2BTR9-XTEINKX3XTEINK X3

Shenzhen Xiaohu Xingtong Technology Co., Ltd. Federal Communications Commission Authorization and Evaluation Division Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 [December 24, 2025] U.S. Agent Designation [Shenzhen Xiaohu Xingtong Technology Co., Ltd.] acknowledges their consent for the following contact located in the United States to act as their agent for service of process for the equipment for which authorization is sought FCC ID: 2BTR9-XTEINKX3 Name and company of U.S. agent: [GLOCERTS TECHNOLOGY INC] Physical U.S. address of agent: [19784 SUNKISSED RIDGE DR, RIVERSIDE, CA 92507] FRN of U.S. agent: [0036339737] Email address of U.S. agent: [[email protected]] Telephone of U.S.agent: (626) 588-8039 [GLOCERTS TECHNOLOGY INC] acknowledges their obligation to accept service of process on behalf of [Shenzhen Xiaohu Xingtong Technology Co., Ltd.]. [Shenzhen Xiaohu Xingtong Technology Co., Ltd.] with the FRN [0037772233] accepts its obligation to maintain an agent for service of process in the United States for no less than 1 year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. By signing this form, we confirm the above and that we are aware of the application requirements listed under § 2.911(d)(7). The information provided in this letter is based on the referenced rule parts of Title 47 of the CFR as well as KDB 986446 D01. Sincerely, Signature Signature [Chen Chu] [Huiying Fan] [Manager] [Director] [Shenzhen Xiaohu Xingtong Technology Co., Ltd.] [GLOCERTS TECHNOLOGY INC]

Shenzhen Xiaohu Xingtong Technology Co., Ltd. (December 24, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for FCC ID:2BTR9-XTEINKX3 [Shenzhen Xiaohu Xingtong Technology Co., Ltd.] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. We also certify that, as of the date of the filing of the application, the equipment does not utilize cyber-security or anti-virus software from Kaspersky Lab, Inc, or any of its successors and assignees, which is also on the “covered list”. Sincerely, (Applicant signature) (Applicant printed name)Chen Chu Shenzhen Xiaohu Xingtong Technology Co., Ltd. (December 24, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for FCC ID:2BTR9-XTEINKX3 [Shenzhen Xiaohu Xingtong Technology Co., Ltd.] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, (Applicant signature) (Applicant printed name)Chen Chu

Shenzhen Xiaohu Xingtong Technology Co., Ltd. (December 24, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (XTEINK X3 / XTEINK X3 / FCC ID: 2BTR9-XTEINKX3 ) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☒ Internal Photos ☐ NOTE 1 ☒ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: Chen Chu Title: Manager

Shenzhen Xiaohu Xingtong Technology Co., Ltd. (December 24, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen CTB Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: Chen Chu Title: Manager

Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 4 External Photos Model: XTEINK X3 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 4 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 3 of 4 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 4 of 4

FCC ID LABEL: Label Location: FCC ID: 2BTR9-XTEINKX3 Model No.: XTEINK X3

Shenzhen CTB Testing Co., Ltd. FCC ID:2BTR9-XTEINKX3 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. BLE1M: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 -0.504 0.89-0±11.001.26<50.390233.00YES 2.441 -0.136 0.97-0±11.001.26<50.393383.00YES 2.480 0.514 1.130±11.001.26<50.396513.00YES GFSK BLE2M: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 -0.95 0.800±11.001.26<50.390233.00YES 2.441 -0.541 0.880±11.001.26<50.393383.00YES 2.480 0.17 1.040±11.001.26<50.396513.00YES GFSK 2.4GWIFI: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.412 7.5 5.627±18.006.31<51.959833.00YES 2.437 7.614 5.777±18.006.31<51.969963.00YES 2.462 7.809 6.047±18.006.31<51.980043.00YES 2.412 7.895 6.167±18.006.31<51.959833.00YES 2.437 7.236 5.297±18.006.31<51.969963.00YES 2.462 7.057 5.087±18.006.31<51.980043.00YES 2.412 7.013 5.037±18.006.31<51.959833.00YES 2.437 7.274 5.347±18.006.31<51.969963.00YES 2.462 6.746 4.736±17.005.01<51.572803.00YES 2.422 7.961 6.257±18.006.31<51.963893.00YES 2.437 6.936 4.946±17.005.01<51.564803.00YES 2.452 7.073 5.106±17.005.01<51.569603.00YES 802.11b 802.11g 802.11n( HT20) 802.11n( HT40) Shenzhen CTB Testing Co., Ltd. Conclusion: For the max result : 1.98004≤ FCC Limit 3.0 for 1g SAR.

深圳市金航标电子有限公司 http://www.BDS666.com - 1 - 产 品 技 术 规 格 书 SPECIFICATION 深圳市龙华区民治大道1079号展滔科技大厦C座C809室 TEL：0755-83040901 FAX：0755-83040901 拟制Prepared by： 审核Checked by ： 批准Approved by： 送样日期Formed On 产品版本Document Version ( V1.3 ) 产品型号 PART NO： KH5220-A36 客户料号CUSTOMER PART NO： 客户确认CUSTOMER APPROVED BY： 确认日期APPROVED DATE： 深圳市金航标电子有限公司 深圳市金航标电子有限公司 http://www.BDS666.com - 2 - 目 录 Table of contents 规格书版本更改记录 Version rejigger track record ..............................3 1. 概述 Introduction..................................................................4 2. 外型尺寸及测试板焊盘尺寸 D i m e n s i o n s.....................4～5 3. 测试电路和匹配电路 Evaluation Board and Matching Circuits............5 4. 电气性能 Electrical Characteristics..........................................6 5. 特性曲线 Characteristic curve...................................................6 6. 方向图 Radiation Pattern...................................................7～8 7. 可靠性试验后允许误差 Post Dependability Tolerance ...............9 8. 可靠性试验 Dependability Test..........................................9～10 9. 回流焊温度 Reflow Soldering Standard Condition.....................10 10.包装尺寸 Packaging and Dimensions ....................................11 深圳市金航标电子有限公司 http://www.BDS666.com - 3 - 产品规格书版本更改记录 Version rejigger track record 版本号 Version 更改记录 Rejigger 拟制 Prepared 批准 Approve 日期 Date V1.0 首次发行 姚富鑫 贺俊驹 2015.12.25 V1.1 更改产品尺寸公差值 姚富鑫 贺俊驹 2017.05.24 V1.2 修正可靠性试验说明内容8.1~8.4 陈星 贺俊驹 2017.11.07 V1.3 修正可靠性项目9.4内容 更新回流焊温度曲线图表 新增11.1产品包装摆放方向示意图 修正11.3产品储存条件为MSL:1 姚富鑫 贺俊驹 2018.06.13 备注： 1、更改产品电性能指标时，版本号需更换（V1.0换为V2.0、V3.0......）； 2、更改产品测试方法（包括可靠性测试条件），或更改使用条件时，当前版本号加系列（V1.0 换为V1.1、V1.2......）。 深圳市金航标电子有限公司 http://www.BDS666.com - 4 - 2.外型尺寸及测试板焊盘尺寸 Dimensions（Unit：mm） 1. 概述 INTRODUCTION 金航标微波多层陶瓷天线LA系列产品设计用于WLAN、WiFi、蓝牙、PHS，手机 多频天线, FM等小体积SMD片式设计。 kinghelm Microwave Multi-Layer Ceramic Antenna LA series are designed to be used in WLAN、WiFi、Bluetooth、PHS、 Multiple-band Mobile phone antenna, FM, etc and compact size SMD chip design. 深圳市金航标电子有限公司 http://www.BDS666.com - 5 - 3. 测试电路和匹配电路 Evaluation Board and Matching Circuits 90 50 Unit：mm 4.3nH 1.5pF 深圳市金航标电子有限公司 http://www.BDS666.com - 6 - 4. 电气性能 Electrical Characteristics 5. 特性曲线 Characteristic curve No. Item （项目） Specifications （特性） 4.1 Working Central Frequency 中心工作频率 2450 MHz 4.2 Band Width 通带宽度 100MHz typ. 4.3 Peak Gain 峰值增益 4.97 dBi 4.4 V.S.W.R 驻波比 ≤2.0 4.5 Polarization 极化方式 Linear 线性 4.6 Azimuth Beam width 方位角 Omni-directional 全向 4.7 Impedance 阻抗 50 Ω 深圳市金航标电子有限公司 http://www.BDS666.com - 7 - 6. 方向图及效率 Radiation Pattern & Efficiency coordinates： X-Z Plane Y-Z Plane 深圳市金航标电子有限公司 http://www.BDS666.com - 8 - X-Y Plane 3D Radiation Pattern Frequency (MHz) 2400 2450 2500 Avg. Gain (dBi) -0.75 -0.79 -0.88 Peck Gain (dBi) 4.52 4.97 4.85 Efficiency (%) 70.2 71.1 71.2 深圳市金航标电子有限公司 http://www.BDS666.com - 9 - 7. 可靠性试验后允许误差 Post Dependability Tolerance 经可靠性试验后允许比起始读数偏差见下表 Post Dependability Tolerance ( Refer to the table ) 8. 可靠性试验 Dependability Test 基准条件：温度范围 Temperature range 25±5°C 相对湿度范围 Relative Humidity range 55~75%RH 工作温度 Operating Temperature range -40°C~+85°C 8.1 耐振动 Vibration Resist 在振动频率为10~55Hz振幅为1.5mm 沿X.Y.Z方向各振动2小时后测试符合表8.1~8.4规定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after applied to the vibration of 10 to 55Hz with amplitude of 1.5mm for 2 hours each in X , Y and Z directions. 8.2 耐跌落冲击 Drop Shock 在100cm高度处按X，Y，Z三个面分别自由跌落在木制地板上共3次后测试符合表8.1~8.4规 定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after dropping onto the hard wooden board from the height of 100cm for 3 times each facet of the 3 dimensions of the device. 8.3 耐焊接热 Solder Heat Proof 能承受经120~150°C的温度预热120秒后，在255°C+10°C的焊锡浸5±0.5秒，或300°C-10°C的 电烙铁焊接3±0.5秒，焊接面无损伤。 The device should be satisfied after preheating at 120°C~150°C for 120 seconds and dipping in soldering Sn at 255°C+10°C for 5±0.5 seconds，or electric iron 300°C-10°C for 3±0.5 seconds， without damnify. 8.4 推力试验 Adhesive Strength of Termination 在产品电极端子上或表面上可承受5N(≦0603)；10N(>0603)水平推力10±1秒而无明显外观损坏 与电极移位。 The device have no remarkable damage or removal of the termination after horizontal force of 5N(≦0603)；10N(>0603)with 10±1 seconds. No. Item （项目） Post Dependability Tolerance (可靠性试验后允许附加误差) 7.1 Central Frequency 中心频率 ±5 MHz 7.2 Band Width 通带宽度 ±5 MHz 7.3 Gain 增益 ±0.1 dBi 7.4 V.S.W.R (in BW) 驻波比 ±0.1 深圳市金航标电子有限公司 http://www.BDS666.com - 10 - 8.5 耐弯曲试验 Bending Resist Test 将产品按图焊在1.6±0.2mm的 PCB 板中间，由箭头方向施 力：1mm/S，弯曲距离：1.5mm，保持5±1S，产品金属层无脱落。 Weld the product to the center part of the PCB with the thickness 1.6±0.2mm as the illustration shows, and keep exerting force arrow-ward on it at speed of :1mm/S , and hold for 5±1S at the position of 1.5mm bending distance , so far , any peeling off of the product metal coating should not be detected . 8.6 耐湿热特性 Moisture Proof 在温度为60±2°C，相对湿度90~95%的恒温湿箱中放置96小时，在常温中恢复1~2小时后测 试，符合表8.1~8.4规定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to the temperature 60±2°Cand the relative humidity 90~95% RH for 96 hours and 1~2 hours recovery time under normal condition. 8.7 高温特性 High Temperature Endurance 在温度为85±5°C的恒温箱中放置96±2小时，在常温中恢复1~2小时后测试。符合表8.1~8.4 规定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to temperature 85±5°Cfor 96±2 hours and 1~2 hours recovery time under normal temperature. 8.8 低温特性 Low Temperature Endurance 在温度为-40°C±5°C低温箱中放置96±2小时后恢复1~2小时测试符合表8.1~8.4规定。 The device should also satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to the temperature -40°C±5°C for 96±2 hours and to 2 hours recovery time under normal temperature. 8.9 温度循环 Temperature Cycle Test 在-40°C温度中保持30分钟，再在+85°C温度中保持30分钟，共循环5次后在常温中恢复1~2 小时后测试符合表8.1~8.4规定。 The device should also satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to the low temperature -40°C and high temperature +85°C for 30±2 min each by 5 cycles and 1 to 2 hours r…

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Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 40 TEST REPORT Compiled by: Reviewed by: Approved by: Kai Chen Martin Feng Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Test item description: XTEINK X3 FCC ID: 2BTR9-XTEINKX3 Trademark(s): N/A Model/Type reference: XTEINK X3 Applicant’s name: Shenzhen Xiaohu Xingtong Technology Co., Ltd. Address: Room 1209, Yichuang International Center, Building 2B, No. 8, Golf Avenue, Guangpei Community, Guanlan Street, Longhua District, Shenzhen, China Manufacturer: Shenzhen Xiaohu Xingtong Technology Co., Ltd. Address: Room 1209, Yichuang International Center, Building 2B, No. 8, Golf Avenue, Guangpei Community, Guanlan Street, Longhua District, Shenzhen, China Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, S henzhen, Guangdong, China Sample Received Date: Nov. 29, 2025 Sample tested Date: Nov. 29, 2025 to Dec. 02, 2025 Issue Date: Dec. 02, 2025 Report No.: CTB25112901001RF01 Test Standards FCC CFR Title 47 Part 15 Subpart C Section 15.247 ANSI C63.10:2020 Test Results PASS Remark: This is Bluetooth radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB25112901001RF01 Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 40 TABLE OF CONTENT Test Report Declaration Page 1. VERSION ........................................................................................................................................ 3 2. TEST SUMMARY ........................................................................................................................... 4 3. MEASUREMENT UNCERTAINTY ................................................................................................. 5 4. PRODUCT INFORMATION AND TEST SETUP ............................................................................ 6 4.1 Product Information .......................................................................................................................... 6 4.2 Test Setup Configuration .................................................................................................................. 6 4.3 Support Equipment........................................................................................................................... 6 4.4 Channel List ..................................................................................................................................... 7 4.5 Test Mode ........................................................................................................................................ 7 4.6 Test Environment ............................................................................................................................. 7 5. TEST FACILITY AND TEST INSTRUMENT USED ....................................................................... 8 5.1 Test Facility ...................................................................................................................................... 8 5.2 Test Instrument Used ....................................................................................................................... 8 6. AC POWER LINE CONDUCTED EMISSION ................................................................................ 10 6.1 Block Diagram Of Test Setup ......................................................................................................... 10 6.2 Limit ................................................................................................................................................ 10 6.3 Test procedure ............................................................................................................................... 10 6.4 Test Result ..................................................................................................................................... 12 7. RADIATED SPURIOUS EMISSION ............................................................................................. 14 7.1 Block Diagram Of Test Setup ......................................................................................................... 14 7.2 Limit ................................................................................................................................................ 14 7.3 Test procedure ............................................................................................................................... 15 7.4 Test Result ..................................................................................................................................... 16 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS ............................................... 23 8.1 Block Diagram Of Test Setup ......................................................................................................... 23 8.2 Limit ................................................................................................................................................ 23 8.3 Test procedure ............................................................................................................................... 23 8. 4 Test Result ..................................................................................................................................... 24 9. CO…

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Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 64 TEST REPORT Compiled by: Reviewed by: Approved by: Kai Chen Martin Feng Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Test item description: XTEINK X3 FCC ID: 2BTR9-XTEINKX3 Trademark(s): N/A Model/Type reference: XTEINK X3 Applicant’s name: Shenzhen Xiaohu Xingtong Technology Co., Ltd. Address: Room 1209, Yichuang International Center, Building 2B, No. 8, Golf Avenue, Guangpei Community, Guanlan Street, Longhua District, Shenzhen, China Manufacturer: Shenzhen Xiaohu Xingtong Technology Co., Ltd. Address: Room 1209, Yichuang International Center, Building 2B, No. 8, Golf Avenue, Guangpei Community, Guanlan Street, Longhua District, Shenzhen, China Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Nov. 29, 2025 Sample tested Date: Nov. 29, 2025 to Dec. 02, 2025 Issue Date: Dec. 02, 2025 Report No.: CTB25112901001RF02 Test Standards FCC CFR Title 47 Part 15 Subpart C Section 15.247 ANSI C63.10:2020 Test Results PASS Remark: This is WIFI-2.4GHz band radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB25112901001RF02 Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 64 TABLE OF CONTENT Test Report Declaration Page 1. VERSION ........................................................................................................................................................ 4 2. TEST SUMMARY .......................................................................................................................................... 5 3. MEASUREMENT UNCERTAINTY............................................................................................................. 6 4. PRODUCT INFORMATION AND TEST SETUP ..................................................................................... 7 4.1 Product Information .................................................................................................................................................... 7 4.2 Test Setup Configuration .......................................................................................................................................... 7 4.3 Support Equipment ..................................................................................................................................................... 7 4.4 Channel List .................................................................................................................................................................. 8 4.5 Test Mode ...................................................................................................................................................................... 8 4.6 Test Environment ........................................................................................................................................................ 8 5. TEST FACILITY AND TEST INSTRUMENT USED ................................................................................ 9 5.1 Test Facility ................................................................................................................................................................... 9 5.2 Test Instrument Used ................................................................................................................................................. 9 6. AC POWER LINE CONDUCTED EMISSION .......................................................................................... 12 6.1 Block Diagram Of Test Setup ................................................................................................................................ 12 6.2 Limit ............................................................................................................................................................................... 12 6.3 Test procedure ........................................................................................................................................................... 12 6.4 Test Result .................................................................................................................................................................. 14 7. RADIATED SPURIOUS EMISSION ........................................................................................................ 16 7.1 Block Diagram Of Test Setup ................................................................................................................................ 16 7.2 Limit ............................................................................................................................................................................... 16 7.3 Test procedure ........................................................................................................................................................... 17 7.4 Test Result .................................................................................................................................................................. 18 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS..................................................... 40 8.1 Block Diagram Of Test Setup ............................................…

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Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 2 Model: XTEINK X3 Radiated Emission Below 1G Above 1G Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 2 Conducted emissions