2BU35-BLLT01ASmart Electronic Nameplate

FCC Warning This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Any Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -Reorient or relocate the receiving antenna. -Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or an experienced radio/TV technician for help. This equipment complies with FCC radiation exposure limits set forth for an uncontrolled environment. This equipment should be installed and operated with minimum distance 20cm between the radiator & your body.

LocalRepresentativeLetter ForCertificationServiceintheUSA FederalCommunicationsCommission EquipmentAuthorizationDivision,ApplicationProcessingBranch 7435OaklandMillsRoad Columbia,MD21048 Towhomitmayconcern PursuanttoSection2.911(d)(7),oftheCommission’sRules(47C.F.R.)weattestasfollowsfor theproductlistedbelow: FCCIDModelname 2BU35-BLLT01ABLLT01A,BLLT01B,BLLT01C,BLLT01D, BLLT01E,BLLT01F,BLLT01*(*A~Z) Weherebyacknowledgeasfollows: i.bothsigneesconfirmthatthepointofcontactacceptsresponsibilitytoactasaUS- AmericanRepresentativeonbehalfoftheapplicant ii.thepointofcontactprovidesthephysicalU.S.addressandemailaslistedbelow iii.bothpartiesmaintaintherequirementsofthisagreementfornolessthanoneyear afterthegranteehasterminatedallmarketingandimportationortheconclusionof anyCommission-relatedproceedinginvolvingtheequipment. iv.Anexpirationdateforthisletterdoesnotexist.IncasetheU.S.agentchanges,the granteeisobligatedtonotifytheFCCwithin30daysviathegrantingTCB. US-AmericanPointofContactApplicant/ApprovalHolder SignatureDate:2026-3-25SignatureDate:2026-3-25 CompanyName:GLOCERTSTECHNOLOGYINCGuangdongBiLightIntelligent ManufacturingTechnology Co.,Ltd. FRN:00363397370038117636 ContactName:HuiyingFanMarsMa Address:19784SUNKISSEDRIDGEDR, RIVERSIDE,CA92507UnitedStates 7thFloor,Building3,Phase1, SciPolis,No.4,XinxiRoad, SongshanLake,Dongguan, GuangdongProvince,China. Phone:(626)588-803915710836023 Email:[email protected]@bilight.com

Page1of4FCCID: 2BU35-BLLT01A GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China ExternalPhotos Photo1 Photo2 Page2of4FCCID: 2BU35-BLLT01A GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China Photo3 Photo4 Page3of4FCCID: 2BU35-BLLT01A GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China Photo5 Photo6 Page4of4FCCID: 2BU35-BLLT01A GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China Photo7 ------End------

Label FCCID:2BU35-BLLT01A

Page 1 of 4FCC ID: 2BU35-BLLT01A Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Internal Photos Photo 1 Photo 2 Page 2 of 4FCC ID: 2BU35-BLLT01A Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 3 Photo 4 Page 3 of 4FCC ID: 2BU35-BLLT01A Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 5 Photo 6 Page 4 of 4FCC ID: 2BU35-BLLT01A Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Photo 7 Photo 8 ------End------ BT Antenna

Page1of8ReportNo.:AiTDG-260302005W2 Note:Thisdevicehasbeentestedandfoundtocomplywiththestandard(s)listed,thistestreportmerelycorrespondstothe testsample.Itisnotpermittedtocopyextractsofthesetestresultwithoutthewrittenpermissionofthetestlaboratory.This reportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofGuangdongAsiaHongkeTestTechnologyLimited. Ifthereisaneedtoalterorrevisethisdocument,therightbelongstoGuangdongAsiaHongkeTestTechnologyLimited,and itshouldgiveapriorwrittennoticeoftherevisiondocument.Thistestreportmustnotbeusedbytheclienttoclaimproduct endorsement. GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China RFExposureevaluation ProductName: SmartElectronicNameplate BrandName: BiLight Model: BLLT01A SeriesModel: BLLT01B,BLLT01C,BLLT01D,BLLT01E,BLLT01F, BLLT01*(*A~Z) FCCID: 2BU35-BLLT01A Applicant: GuangdongBiLightIntelligentManufacturingTechnology Co.,Ltd. Address: 7thFloor,Building3,Phase1,SciPolis,No.4,XinxiRoad, SongshanLake,Dongguan,GuangdongProvince,China. Manufacturer: GuangdongBiLightIntelligentManufacturingTechnology Co.,Ltd. Address: 7thFloor,Building3,Phase1,SciPolis,No.4,XinxiRoad, SongshanLake,Dongguan,GuangdongProvince,China. Standard(s): 47CFR§1.1310,47CFR§2.1091 KDB447498D01GeneralRFExposureGuidancev06 DateofReceipt: Mar.02,2026 DateofTest: Mar.02,2026~Mar.16,2026 IssuedDate: Mar.17,2026 IssuedBy: GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,HepingCommunity,FuhaiStreet, Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+860755-230967639Fax.:+860755-230967639 Reviewedby:Approvedby: Aalen.YeAllenWang Page 2 of 8 ReportNo.:AiTDG-260302005W2 ReportReviseRecord ReportVersionIssuedDateNotes V1.0Mar.17,2026InitialRelease Page 3 of 8 ReportNo.:AiTDG-260302005W2 Contents 1GENERALINFORMATION.............................................................................................................................................4 1.1ENVIRONMENTALCONDITIONS........................................................................................................................................4 1.2GENERALDESCRIPTIONOFEUT......................................................................................................................................4 1.3TESTFACILITY...............................................................................................................................................................5 1.4MEASUREMENTUNCERTAINTY........................................................................................................................................6 2METHODOFMEASUREMENT......................................................................................................................................7 2.1APPLICABLESTANDARD.................................................................................................................................................7 2.2LIMIT..........................................................................................................................................................................7 2.3MPECALCULATIONMETHOD.........................................................................................................................................8 2.4MANUFACTURINGTOLERANCE........................................................................................................................................8 2.5STANDALONEMPERESULT............................................................................................................................................8 2.6CONCLUSION................................................................................................................................................................8 Page 4 of 8 ReportNo.:AiTDG-260302005W2 1GENERALINFORMATION 1.1Environmentalconditions Duringthemeasurementtheenvironmentalconditionswerewithinthelistedranges: NormalTemperature:25°C RelativeHumidity:55% AirPressure:101kPa 1.2GeneralDescriptionofEUT ProductName:SmartElectronicNameplate Model/Type reference: BLLT01A SerialModel:BLLT01B,BLLT01C,BLLT01D,BLLT01E,BLLT01F,BLLT01*(*A~Z) PowerSupply:IndoorLight/Type-CDC5V Hardwareversion.:VER2.71 Softwareversion.:V3 Testsample(s)ID:AiTDG-260302005-1 BT: Operationfrequency:2402MHz-2480MHz ChannelNumber:40channels Channelseparation:2MHz Modulation Technology: GFSK AntennaType:FPCAntenna Antennagain:5dBi Remark:TheaboveDUT'sinformationwasdeclaredbymanufacturer.Formoredetailedfeatures description,pleaserefertothemanufacturer’sspecificationsortheUser'sManual. Page 5 of 8 ReportNo.:AiTDG-260302005W2 1.3TestFacility TestLaboratory: GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,HepingCommunity,FuhaiStreet,Bao'an District,Shenzhen,Guangdong,China Thetestfacilityisrecognized,certifiedoraccreditedbythefollowingorganizations: FCC-RegistrationNo.:251906DesignationNumber:CN1376 GuangdongAsiaHongkeTestTechnologyLimitedhasbeenregisteredandfullydescribedinareport filedwiththe(FCC)FederalCommunicationsCommission.TheacceptanceletterfromtheFCCis maintainedinourfiles. IC-RegistrationNo.:31737CABidentifier:CN0165 The3mSemi-anechoicchamberofGuangdongAsiaHongkeTestTechnologyLimitedhasbeen registeredbyCertificationandEngineeringBureauofIndustryCanadaforradioequipmenttestingwith RegistrationNo.:31737 A2LA-LabCert.No.:7133.01 GuangdongAsiaHongkeTestTechnologyLimitedhasbeenaccreditedbyA2LAfortechnical competenceinthefieldofelectricaltesting,andprovedtobeincompliancewithISO/IEC17025:2017 GeneralRequirementsfortheCompetenceofTestingandCalibrationLaboratoriesandanyadditional programrequirementsintheidentifiedfieldoftesting. Page 6 of 8 ReportNo.:AiTDG-260302005W2 1.4Measurementuncertainty Thedataandresultsreferencedinthisdocumentaretrueandaccurate.Thereaderiscautionedthat theremaybeerrorswithinthecalibrationlimitsoftheequipmentandfa…

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Page1of35ReportNo.:AiTDG-260302005W1 GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China TESTREPORT ClientInformation: Applicant:GuangdongBiLightIntelligentManufacturingTechnologyCo.,Ltd. Applicantadd.: 7thFloor,Building3,Phase1,SciPolis,No.4,XinxiRoad,SongshanLake, Dongguan,GuangdongProvince,China. Manufacturer:GuangdongBiLightIntelligentManufacturingTechnologyCo.,Ltd. Manufactureradd.: 7thFloor,Building3,Phase1,SciPolis,No.4,XinxiRoad,SongshanLake, Dongguan,GuangdongProvince,China. ProductInformation: ProductName:SmartElectronicNameplate ModelNo: BLLT01A,BLLT01B,BLLT01C,BLLT01D,BLLT01E,BLLT01F, BLLT01*(*A~Z) BrandName:BiLight FCCID:2BU35-BLLT01A Applicablestandards : FCCCFRTitle47Part15SubpartCSection15.247 PreparedBy: GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,HepingCommunity,FuhaiStreet,Bao'anDistrict, Shenzhen,Guangdong,China Tel.:+860755-230967639Fax.:+860755-230967639 DateofReceipt:Mar.02,2026DateofTest:Mar.02,2026~Mar.16,2026 DateofIssue:Mar.17,2026TestResult:Pass ThisdevicedescribedabovehasbeentestedbyGuangdongAsiaHongkeTestTechnologyLimited andthetestresultsshowthattheequipmentundertest(EUT)isincompliancewiththeFCC requirements.Anditisapplicableonlytothetestedsampleidentifiedinthereport. Note:Thisreportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofGuangdong AsiaHongkeTestTechnologyLimited,thisdocumentmaybealteredorrevisedbyGuangdong AsiaHongkeTestTechnologyLimited,personalonly,andshallbenotedintherevisionofthe document.Thistestreportmustnotbeusedbytheclienttoclaimproductendorsement. Reviewedby:Approvedby: Aalen.YeAllenWang Page2of35ReportNo.:AiTDG-260302005W1 GuangdongAsiaHongkeTestTechnologyLimited B1/F,Building11,JunfengIndustrialPark,ChongqingRoad,Heping Community,FuhaiStreet,Bao'anDistrict,Shenzhen,Guangdong,China 1Contents Page COVERPAGE 1CONTENTS...........................................................................................................................................................................2 2TESTSUMMARY.................................................................................................................................................................4 2.1StatementoftheMeasurementUncertainty.....................................................................................4 2.2MeasurementUncertainty.................................................................................................................4 3TESTFACILITY...................................................................................................................................................................5 3.1Deviationfromstandard....................................................................................................................5 3.2Abnormalitiesfromstandardconditions...........................................................................................5 3.3TestLocation.....................................................................................................................................5 4GENERALINFORMATION................................................................................................................................................6 4.1Testfrequencies................................................................................................................................7 4.2EUTPeripheralList...........................................................................................................................7 4.3TestPeripheralList............................................................................................................................7 4.4TESTMETHODOLOGY....................................................................................................................8 4.4.1EUTConfiguration.......................................................................................................................8 4.4.2EUTExercise...............................................................................................................................8 4.4.3GeneralTestProcedures.............................................................................................................8 4.5DescriptionofTestModes.................................................................................................................9 5EQUIPMENTUSEDDURINGTEST...............................................................................................................................10 6TESTRESULTSANDMEASUREMENTDATA..........................................................................................................12 6.1Antennarequirement.......................................................................................................................12 6.2OnTimeandDutyCycle.................................................................................................................13 6.3MaximumConductedOutputPowerMeasurement.......................................................................14 6.46dBSpectrumBandwidthMeasurement.......................................................................................15 6.5PowerSpectralDensity...................................................................................................................16 6.6ConductedSpuriousEmissionsandBandEdgesTest..................................................................17 6.7Restrict-bandBand-edgeMeasurements.......................................................................................18 6.8RadiatedEmissionsMeasurement.................................................................................................21 6.9ConductedEmissions.....................................................................................................................32 7TESTSETUPPHOTOGRAPHSOFEUT......................…

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内容 页数页码 NO. （ Number （ Page （ Contents ） of Page ） Code ） 1 承认书封面（SpecCover） 11 2 承认书项目表（SpecItem） 12 3 工程成品图（Drawing） 13 4 电性测试报告（TestReports） 14 5 S参数测试（S Parameter） 15 6 增益测试（GainTest） 16 7 8 9 10 --- 11--- 12 --- Manufacturer:Guangdong BiLight Intelligent Manufacturing Technology Co.,Ltd. Address:7th Floor, Building 3, Phase 1, SciPolis, No. 4, Xinxi Road, Songshan Lake, Dongguan, Guangdong Province, China. DESCRIPTION SIGN DATE APPROVER D C B YD 2014-03-18 SCALE: 1/1 UNITS: mmREVISION: A APPROVED BY Tolerance DWG NAME: CHECKED BY DESIDNED BY ±3° X°X.X ±0.20X.XX ±0.10 FPC 37*10*0.3mm O.D. 1.13mm Black Mini Connector Part Number Name FPC R-CB-113B Coaxial CableConnector CI-113 1 No. 2 3 1 1 Q'ty 1 Material leon 2014-03-18 jeff 2014-03-18 TITLE: 2.4G 5G 5.8G Antenna PART NO:WF3710-113B-130 WF3710-113B-60 电性测试报告 TestReports Impedance500hmNominal ReturnLoss-10dBMax RadiationOmni-directional CableLoss2dB/mMax PolarizationLinear,Vertical AdmittedPower1W ConnectorIPEX PhysicalProperties AntennaMaterialFPC CableTypeO.D.1.13mm//50mm OperatingTemp. -10~+60 ̊C StorageTemp.-10~+70 ̊C SamplePhoto A.ElectricalCharacteristics Frequency 2400~2500MHz 4900~5900MHz S.W.R. <=2.0@2400~2500MHz <=2.0@4900~5900MHz Gain(Peak)5dBi S参数测试 SParameterTest AgilentE5071C 增益测试 GainTest Antenna Radiation Pattern VS Gain

Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 1 of 35 Appendix B RF Test Data for BT (BLE) (Conducted Measurement) Product Name: Smart Electronic Nameplate Trade Mark: BiLight Test Model: BLLT01A Environmental Conditions Temperature: 24.6  C Relative Humidity:52.4% ATM Pressure:100.0 kPa Test Engineer:Emiya Lin Supervised by:Simba Huang Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 2 of 35 Contents Page COVER PAGE 1 Duty Cycle........................................................................................................................................................................................ 3 1.1 Test Result............................................................................................................................................................................3 1.2 Test Graphs...........................................................................................................................................................................4 2 Maximum Conducted Output Power................................................................................................................................................. 7 2.1 Test Result............................................................................................................................................................................7 2.2 Test Graphs...........................................................................................................................................................................8 3 -6dB Bandwidth...............................................................................................................................................................................11 3.1 Test Result.......................................................................................................................................................................... 11 3.2 Test Graphs.........................................................................................................................................................................12 4 Maximum Power Spectral Density Level.........................................................................................................................................15 4.1 Test Result..........................................................................................................................................................................15 4.2 Test Graphs.........................................................................................................................................................................16 5 Band Edge......................................................................................................................................................................................19 5.1 Test Result..........................................................................................................................................................................19 5.2 Test Graphs.........................................................................................................................................................................20 6 Conducted RF Spurious Emission.................................................................................................................................................. 24 6.1 Test Result..........................................................................................................................................................................24 6.2 Test Graphs.........................................................................................................................................................................25 7 Restrict Band.................................................................................................................................................................................. 31 7.1 Test Result..........................................................................................................................................................................31 7.2 Test Graphs.........................................................................................................................................................................32 Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 3 of 35 1 Duty Cycle 1.1 Test Result ModeFrequency (MHz)Duty Cycle (%)Correction Factor 1/T (kHz) BLE 1M240245.63.411.79 BLE 1M244046.143.361.75 BLE 1M248045.963.381.75 BLE 2M240451.312.93.23 BLE 2M244051.312.93.23 BLE 2M247851.332.93.23 Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 4 of 35 1.2 Test Graphs Test Graphs BLE 1M 2402MHz BLE 1M 2440MHz Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 5 of 35 BLE 1M 2480MHz BLE 2M 2404MHz Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 6 of 35 BLE 2M 2440MHz BLE 2M 2478MHz Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 7 of 35 2 Maximum Conducted Output Power 2.1 Test Result ModeFrequency (MHz)Conducted Power (dBm) Limit (dBm)Verdict BLE 1M24025.3130Pass BLE 1M24405.3330Pass BLE 1M24805.2730Pass BLE 2M24045.3330Pass BLE 2M24405.3630Pass BLE 2M24785.3330Pass Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 8 of 35 2.2 Test Graphs Test Graphs BLE 1M 2402MHz BLE 1M 2440MHz Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005W1 FCC ID: 2BU35-BLLT01A Page 9 of 35 BLE 1M 2480MHz BLE 2M 2404MHz Guangdong Asia Hongke Test Technology Limited Report No.:AiTDG-260302005…

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Page 1 of 2 FCC ID:2BU35-BLLT01A Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Test Setup Photo Radiated Emission Page 2 of 2 FCC ID:2BU35-BLLT01A Guangdong Asia Hongke Test Technology Limited B1/F, Building 11, Junfeng Industrial Park, Chongqing Road, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, China Conducted Emission RF Conduction ------End------