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ReportNo. : EEED32S815990Page1 of 8 RF ExposureEvaluationReport Product:Thermalprinter Trademark:N/A Model/Typereference:ST82,X1, X2 ,X3, X4, X5, X6 ,X7 ,X8, X9, X10 SerialNumber:N/A ReportNumber:EEED32S815990 FCC ID:2BW77-X1 Date of Issue:Jul. 24, 2026 Test Standards: 47 CFR Part 1.1307 47 CFR Part 1.13 10 47 CFR Part 2.1091 KDB447498D04 InterimGeneralRF ExposureGuidancev01 Test result:PASS Preparedfor: YangzhouGLD TradingCo., Ltd. 507, Building2, Wutinglong,Xihu Town,HanjiangDistrict, YangzhouCity, JiangsuProvince,China Preparedby: CentreTestingInternationalGroupCo., Ltd. BuildingC, HongweiIndustrialPark Block70, Bao'anDistrict, Shenzhen,China TEL: +86-755-33683668 FAX: +86-755-3368 3385 Compiledby:Reviewedby: FrazerLiKevenTan Approvedby:Date:Jul. 24, 2026 AaronMa Check No.: 2626070726 ReportNo. : EEED32S815990Page2 of 8 ModificationRecord VersionNo.ReportNo.ModificationDescription 00EED32S812523First report 01EED32S815990ModifyApplicant,ManufacturerFactory& Model No. Note: All test data come from the report of No. EED32S8125 23. ReportNo. : EEED32S815990Page3 of 8 1 Contents Page 1 CONTENTS........................................................................................................................................................................3 2 GENERALINFORMATION..............................................................................................................................................4 2.1 CLIENTINFORMATION...................................................................................................................................................4 2.2 GENERALDESCRIPTIONOFEUT ...................................................................................................................................4 2.3 PRODUCTSPECIFICATIONSUBJECTIVETO THIS STANDARD...........................................................................................4 2.4 TESTLOCATION.............................................................................................................................................................5 2.5 DEVIATIONFROMSTANDARDS......................................................................................................................................5 2.6 ABNORMALITIESFROMSTANDARDCONDITIONS..........................................................................................................5 2.7 OTHERINFORMATIONREQUESTEDBY THECUSTOMER................................................................................................5 3 SAR EVALUATION...........................................................................................................................................................6 3.1 RF EXPOSURECOMPLIANCEREQUIREMENT.................................................................................................................6 3.1.1 Limits....................................................................................................................................................................6 3.1.2 T est Procedure....................................................................................................................................................6 3.1.3 EUT RF ExposureEvaluation..........................................................................................................................7 ReportNo. : EEED32S815990Page4 of 8 2 GeneralInformation 2.1 ClientInformation Applicant:YangzhouGLDTradingCo., Ltd. Addressof Applicant:507, Building2, Wutinglong,Xihu Town,HanjiangDistrict,YangzhouCity, Jiangsu Province,China Manufacturer:YangzhouGLDTradingCo., Ltd. Addressof Manufacturer:507, Building2, Wutinglong,Xihu Town,HanjiangDistrict,YangzhouCity, Jiangsu Province,China Factory:XiamenPrintFutureTechnologyCo.,Ltd. Addressof Factory:Rooms501, 601, 701, No.55DonglingRoad,HouxiTown,JimeiDistrict, XiamenCity, FujianProvince,China 2.2 GeneralDescriptionof EUT ProductName: Thermalprinter Model No. : ST82, X1, X2 ,X3, X4, X5, X6 ,X7 ,X8, X9, X10 Test Model No.: ST82 Modeldifference: Theyhavesameelectrical,PCBand layout,only the modelnamesand colorare differentfor marketingrequirements. TradeMark: N/A 2.3 ProductSpecificationsubjectiveto this standard FrequencyRange:BLE/BT:2402MHz~2480MHz ModulationType:BLE:GFSK BT: GFSK Test PowerGrade:Default Test Softwareof EUT:fcc_test_tool.exe AntennaType: PCBAntenna AntennaGain: 2.58dBi PowerSupply: Battery: DC 7.4V USBPort: USB5V SampleReceivedDate: Jun. 12, 2026 SampletestedDate: Jun. 12, 2026to Jun. 22, 2026 ReportNo. : EEED32S815990Page5 of 8 2.4 Test Location All testswereperformedat: CentreTestingInternationalGroupCo., Ltd BuildingC, HongweiIndustrialParkBlock70, Bao'anDistrict,Shenzhen,China Telephone:+86 (0) 755 33683668Fax:+86(0) 755 33683385 No testsweresub-contracted. FCCDesignationNo.: CN1164,Test Firm RegistrationNo.: 260439 2.5 Deviationfrom Standards None. 2.6 Abnormalitiesfrom StandardConditions None. 2.7 OtherInformationRequestedby the Customer None. ReportNo. : EEED32S815990Page6 of 8 3 SAR Evaluation 3.1 RF ExposureComplianceRequirement 3.1.1 Limits The SAR-basedexemptionformulaof § 1.1307(b)(3)(i)(B),repeatedhereas Formula(B.2),appliesfor singlefixed,mobile,and portableRF sourceswith availablemaximumtime-averagedpoweror effective radiatedpower(ERP),whicheveris greater,of less than or equalto the thresholdPth (mW). This methodshallonly be usedat separationdistancesfrom0.5 cm to 40 cm and at frequenciesfrom 0.3 GHz to 6 GHz (inclusive).Pth is givenby Formula and f is in GHz,d is the separationdistance(cm),and ERP20cmis per Formula(B.1). The 1 mW BlanketExemptionof § 1.1307(b)(3)(i)(A)appliesfor singlefixed,mobile,and portableRF sourceswith availablemaximumtime-averagedpowerof no morethan 1 mW,regardlessof separation distance. 3.1.2 Te st Procedure Softwareprovidedby clientenabledthe EUTto transmitand receivedata at lowest,middleand highest channelindividually. ReportNo. : EEED32S815990Page7 of 8 3.1.3 EUT RF ExposureEvaluati…
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ReportNo. : EED32S815993Page 26 of 30 1M_HCH_2480MHz_Ant1_NTNV ReportNo. : EED32S815993Page 27 of 30 5.2.2 CSE 1M_LCH_2402MHz_Ant1_NTNV 1M_LCH_2402MHz_Ant1_NTNV ReportNo. : EED32S815993Page 28 of 30 ReportNo. : EED32S815993Page 29 of 30 1M_MCH_2440MHz_Ant1_NTNV 1M_HCH_2480MHz_Ant1_NTNV ReportNo. : EED32S815993Page 30 of 30 1M_HCH_2480MHz_Ant1_NTNV *** End of Report***
ReportNo. : EED32S815993Page 1 of 44 TESTREPORT Product:Thermalprinter Trademark:N/A Model/Typereference:ST82,X1, X2 ,X3, X4, X5, X6 ,X7 ,X8, X9, X10 SerialNumber:N/A ReportNumber:EED32S815993 FCC ID:2BW77-X1 Dateof Issue:Jul. 24, 2026 TestStandards:47 CFR Part 15 SubpartC Testresult:PASS Preparedfor: YangzhouGLDTradingCo., Ltd. 507, Building2, Wutinglong,XihuTown,HanjiangDistrict, YangzhouCity,JiangsuProvince,China Preparedby: CentreTestingInternationalGroupCo., Ltd. BuildingC, HongweiIndustrialParkBlock70, Bao'anDistrict, Shenzhen,China TEL:+86-755-33683668 FAX:+86-755-33683385 Compiledby:Reviewedby: FrazerLiKevenTan Approvedby:Date:Jul. 24, 2026 AaronMa CheckNo.: 2626070726 ReportNo. : EED32S815993Page 2 of 44 1 Content 1 CONTENT............................................................................................................................................................................2 2 TESTSUMMARY...............................................................................................................................................................3 3 GENERALINFORMATION...............................................................................................................................................4 3.1 CLIENTINFORMATION....................................................................................................................................................4 3.2 GENERALDESCRIPTIONOFEUT.................................................................................................................................4 3.3 TESTCONFIGURATION..................................................................................................................................................5 3.4 TESTENVIRONMENT.....................................................................................................................................................6 3.5 DESCRIPTIONOFSUPPORTUNITS...............................................................................................................................6 3.6 TESTLOCATION.............................................................................................................................................................6 3.7 MEASUREMENTUNCERTAINTY(95%CONFIDENCELEVELS,K=2).............................................................................7 4 EQUIPMENTLIST..............................................................................................................................................................8 5 TESTRESULTSANDMEASUREMENTDATA.........................................................................................................12 5.1 ANTENNAREQUIREMENT............................................................................................................................................12 5.2 CONDUCTEDEMISSIONS.............................................................................................................................................13 5.3 MAXIMUMCONDUCTEDOUTPUTPOWER..................................................................................................................17 5.4 DTS BANDWIDTH........................................................................................................................................................18 5.5 MAXIMUMPOWERSPECTRALDENSITY.....................................................................................................................19 5.6 BANDEDGEMEASUREMENTSANDCONDUCTEDSPURIOUSEMISSION...................................................................20 5.7 RADIATEDSPURIOUSEMISSION& RESTRICTEDBANDS...........................................................................................21 6 APPENDIXA.....................................................................................................................................................................42 7 PHOTOGRAPHS..............................................................................................................................................................43 ReportNo. : EED32S815993Page 3 of 44 2 TestSummary TestItemTestRequirementResult AntennaRequirement 47 CFRPart 15 SubpartC Section 15.203/15.247(c) PASS AC PowerLineConducted Emission 47 CFRPart 15 SubpartC Section 15.207 PASS DTS Bandwidth 47 CFRPart 15 SubpartC Section 15.247(a)(2) PASS MaximumConductedOutput Power 47 CFRPart 15 SubpartC Section 15.247(b)(3) PASS MaximumPowerSpectral Density 47 CFRPart 15 SubpartC Section15.247(e)PASS BandEdgeMeasurements 47 CFRPart 15 SubpartC Section 15.247(d) PASS ConductedSpuriousEmissions 47 CFRPart 15 SubpartC Section 15.247(d) PASS RadiatedSpuriousEmission& Restrictedbands 47 CFRPart 15 SubpartC Section 15.205/15.209 PASS ReportNo. : EED32S815993Page 4 of 44 3 GeneralInformation 3.1 ClientInformation Applicant: YangzhouGLDTradingCo., Ltd. Addressof Applicant: 507, Building2, Wutinglong,Xihu Town,HanjiangDistrict,YangzhouCity, JiangsuProvince,China Manufacturer: YangzhouGLDTradingCo., Ltd. Addressof Manufacturer: 507, Building2, Wutinglong,Xihu Town,HanjiangDistrict,YangzhouCity, JiangsuProvince,China Factory: XiamenPrintFutureTechnologyCo.,Ltd. Addressof Factory: Rooms501, 601, 701, No.55DonglingRoad,HouxiTown,JimeiDistrict, XiamenCity, FujianProvince,China 3.2 GeneralDescriptionof EUT ProductName: Thermalprinter Model No. : ST82, X1, X2 ,X3, X4, X5, X6 ,X7 ,X8, X9, X10 Test Model No.: ST82 Modeldifference: Theyhavesameelectrical,PCBand layout,only the modelnamesand colorare differentfor marketingrequirements. Trade mark: N/A ProductType: MobilePortableFix Location OperationFrequency: 2402MHz~2480MHz ModulationType: GFSK TransferRate:1Mbps Numberof Channel: 40 AntennaType :PCBAntenna AntennaGain:2.58dBi PowerSupply: Battery: DC 7.4V USBPort: USB5V Test Voltage:DC 7.4V SampleReceivedDate: Jun. 12, 2026 SampletestedDate: Jun. 12, 2026to Jun. 22, 2026 ReportNo. : EED32S815993Page 5 of 44 OperationFrequencyeachof …
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ReportNo. : EED32S815993Page 28 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2402MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 118768.0907-26.3562.5036.1574.0037.85PASS Horizont al PK 220039.7416-24.8061.8137.0174.0036.99PASS Horizont al PK 321197.1479-25.7561.2235.4774.0038.53PASS Horizont al PK 422706.1282-25.0359.6034.5774.0039.43PASS Horizont al PK 524319.8328-22.0657.9935.9374.0038.07PASS Horizont al PK 625867.2347-20.8557.5536.7074.0037.30PASS Horizont al PK ReportNo. : EED32S815993Page 29 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2402MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 119126.8051-26.1362.1035.9774.0038.03PASSVerticalPK 220513.7205-25.8260.9235.1074.0038.90PASSVerticalPK 322015.9006-25.7860.1234.3474.0039.66PASSVerticalPK 423150.186-24.6259.1434.5274.0039.48PASSVerticalPK 524626.185-21.8957.7735.8874.0038.12PASSVerticalPK 625830.8532-20.8357.5736.7474.0037.26PASSVerticalPK ReportNo. : EED32S815993Page 30 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2440MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 11604.70713.7336.6750.4074.0023.60PASS Horizont al PK 22687.312517.2037.0954.2974.0019.71PASS Horizont al PK 33985.0657-11.7553.5041.7574.0032.25PASS Horizont al PK 46649.2433-3.9744.3940.4274.0033.58PASS Horizont al PK 511971.59813.1144.7447.8574.0026.15PASS Horizont al PK 617775.985116.3237.5253.8474.0020.16PASS Horizont al PK 72670.37817.1218.7035.8254.0018.18PASS Horizont al AV ReportNo. : EED32S815993Page 31 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2440MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 11695.51314.0536.6450.6974.0023.31PASSVerticalPK 22937.062517.6837.0354.7174.0019.29PASSVerticalPK 33982.0655-11.7756.4444.6774.0029.33PASSVerticalPK 46644.243-3.9749.1945.2274.0028.78PASSVerticalPK 511297.55322.4444.2346.6774.0027.33PASSVerticalPK 617179.945312.8240.0752.8974.0021.11PASSVerticalPK 72926.261817.6717.9735.6454.0018.36PASSVerticalAV ReportNo. : EED32S815993Page 32 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2440MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 119226.4291-26.0062.1236.1274.0037.88PASS Horizont al PK 220837.7535-25.7260.9735.2574.0038.75PASS Horizont al PK 322125.045-25.5560.1234.5774.0039.43PASS Horizont al PK 423375.275-23.6558.7435.0974.0038.91PASS Horizont al PK 525107.6443-21.5557.4835.9374.0038.07PASS Horizont al PK 626063.0825-21.0459.0638.0274.0035.98PASS Horizont al PK ReportNo. : EED32S815993Page 33 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2440MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 119312.4525-25.8262.7236.9074.0037.10PASSVerticalPK 220661.6265-25.9461.1535.2174.0038.79PASSVerticalPK 321881.5953-25.6460.7935.1574.0038.85PASSVerticalPK 423296.7319-23.9358.3934.4674.0039.54PASSVerticalPK 524662.2265-21.9057.3935.4974.0038.51PASSVerticalPK 626001.8801-20.9057.9437.0474.0036.96PASSVerticalPK ReportNo. : EED32S815993Page 34 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2480MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 11598.173213.7335.6449.3774.0024.63PASS Horizont al PK 22690.512717.2337.6854.9174.0019.09PASS Horizont al PK 33796.0531-12.4754.0741.6074.0032.40PASS Horizont al PK 45218.1479-7.6450.3242.6874.0031.32PASS Horizont al PK 58759.384-0.1845.2145.0374.0028.97PASS Horizont al PK 616503.900311.9341.3953.3274.0020.68PASS Horizont al PK 72713.180917.0818.5835.6654.0018.34PASS Horizont al AV ReportNo. : EED32S815993Page 35 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2480MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 11570.571413.4735.8549.3274.0024.68PASSVerticalPK 22756.917116.9436.7553.6974.0020.31PASSVerticalPK 33992.0661-11.7256.1544.4374.0029.57PASSVerticalPK 46666.2444-3.7649.4645.7074.0028.30PASSVerticalPK 510203.48021.5543.5245.0774.0028.93PASSVerticalPK 617054.93712.3841.6454.0274.0019.98PASSVerticalPK 717051.936812.3321.6133.9454.0020.06PASSVerticalAV ReportNo. : EED32S815993Page 36 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2480MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 118887.4355-26.2862.4336.1574.0037.85PASS Horizont al PK 220344.7338-25.4961.2335.7474.0038.26PASS Horizont al PK 321800.672-25.5360.7635.2374.0038.77PASS Horizont al PK 423306.9323-23.8958.8434.9574.0039.05PASS Horizont al PK 524547.3019-21.8257.7235.9074.0038.10PASS Horizont al PK 625917.5567-20.8757.2936.4274.0037.58PASS Horizont al PK ReportNo. : EED32S815993Page 37 of 44 Test_Mode BLE 1M GFSK Transmitting Test_Frequency2480MHz Remark:/Test_Date2026/6/19 TestGraph SuspectedList NO Freq. [MHz] Factor [dB] Reading [dB μV] Level [dB μV/m] Limit [dB μV/m] Margin [dB] ResultPolarityRemark 118826.233-26.2963.9937.7074.0036.30PASSVerticalPK 220050.962-24.8561.1836.3374.0037.67PASSVerticalPK 321010.1404-25.9961.1035.1174.0038.89PASSVerticalPK 422182.1673-25.4460.8135.3774.0038.63PASSVerticalPK 523556.5023-23.1758.3435.1774.0038.83PASSVerticalPK 625069.2228-21.7657.6735.9174.0038.09PASSVerticalPK Remark: 1) The field strengthis …
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ReportNo. : EED32S815993Page 44 of 44 Statement 1. This reportis consideredinvalidwithoutapprovedsignature, specialseal and the seal on the perforation; 2. The CompanyNameshownon Reportand Address, the sample(s)and sampleinformationwas/were providedby the applicantwho shouldbe responsiblefor the authenticitywhichCTI hasn'tverified; 3. The result(s)shownin this reportrefer(s)only to the sample(s)tested; 4. Unlessotherwisestated,thedecisionrule for conformityreportingis basedon BinaryStatementfor Simple AcceptanceRulestatedin ILAC-G8:09/2019/CNAS-GL015:2022; 5. Withoutwrittenapprovalof CT I, this reportcan'tbe reproducedexceptin full; *** End of Report***
BluetoothAntenna specification&Testreport AntennaManufacturer:XiamenPrintFutureTechnologyCo.,Ltd. Address:Room701,No.55DonglingRoad,HouxiTown,Jimei District,XiamenCity,FujianProvince,China YichipMicroelectronics ©2014 Test CcompanyTATechnology(Shanghai)Co.,Ltd. TestAddress Building1,No.400,FangchunRoad,China(Shanghai)PilotFreeTradeZone TestDate2020/7/24 TestInstrument KeysightE5071B antennadesignspecification Antennadimensionsasblowpictureshow:thematerialisFR4andthe thicknessis1.6mmofPCB. ANT1 GianandEfficiency Frequency(MHz) Efficiency(%)Gain(dBi) 230034.81-0.14 232038.900.50 234038.951.16 236040.111.28 238039.281.80 240041.772.20 242049.712.34 244050.232.58 246045.912.45 248042.462.09 250041.102.01 252035.580.96 254032.430.44 3Dand1D RadiationPatterns Total Azimuth=0.0 Elevation=0.0 Roll=0.0 Frequency=2440MHz Efficiency=50.23% Gain=2.58dBi Y X -10 -15 10 5 -5 0 Z Max:5 Min:-5 Scale:1/div Frequency=2440MHz Efficiency=50.23% Gain=2.58dBi Cut1 0 90 330 300 240 210 270 180 Angle(? Max:4 Min:-16 Scale:2/div Frequency=2440MHz Efficiency=50.23% Gain=2.58dBi Cut2 0 90 330 300 240 210 270 180 Angle(? Max:6 Min:-6 Scale:2/div Frequency=2440MHz Efficiency=50.23% Gain=2.58dBi Cut3 0 90 330 300 240 210 270 180 Angle(? 120 60 150 30 150 120 60 30 150 120 60 30
ReportNo. : EED32S815993Page 1 of 30 Appendix:BluetoothLE ReportNo. : EED32S815993Page 2 of 30 Contents Contents......................................................................................................................................................2 1. Duty Cycle...............................................................................................................................................4 1.1 Test Result.....................................................................................................................................4 1.1.1Ant1 .....................................................................................................................................4 1.2 Test Graph.....................................................................................................................................5 1.2.1Ant1 .....................................................................................................................................5 2. Bandwidth................................................................................................................................................8 2.1 Test Result.....................................................................................................................................8 2.1.1OBW....................................................................................................................................8 2.1.26dB BW ................................................................................................................................8 2.2 Test Graph.....................................................................................................................................9 2.2.1OBW....................................................................................................................................9 2.2.26dB BW ..............................................................................................................................12 3. MaximumConductedOutputPower.....................................................................................................15 3.1 Test Result...................................................................................................................................15 3.1.1Power.................................................................................................................................15 3.2 Test Graph...................................................................................................................................16 3.2.1Power.................................................................................................................................16 4. MaximumPowerSpectralDensity........................................................................................................19 4.1 Test Result...................................................................................................................................19 4.1.1PSD ...................................................................................................................................19 4.2 Test Graph...................................................................................................................................20 4.2.1PSD ...................................................................................................................................20 5. UnwantedEmissionsIn Non-restrictedFrequencyBands...................................................................23 ReportNo. : EED32S815993Page 3 of 30 5.1 Test Result...................................................................................................................................23 5.1.1Ref .....................................................................................................................................23 5.1.2CSE ...................................................................................................................................23 5.2 Test Graph...................................................................................................................................24 5.2.1Ref .....................................................................................................................................24 5.2.2CSE ...................................................................................................................................27 ReportNo. : EED32S815993Page 4 of 30 1. Duty Cycle 1.1 Test Result 1.1.1 Ant1 Ant1 Mode TX Type Frequency (MHz) T_on (ms) Period (ms) DutyCycle (%) DutyCycle CorrectionFactor(dB) Max.DC Variation(%) 1MSISO 24020.4121.19134.594.610.01 24400.4121.19134.594.610.01 24800.4131.19234.654.600.03 ReportNo. : EED32S815993Page 5 of 30 1.2 Test Graph 1.2.1 Ant1 1M_LCH_2402MHz_Ant1_NTNV 1M_MCH_2440MHz_Ant1_NTNV ReportNo. : EED32S815993Page 6 of 30 ReportNo. : EED32S815993Page 7 of 30 1M_HCH_2480MHz_Ant1_NTNV ReportNo. : EED32S815993Page 8 of 30 2. Bandwidth 2.1 Test Result 2.1.1 OBW Mode TX Type Frequency (MHz) ANT 99% OccupiedBandwidth(MHz) Verdict ResultLimit 1MSISO 240211.030/Pass 244011.031/Pass 248011.031/Pass 2.1.2 6dB BW Mode TX Type Frequency (MHz) ANT 6dB Bandwidth(MHz) Verdict ResultLimit 1MSISO 240210.669>=0.5Pass 244010.682>=0.5Pass 248010.685>=0.5Pass ReportNo. : EED32S815993Page 9 of 30 2.2 Test Graph 2.2.1 OBW 1M_LCH_2402MHz_Ant1_NTNV 1M_MCH_2440MHz_Ant1_NTNV ReportNo. : EED32S815993Page 10 of 30 ReportNo. : EED32S815993Page 11 of 30 1M_HCH_2480MHz_Ant1_NTNV ReportNo. : EED32S815993Page 12 of 30 2.2.2 6dB BW 1M_LCH_2402MHz_Ant1_NTNV 1M_MCH_2440MHz_Ant1_NTNV ReportNo. : EED32S815993Page 13 of 30 ReportNo. : EED32S815993Page 14 of 30 1M_HCH_2480MHz_Ant1_NTNV ReportNo. : EED32S815993Page 15 of 30 3. MaximumConductedOutputPower 3.1 Test Result 3.1.1 Power Mode TX Type Frequency (MHz) MaximumPeakConductedOutputPower(dBm) Verdict ANT1Limit 1MSISO 2402-4.04<=30Pass 2440-3.66<=30…
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3722 Illinois Avenue · Saint Charles, Illinois, 60174 · United States
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.40 GHz - 2.48 GHz | 500.00 µW |