing Engineer : (Aaron Bu) Technical Manager : (Chris Chen) Authorized Signatory : (Bovey Yang) Page 3 of 158 Report No.: STS2407134W02 Table of Contents Page 1. SUMMARY OF TEST RESULTS 7 1.1 TEST FACTORY 8 1.2 MEASUREMENT UNCERTAINTY 8 2. GENERAL INFORMATION 9 2.1 GENERAL DESCRIPTION OF THE EUT 9 2.2 DESCRIPTION OF THE TEST MODES 11 2.3 FREQUENCY HOPPING SYSTEM REQUIREMENTS 11 2.4 TABLE OF PARAMETERS OF TEST SOFTWARE SETTING 13 2.5 BLOCK DIAGRAM SHOWING THE CONFIGURATION OF SYSTEM TESTED 13 2.6 DESCRIPTION OF NECESSARY ACCESSORIES AND SUPPORT UNITS 14 2.7 EQUIPMENTS LIST 15 3. EMC EMISSION TEST 16 3.1 CONDUCTED EMISSION MEASUREMENT 16 3.2 RADIATED EMISSION MEASUREMENT 22 4. CONDUCTED SPURIOUS & BAND EDGE EMISSION 40 4.1 LIMIT 40 4.2 TEST PROCEDURE 40 4.3 TEST SETUP 41 4.4 EUT OPERATION CONDITIONS 41 4.5 TEST RESULTS 41 5. NUMBER OF HOPPING CHANNEL 42 5.1 LIMIT 42 5.2 TEST PROCEDURE 42 5.3 TEST SETUP 42 5.4 EUT OPERATION CONDITIONS 42 5.5 TEST RESULTS 42 6. AVERAGE TIME OF OCCUPANCY 43 6.1 LIMIT 43 6.2 TEST PROCEDURE 43 6.3 TEST SETUP 43 6.4 EUT OPERATION CONDITIONS 43 6.5 TEST RESULTS 43 7. HOPPING CHANNEL SEPARATION MEASUREMEN 44 Page 4 of 158 Report No.: STS2407134W02 Table of Contents Page 7.1 LIMIT 44 7.2 TEST PROCEDURE 44 7.3 TEST SETUP 44 7.4 EUT OPERATION CONDITIONS 44 7.5 TEST RESULTS 44 8. BANDWIDTH TEST 45 8.1 LIMIT 45 8.2 TEST PROCEDURE 45 8.3 TEST SETUP 45 8.4 EUT OPERATION CONDITIONS 45 8.5 TEST RESULTS 45 9. OUTPUT POWER TEST 46 9.1 LIMIT 46 9.2 TEST PROCEDURE 46 9.3 TEST SETUP 47 9.4 EUT OPERATION CONDITIONS 47 9.5 TEST RESULTS 47 10. ANTENNA REQUIREMENT 47 10.1 STANDARD REQUIREMENT 47 10.2 EUT ANTENNA 47 APPENDIX 1-TEST DATA 48 Left 48 1. DWELL TIME 48 2. MAXIMUM PEAK CONDUCTED OUTPUT POWER 58 3. -20DB BANDWIDTH 64 4. CARRIER FREQUENCIES SEPARATION 70 5. NUMBER OF HOPPING CHANNEL 76 6. BAND EDGE 79 7. BAND EDGE(HOPPING) 86 8. CONDUCTED RF SPURIOUS EMISSION 93 Right 103 Page 5 of 158 Report No.: STS2407134W02 Table of Contents Page 1. DWELL TIME 103 2. MAXIMUM PEAK CONDUCTED OUTPUT POWER 113 3. -20DB BANDWIDTH 119 4. CARRIER FREQUENCIES SEPARATION 125 5. NUMBER OF HOPPING CHANNEL 131 6. BAND EDGE 134 7. BAND EDGE(HOPPING) 141 8. CONDUCTED RF SPURIOUS EMISSION 148 APPENDIX 2-PHOTOS OF TEST SETUP 158 Page 6 of 158 Report No.: STS2407134W02 Revision History Rev. Issue Date Report No. Effect Page Contents 00 04 Aug. 2024 STS2407134W02 ALL Initial Issue Page 7 of 158 Report No.: STS2407134W02 1. SUMMARY OF TEST RESULTS Test procedures according to the technical standards: KDB 558074 D01 15.247 Meas Guidance v05r02. FCC Part 15.247,Subpart C Standard Section Test Item Judgment Remark 15.207 Conducted Emission PASS -- 15.247(a)(1) Hopping Channel Separation PASS -- 15.247(a)(1)&(b)(1) Output Power PASS -- 15.209 Radiated Spurious Emission PASS -- 15.247(d) Conducted Spurious & Band Edge Emission PASS -- 15.247(a)(1)(iii) Number of Hopping Frequency PASS -- 15.247(a)(1)(iii) Dwell Time PASS -- 15.247(a)(1) Bandwidth PASS -- 15.205 Restricted bands of operation PASS -- Part 15.247(d)/part 15.209(a) Band Edge Emission PASS -- 15.203 Antenna Requirement PASS -- NOTE: (1) ‘N/A’ denotes test is not applicable in this Test Report. (2) All tests are according to ANSI C63.10-2020. Page 8 of 158 Report No.: STS2407134W02 1.1 TEST FACTORY SHENZHEN STS TEST SERVICES CO., LTD Add. : 101, Building B, Zhuoke Science Park, No.190 Chongqing Road, ZhanChengShequ, Fuhai Sub-District, Bao’an District, Shenzhen, Guang Dong, China FCC test Firm Registration Number: 625569 IC test Firm Registration Number: 12108A A2LA Certificate No.: 4338.01 1.2 MEASUREMENT UNCERTAINTY The reported uncertainty of measurement y ±U, where expended uncertainty U is based on a standard uncertainty multiplied by a coverage factor of k=2, providing a level of confidence of approximately 95 %. No. Item Uncertainty 1 RF output power, conducted ±0.755dB 2 Unwanted Emissions, conducted ±2.874dB 3 All emissions, radiated 9K-30MHz ±3.80dB 4 All emissi…

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Page 80 of 158 Report No.: STS2407134W02 Test Graphs Band Edge NVNT 1-DH5 2402MHz No-Hopping Ref Band Edge NVNT 1-DH5 2402MHz No-Hopping Emission Page 81 of 158 Report No.: STS2407134W02 Band Edge NVNT 1-DH5 2480MHz No-Hopping Ref Band Edge NVNT 1-DH5 2480MHz No-Hopping Emission Page 82 of 158 Report No.: STS2407134W02 Band Edge NVNT 2-DH5 2402MHz No-Hopping Ref Band Edge NVNT 2-DH5 2402MHz No-Hopping Emission Page 83 of 158 Report No.: STS2407134W02 Band Edge NVNT 2-DH5 2480MHz No-Hopping Ref Band Edge NVNT 2-DH5 2480MHz No-Hopping Emission Page 84 of 158 Report No.: STS2407134W02 Band Edge NVNT 3-DH5 2402MHz No-Hopping Ref Band Edge NVNT 3-DH5 2402MHz No-Hopping Emission Page 85 of 158 Report No.: STS2407134W02 Band Edge NVNT 3-DH5 2480MHz No-Hopping Ref Band Edge NVNT 3-DH5 2480MHz No-Hopping Emission Page 86 of 158 Report No.: STS2407134W02 7. Band Edge(Hopping) Condition Mode Frequency (MHz) Hopping Mode Max Value (dBc) Limit (dBc) Verdict NVNT 1-DH5 2402 Hopping -57.64 <=-20 Pass NVNT 1-DH5 2480 Hopping -58.84 <=-20 Pass NVNT 2-DH5 2402 Hopping -57 <=-20 Pass NVNT 2-DH5 2480 Hopping -58.66 <=-20 Pass NVNT 3-DH5 2402 Hopping -54.27 <=-20 Pass NVNT 3-DH5 2480 Hopping -57.49 <=-20 Pass Page 87 of 158 Report No.: STS2407134W02 Test Graphs Band Edge(Hopping) NVNT 1-DH5 2402MHz Hopping Ref Band Edge(Hopping) NVNT 1-DH5 2402MHz Hopping Emission Page 88 of 158 Report No.: STS2407134W02 Band Edge(Hopping) NVNT 1-DH5 2480MHz Hopping Ref Band Edge(Hopping) NVNT 1-DH5 2480MHz Hopping Emission Page 89 of 158 Report No.: STS2407134W02 Band Edge(Hopping) NVNT 2-DH5 2402MHz Hopping Ref Band Edge(Hopping) NVNT 2-DH5 2402MHz Hopping Emission Page 90 of 158 Report No.: STS2407134W02 Band Edge(Hopping) NVNT 2-DH5 2480MHz Hopping Ref Band Edge(Hopping) NVNT 2-DH5 2480MHz Hopping Emission Page 91 of 158 Report No.: STS2407134W02 Band Edge(Hopping) NVNT 3-DH5 2402MHz Hopping Ref Band Edge(Hopping) NVNT 3-DH5 2402MHz Hopping Emission Page 92 of 158 Report No.: STS2407134W02 Band Edge(Hopping) NVNT 3-DH5 2480MHz Hopping Ref Band Edge(Hopping) NVNT 3-DH5 2480MHz Hopping Emission Page 93 of 158 Report No.: STS2407134W02 8. Conducted RF Spurious Emission Condition Mode Frequency (MHz) Max Value (dBc) Limit (dBc) Verdict NVNT 1-DH5 2402 -53.96 <=-20 Pass NVNT 1-DH5 2441 -47.87 <=-20 Pass NVNT 1-DH5 2480 -53.38 <=-20 Pass NVNT 2-DH5 2402 -43.98 <=-20 Pass NVNT 2-DH5 2441 -42.03 <=-20 Pass NVNT 2-DH5 2480 -44.84 <=-20 Pass NVNT 3-DH5 2402 -47.84 <=-20 Pass NVNT 3-DH5 2441 -47.92 <=-20 Pass NVNT 3-DH5 2480 -48.76 <=-20 Pass Page 94 of 158 Report No.: STS2407134W02 Test Graphs Tx. Spurious NVNT 1-DH5 2402MHz Ref Tx. Spurious NVNT 1-DH5 2402MHz Emission Page 95 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 1-DH5 2441MHz Ref Tx. Spurious NVNT 1-DH5 2441MHz Emission Page 96 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 1-DH5 2480MHz Ref Tx. Spurious NVNT 1-DH5 2480MHz Emission Page 97 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 2-DH5 2402MHz Ref Tx. Spurious NVNT 2-DH5 2402MHz Emission Page 98 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 2-DH5 2441MHz Ref Tx. Spurious NVNT 2-DH5 2441MHz Emission Page 99 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 2-DH5 2480MHz Ref Tx. Spurious NVNT 2-DH5 2480MHz Emission Page 100 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 3-DH5 2402MHz Ref Tx. Spurious NVNT 3-DH5 2402MHz Emission Page 101 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 3-DH5 2441MHz Ref Tx. Spurious NVNT 3-DH5 2441MHz Emission Page 102 of 158 Report No.: STS2407134W02 Tx. Spurious NVNT 3-DH5 2480MHz Ref Tx. Spurious NVNT 3-DH5 2480MHz Emission Page 103 of 158 Report No.: STS2407134W02 Right 1. Dwell Time Condition Mode Frequency (MHz) Pulse Time (ms) Total Dwell Time (ms) Burst Count Period Time (ms) Limit (ms) Verdict NVNT 1-DH1 2441 0.375 63.375 169 31600 <=400 Pass NVNT 1-DH3 2441 1.63 159.74 98 31600 <=400 Pass NVNT 1-DH5 2441 2.879 207.288 72 31600 <=400 Pass NVNT 2-DH1 2441 0.382 55.772 146 31600 <=400 Pass NVNT 2-DH3 2441 1.636 186.504 114 31600 <=400 Pass NVNT 2-DH5 2441 2.884 201.88 70 31600 <=400 Pass NVNT 3-DH1 2441 0.384 63.744 166 31600 <=400 Pass NVNT 3-DH3 2441 1.633 176.364 108 31600 <=400 Pass NVNT 3-DH5 2441 2.885 239.455 83 31600 <=400 Pass Page 104 of 158 Report No.: STS2407134W02 Test Graphs Dwell NVNT 1-DH1 2441MHz One Burst Dwell NVNT 1-DH1 2441MHz Accumulated Page 105 of 158 Report No.: STS2407134W02 Dwell NVNT 1-DH3 2441MHz One Burst Dwell NVNT 1-DH3 2441MHz Accumulated Page 106 of 158 Report No.: STS2407134W02 Dwell NVNT 1-DH5 2441MHz One Burst Dwell NVNT 1-DH5 2441MHz Accumulated Page 107 of 158 Report No.: STS2407134W02 Dwell NVNT 2-DH1 2441MHz One Burst Dwell NVNT 2-DH1 2441MHz Accumulated Page 108 of 158 Report No.: STS2407134W02 Dwell NVNT 2-DH3 2441MHz One Burst Dwell NVNT 2-DH3 2441MHz Accumulated Page 109 of 158 Report No.: STS2407134W02 Dwell NVNT 2-DH5 2441MHz One Burst Dwell NVNT 2-DH5 2441MHz Accumulated Page 110 of 158 Report No.: STS2407134W02 Dwell NVNT 3-DH1 2441MHz One Burst Dwell NVNT 3-DH1 2441MHz Accumulated Page 111 of 158 Report No.: STS2407134W02 Dwell NVNT 3-DH3 2441MHz One Burst Dwell NVNT 3-DH3 2441MHz Accumulated Page 112 of 158 Report No.: STS2407134W02 Dwell NVNT 3-DH5 2441MHz One Burst Dwell NVNT 3-DH5 2441MHz Accumulated Page 113 of 158 Report No.: STS2407134W02 2. Maximum Peak Conducted Output Power Condition Mode Frequency (MHz) Conducted Power (dBm) Limit (dBm) Verdict NVNT 1-DH5 2402 1 <=20.97 Pass NVNT 1-DH5 2441 1.8 <=20.97 Pass NVNT 1-DH5 2480 1.7 <=20.97 Pass NVNT 2-DH5 2402 0.9 <=20.97 Pass NVNT 2-DH5 2441 1.79 <=20.97 Pass NVNT 2-DH5 2480 1.72 <=20.97 Pass NVNT 3-DH5 2402 0.9 <=20.97 Pass NVNT 3-DH5 2441 1.47 <=20.97 Pass NVNT 3-DH5 2480 1.72 <=20.97 Pass Page 114 of 158 Report No.: STS2407134W02 Test Graphs Peak Power NVNT 1-DH5 2402MHz Peak Power NVNT 1-DH5 2441MHz Page 115 of 158 Report No.: STS2407134W02 Peak Power NVNT 1-DH5 2480MHz Peak Power NVNT 2-DH5 2402MHz Page 116 of 158 Report No.: STS2407134W02 Pe…

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Page 1 of 2 FCC ID: 2BKBC-XFXK-A05-001 DSS_DTS Setup photo Model Number: XF-A01 DSS_DTS conduction DSS_DTS radiation L DSS_DTS radiation H Page 2 of 2 FCC ID: 2BKBC-XFXK-A05-001