2BUXD-SW124-125Wireless Earphone

SW124 SW124 FCC Warning This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: —Reorient or relocate the receiving antenna. —Increase the separation between the equipment and receiver. —Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. —Consult the dealer or an experienced radio/TV technician for help. Note: The Grantee is not responsible for any changes or modifications not expressly approved by the party responsible for compliance. such modifications could void the user's authority to operate the equipment. The device has been evaluated to meet general RF exposure requirement. The device can be used in portable exposure condition without restriction. SW124 SW124

SW125 SW125 SW125 SW125 FCC Warning This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: —Reorient or relocate the receiving antenna. —Increase the separation between the equipment and receiver. —Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. —Consult the dealer or an experienced radio/TV technician for help. Note: The Grantee is not responsible for any changes or modifications not expressly approved by the party responsible for compliance. such modifications could void the user's authority to operate the equipment. The device has been evaluated to meet general RF exposure requirement. The device can be used in portable exposure condition without restriction.

Rev 1/26/2023 INW INC Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 USA Date: 03‐04‐2026 Ref: Attestation Statements Part 2.911(d)(5)(i) Filing FCC ID: 2BUXD‐SW124‐125 INW INC (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. INW INC (“the applicant”) certifies that the equipment for which authorization is sought does not include cybersecurity or anti‐virus software produced or provided by Kaspersky Lab, Inc. or any of its successors and assignees, including equipment with integrated Kaspersky Lab, Inc. (or any of its successors and assignees) cybersecurity or anti‐virus software pursuant to DA‐24‐886 and KDB 986446 D01 Covered Equipment Guidance section B(2a). Device is inherently compliant based on hardware limitations or software controls. or A Software Bill of Materials (SBOM) is provided to the TCB for review, and The end‐user or third parties cannot install additional software on this device. Sincerely, (Applicant signature) Khalid Aldajani Rev 1/26/2023 INW INC Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 USA Date: 03‐04‐2026 Ref: Attestation Statements Part 2.911(d)(5)(ii) Filing FCC ID: 2BUXD‐SW124‐125 INW INC (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List (as a specifically named entity or any of its subsidiaries or affiliates) as an entity producing “covered” equipment. Sincerely, (Applicant signature) Khalid Aldajani

Rev 1/26/2023 INW INC Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 USA Date: 03‐04‐2026 Ref: Attestation Statements Part 2.911(d)(7) Filing FCC ID: 2BUXD‐SW124‐125 INW INC (“the applicant”) certifies that, as of the date of the filing of the application, we designate ourselves as the U.S. agent for service of process. Designated U.S. Agent Information: FRN: 0037859881 Name: INW INC Address: 5700 Stoneridge Mall Road, Suite 160, Pleasanton, Ca USA, 94588 Contact Person: Khalid Aldajani Tel.: (916) 370‐2662 Email: [email protected] Sincerely, INW INC Khalid Aldajani

INW INC Date: 03-04-2026 Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: 2BUXD-SW124-125 Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Exhibit Type File Name Long-term confidentiality: Schematics Block Diagram Operational Description Schematics.pdf Block Diagram.pdf Operational Description.pdf The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, INW INC Signature Khalid Aldajani / President Typed name and Title

INW INC FCC ID: 2BUXD-SW124-125 POWER OF ATTORNEY Date: Mar.04, 2026 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Testing Group Co., Ltd. (Deval Qin) on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Testing Group Co., Ltd. (Deval Qin) on our behalf shall have the same effect as acts of our own. This authorization expires on Mar.03, 2027. Sincerely, INW INC Signature Khalid Aldajani / President Typed name and Title

INW INC FCC ID: 2BUXD-SW124-125 Date: 3/4/2026 Subject: authorization for adding family models To whom it May concern, Statement We confirm the product Wireless Earphone with models SW124, SW125. Only the colors are different. SW124 is white. SW125 is black. Yours sincerely, [signature] Khalid Aldajani / President INW INC

Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 4 of 14 2. Photographs –Constructional Details 2.1. EUT – External View Model SW124, SW125 SW124 Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 5 of 14 Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 6 of 14 Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 7 of 14 SW125 Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 8 of 14 Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 9 of 14 Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 10 of 14

SW124 Inside the charging case： charging case Logo: MobileMatrix： SW125 charging case Logo: MobileMatrix： Inside the charging case:

Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 11 of 14 2.2. EUT – Internal View SW124, SW125 Left earbud Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 12 of 14 Ant. Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 13 of 14 Right earbud Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 14 of 14 Ant.

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 8 TEST REPORT Referen ce No. .................... : WTD25D12345514W004 FCC ID ................................ : 2BUXD-SW124-125 Applicant ............................ : INW INC Address .............................. : 5700 Stoneridge Mall Road, Suite 160, Pleasanton, Ca USA, 94588 Manufacturer ..................... : Somostel Group Electronic Co.,Limited Address .............................. : No.2101, No.12 Weigu Street, Liwan District, Guangzhou, China Product ............................... : Wireless Earphone Model(s). ............................ : SW124, SW125 Standards........................... : 47CFR FCC Part 2 Subpart J Section 2.1093 Date of Receipt Sample .... : 2025-12-26 Date of Test ....................... : 2025-12-31 to 2026-01-13 Date of Issue ...................... : 2026-02-04 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Estel Qian / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTD25D12345514W004 Page 2 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2. Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2. CONTENTS ............................................................................................................................................... 2 3. REVISION HISTORY ................................................................................................................................. 3 4. GENERAL INFORMATION ....................................................................................................................... 4 4.1. GENERAL DESCRIPTION OF E.U.T.................................................................................................... 4 4.2. DETAILS OF E.U.T. ......................................................................................................................... 4 4.3. TEST FACILITY ................................................................................................................................ 5 4.4. SUBCONTRACTED ........................................................................................................................... 5 4.5. ABNORMALITIES FROM STANDARD CONDITIONS ................................................................................ 5 5. TEST SUMMARY ...................................................................................................................................... 6 6. RF EXPOSURE ......................................................................................................................................... 7 6.1. PROCEDURES AND REQUIREMENTS ................................................................................................. 7 6.2. CALCULATION METHOD ................................................................................................................... 7 6.3. TEST RESULT ................................................................................................................................. 8 Reference No.: WTD25D12345514W004 Page 3 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 3. Revision History Test Report No. Date of Receipt Sample Date of Test Date of Issue Purpose CommentApproved WTD25D12345514W004 2025-12-26 2025-12-31 to 2026-01-13 2026-02-04Original - Valid Reference No.: WTD25D12345514W004 Page 4 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4. General Information 4.1. General Description of E.U.T. Product: Wireless Earphone Model(s): SW124, SW125 Model Description: Only the colors are different. SW124 is white. SW125 is black. Model SW124 was tested in the report. Test Sample No.: 1-1/1 Bluetooth Version: 5.4 Hardware Version: DXC-T8655_7016G8 Software Version: V5.30 4.2. Details of E.U.T. Operation Frequency: Bluetooth: 2402-2480MHz, 79 Channels in total BLE: 2402-2480MHz, 40 Channels in total Max. RF output power: Bluetooth: 0.17dBm BLE: -0.91dBm Modulation Technology: Bluetooth: GFSK BLE: GFSK, π/4DQPSK, 8DPSK Antenna installation: Chip Antenna Antenna Gain: 1.7dBi Note: #: The antenna gain is provided by the applicant, and the applicant should be responsible for its authenticity, WALTEK lab has not verified the authenticity of its information. Charging Voltage: 5V/1A Battery Capacity: 3.7V 40mAh (Earbuds)/3.7V 400mAh (Charging Case) Reference No.: WTD25D12345514W004 Page 5 of 8 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4.3. Test Facility The test facility has a test site registered with the following organizations: ISED CAB identifier: CN0013. Test Firm Registration No.: 7760A. Waltek Testing Group Co., Ltd. Has been registered and fully described in a report filed with the Industry Canada. The acceptance letter from the Industry Canada is maintained in our files. Registration number 7760A, October 15, 2016. FCC Designation No.: CN1201. Test Firm Registration No.: 523476. Waltek Testing Group Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration number 523476, September 10, 2019. 4.4. Subcontracted Whether parts of tests for the product have been subcontracted to other labs: Yes No If Yes, list the related test items and lab information: Test Lab: N/A Lab address: N/A Test item…

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2.4GHz2012ChipAntenna:RANT2012F245C07 Dimension(mm) L2.05+-0.10 W1.20+-0.10 T0.65+-0.10 No.TerminalName 1Feeding/GNG 2GND Application: WLAN,802.11b/g,Bluetooth,WLAN,etc... Features SMD,highreliability,ultraImpact,Omni-directional... PartnumberInformation RANT2012F245C07 (A)(B)(C)(D)(E)(F) (A)ProductTypeChipAntenna (B)SizeCode2.0x1.2mm(+-0.2mm) (C)MaterialHighKmaterial (D)Frequency2.4~2.5GHz (E)FeedingmodePIFA&SingleFeeding (F)AntennatypeType=07 ElectricalSpecification WorkingFrequencyRange2400~2484MHz Bandwidth84(Min.) PeakGain1.7dBi(Typ.) Impedance50Ohm Returnloss10dB(Min) PolarizationLinear AzimuthBeamwidthOmni-directional OperationTemperature( °C )-40~85 °C ResistancetoSolderingHeats 10sec.(@280°C) TerminationNi/Au(Leadless) ThespecificationisdefinedonEVB. DimensionandTerminalConfiguration 咏成國際科技有限公司電話:13530576606 RAINInternationalTechnologyCo.,Ltd. 7/F,BuildingF,ZhichuangPark,Tong'an,Gushu,Shenzhen 2.4GHz2012ChipAntenna:RANT2012F245C07 EvaluationBoardReference PCBDimensionAntennaLayoutReferenceUnit:mm ElectricalCharacteristics ReturnLoss ReturnLoss&Radiation 1 Frequency(MHz) S11(dB) 2400-10.77 2450-24.81 2484-10.243 Radiation Z Y X 2400MHz2450MHz2500MHz Efficiency70.56%75.25%71.01% 2.4GHz2012ChipAntenna:RANT2012F245C07 TapingSpecifications ReelandTapingSpecification ReelSpecification TYPESIZEABCD 20127”5K/Reel 9.0±0.5 60±213.5±0.5178±2 TappingSpecification PackagingTypeABWEFGHTDP PaperType2012 1.50±0.202.30±0.208.0±0.201.75±0.103.5±0.054.0±0.102.0±0.050.75±0.101.57±0.104.0±0.1 2.4GHz2012ChipAntenna:RANT2012F245C07 ReliabilityTable TestItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfilltheelectrical specification UserSpec. Thermal Shock 1.Preconditioning: 50±10°C/1hr,thenkeepfor24±1hrsatroomtemp. 2.Initialmeasure:Spec:referInitialspec. 3.Rapidchangeoftemperaturetest: -30°Cto+85°C;100cycles; 15minutesatLowercategorytemperature; 15minutesatUppercategorytemperature. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 107 Temperature Cycling 1.Initialmeasure:Spec:referInitialspec. 2.100Cycles(-30°Cto+85°C),SoakMode=1(2Cycle/hours). 3.Measurementat24±2Hoursaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. JESD22 JA104 HighTemperature Exposure 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered;500hours@T=+85°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 LowTemperature Storage 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered:500hours@T=-30°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 Solderability (SMDBottomSide) Dippingmethod: a.Temperature:235±5°C b.Dippingtime:3±0.5s Thesoldershouldcover over95%ofthecritical areaofbottomside. IEC60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150±10°C. Preheatingtime:1~2min. Soldertemperature:260±5°C. Dippingtime:5±0.5s NoVisibleDamage.IEC60384-21/22 4.10 Vibration5g'sfor20min.,12cycleseachof3orientations Note:Use8"X5"PCB.031"thick7securepointson,onelong sideand2securepointsatcornersofoppositesides.Parts mountedwithin2"fromanysecurepoint.Testfrom10-2000 Hz. NoVisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksineachdirectionshallbeappliedalongthethree mutuallyperpendicularaxesofthetestspecimen(18shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4ft/s Waveform:Half-sine NoVisibleDamage.MIL-STD-202 Method213 Humidity Bias 1.Humidity:85%R.H.,Temperature:85±2°C. 2.Time:500±24hours. 3.Measurementat24±2hrsaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 Method106 2.4GHz2012ChipAntenna:RANT2012F245C07 2.4GHz2012ChipAntenna:RANT2012F245C07 _ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds.NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12020/10/15NewDatasheet

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 42 TEST REPORT Referen ce No. .................... : WTD25D12345514W002 FCC ID ................................ : 2BUXD-SW124-125 Applicant ............................ : INW INC Address .............................. : 5700 Stoneridge Mall Road, Suite 160, Pleasanton, Ca USA, 94588 Manufacturer ..................... : Somostel Group Electronic Co.,Limited Address .............................. : No.2101, No.12 Weigu Street, Liwan District, Guangzhou, China Product ............................... : Wireless Earphone Model(s). ............................ : SW124, SW125 Standards........................... : FCC 47CFR Part 15.247 Date of Receipt sample .... : 2025-12-26 Date of Test ....................... : 2025-12-31 to 2026-01-13 Date of Issue ...................... : 2026-02-04 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Estel Qian / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTD25D12345514W002 Page 2 of 42 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 CONTENTS ............................................................................................................................................... 2 3 REVISION HISTORY ................................................................................................................................. 4 4 GENERAL INFORMATION ....................................................................................................................... 5 4.1 General Description of E.U.T. ....................................................................................................... 5 4.2 Details of E.U.T. ............................................................................................................................ 5 4.3 Channel List .................................................................................................................................. 5 4.4 Test Facility ................................................................................................................................... 6 4.5 Subcontracted ............................................................................................................................... 6 4.6 Abnormalities from Standard Conditions ...................................................................................... 6 4.7 Test Mode ..................................................................................................................................... 6 5 TEST SUMMARY ...................................................................................................................................... 7 6 EQUIPMENT USED DURING TEST ......................................................................................................... 8 6.1 Equipments List ............................................................................................................................ 8 6.2 Description of Support Units ......................................................................................................... 9 6.3 Measurement Uncertainty ............................................................................................................ 9 6.4 Test Equipment Calibration .......................................................................................................... 9 7 DUTY CYCLE .......................................................................................................................................... 10 8 CONDUCTED EMISSION ....................................................................................................................... 11 8.1 E.U.T. Operation ......................................................................................................................... 11 8.2 EUT Setup .................................................................................................................................. 11 8.3 Measurement Description ........................................................................................................... 11 8.4 Conducted Emission Test Result ............................................................................................... 12 9 RADIATED EMISSIONS ......................................................................................................................... 14 9.1 EUT Operation ............................................................................................................................ 14 9.2 Test Setup .................................................................................................................................. 15 9.3 Spectrum Analyzer Setup ........................................................................................................... 16 9.4 Test Procedure ........................................................................................................................... 17 9.5 Corrected Amplitude & Margin Calculation ................................................................................ 17 9.6 Summary of Test Results ........................................................................................................... 18 10 CONDUCTED SPURIOUS EMISSIONS ..............................…

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Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 1 of 14 1. Test Setup photos Model SW124, SW125 1.1 Photograph – Radiated Emissions Left Earbud For 9kHz-30MHz Test Site 2# For 30MHz-1000MHz Test Site 2# Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 2 of 14 For Above 1GHz Test Site 1# Right Earbud For 9kHz-30MHz Test Site 2# Appendix- SW124, SW125-Photos FCC ID: 2BUXD-SW124-125 Page 3 of 14 For 30MHz-1000MHz Test Site 2# For Above 1GHz Test Site 1#