
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
S M ART G LA SS E S S M AR T G L A SS E S FCC Warning 15.19 Labeling requirements. This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. 15.21 Information to user. Any Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. 15.105 Information to the user. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -Reorient or relocate the receiving antenna. -Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or an experienced radio/TV technician for help. Absorption Rate (SAR) information: This device meets the government's requirements for exposure to radio waves. The guidelines are based on standards that were developed by independent scientific organizations through periodic and thorough evaluation of scientific studies. The standards include a substantial safety margin designed to assure the safety of all persons regardless of age or health. FCC RF Exposure Information and Statement The SAR limit of USA (FCC) is 1.6 W/kg averaged over one gram of tissue. This device was tested for typical body-worn operations with the back of the device kept 0mm from the body. To maintain compliance with FCC RF exposure requirements, use accessories that maintain a appropriate separation distance between the user's body and the back of the device. The use of belt clips, holsters and similar accessories should not contain metallic components in its assembly. The use of accessories that do not satisfy these requirements may not comply with FCC RF exposure requirements, and should be avoided. Use only the supplied or an approved antenna.
ShenzhenFutureElectronicsCo.,Ltd. AttestationStatements NotCoveredEntityApplicant&NotCoveredEquipment To:FederalCommunicationsCommissionDate:Jan.29,26 7435OaklandMillsRoad, Columbia,MD21046,USA Ref:InformationRequiredbySection2.911(d)(5)(i)&(ii) FCCID:2BTVM-G6PRO ShenzhenFutureElectronicsCo.,Ltd.(“theapplicant”)certifiesthat,asofthedateofthe filingoftheapplication,theapplicantisnotidentifiedontheCoveredList,establishedpursuantto§ 1.50002ofreferencechapter,asanentityproducing“covered”communicationequipment.The equipmentforwhichauthorizationissoughtisnot“covered”telecommunicationsequipmentandvideo surveillanceequipmentproducedbyentitiesidentifiedontheCommission’sCoveredListthatprohibited fromreceivinganequipmentauthorizationpursuanttosection§2.903oftheFCCrules. Sincerelyyours, ApplicantSignature PrintedName:GiselleTan Title:Manager Address:Floor6,Building11,RundongshengindustrialParkLongtengCommunity,XixiangStreet,Bao’an District,Shenzhen,China Tel:13632531686 Email:[email protected]
ShenzhenFutureElectronicsCo.,Ltd. 1|Page AttestationStatements To:FederalCommunicationsCommissionDate:Jan.29,26 7435OaklandMillsRoad, Columbia,MD21046,USA Subject:AttestationofCompliancewithFCCCoveredListSoftwareRequirements FCCID:2BTVM-G6PRO ProductName:SmartGlasses Thisletterservesasanattestationthattheequipmentidentifiedabove☐is/☒isnot(selectone)"covered" softwareasdefinedundertheFederalCommunicationsCommission(FCC)CoveredListrequirements,as outlinedinFCC22-84andKDB986446. Specifically,theundersignedcertifiesthattheequipmentforwhichauthorizationissought: 1.Doesnotcontaincybersecurityoranti-virussoftwareproducedorprovidedbyKasperskyLab, Inc.oranyofitssuccessors,assignees,parents,subsidiaries,affiliates,oranyentitythathasrebranded orrelabeledsoftwareproducedbytheaforementionedentities. 2.Doesnothavethecapabilitytostore,run,ordeliveranysoftwareidentifiedontheFCCCoveredList, includingbutnotlimitedtocybersecurityandanti-virussoftware. Tosupportthisattestation,theappendixevaluationdocumentationhasbeenpreparedandisincludedinthe certificationfiling. Thisattestationisbasedonathoroughevaluationofthedevice'sdesign,functionality,andsoftware environment.Theundersignedaffirmsthattheinformationprovidedisaccurateandcompletetothebestof theirknowledge. Sincerelyyours, ApplicantSignature PrintedName:GiselleTan Title:Manager Address:Floor6,Building11,RundongshengindustrialParkLongtengCommunity,XixiangStreet,Bao’an District,Shenzhen,China Tel:13632531686 Email:[email protected] ShenzhenFutureElectronicsCo.,Ltd. 2|Page EvaluationregardingtotheCoveredListSoftware: Compliance Methodology EvaluationProcessResults Deviceis Inherent compliance ☒ TheChipset(s)usedislimitedtorun theCybersecurityoranti-virus software. Compliance ☒ TheMemoryusedislimitedtorunthe Cybersecurityoranti-virussoftware. Compliance ☒ Thereisstoragecapacitylimitationfor storeorinstalltheCybersecurityor anti-virussoftware. Compliance ☒ Operatingsystemusedislimitedto run,installordelivertheCybersecurity oranti-virussoftware. Compliance Deviceisnot Inherent compliance ☐ EvaluationBasedonSoftware BillofMaterials(SBoM) Seeattached“SBoM“ Note:TheSBoMcontentislimited tothescopeofcoveredlist software(e.g.antivirusand cybersecuritysoftware). ☐ EvaluationBasedonScanfor Softwareonthedevice ☐ EvaluationBasedonFilesystemscan ☐ EvaluationBasedonRunning softwarecheck
ShenzhenFutureElectronicsCo.,Ltd. FederalCommunicationsCommission AuthorizationandEvaluationDivision EquipmentAuthorizationBranch 7435OaklandMillsRoad Columbia,MD21046 [2026-01-29] U.S.AgentDesignation [ShenzhenFutureElectronicsCo.,Ltd.]acknowledgestheirconsentforthefollowingcontactlocatedinthe UnitedStatestoactastheiragentforserviceofprocessfortheequipmentforwhichauthorizationissought(FCC ID:2BTVM-G6PRO): NameandcompanyofU.S.agent:[GLOCERTSTECHNOLOGYINC] PhysicalU.S.addressofagent:[19784SUNKISSEDRIDGEDR,RIVERSIDE,CA92507] FRNofU.S.agent:[0036339737] EmailaddressofU.S.agent:[[email protected]] TelephoneofU.S.agent:(626)588-8039 [GLOCERTSTECHNOLOGYINC]acknowledgestheirobligationtoacceptserviceofprocessonbehalfof [ShenzhenFutureElectronicsCo.,Ltd.]. [ShenzhenFutureElectronicsCo.,Ltd.]withtheFRN[0037782406]acceptsitsobligationtomaintainanagent forserviceofprocessintheUnitedStatesfornolessthan1yearaftereitherthegranteehaspermanently terminatedallmarketingandimportationoftheapplicableequipmentwithintheU.S.,ortheconclusionofany Commission-relatedadministrativeorjudicialproceedinginvolvingtheequipment,whicheverislater. Bysigningthisform,weconfirmtheaboveandthatweareawareoftheapplicationrequirementslistedunder§ 2.911(d)(7). TheinformationprovidedinthisletterisbasedonthereferencedrulepartsofTitle47oftheCFRaswellasKDB 986446D01. Sincerely, SignatureSignature [GiselleTan][HuiyingFan] [Manager][Director] [ShenzhenGold-EastElectronicCo.,Ltd][GLOCERTSTECHNOLOGYINC] Tel:13632531686 Email:[email protected]
ShenzhenFutureElectronicsCo.,Ltd. (January29,2026) FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 Subject:ConfidentialityRequestfor:FCCID:2BTVM-G6PRO PursuanttoSections0.457and0.459oftheCommission’sRules,weherebyrequestpermanent confidentialtreatmentoftheexhibitsaccompanyingthiscertificationapplicationasoutlinedbelow: BlockDiagram Schematics OperationalDescription Theaboveexhibitscontaintradesecretsand/orproprietaryinformationthatarenotpubliclyavailableand materialsthattheApplicanthasspentconsiderableeffortsindeveloping.Publicdisclosureofthesemay beharmfultotheApplicantandgiveanunfairadvantagetocompetitorsonthemarket. Sincerely, (Signature) PrintedName:GiselleTan Title:Manager Address:Floor6,Building11,RundongshengindustrialParkLongtengCommunity,XixiangStreet, Bao’anDistrict,Shenzhen,China Tel:13632531686 Email:[email protected]
ShenzhenFutureElectronicsCo.,Ltd. (January29,2026) FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 Subject:AgentAuthorizationforFCCID:2BTVM-G6PRO I,theundersigned,herebyauthorize( BTFTestingLab(Shenzhen)Co.,Ltd. )toactonour behalfinallmattersrelatingtothisapplicationforequipmentcertification. Anyactcarriedoutby(BTFTestingLab(Shenzhen)Co.,Ltd.)shallhavethesameeffectas ourownandIacknowledgethatallresponsibilityforcomplyingwiththetermsandconditionsof certification,asspecifiedbyDERYCOMCERTIFICATIONSERVICES,INC.,stillresideswith (ShenzhenFutureElectronicsCo.,Ltd.). WecertifythatwearenotsubjecttoadenialoffederalbenefitsthatincludesFCCbenefitspursuantto Section5301oftheAnti-DrugAbuseActof1988,21U.S.C.§862,andthatnopartytotheapplication,as definedin47CFR§1.2002(b),issubjecttoadenialoffederalbenefitsthatincludesFCCbenefits pursuanttothatsection. Sincerely, (Signature) (FullnameofcontactpersonlistedonFCC’swebsite)GiselleTan (Title)Manager Tel:13632531686 Email:[email protected]
FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of5 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 AppendixIIExternalPhotos FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of5 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page3of5 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page4of5 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page5of5 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00
Label&Location SmartGlasses Model:2BTVM-G6Pro FCCID:2BTVM-G6PRO Size:30mm*18mm
FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of3 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 AppendixIIIInternalPhotos FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of3 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 FCCID:2BTVM-G6PROReportNumber:BTF260115R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page3of3 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00
TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 1 of 35 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China SARTestReport For ApplicantName: ShenzhenFutureElectronicsCo.,Ltd. Address: Floor6,Building11,RundongshengindustrialParkLongteng Community,XixiangStreet,Bao’anDistrict,Shenzhen,China EUTName: SmartGlasses ModelNumber: 2BTVM-G6Pro IssuedBy CompanyName: BTFTestingLab(Shenzhen)Co.,Ltd. Address: Plant101,201and301,Building1,Block2,TantouIndustrial Park,TantouCommunity,SonggangStreet,Bao'anDistrict, Shenzhen,Guangdong,China ReportNumber: BTF260115R00301 TestStandards: 47CFRPart2.1093IEEEStd.1528-2013 IEEEC95.1-2019 FCCID: 2BTVM-G6PRO TestConclusion: Pass TestDate: 2025-12-28 DateofIssue: 2026-01-17 TestedBy: Kris.Li/Tester Date: 2026-01-17 ReviewedBy: AmendaZhong/ProjectEngineer Date: 2026-01-17 ApprovedBy: Ryan.CJ/EMCManager Date: 2026-01-17 Note:Allthetestresultsinthisreportonlyrelatedtothetestingsamples.Whichcanbeduplicatedcompletelyforthelegalusewithapprovalof applicant;itshallnotbereproducedexceptinfullwithoutthewrittenapprovalofBTFTestingLab(Shenzhen)Co.,Ltd.,Alltheobjectionsshouldbe raisedwithinthirtydaysfromthedateofissue.Tovalidatethereport,youcancontactus. TestReportNumber:BTF260115R00301 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 2 of 35 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China RevisionHistory VersionIssueDateRevisionsContent R_V02026-01-17Original Note:Oncetherevisionhasbeenmade,thenpreviousversionsreportsareinvalid. TestReportNumber:BTF260115R00301 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 3 of 35 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China TableofContents 1.Introduction...............................................................................................................................................................................4 1.1IdentificationofTestingLaboratory.................................................................................................................................4 1.2IdentificationoftheResponsibleTestingLocation..........................................................................................................4 1.3LaboratoryCondition.......................................................................................................................................................4 1.4Announcement................................................................................................................................................................4 2.ProductInformation..................................................................................................................................................................5 2.1ApplicationInformation....................................................................................................................................................5 2.2ManufacturerInformation................................................................................................................................................5 2.3FactoryInformation.........................................................................................................................................................5 2.4GeneralDescriptionofEquipmentunderTest(EUT).....................................................................................................5 2.5EquipmentunderTestAncillaryEquipment....................................................................................................................5 2.6TechnicalInformation......................................................................................................................................................5 3.SummaryofTestResults.........................................................................................................................................................6 3.1TestStandards................................................................................................................................................................6 3.2DeviceCategoryandSARLimit......................................................................................................................................7 3.3TestResultSummary......................................................................................................................................................7 3.4TestUncertainty..............................................................................................................................................................8 4.MeasurementSystem.............................................................................................................................................................10 4.1SpecificAbsorptionRate(SAR)Definition....................................................................................................................10 4.2MVGSARSystem.........................................................................................................................................................10 5.SystemVerification.................................................................................................................................................................15 5.1PurposeofSystemCheck.............................................................................................................................................15 5.2SystemCheckSetup.........................................................................................................................…
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Page: 1/11 Ref : ACR.9.6.25.BES.B Cancel and replace the report ACR.9.6.25.BES.A BTF TESTING LAB (SHENZHEN) CO., LTD. F101,201 AND 301, BUILDING 1, BLOCK 2, TANTOU INDUSTRIAL PARK, TANTOU COMMUNITY SONGGANG STREET, BAO'AN DISTRICT, SHENZHEN, CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: 0125-EPGO-445 Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Iroise – 295 avenue Alexis de Rochon 29280 PLOUZANE - FRANCE Calibration date: 01/02/2025 Accreditations #2-6789 Scope available on www.cofrac.fr The use of the Cofrac brand and the accreditation references is prohibited from any reproduction. Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed at MVG, using the CALIPROBE test bench, for use with a MVG COMOSAR system only. The test results covered by accreditation are traceable to the International System of Units (SI). COMOSAR E-Field Probe Calibration Report Docusign Envelope ID: 691C3E09-7794-43A0-BF36-C536093756C8 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.9.6.25.BES.B Page: 2/11 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Pedro Ruiz Technical Manager 1/9/2025 Checked & approved by: Pedro Ruiz Technical Manager 1/9/2025 Authorized by: Geraldine Toutain Quality Manager Customer Name Distribution : BTF Testing Lab (Shenzhen) Co., Ltd. Issue Name Date Modifications A Pedro Ruiz 1/9/2025 Initial release B Pedro Ruiz 2/12/2025 Change freq label 850 to 835 Docusign Envelope ID: 691C3E09-7794-43A0-BF36-C536093756C8 2/13/2025 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.9.6.25.BES.B Page: 3/11 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Sensitivity _______________________________________________________________ 4 3.2 Linearity ________________________________________________________________ 5 3.3 Isotropy _________________________________________________________________ 5 3.4 Boundary Effect __________________________________________________________ 5 3.5 Probe Modulation Response _________________________________________________ 6 4 Measurement Uncertainty .......................................................................................... 6 5 Calibration Results ..................................................................................................... 6 5.1 Calibration in air __________________________________________________________ 6 5.2 Calibration in liquid _______________________________________________________ 7 6 Verification Results ................................................................................................... 8 7 List of Equipment .................................................................................................... 10 Docusign Envelope ID: 691C3E09-7794-43A0-BF36-C536093756C8 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.9.6.25.BES.B Page: 4/11 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number 0125-EPGO-445 Product Condition (new / used) New Frequency Range of Probe 0.15 GHz-7.5GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.206 M Dipole 2: R2=0.208 M Dipole 3: R3=0.226 M 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. Figure 1 – MVG COMOSAR Dosimetric E field Probe Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their effect. All calibrations / measurements performed meet the fore-mentioned standards. 3.1 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards for frequency range 600- 7500MHz and using the calorimeter cell method (transfer method) as outlined in the standards for frequency 150-450 MHz. Docusign Envelope ID: 691C3E09-7794-43A0-BF36-C536093756C8 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.9.6.25.BES.B Page: 5/11 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to …
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ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Appendix-BT 1.Bandwidth 1.1TestResult 1.1.1OBW Mode TX Type Frequency (MHz) Packet Type ANT 99%OccupiedBandwidth(MHz) Verdict ResultLimit GFSKSISO 2402DH510.751/Pass 2441DH510.750/Pass 2480DH510.752/Pass Pi/4DQPSKSISO 24022DH511.149/Pass 24412DH511.153/Pass 24802DH511.149/Pass 8DPSKSISO 24023DH511.157/Pass 24413DH511.162/Pass 24803DH511.153/Pass 1.1.220dBBW Mode TX Type Frequency (MHz) Packet Type ANT 20dBBandwidth(MHz) Verdict ResultLimit GFSKSISO 2402DH510.851/Pass 2441DH510.852/Pass 2480DH510.850/Pass Pi/4DQPSKSISO 24022DH511.284/Pass 24412DH511.292/Pass 24802DH511.284/Pass 8DPSKSISO 24023DH511.281/Pass 24413DH511.256/Pass 24803DH511.280/Pass ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 1.2TestGraph 1.2.1OBW GFSK_DH5_LCH_2402MHz_Ant1_NTNV GFSK_DH5_MCH_2441MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page3of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 GFSK_DH5_HCH_2480MHz_Ant1_NTNV Pi/4DQPSK_2DH5_LCH_2402MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page4of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Pi/4DQPSK_2DH5_MCH_2441MHz_Ant1_NTNV Pi/4DQPSK_2DH5_HCH_2480MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page5of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 8DPSK_3DH5_LCH_2402MHz_Ant1_NTNV 8DPSK_3DH5_MCH_2441MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page6of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 8DPSK_3DH5_HCH_2480MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page7of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 1.2.220dBBW GFSK_DH5_LCH_2402MHz_Ant1_NTNV GFSK_DH5_MCH_2441MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page8of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 GFSK_DH5_HCH_2480MHz_Ant1_NTNV Pi/4DQPSK_2DH5_LCH_2402MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page9of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Pi/4DQPSK_2DH5_MCH_2441MHz_Ant1_NTNV Pi/4DQPSK_2DH5_HCH_2480MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page10of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 8DPSK_3DH5_LCH_2402MHz_Ant1_NTNV 8DPSK_3DH5_MCH_2441MHz_Ant1_NTNV ReportNumber:BTF260115R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page11of67 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 8DPSK_3DH5_HCH_2480MHz_Ant1_NTNV ReportNumber:BTF260115R00202 Total…
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19784 SUNKISSED RIDGE DR · RIVERSIDE, 92507 · United States
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.40 GHz - 2.48 GHz | 4.40 mW |

Smart Glasses
Equipment Class
DSS - Part 15 Spread Spectrum Transmitter
Smart Glasses
Equipment Class
DSS - Part 15 Spread Spectrum Transmitter