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  3. A3LAT50L6R

A3LAT50L6RDLP Projection TV

Samsung Electronics Co Ltd
DLP Projection TV - FCC ID A3LAT50L6R - Samsung Electronics Co Ltd
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Application Details

Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Date of Grant
Mar 10, 2005
Application Purpose
Original Equipment
Date of Application
Mar 10, 2005
Equipment Note
DLP Projection TV
Company
Samsung Electronics Co Ltd
Country
United States

Documents & Files

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Users Manual

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Block Diagram

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External Photos

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ID Label/Location Info

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Internal Photos

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

ID Label/Location Info

FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE)

Test Report

Page : 1 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE050291 Equipment under Test Address 416 Maetan3-Dong,Yeongtong-Gu,Suwon-Si,Gyeonggi-Do, Korea,443-742 Product Name DLP Projection Monitor Model Name AT50L6 Manufacturer SAMSUNG Brand Name SAMSUNG Variant Model See Page 3 FCC ID A3LAT50L6R Date of Test February 8 ~ 16, 2005 Issued Date February 22, 2005 Name/Position Signature Tested by Tae Young, Jang Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE 200623-0 Page : 2 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co. Ltd Model name AT50L6 Applicant Address Samsung Electronics Co. Ltd 416 Maetan3- Dong, Yeongtong-Gu, Suwon-Si, Gyeonggi-Do, Korea, 443-742 Contact Person Chang Young, Choi Kind of product DLP Projection Monitor Valiant list None Manufacturer Samsung Electronics Co. Ltd New / Alternative / Permissive change Information This report is original report # 1.2 Detail Information related Product Specification Page : 4 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Item(s) Description Power Supply AC 110 ~ 120V, 60Hz Maximum Resolution 1024 X 768 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cables were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. - PC video in - PC DVI in 1.4 Equipment Modifications No equipment modifications were required. Page : 5 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Seq Device Model Name Serial # Maker FCC ID A DLP Projection TV AT50L6 - SAMSUNG A3LAT50L6R B Personal Computer M6050 812092FRCO2822SAMSUNG DoC C Printer ML-1750 BABX822977N SAMSUNG A3LML-1750 D PS/2 Keyboard 5900 K15103278 SAMSUNG DoC E PS/2 Mouse M-S48a LZA95254368 SAMSUNG DoC Port Description Connect Cable Length [m] Shielded [Y/N] Remark 1 Power 1.5 No to the Mains 2 Ant 1 in 1.5 Yes To the SG 3 Ant 2 in 1.5 Yes To the SG 4 RF out 1.5 Yes Termination 5 Composite 1 in 1.5 No Termination 6 Composite 2 in 1.5 No Termination 7 Composite 3 in 1.5 No Termination 8 S-video 1 in 1.5 No Termination 9 S-video 2 in 1.5 No Termination 10 S-video 3 in 1.5 No Termination 11 Component 1 in 1.5 No Termination 12 Component 2 in 1.5 No Termination 13 PC audio in 1.5 No Termination 14 DVI audio in 1.5 No Termination 15 PC video in 1.5 Yes To the SG 16 PC DVI in 1.5 Yes To the SG 17 Composite out 1.5 No Termination 18 HDMI 1.5 Yes Termination Page : 6 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram A B 259 10 7 68173111121314 15 4 16 18 C D E Page : 7 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Applied Standards List Applied Standards Test Procedure FCC Part15 Subpart B ANSI C63.4 : 2003 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 16-1, 16-2. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Radiated Emission ±5.09 Conducted Emission ±1.64 (According to NAMAS Pub.NIS81) Page : 8 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conduc…

Text truncated - open the document above for the full version.

Test Setup Photos

Page : 17 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission Picture 2. Radiated Emission (front view) Page : 18 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050291 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (rear view)

Contact Information

Applicant

Jenni Chun(General Manager)
[email protected]973-808-6375Fax: 973-808-6361

Technical Contact

PCTEST Engineering Lab., Inc.Randy Ortanez
[email protected]410-290-6652

6660-B Dobbin Road · Columbia, Maryland · United States

Test Firm

SAMSUNG ELECTRONICS CO., LTD.No Cheon Park
[email protected]82-31-200-2185Fax: 82-31-200-2189

Technical Specifications

#Rule PartsFrequency RangePower Output
115B--
Grant Notes
Max. Resolution: 1024 x 768

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