2BVG6-ED1000Wrist Watch

WWW.OSMILE.COM.TW OsmileTechnology Co., Ltd. Tel: +886-2-2321-6370 Email: [email protected] Step6: Scan the Registration Code to Bind the Watch Align the watch screen with the registration code to scan. Osmile ED1000 4G Calling / SOS / Wrist Watch Quick User Guide OsmileGPSKD1000T is an auxiliary tool designed to help parents locate their children and provide emergency assistance. It does not assume any legal responsibility related to children getting lost or safety issues. Step5: Add a New Device OSMILE Reminder: The warranty period is not a trial period.Once the SIM card is inserted and the watch connects to 4G, the device will be automatically registered by OSMILE and cannot be returned. P.S. After binding the device, please restart the smartwatch and log in to the app again. For detailed instructions, please scan the QR code to download the manual. Step 3: Install the Mobile App and Bind the Watch 1.Download the App: Download the "OsmileAPP: OsmileGPS Tracker". 2.Register the App: •Language: Please select the language of your region. •Region: Please select your region. •Shared Access: The account username and password can be shared among family members (so that everyone can track the watch). Step 4: After logging into the App, press "Me" Step 5: Press "Device List" Step 2. Installing a Nano SIM Card •Use the removal tool to take out the SIM card tray. •Place the SIM card into the tray with the chip facing up and the notch facing outward. Insert the tray into the watch. •Push the tray in until it clicks into place. •Restart the watch: Go to the settings interface, select "Power Off," then press and hold the SOS button for about 5 seconds to restart. Step 1: Charge the watch for three hours Upon receiving the watch, please charge it for three hours.Thewatch charging cable has a magnetic suction function; correct charging is shown in the illustration Power Button SOS Button Important Notes: 1. You can set up to three SOS emergency contact numbers. 2. The first GPS positioning must be done outdoors. 3. Please turn off the LBS (base station positioning option). 4. Please turn off Wi-Fi. 5. Do not wait until the battery is completely drained before charging. Please charge the watch daily. The arrow below indicates the power button When the watch is powered off, press and hold for 5 seconds to turn on the smartwatch. 1.Use the auxiliary tool to first remove the SIM card slot. 2. Place the SIM card into the SIM card slot. FCC Warning 15.19 Labeling requirements. This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. 15.21 Information to user. Any Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. 15.105 Information to the user. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -Reorient or relocate the receiving antenna. -Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or an experienced radio/TV technician for help. Absorption Rate (SAR) information: This device meets the government's requirements for exposure to radio waves. The guidelines are based on standards that were developed by independent scientific organizations through periodic and thorough evaluation of scientific studies. The standards include a substantial safety margin designed to assure the safety of all persons regardless of age or health. FCC RF Exposure Information and Statement The SAR Next-to-mouth limit of USA (FCC) is 1.6 W/kg averaged over one gram of tissue. The SAR Wrist-worn limit of USA (FCC) is 4.0 W/kg averaged over ten gram of tissue.This device was tested for typical Next- to-mouth operations with t the device kept 10mm from the mouth and 0mm from the Wrist. To maintain compliance with FCC RF exposure requirements, use accessories that maintain a appropriate separation distance between the user's body and the device. The use of belt clips, holsters and similar accessories should not contain metallic components in its assembly. The use of accessories that do not satisfy these requirements may not comply with FCC RF exposure requirements, and should be avoided. Use only the supplied or an approved antenna.

TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 1 of 36 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China SARTestReport For ApplicantName:OsmileTechnologyCo.,Ltd Address: 3F-1,No.92,Section2,ChangshaStreet,WanhuaDistrict,TaipeiCity EUTName:WristWatch BrandName:Osmile ModelNumber:OsmileED1000 SeriesModelNumber: GPS1000,GPSKD1000,GPSKD1000T,GPSRKD1000,GPSKD1000A,GPSKD1000S, GPSKD1000SB,GPSKD1000CB,GPSKD1000AB,ED1000MT,ED1000SL,ED1000GSL, ED1000FL,ED1000BL,ED1000ABL,ED1000ASL,GPSKD1000RC,GPSKD1000RB, GPSKD1000RA IssuedBy CompanyName:BTFTestingLab(Shenzhen)Co.,Ltd. Address: Plant101,201and301,Building1,Block2,TantouIndustrial Park,TantouCommunity,SonggangStreet,Bao'anDistrict, Shenzhen,Guangdong,China ReportNumber:BTF251201R01001 TestStandards:47CFRPart2.1093IEEEC95.1-2019IEEEStd.1528-2013 FCCID:2BVG6-ED1000 TestConclusion:Pass TestDate:2025-12-12 DateofIssue:2026-03-13 TestedBy: BirchZhang/Tester DateofIssue:2026-03-13 ReviewedBy: AmendaZhong/ProjectEngineer Date:2026-03-13 ApprovedBy: Ryan.CJ/EMCManager Date:2026-03-13 Note:Allthetestresultsinthisreportonlyrelatedtothetestingsamples.Whichcanbeduplicatedcompletelyforthelegalusewithapprovalof applicant;itshallnotbereproducedexceptinfullwithoutthewrittenapprovalofBTFTestingLab(Shenzhen)Co.,Ltd.,Alltheobjectionsshouldbe raisedwithinthirtydaysfromthedateofissue.Tovalidatethereport,youcancontactus. TestReportNumber:BTF251201R01001 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 2 of 36 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China RevisionHistory VersionIssueDateRevisionsContent R_V02026-03-13Original Note:Oncetherevisionhasbeenmade,thenpreviousversionsreportsareinvalid. TestReportNumber:BTF251201R01001 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 3 of 36 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China TableofContents 1.Introduction...............................................................................................................................................................................4 1.1IdentificationofTestingLaboratory.................................................................................................................................4 1.2IdentificationoftheResponsibleTestingLocation..........................................................................................................4 1.3LaboratoryCondition.......................................................................................................................................................4 1.4Announcement................................................................................................................................................................4 2.ProductInformation..................................................................................................................................................................5 2.1ApplicationInformation....................................................................................................................................................5 2.2ManufacturerInformation................................................................................................................................................5 2.3FactoryInformation.........................................................................................................................................................5 2.4GeneralDescriptionofEquipmentunderTest(EUT).....................................................................................................5 2.5EquipmentunderTestAncillaryEquipment....................................................................................................................5 2.6TechnicalInformation......................................................................................................................................................5 3.SummaryofTestResults.........................................................................................................................................................6 3.1TestStandards................................................................................................................................................................6 3.2DeviceCategoryandSARLimit......................................................................................................................................6 3.3TestResultSummary......................................................................................................................................................7 3.4TestUncertainty..............................................................................................................................................................7 4.MeasurementSystem...............................................................................................................................................................9 4.1SpecificAbsorptionRate(SAR)Definition....................................................................................................................10 4.2MVGSARSystem.........................................................................................................................................................10 5.SystemVerification.................................................................................................................................................................15 5.1PurposeofSystemCheck........................................................................................................…

Text truncated - open the document above for the full version.

FCC ID: 2BVG6-ED1000 Report Number: BTF251201R00701 Total or partial reproduction of this document without permission of the Laboratory is not allowed. Page 1 of 2 BTF Testing Lab (Shenzhen) Co., Ltd. Plant 101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, Guangdong, China Email: [email protected] Tel: +86-755-23146130 http://www.btf-lab.com Version: 1/00 Appendix I Test Setup Photos Emissions in Non-restricted Frequency Bands(30 MHz–1 GHz) Emissions in Restricted Frequency Bands Emissions in Non-restricted Frequency Bands(1-18 GHz) FCC ID: 2BVG6-ED1000 Report Number: BTF251201R00701 Total or partial reproduction of this document without permission of the Laboratory is not allowed. Page 2 of 2 BTF Testing Lab (Shenzhen) Co., Ltd. Plant 101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, Guangdong, China Email: [email protected] Tel: +86-755-23146130 http://www.btf-lab.com Version: 1/00 AC Power Line Conducted Emission

FCCID:2BVG6-ED1000ReportNumber:BTF251201R01001 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of1 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 ANNEXDSARTestSetupPhotos ReferencePhotos Next-to-mouth(10mm)wrist-worn(0mm)

ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Appendix-LTE 1.Effective(Isotropic)RadiatedPowerOutputData 1.1TestResult 1.1.1B4_1.4MHz_EIRP Band:4/Bandwidth:1.4MHz/NTNV Modulation Frequency (MHz) RBAllocation ConductedPower (dBm) Gain (dBi) EIRP(dBm) Verdict SizeOffsetResultLimit QPSK 1710.7 1 021.70-1.8919.81<=30Pass 221.80-1.8919.91<=30Pass 521.81-1.8919.92<=30Pass 3 021.80-1.8919.91<=30Pass 221.80-1.8919.91<=30Pass 321.83-1.8919.94<=30Pass 6020.76-1.8918.87<=30Pass 1732.5 1 021.90-1.8920.01<=30Pass 221.88-1.8919.99<=30Pass 521.98-1.8920.09<=30Pass 3 021.94-1.8920.05<=30Pass 221.90-1.8920.01<=30Pass 322.00-1.8920.11<=30Pass 6020.96-1.8919.07<=30Pass 1754.3 1 022.09-1.8920.20<=30Pass 221.98-1.8920.09<=30Pass 521.98-1.8920.09<=30Pass 3 022.09-1.8920.20<=30Pass 222.02-1.8920.13<=30Pass 322.10-1.8920.21<=30Pass 6020.97-1.8919.08<=30Pass 16QAM 1710.7 1 020.34-1.8918.45<=30Pass 220.32-1.8918.43<=30Pass 520.32-1.8918.43<=30Pass 3 020.66-1.8918.77<=30Pass 220.65-1.8918.76<=30Pass 320.62-1.8918.73<=30Pass 6019.85-1.8917.96<=30Pass 1732.5 1 021.09-1.8919.20<=30Pass 221.17-1.8919.28<=30Pass 521.16-1.8919.27<=30Pass 3 021.12-1.8919.23<=30Pass 221.14-1.8919.25<=30Pass 321.12-1.8919.23<=30Pass 6020.07-1.8918.18<=30Pass 1754.3 1 021.36-1.8919.47<=30Pass 221.40-1.8919.51<=30Pass 521.42-1.8919.53<=30Pass 3 020.57-1.8918.68<=30Pass 220.62-1.8918.73<=30Pass 320.60-1.8918.71<=30Pass 6020.02-1.8918.13<=30Pass Note1:EIRP=ConductedPower+AntennaGain 1.1.2B4_3MHz_EIRP ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band:4/Bandwidth:3MHz/NTNV Modulation Frequency (MHz) RBAllocation ConductedPower (dBm) Gain (dBi) EIRP(dBm) Verdict SizeOffsetResultLimit QPSK 1711.5 1 021.77-1.8919.88<=30Pass 721.66-1.8919.77<=30Pass 1421.81-1.8919.92<=30Pass 8 020.74-1.8918.85<=30Pass 420.79-1.8918.90<=30Pass 720.75-1.8918.86<=30Pass 15020.71-1.8918.82<=30Pass 1732.5 1 021.78-1.8919.89<=30Pass 721.81-1.8919.92<=30Pass 1421.75-1.8919.86<=30Pass 8 020.79-1.8918.90<=30Pass 420.86-1.8918.97<=30Pass 720.83-1.8918.94<=30Pass 15020.86-1.8918.97<=30Pass 1753.5 1 021.87-1.8919.98<=30Pass 721.84-1.8919.95<=30Pass 1421.84-1.8919.95<=30Pass 8 021.01-1.8919.12<=30Pass 421.08-1.8919.19<=30Pass 721.07-1.8919.18<=30Pass 15021.05-1.8919.16<=30Pass 16QAM 1711.5 1 020.29-1.8918.40<=30Pass 720.34-1.8918.45<=30Pass 1420.30-1.8918.41<=30Pass 8 020.02-1.8918.13<=30Pass 420.08-1.8918.19<=30Pass 719.94-1.8918.05<=30Pass 15019.90-1.8918.01<=30Pass 1732.5 1 021.66-1.8919.77<=30Pass 721.60-1.8919.71<=30Pass 1421.60-1.8919.71<=30Pass 8 020.03-1.8918.14<=30Pass 420.01-1.8918.12<=30Pass 719.98-1.8918.09<=30Pass 15019.92-1.8918.03<=30Pass 1753.5 1 021.21-1.8919.32<=30Pass 721.17-1.8919.28<=30Pass 1421.21-1.8919.32<=30Pass 8 020.42-1.8918.53<=30Pass 420.34-1.8918.45<=30Pass 720.30-1.8918.41<=30Pass 15020.23-1.8918.34<=30Pass Note1:EIRP=ConductedPower+AntennaGain 1.1.3B4_5MHz_EIRP Band:4/Bandwidth:5MHz/NTNV Modulation Frequency (MHz) RBAllocation ConductedPower (dBm) Gain (dBi) EIRP(dBm) Verdict SizeOffsetResultLimit QPSK1712.5 1 021.67-1.8919.78<=30Pass 1321.72-1.8919.83<=30Pass 2421.64-1.8919.75<=30Pass 12 020.72-1.8918.83<=30Pass 620.68-1.8918.79<=30Pass 1320.77-1.8918.88<=30Pass ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page3of192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 25020.75-1.8918.86<=30Pass 1732.5 1 021.85-1.8919.96<=30Pass 1321.82-1.8919.93<=30Pass 2421.92-1.8920.03<=30Pass 12 020.87-1.8918.98<=30Pass 620.86-1.8918.97<=30Pass 1320.83-1.8918.94<=30Pass 25020.84-1.8918.95<=30Pass 1752.5 1 021.97-1.8920.08<=30Pass 1321.99-1.8920.10<=30Pass 2422.02-1.8920.13<=30Pass 12 020.87-1.8918.98<=30Pass 620.94-1.8919.05<=30Pass 1320.85-1.8918.96<=30Pass 25020.82-1.8918.93<=30Pass 16QAM 1712.5 1 020.75-1.8918.86<=30Pass 1320.76-1.8918.87<=30Pass 2420.78-1.8918.89<=30Pass 12 019.81-1.8917.92<=30Pass 619.78-1.8917.89<=30Pass 1319.79-1.8917.90<=30Pass 25019.79-1.8917.90<=30Pass 1732.5 1 020.97-1.8919.08<=30Pass 1320.96-1.8919.07<=30Pass 2421.00-1.8919.11<=30Pass 12 019.87-1.8917.98<=30Pass 619.88-1.8917.99<=30Pass 1319.96-1.8918.07<=30Pass 25019.95-1.8918.06<=30Pass 1752.5 1 020.10-1.8918.21<=30Pass 1320.08-1.8918.19<=30Pass 2420.12-1.8918.23<=30Pass 12 020.00-1.8918.11<=30Pass 620.07-1.8918.18<=30Pass 1320.09-1.8918.20<=30Pass 25020.23-1.8918.34<=30Pass Note1:EIRP=ConductedPower+AntennaGain 1.1.4B4_10MHz_EIRP Band:4/Bandwidth:10MHz/NTNV Modulation Frequency (MHz) RBAllocation ConductedPower (dBm) Gain (dBi) EIRP(dBm) Verdict SizeOffsetResultLimit QPSK 1715 1 021.72-1.8919.83<=30Pass 2521.72-1.8919.83<=30Pass 4921.71-1.8919.82<=30Pass 25 020.84-1.8918.95<=30Pass 1320.87-1.8918.98<=30Pass 2520.83-1.8918.94<=30Pass 50020.76-1.8918.87<=30Pass 1732.5 1 021.83-1.8919.94<=30Pass 2521.85-1.8919.96<=30Pass 4921.97-1.8920.08<=30Pass 25 020.82-1.8918.93<=30Pass 1320.92-1.8919.03<=30Pass 2520.77-1.8918.88<=30Pass 50020.78-1.8918.89<=30Pass 17501021.87-1.8919.98<=30Pass ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page4of192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,S…

Text truncated - open the document above for the full version.

Total or partial reproduction of this document without permission of the Laboratory is not allowed. Page 1 of 36 BTF Testing Lab (Shenzhen) Co., Ltd. Plant 101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, Guangdong, China Email: [email protected] Tel: +86-755-23146130 http://www.btf-lab.com Version: 1/00 RF Test Report For Applicant name: Osmile Technology Co., Ltd Address: 3F-1, No. 92, Section 2, Changsha Street, Wanhua District, Taipei City EUT name: Wrist Watch Brand name: Osmile Model number: Osmile ED1000 Series model number: Please refer to section 2.4 FCC ID: 2BVG6-ED1000 Issued By Company name: BTF Testing Lab (Shenzhen) Co., Ltd. Address: Plant 101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, Guangdong, China Report number: BTF251201R00701 Test standards: FCC CFR Title 47 Part 2 FCC CFR Title 47 Part27 Test conclusion: Pass Date of sample receipt: 2025-12-01 Test date: 2025-12-02 to 2025-12-27 Date of issue: 2025-12-28 Test by: Sean He / Tester Prepared by: Approved by: Chris Liu / Project engineer Ryan.CJ /EMC manager Note: All the test results in this report only related to the testing samples. Which can be duplicated completely for the legal use with approval of applicant; it shall not be reproduced except in full without the written approval of BTF Testing Lab (Shenzhen) Co., Ltd., All the objections should be raised within thirty days from the date of issue. To validate the report, you can contact us. Report Number: BTF251201R00701 Total or partial reproduction of this document without permission of the Laboratory is not allowed. Page 2 of 36 BTF Testing Lab (Shenzhen) Co., Ltd. Plant 101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, Guangdong, China Email: [email protected] Tel: +86-755-23146130 http://www.btf-lab.com Version: 1/00 Revision History Version Issue date Revisions content R_V0 2025-12-28 Original Note: Once the revision has been made, then previous versions reports are invalid. Report Number: BTF251201R00701 Total or partial reproduction of this document without permission of the Laboratory is not allowed. Page 3 of 36 BTF Testing Lab (Shenzhen) Co., Ltd. Plant 101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, Guangdong, China Email: [email protected] Tel: +86-755-23146130 http://www.btf-lab.com Version: 1/00 Table of Contents 1 Introduction ............................................................................................................................................................... 5 1.1 Laboratory Location .......................................................................................................................................... 5 1.2 Laboratory Facility ............................................................................................................................................ 5 1.3 Announcement ................................................................................................................................................. 5 2 Product Information ................................................................................................................................................. 6 2.1 Application Information ..................................................................................................................................... 6 2.2 Manufacturer Information ................................................................................................................................. 6 2.3 Factory Information .......................................................................................................................................... 6 2.4 General Description of Equipment under Test (EUT) ...................................................................................... 6 2.5 Technical Information ....................................................................................................................................... 6 3 Test Information ........................................................................................................................................................ 7 3.1 Test Standards ................................................................................................................................................. 7 3.2 Summary of Test .............................................................................................................................................. 7 3.3 Uncertainty of Test ........................................................................................................................................... 8 3.4 Additions to, deviations, or exclusions from the method .................................................................................. 8 3.5 Test Auxiliary Equipment .................................................................................................................................. 8 3.6 Test Equipment List .......................................................................................................................................... 8 4 Test Configuration .................................................................................................................................................. 10 4.1 Environment Condition ................................................................................................................................... 10 4.2 Test mode ....................................................................................................................................................... 10 4.3 Test Channel of EUT ...............................................................................................…

Text truncated - open the document above for the full version.

ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page131of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_LCH_1712.5MHz_RB_1_0_NTNV Band4_5MHz_16QAM_LCH_1712.5MHz_RB_25_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page132of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_MCH_1732.5MHz_RB_1_0_NTNV Band4_5MHz_16QAM_MCH_1732.5MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page133of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_MCH_1732.5MHz_RB_1_0_NTNV Band4_5MHz_16QAM_MCH_1732.5MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page134of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_MCH_1732.5MHz_RB_1_0_NTNV Band4_5MHz_16QAM_HCH_1752.5MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page135of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_HCH_1752.5MHz_RB_1_0_NTNV Band4_5MHz_16QAM_HCH_1752.5MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page136of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_HCH_1752.5MHz_RB_1_0_NTNV Band4_5MHz_16QAM_HCH_1752.5MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page137of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_5MHz_16QAM_HCH_1752.5MHz_RB_1_24_NTNV Band4_5MHz_16QAM_HCH_1752.5MHz_RB_25_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page138of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 6.2.4B4_10MHz Band4_10MHz_QPSK_LCH_1715MHz_RB_1_0_NTNV Band4_10MHz_QPSK_LCH_1715MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page139of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_10MHz_QPSK_LCH_1715MHz_RB_1_0_NTNV Band4_10MHz_QPSK_LCH_1715MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page140of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_10MHz_QPSK_LCH_1715MHz_RB_1_0_NTNV Band4_10MHz_QPSK_LCH_1715MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page141of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Band4_10MHz_QPSK_LCH_1715MHz_RB_50_0_NTNV Band4_10MHz_QPSK_MCH_1732.5MHz_RB_1_0_NTNV ReportNumber:BTF251201R00701 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page142of 192 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,Songg…

Text truncated - open the document above for the full version.