2BXD5-CANDLEVNIMOU AI Glasses

Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn RF Exposure evaluation Report Reference No. ..................... : FCC ID............................................. : CTA26071700303 2BXD5-CANDLEV Compiled by ( position+printed name+signature) . : File administrators Zoey Cao Supervised by ( position+printed name+signature) . : Project Engineer Ace Chai Approved by ( position+printed name+signature) . : RF Manager Eric Wang Date of issue .................................... : Jul. 25, 2026 Testing Laboratory Name .............. : Shenzhen CTA Testing Technology Co., Ltd. Address............................................ : Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Applicant’s name ............................ : Beijing Baolu Technology Co., Ltd. Address............................................ : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Standard ........................................... : 47CFR §1.1310 47CFR §2.1093 KDB447498 D01 General RF Exposure Guidance v06 Shenzhen CTA Testing Technology Co., Ltd. All rights reserved. This publication may be reproduced in whole or in part for non-commercial purpses as long as the Shenzhen CTA Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen CTA Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Test item description ..................... : NIMOU AI Glasses Trade Mark ....................................... : N/A Manufacturer .................................... : Beijing Baolu Technology Co., Ltd. Model/Type reference ...................... : Candlev Listed Models ................................... : Candlev1 Rating ............................................... : Input: 5V0.2A Battery: 3.8V 290mAh 1.102Wh Result ............................................... : PASS Report No.: CTA26071700303 Page 2 of 9 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn T E S T R E P O R T Equipment under Test : NIMOU AI Glasses Model /Type : Candlev Listed Models : Candlev1 Model difference : The PCB board, circuit, structure and internal of these models are the same, only model number and colour are different for these model. So the tests were performed on model Candlev and the test results for the main test model can cover the listed models. Applicant : Beijing Baolu Technology Co., Ltd. Address : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Manufacturer : Beijing Baolu Technology Co., Ltd. Address : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Test Result: PASS The test report merely corresponds to the test sample. It is not permitted to copy extracts of these test result without the written permission of the test laboratory. Report No.: CTA26071700303 Page 3 of 9 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn Contents 1 TEST STANDARDS ............................................................................................................ 4 2 SUMMARY .......................................................................................................................... 5 2.1 General Remarks ..................................................................................................... 5 2.2 Product Description ................................................................................................. 5 2.3 Special Accessories ................................................................................................. 5 2.4 Modifications ............................................................................................................ 5 3 TEST ENVIRONMENT ....................................................................................................... 6 3.1 Address of the test laboratory .................................................................................. 6 3.2 Test Facility .............................................................................................................. 6 3.3 Statement of the measurement uncertainty ............................................................. 6 4 Test limit .............................................................................................................................. 7 4.1 Requirement ............................................................................................................ 7 4.2 Conducted Power Results ....................................................................................... 8 4.3 Manufacturing tolerance .......................................................................................... 8 4.4 Evaluation Result ..................................................................................................... 8 4.5 Simultaneous Transmission for SAR Exclusion ...................................................... 8 5 Conclusion ..............................................................................................................…

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FCC ID: 2BXD5-CANDLEV Test Setup Photos of the EUT FCC ID: 2BXD5-CANDLEV

1. Antenna Description: Antenna type Internal antenna Model Candlev Frequency range 2400-2500MHz Manufacturer Beijing Baolu Technology Co., Ltd. Address Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China ANT Peak Gain 0.76 dBi 2. Antenna Photo: 3. Test Equipment & Conditions 3.1 Test instrument VSWR is tested using Agilent E5071B connected to a hand mechanism, and the status is free space. 3.2 Test environment and methods 4．Antenna Radiation Pattern 2400MHz 2450MHz 2500MHz

1 FCC Appendix RF Test Data for BLE FCC ID : 2BXD5-CANDLEV Company : Beijing Baolu Technology Co., Ltd. EUT : NIMOU AI Glasses Model Number : Candlev Report No. : CTA26071700301 Reviewed By : Eric Wang 2 Appendix A: DTS Bandwidth Test Result TestMode Antenna Freq(MHz) DTS BW [MHz] FL[MHz] FH[MHz] Limit[MHz] Verdict BLE_1M Ant1 2402 0.644 2401.688 2402.332 0.5 PASS 2440 0.632 2439.696 2440.328 0.5 PASS 2480 0.648 2479.688 2480.336 0.5 PASS 3 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 4 5 Appendix B: Occupied Channel Bandwidth Test Result TestMode Antenna Freq(MHz) OCB [MHz] FL[MHz] FH[MHz] Limit[MHz] Verdict BLE_1M Ant1 2402 1.0119 2401.5141 2402.5260 --- --- 2440 1.0087 2439.5186 2440.5273 --- --- 2480 1.0077 2479.5177 2480.5254 --- --- 6 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 7 8 Appendix C: Maximum conducted output power Test Result Peak TestMode Antenna Freq(MHz) Conducted Peak Powert[dBm] Conducted Limit[dBm] Verdict BLE_1M Ant1 2402 0.41 ≤30 PASS 2440 0.32 ≤30 PASS 2480 0.06 ≤30 PASS 9 Appendix D: Maximum power spectral density Test Result TestMode Antenna Freq(MHz) Result[dBm/3kHz] Limit[dBm/3kHz] Verdict BLE_1M Ant1 2402 -15.12 ≤8.00 PASS 2440 -15.34 ≤8.00 PASS 2480 -15.33 ≤8.00 PASS 10 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 11 12 Appendix E: Band edge measurements Test Result TestMod e Antenn a ChNam e Freq(MHz ) RefLevel[dBm ] Result[dBm ] Limit[dBm ] Verdic t BLE_1M Ant1 Low 2402 -0.01 -51.03 ≤-20.01 PASS High 2480 0.11 -52.57 ≤-19.89 PASS 13 Test Graphs BLE_1M_Ant1_Low_2402 BLE_1M_Ant1_High_2480 14 Appendix F: Conducted Spurious Emission Test Result TestMode Antenna Freq(MHz) FreqRange [MHz] RefLevel [dBm] Result[dBm] Limit[dBm] Verdict BLE_1M Ant1 2402 Reference -1.08 -1.08 --- PASS 30~1000 -1.08 -69.08 ≤-21.08 PASS 1000~26500 -1.08 -39.84 ≤-21.08 PASS 2440 Reference -0.46 -0.46 --- PASS 30~1000 -0.46 -68.32 ≤-20.46 PASS 1000~26500 -0.46 -41.46 ≤-20.46 PASS 2480 Reference -1.00 -1.00 --- PASS 30~1000 -1.00 -68.08 ≤-21 PASS 1000~26500 -1.00 -40.48 ≤-21 PASS 15 Test Graphs BLE_1M_Ant1_2402_0~Reference BLE_1M_Ant1_2402_30~1000 BLE_1M_Ant1_2402_1000~26500 16 BLE_1M_Ant1_2440_0~Reference BLE_1M_Ant1_2440_30~1000 17 BLE_1M_Ant1_2440_1000~26500 BLE_1M_Ant1_2480_0~Reference BLE_1M_Ant1_2480_30~1000 18 BLE_1M_Ant1_2480_1000~26500 19 Appendix G: Duty Cycle Test Result TestMode Antenna Freq(MHz) ON Time [ms] Period [ms] X DC [%] xFactor Limit Verdict BLE_1M Ant1 2402 0.41 0.62 0.6613 66.13 1.80 --- --- 2440 0.42 0.63 0.6667 66.67 1.76 --- --- 2480 0.42 0.63 0.6667 66.67 1.76 --- --- 20 Test Graphs BLE_1M_Ant1_2402 BLE_1M_Ant1_2440 BLE_1M_Ant1_2480 21 22 Appendix H: Emissions in Restricted Bands Test Result TestMod e Antenn a ChNam e Freq(MH z) Detector Freq [MHz] Result [dBm] Gain [dB] DC Factor [dB] Result [dBuV/m] Limit [dBuV/m] Verdict BLE_1M Ant1 Low 2402 AV 2310.000 -59.94 2.00 1.80 39.06 ≤54 PASS AV 2375.915 -58.78 2.00 1.80 40.22 ≤54 PASS AV 2390.000 -59.76 2.00 1.80 39.24 ≤54 PASS Peak 2310.000 -51.4 2.00 0.00 45.80 ≤74 PASS Peak 2382.950 -47.87 2.00 0.00 49.33 ≤74 PASS Peak 2390.000 -50.93 2.00 0.00 46.27 ≤74 PASS High 2480 AV 2483.500 -57.63 2.00 1.76 41.33 ≤54 PASS AV 2484.080 -57.41 2.00 1.76 41.55 ≤54 PASS AV 2500.000 -59.07 2.00 1.76 39.89 ≤54 PASS Peak 2483.500 -49.66 2.00 0.00 47.54 ≤74 PASS Peak 2484.640 -44.96 2.00 0.00 52.24 ≤74 PASS Peak 2500.000 -51.12 2.00 0.00 46.08 ≤74 PASS Note： 1. The limit in dBm for average detector is conversion from 54dBuV/m, according to 15.209(a). The limit in dBm for peak detector is 20dB above the limit of average detector in dBm. 23 Test Graphs BLE_1M_Ant1_Low_2402_AV BLE_1M_Ant1_Low_2402_Peak BLE_1M_Ant1_High_2480_AV 24 BLE_1M_Ant1_High_2480_Peak

35 11N20SISO_Ant1_2412_1000~26500 11N20SISO_Ant1_2437_0~Reference 11N20SISO_Ant1_2437_30~1000 36 11N20SISO_Ant1_2437_1000~26500 11N20SISO_Ant1_2462_0~Reference 37 11N20SISO_Ant1_2462_30~1000 11N20SISO_Ant1_2462_1000~26500 11N40SISO_Ant1_2422_0~Reference 38 11N40SISO_Ant1_2422_30~1000 11N40SISO_Ant1_2422_1000~26500 39 11N40SISO_Ant1_2437_0~Reference 11N40SISO_Ant1_2437_30~1000 11N40SISO_Ant1_2437_1000~26500 40 11N40SISO_Ant1_2452_0~Reference 11N40SISO_Ant1_2452_30~1000 41 11N40SISO_Ant1_2452_1000~26500 42 Appendix G: Duty Cycle Test Result TestMode Antenna Frequency[MHz] Transmission Duration [ms] Transmission Period [ms] Duty Cycle [%] DC Factor [dB] T Factor [dB] 11B Ant1 2412 8.35 8.39 99.52 0.02 0.12 2437 8.35 8.39 99.52 0.02 0.12 2462 8.35 8.40 99.40 0.03 0.12 11G Ant1 2412 0.15 0.19 78.95 1.03 6.67 2437 0.15 0.19 78.95 1.03 6.67 2462 0.14 0.19 73.68 1.33 7.14 11N20SISO Ant1 2412 0.18 0.23 78.26 1.06 5.56 2437 0.18 0.22 81.82 0.87 5.56 2462 0.17 0.22 77.27 1.12 5.88 11N40SISO Ant1 2422 0.18 0.23 78.26 1.06 5.56 2437 0.18 0.23 78.26 1.06 5.56 2452 0.18 0.22 81.82 0.87 5.56 43 Test Graphs 11B_Ant1_2412 11B_Ant1_2437 11B_Ant1_2462 44 11G_Ant1_2412 11G_Ant1_2437 45 11G_Ant1_2462 11N20SISO_Ant1_2412 11N20SISO_Ant1_2437 46 11N20SISO_Ant1_2462 11N40SISO_Ant1_2422 47 11N40SISO_Ant1_2437 11N40SISO_Ant1_2452 48 Appendix H: Emissions in Restricted Bands Test Result TestMod e Antenn a ChNam e Frequen cy[MHz] Detector Freq [MHz] Result [dBm] Gain [dB] DC Factor [dB] Result [dBuV/m] Limit [dBuV/m] Verdict 11B Ant1 Low 2412 AV 2310.000 -60.26 2.00 0.02 36.96 ≤54 PASS AV 2386.060 -58.44 2.00 0.02 38.78 ≤54 PASS AV 2390.000 -59.75 2.00 0.02 37.47 ≤54 PASS Peak 2310.000 -51.85 2.00 0.00 45.35 ≤74 PASS Peak 2349.400 -48.26 2.00 0.00 48.94 ≤74 PASS Peak 2390.000 -51.64 2.00 0.00 45.56 ≤74 PASS High 2462 AV 2483.500 -59.2 2.00 0.03 38.03 ≤54 PASS AV 2489.280 -58.51 2.00 0.03 38.72 ≤54 PASS AV 2500.000 -59 2.00 0.03 38.23 ≤54 PASS Peak 2483.500 -51.94 2.00 0.00 45.26 ≤74 PASS Peak 2490.380 -48.05 2.00 0.00 49.15 ≤74 PASS Peak 2500.000 -52.93 2.00 0.00 44.27 ≤74 PASS 11G Ant1 Low 2412 AV 2310.000 -60.52 2.00 1.03 37.71 ≤54 PASS AV 2383.590 -59.23 2.00 1.03 39.00 ≤54 PASS AV 2390.000 -59.89 2.00 1.03 38.34 ≤54 PASS Peak 2310.000 -53.57 2.00 0.00 43.63 ≤74 PASS Peak 2314.690 -48.71 2.00 0.00 48.49 ≤74 PASS Peak 2390.000 -52.26 2.00 0.00 44.94 ≤74 PASS High 2462 AV 2483.500 -59.43 2.00 1.33 39.10 ≤54 PASS AV 2494.120 -58.83 2.00 1.33 39.70 ≤54 PASS AV 2500.000 -59.82 2.00 1.33 38.71 ≤54 PASS Peak 2483.500 -50.78 2.00 0.00 46.42 ≤74 PASS Peak 2485.320 -48.67 2.00 0.00 48.53 ≤74 PASS Peak 2500.000 -50.9 2.00 0.00 46.30 ≤74 PASS 11N20SI SO Ant1 Low 2412 AV 2310.000 -60.2 2.00 1.06 38.06 ≤54 PASS AV 2387.360 -58.98 2.00 1.06 39.28 ≤54 PASS AV 2390.000 -59.56 2.00 1.06 38.70 ≤54 PASS Peak 2310.000 -51.75 2.00 0.00 45.45 ≤74 PASS Peak 2379.300 -49.03 2.00 0.00 48.17 ≤74 PASS Peak 2390.000 -52.75 2.00 0.00 44.45 ≤74 PASS High 2462 AV 2483.500 -59.62 2.00 1.12 38.70 ≤54 PASS AV 2492.910 -58.85 2.00 1.12 39.47 ≤54 PASS AV 2500.000 -59.25 2.00 1.12 39.07 ≤54 PASS Peak 2483.500 -52.63 2.00 0.00 44.57 ≤74 PASS Peak 2498.850 -49.1 2.00 0.00 48.10 ≤74 PASS Peak 2500.000 -51.05 2.00 0.00 46.15 ≤74 PASS 49 11N40SI SO Ant1 Low 2422 AV 2310.000 -60.21 2.00 1.06 38.05 ≤54 PASS AV 2389.850 -59.04 2.00 1.06 39.22 ≤54 PASS AV 2390.000 -58.67 2.00 1.06 39.59 ≤54 PASS Peak 2310.000 -52.29 2.00 0.00 44.91 ≤74 PASS Peak 2385.350 -48.84 2.00 0.00 48.36 ≤74 PASS Peak 2390.000 -51.62 2.00 0.00 45.58 ≤74 PASS High 2452 AV 2483.500 -59.21 2.00 0.87 38.86 ≤54 PASS AV 2488.625 -58.63 2.00 0.87 39.44 ≤54 PASS AV 2500.000 -58.97 2.00 0.87 39.10 ≤54 PASS Peak 2483.500 -50.76 2.00 0.00 46.44 ≤74 PASS Peak 2486.875 -48.41 2.00 0.00 48.79 ≤74 PASS Peak 2500.000 -52.14 2.00 0.00 45.06 ≤74 PASS Note： 1. The limit in dBm for average detector is conversion from 54dBuV/m, according to 15.209(a). The limit in dBm for peak detector is 20dB above the limit of average detector in dBm. 50 Test Graphs 11B_Ant1_Low_2412_AV 11B_Ant1_Low_2412_Peak 11B_Ant1_High_2462_AV 51 11B_Ant1_High_2462_Peak 11G_Ant1_Low_2412_AV 52 11G_Ant1_Low_2412_Peak 11G_Ant1_High_2462_AV 11G_Ant1_High_2462_Peak 53 11N20SISO_Ant1_Low_2412_AV 11N20SISO_Ant1_Low_2412_Peak 54 11N20SISO_Ant1_High_2462_AV 11N20SISO_Ant1_High_2462_Peak 11N40SISO_Ant1_Low_2422_AV 55 11N40SISO_Ant1_Low_2422_Peak 11N40SISO_Ant1_High_2452_AV 56 11N40SISO_Ant1_High_2452_Peak

1 FCC Appendix RF Test Data for 2.4GWIFI FCC ID : 2BXD5-CANDLEV Company : Beijing Baolu Technology Co., Ltd. EUT : NIMOU AI Glasses Model Number : Candlev Report No. : CTA26071700302 Reviewed By : Eric Wang 2 Appendix A: DTS Bandwidth Test Result TestMode Antenna Frequency[MHz] DTS BW [MHz] FL[MHz] FH[MHz] Limit[MHz] Verdict 11B Ant1 2412 10.240 2406.920 2417.160 0.5 PASS 2437 10.240 2431.920 2442.160 0.5 PASS 2462 10.240 2456.920 2467.160 0.5 PASS 11G Ant1 2412 15.680 2404.280 2419.960 0.5 PASS 2437 15.800 2429.160 2444.960 0.5 PASS 2462 15.760 2454.040 2469.800 0.5 PASS 11N20SISO Ant1 2412 16.560 2403.680 2420.240 0.5 PASS 2437 16.000 2429.440 2445.440 0.5 PASS 2462 16.320 2454.160 2470.480 0.5 PASS 11N40SISO Ant1 2422 35.920 2404.160 2440.080 0.5 PASS 2437 35.520 2419.640 2455.160 0.5 PASS 2452 35.200 2434.960 2470.160 0.5 PASS 3 Test Graphs 11B_Ant1_2412 11B_Ant1_2437 11B_Ant1_2462 4 11G_Ant1_2412 11G_Ant1_2437 5 11G_Ant1_2462 11N20SISO_Ant1_2412 11N20SISO_Ant1_2437 6 11N20SISO_Ant1_2462 11N40SISO_Ant1_2422 7 11N40SISO_Ant1_2437 11N40SISO_Ant1_2452 8 Appendix B: Occupied Channel Bandwidth Test Result TestMode Antenna Channel Frequency[MHz] OCB [MHz] FL[MHz] FH[MHz] Limit[MHz] Verdict 11B Ant1 2412 13.446 2405.2914 2418.7374 --- --- 2437 13.461 2430.2899 2443.7509 --- --- 2462 13.434 2455.3161 2468.7501 --- --- 11G Ant1 2412 16.837 2403.6589 2420.4959 --- --- 2437 16.814 2428.6241 2445.4381 --- --- 2462 16.843 2453.5766 2470.4196 --- --- 11N20SISO Ant1 2412 17.909 2403.0524 2420.9614 --- --- 2437 17.888 2428.1066 2445.9946 --- --- 2462 17.945 2453.0331 2470.9781 --- --- 11N40SISO Ant1 2422 36.134 2404.1189 2440.2529 --- --- 2437 36.073 2419.1321 2455.2051 --- --- 2452 36.153 2434.0471 2470.2001 --- --- 9 Test Graphs 11B_Ant1_2412 11B_Ant1_2437 11B_Ant1_2462 10 11G_Ant1_2412 11G_Ant1_2437 11 11G_Ant1_2462 11N20SISO_Ant1_2412 11N20SISO_Ant1_2437 12 11N20SISO_Ant1_2462 11N40SISO_Ant1_2422 13 11N40SISO_Ant1_2437 11N40SISO_Ant1_2452 14 Appendix C: Maximum conducted output power Test Result Test Mode Antenna Frequency[ MHz] Result [dBm] Limit [dBm] Verdict 11B Ant1 2412 8.69 ≤30.00 PASS 2437 8.76 ≤30.00 PASS 2462 8.93 ≤30.00 PASS 11G Ant1 2412 8.06 ≤30.00 PASS 2437 8.12 ≤30.00 PASS 2462 8.31 ≤30.00 PASS 11N20SISO Ant1 2412 7.8 ≤30.00 PASS 2437 8.07 ≤30.00 PASS 2462 8.09 ≤30.00 PASS 11N40SISO Ant1 2422 8.21 ≤30.00 PASS 2437 8.55 ≤30.00 PASS 2452 8.39 ≤30.00 PASS 15 Appendix D: Maximum power spectral density Test Result TestMode Antenna Frequency[MHz] Result[dBm/3-100kHz] Limit[dBm/3kHz] Verdict 11B Ant1 2412 -17.63 ≤8.00 PASS 2437 -18.02 ≤8.00 PASS 2462 -17.23 ≤8.00 PASS 11G Ant1 2412 -23.40 ≤8.00 PASS 2437 -23.71 ≤8.00 PASS 2462 -23.54 ≤8.00 PASS 11N20SISO Ant1 2412 -23.89 ≤8.00 PASS 2437 -23.57 ≤8.00 PASS 2462 -23.55 ≤8.00 PASS 11N40SISO Ant1 2422 -26.59 ≤8.00 PASS 2437 -24.66 ≤8.00 PASS 2452 -25.83 ≤8.00 PASS 16 Test Graphs 11B_Ant1_2412 11B_Ant1_2437 11B_Ant1_2462 17 11G_Ant1_2412 11G_Ant1_2437 18 11G_Ant1_2462 11N20SISO_Ant1_2412 11N20SISO_Ant1_2437 19 11N20SISO_Ant1_2462 11N40SISO_Ant1_2422 20 11N40SISO_Ant1_2437 11N40SISO_Ant1_2452 21 Appendix E: Band edge measurements Test Result TestMode Antenn a ChNam e Frequency[MH z] RefLevel[dB m] Result[dB m] Limit[dBm ] Verdic t 11B Ant1 Low 2412 -4.39 -54.89 ≤-24.39 PASS High 2462 -4.20 -57.19 ≤-24.2 PASS 11G Ant1 Low 2412 -8.62 -41.03 ≤-28.62 PASS High 2462 -8.02 -57.67 ≤-28.02 PASS 11N20SIS O Ant1 Low 2412 -8.57 -40.79 ≤-28.57 PASS High 2462 -8.35 -57.45 ≤-28.35 PASS 11N40SIS O Ant1 Low 2422 -11.55 -40.13 ≤-31.55 PASS High 2452 -11.24 -58.28 ≤-31.24 PASS 22 Test Graphs 11B_Ant1_Low_2412 11B_Ant1_High_2462 11G_Ant1_Low_2412 23 11G_Ant1_High_2462 11N20SISO_Ant1_Low_2412 24 11N20SISO_Ant1_High_2462 11N40SISO_Ant1_Low_2422 11N40SISO_Ant1_High_2452 25 26 Appendix F: Conducted Spurious Emission Test Result TestMode Antenna Frequency[MHz] FreqRange [Mhz] RefLevel [dBm] Result [dBm] Limit [dBm] Verdict 11B Ant1 2412 Reference -5.18 -5.18 --- PASS 30~1000 -5.18 -68.89 ≤-25.18 PASS 1000~26500 -5.18 -46.05 ≤-25.18 PASS 2437 Reference -4.65 -4.65 --- PASS 30~1000 -4.65 -68.68 ≤-24.65 PASS 1000~26500 -4.65 -46.52 ≤-24.65 PASS 2462 Reference -5.06 -5.06 --- PASS 30~1000 -5.06 -67.87 ≤-25.06 PASS 1000~26500 -5.06 -46.3 ≤-25.06 PASS 11G Ant1 2412 Reference -9.55 -9.55 --- PASS 30~1000 -9.55 -68.5 ≤-29.55 PASS 1000~26500 -9.55 -46.85 ≤-29.55 PASS 2437 Reference -8.74 -8.74 --- PASS 30~1000 -8.74 -68.66 ≤-28.74 PASS 1000~26500 -8.74 -46.26 ≤-28.74 PASS 2462 Reference -8.40 -8.40 --- PASS 30~1000 -8.40 -68.49 ≤-28.4 PASS 1000~26500 -8.40 -46.63 ≤-28.4 PASS 11N20SISO Ant1 2412 Reference -9.33 -9.33 --- PASS 30~1000 -9.33 -68.98 ≤-29.33 PASS 1000~26500 -9.33 -45.84 ≤-29.33 PASS 2437 Reference -10.13 -10.13 --- PASS 30~1000 -10.13 -68.56 ≤-30.13 PASS 1000~26500 -10.13 -46.04 ≤-30.13 PASS 2462 Reference -9.64 -9.64 --- PASS 30~1000 -9.64 -68.98 ≤-29.64 PASS 1000~26500 -9.64 -45.9 ≤-29.64 PASS 11N40SISO Ant1 2422 Reference -11.97 -11.97 --- PASS 30~1000 -11.97 -69.16 ≤-31.97 PASS 1000~26500 -11.97 -45.85 ≤-31.97 PASS 2437 Reference -11.73 -11.73 --- PASS 30~1000 -11.73 -68.68 ≤-31.73 PASS 1000~26500 -11.73 -46.23 ≤-31.73 PASS 2452 Reference -12.01 -12.01 --- PASS 30~1000 -12.01 -68.47 ≤-32.01 PASS 1000~26500 -12.01 -46.21 ≤-32.01 PASS 27 Test Graphs 11B_Ant1_2412_0~Reference 11B_Ant1_2412_30~1000 11B_Ant1_2412_1000~26500 28 11B_Ant1_2437_0~Reference 11B_Ant1_2437_30~1000 29 11B_Ant1_2437_1000~26500 11B_Ant1_2462_0~Reference 11B_Ant1_2462_30~1000 30 11B_Ant1_2462_1000~26500 11G_Ant1_2412_0~Reference 31 11G_Ant1_2412_30~1000 11G_Ant1_2412_1000~26500 11G_Ant1_2437_0~Reference 32 11G_Ant1_2437_30~1000 11G_Ant1_2437_1000~26500 33 11G_Ant1_2462_0~Reference 11G_Ant1_2462_30~1000 11G_Ant1_2462_1000~26500 34 11N20SISO_Ant1_2412_0~Reference 11N20SISO_Ant1_2412_30~1000

Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn FCC PART 15 SUBPART C TEST REPORT FCC PART 15.247 Report Reference No. .................... : FCC ID. .......................................... : CTA26071700302 2BXD5-CANDLEV Compiled by ( position+printed name+signature) . : File administrators Zoey Cao Supervised by ( position+printed name+signature) . : Project Engineer Ace Chai Approved by ( position+printed name+signature) . : RF Manager Eric Wang Date of issue .................................... : Jul. 25, 2026 Testing Laboratory Name ............. : Shenzhen CTA Testing Technology Co., Ltd. Address ............................................ : Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Applicant’s name ........................... : Beijing Baolu Technology Co., Ltd. Address ............................................ : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Test specification.......................... : Standard .......................................... : FCC Part 15.247 TRF Originator ................................. : Shenzhen CTA Testing Technology Co., Ltd. Shenzhen CTA Testing Technology Co., Ltd. All rights reserved. This publication may be reproduced in whole or in part for non-commercial purposes as long as the Shenzhen CTA Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen CTA Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Test item description .................... : NIMOU AI Glasses Trade Mark ....................................... : N/A Manufacturer .................................... : Beijing Baolu Technology Co., Ltd. Model/Type reference ...................... : Candlev Listed Models ................................... : Candlev1 Modulation Type .............................. : CCK/DSSS/OFDM Operation Frequency ....................... : From 2412 - 2462MHz Rating ............................................... : Input: 5V0.2A Battery: 3.8V 290mAh 1.102Wh Result ............................................... : PASS Report No.: CTA26071700302 Page 2 of 31 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn T E S T R E P O R T Equipment under Test : NIMOU AI Glasses Model /Type : Candlev Listed Models : Candlev1 Model difference : The PCB board, circuit, structure and internal of these models are the same, only model number and colour are different for these model. So the tests were performed on model Candlev and the test results for the main test model can cover the listed models. Applicant : Beijing Baolu Technology Co., Ltd. Address : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Manufacturer : Beijing Baolu Technology Co., Ltd. Address : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Test Result: PASS The test report merely corresponds to the test sample. It is not permitted to copy extracts of these test result without the written permission of the test laboratory. Report No.: CTA26071700302 Page 3 of 31 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn Contents 1 TEST STANDARDS ...................................................................................................................................... 4 2 SUMMARY .................................................................................................................................................... 5 2.1 General Remarks .............................................................................................................................. 5 2.2 Product Description ........................................................................................................................... 5 2.3 Equipment Under Test ....................................................................................................................... 5 2.4 Short description of the Equipment under Test (EUT) ...................................................................... 5 2.5 EUT configuration .............................................................................................................................. 5 2.6 EUT operation mode ......................................................................................................................... 6 2.7 Block Diagram of Test Setup ............................................................................................................. 6 2.8 Related Submittal(s) / Grant (s) ......................................................................................................... 6 2.9 Modifications ...................................................................................................................................... 6 3 TEST ENVIRONMENT ................................................................................................................................. 7 3.1 Address of the test laboratory .........................................................…

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Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn FCC PART 15 SUBPART C TEST REPORT FCC PART 15.247 Report Reference No. ...................: FCC ID. ......................................... : CTA26071700301 2BXD5-CANDLEV Compiled by ( position+printed name+signature) : File administrators Zoey Cao Supervised by ( position+printed name+signature) : Project Engineer Ace Chai Approved by ( position+printed name+signature) : RF Manager Eric Wang Date of issue ...................................: Jul. 25, 2026 Testing Laboratory Name .............: Shenzhen CTA Testing Technology Co., Ltd. Address ..........................................: Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Applicant’s name...........................: Beijing Baolu Technology Co., Ltd. Address ...........................................: Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Test specification ......................... : Standard ..........................................: FCC Part 15.247 Shenzhen CTA Testing Technology Co., Ltd. All rights reserved. This publication may be reproduced in whole or in part for non-commercial purposes as long as the Shenzhen CTA Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen CTA Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Equipment description ................ : NIMOU AI Glasses Trade Mark ......................................: N/A Manufacturer ...................................: Beijing Baolu Technology Co., Ltd. Model/Type reference .....................: Candlev Listed Models ..................................: Candlev1 Modulation ......................................: GFSK Frequency .......................................: From 2402MHz to 2480MHz Ratings ............................................: Input: 5V0.2A Battery: 3.8V 290mAh 1.102Wh Result ..............................................: PASS Report No.: CTA26071700301 Page 2 of 35 Shenzhen CTA Testing Technology Co., Ltd. Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao’an District, Shenzhen, China Tel:+86-755 2322 5875 E-mail:[email protected] Web:http://www.cta-test.cn T E S T R E P O R T Equipment under Test : NIMOU AI Glasses Model /Type : Candlev Listed Models : Candlev1 Model difference : The PCB board, circuit, structure and internal of these models are the same, only model number and colour are different for these model. So the tests were performed on model Candlev and the test results for the main test model can cover the listed models. Applicant : Beijing Baolu Technology Co., Ltd. Address : Room 806, 8th Floor, Building 21, Zone 2, Tiantong Zhongyuan, Dongxiaokou Town, Changping District, Beijing, China Manufacturer : Beijing Baolu Technology Co., Ltd. Address : Room 806, 8th …

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