2BKRSNOISEPUREPODSOWS Wireless Earphone

Nexxbase Marketing Private Limited

Application Details

Equipment Class: DSS - Part 15 Spread Spectrum Transmitter
Date of Grant: Sep 16, 2025
Application Purpose: Original Equipment
Equipment Note: OWS Wireless Earphone
Frequency Range: 2402.00000000 - 2480.00000000
Company: Nexxbase Marketing Private Limited
Country: India

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

ID Label/Location Info

FCC ID LABEL: Ca. 10mm x 2mm Label Location FCC ID: 2BKRSNOISEPUREPODS

RF Exposure Info

FCC RF Exposure EUT Description: OWS Wireless Earphone Model No.: Noise Pure Pods FCC ID: 2BKRSNOISEPUREPODS 1. Limits According to KDB 447498 D01 General RF Exposure Guidance v06 The 1‐g and 10‐g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤50 mm are determined by: [(max power of channel, including tune‐up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHz)]≤3.0 for 1‐g SAR and ≤ 7.5 for 10‐g extremity SAR Where: Result=P/D*√F F= the RF channel transmit frequency in GHz P= Maximum turn‐up power in mw D= Min. test separation distance in mm 2. Test Result of RF Exposure Evaluation Frequency (MHz) Output power (dBm) Tune Up Power (dBm) Max Tune Up power (mW) Min test separation distance (mm) ResultLimit (mW/cm 2 ) SAR Test Exclusion 2480 -5.78 -5±1(-4) 0.398 5 0.1253.0 Pass Note: PK Output power= conducted power. Conducted power see the test report HK2412137722-E, antenna gain=2.7dBi Per KDB 447498 D01, when the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine RF Exposure test exclusion. The test exclusion threshold is 0.125 which is ≤ 3, RF Exposure testing is not required. Note: Exclusion Thresholds Results=[(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] ·[√f (GHz)] f(GHz) is the RF channel transmit frequency in GHz Distance=5mm

Test Report

2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 Application: WLAN,802.11b/g,Bluetooth,WLAN,etc... Features SMD,highreliability,ultraImpact,Omni-directional... PartnumberInformation RANT1608F245C01/04 (A)(B)(C)(D)(E)(F) ElectricalSpecification DimensionandTerminalConfiguration No.TerminalName 1Feeding/GNG 2GND/Feeding (A)ProductTypeChipAntenna (B)SizeCode 1.6x0.8mm( ± 0.1mm) (C)MaterialHighKmaterial (D)Frequency2.4~2.5GHz (E)FeedingmodePIFA&SingleFeeding (F)AntennatypeType=01/04/05 WorkingFrequencyRange2400~2500MHz Bandwidth120MHz(Min.) PeakGain2.7dBi(Typ.) Impedance50Ohm Returnloss10dB(Min) PolarizationLinear AzimuthBeamwidthOmni-directional OperationTemperature( °C )-40~85 °C ResistancetoSolderingHeats 10sec.(@280 °C ) TerminationNi/Au(Leadless) Dimension(mm) L 1.60±0.10 W 0.80 ± 0.10 T 0.80 ± 0.10 咏成國際科技有限公司電話 :13530576606 RAINInternationalTechnologyCo.,Ltd.TEL:13530576606 611, Building F, Tongan Zhichuang Park, Xingyu Road, Gushu, Baoan District, Shenzhen 2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 ２ 1 EvaluationBoardReference 长条板Layout建议参考如下： Toplayer: Bottomlayer: 2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 ３异形Layout建议参考如下： Toplayer: Toplayer: 2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 ４ ElectricalCharacteristics ReturnLoss&Radiation ELECTRICALCHARACTERISTICSS11 RadiationPattern 2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 ５ ElectricalCharacteristics 2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 ６ TapingSpecifications ReelandTapingSpecification ReelSpecification TYPESIZEABCD 16087”4K/Reel 4.0±0.5 4.0±213.5±0.5178±2 TappingSpecification PackagingTypeABWEFGHTψDP PaperType1608 1.90±0.203.50±0.208.0±0.201.75±0.103.5±0.054.0±0.102.0±0.050.75±0.10 1.50±0.10 4.0±0.1 2.4GHz1608ChipAntenna: RANT1608F245C01/1608F245C04/1608F245C05 ７ ReliabilityTable TestItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfilltheelectrical specification UserSpec. Thermal Shock 1.Preconditioning: 50±10°C/1hr,thenkeepfor24±1hrsatroomtemp. 2.Initialmeasure:Spec:referInitialspec. 3.Rapidchangeoftemperaturetest: -30°Cto+85°C;100cycles; 15minutesatLowercategorytemperature; 15minutesatUppercategorytemperature. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 107 Temperature Cycling 1.Initialmeasure:Spec:referInitialspec. 2.100Cycles(-30°Cto+85°C),SoakMode=1(2Cycle/hours). 3.Measurementat24±2Hoursaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. JESD22 JA104 HighTemperature Exposure 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered;500hours@T=+85°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 LowTemperature Storage 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered:500hours@T=-30°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 Solderability (SMDBottomSide) Dippingmethod: a.Temperature:235±5°C b.Dippingtime:3±0.5s Thesoldershouldcover over95%ofthecritical areaofbottomside. IEC60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150±10°C. Preheatingtime:1~2min. Soldertemperature:260±5°C. Dippingtime:5±0.5s NoVisibleDamage.IEC60384-21/22 4.10 Vibration5g'sfor20min.,12cycleseachof3orientations Note:Use8"X5"PCB.031"thick7securepointson,onelong sideand2securepointsatcornersofoppositesides.Parts mountedwithin2"fromanysecurepoint.Testfrom10-2000 Hz. NoVisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksineachdirectionshallbeappliedalongthethree mutuallyperpendicularaxesofthetestspecimen(18shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4ft/s Waveform:Half-sine NoVisibleDamage.MIL-STD-202 Method213 Humidity Bias 1.Humidity:85%R.H.,Temperature:85±2°C. 2.Time:500±24hours. 3.Measurementat24±2hrsaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 Method106 2.4GHz3216ChipAntenna: RANT1608F245C01/RANT1608F245C04/1608F245C05 _ ８ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds.NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12019/03/01NewDatasheet 22020/02/22Add2Dradiationcharacteristic Tester: Alan Liao

Test Report

Page 1 of 48 Report No.: HK2412137722-E FCC Test Report Test Report On Behalf of Nexxbase Marketing Private Limited For OWS Wireless Earphone Model No.: Noise Pure Pods FCC ID: 2BKRSNOISEPUREPODS Prepared For: Nexxbase Marketing Private Limited 15th Floor, DLF City Phase 5, Two Horizon Centre, Golf course Road, Sector 43, Gurugram, Haryana, 122002, India Prepared By: Shenzhen HUAK Testing Technology Co., Ltd. 1-2/F., Building B2, Junfeng Zhongcheng Zhizao Innovation Park, Heping, Fuhai Street, Bao’an District, Shenzhen, Guangdong, China Date of Test: Dec. 13, 2024 ~ Jan. 17, 2025 Date of Report: Jan. 17, 2025 Report Number: HK2412137722-E Page 2 of 48 Report No.: HK2412137722-E Test Result Certification Applicant’s Name .................. : Nexxbase Marketing Private Limited Address .................................. : 15th Floor, DLF City Phase 5, Two Horizon Centre, Golf course Road, Sector 43, Gurugram, Haryana, 122002, India Manufacturer's Name ........... : ZET TOWN INDIA PRIVATE LIMITED Address .................................. : B-04, SECTOR-63, NOIDA, GAUTAM BUDDHA NAGAR Uttar Pradesh, India, 201301 Product Description Trade Mark ............................. : NOISE Product Name ........................... : OWS Wireless Earphone Model and/or Type Reference...: Noise Pure Pods Standards .............................. : 47 CFR FCC Part 15 Subpart C 15.247 This publication may be reproduced in whole or in part for non-commercial purposes as long as the Shenzhen HUAK Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen HUAK Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Date of Test .................................... . Date (s) of Performance of Tests .... . Dec. 13, 2024 ~ Jan. 17, 2025 Date of Issue .................................... Jan. 17, 2025 Test Result ........................................ Pass Testing Engineer Len Liao Technical Manager Sliver Wan Authorized Signatory Jason Zhou Page 3 of 48 Report No.: HK2412137722-E Table of Contents Page 1. Summary .............................................................................................................................................................. 5 1.1. Test Standards ......................................................................................................................................................... 5 1.2. Test Description ....................................................................................................................................................... 5 1.3. Information of the Test Laboratory ......................................................................................................................... 6 1.4. Statement of the Measurement Uncertainty .......................................................................................................... 6 2. General Information ............................................................................................................................................. 7 2.1. Environmental Conditions ....................................................................................................................................... 7 2.2. General Description of EUT ..................................................................................................................................... 7 2.3. Description of Test Modes and Test Frequency ....................................................................................................... 8 2.4. Equipments Used during the Test ............................................................................................................................ 9 2.5. Related Submittal(s) / Grant (s) ............................................................................................................................. 10 2.6. Modifications ........................................................................................................................................................ 10 2.7. Description of Test Setup ....................................................................................................................................... 10 2.8. Description of Support Units ................................................................................................................................. 11 3. Test Conditions and Results ................................................................................................................................. 12 3.1. AC Conducted Emissions Test ................................................................................................................................ 12 3.2. Radiated Emissions and Band Edge ....................................................................................................................... 15 3.3. Maximum Peak Conducted Output Power ............................................................................................................ 26 3.4. 20dB Bandwidth .................................................................................................................................................... 27 3.5. Frequency Separation ........................................................................................................................................... 30 3.6. Number of Hopping Frequency ............................................................................................................................. 32 3.7. Time of Occupancy (Dwell Time) .......................................................................................................................... 34 3.8. Out‐of‐Band Emissions .....................................................................................................................…

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Test Setup Photos

Test Model：Noise Pure Pods Radiated Emission AC Conducted Emission RF Conducted Emission