A3LAT56L7DLP Projection TV

FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE)

Page : 1 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE041242 Equipment under Test Address 416 Maetan3-Dong,Yeongtong-Gu,Suwon-City,Gyeonggi-Do, Korea,443-742 Product Name DLP PROJECTION TV Model Name AT56L7 Manufacturer SAMSUNG Brand Name SAMSUNG FCC ID A3LAT56L7 Variant Model See Page 3 Date of Test June 14 ~ 16 , 2004 Issued Date June 17, 2004 Name/Position Signature Tested by Sung Wook Choi Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Kyu Baek, Chung Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE 200623-0 Page : 2 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3. 1 Conducted Emission 3. 2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co. Ltd; Model name AT56L7 Applicant Address Samsung Electronics Co. Ltd; 416 Maetan3- Dong, Yeongtong-Gu, Suwon-City, Gyeonggi-Do, Korea, 443-742 Contact Person SEUNGCHEOL LEE Kind of product DLP PROJECTION TV Valiant list None Manufacturer Samsung Electronics Co.Ltd; 1.2 Detail Information related Product Specification Resolution 1280 * 720 Horizontal Frequency 45kHz Vertical Frequency 60Hz Operating Frequency 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. The mode of operation utilized for testing was selected to best simulate typical EUT use. - PC Video Input - PC DVI Input 1.4 Equipment Modifications No equipment modifications were required. Page : 4 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Mark Item Model No. Serial No. Manufacturer FCC ID A DLP PROJECTION TV AT56L7 - Samsung A3LAT56L7 B Personal Computer M6050 810292FRC02822 SAMSUNG DOC C Printer K10158 CLG001000275 Canon DOC D Printer Adapter K30088 CLG001000275 Canon DOC E PS/2 Keyboard SEM-DT35 K1C111342 SAMSUNG DOC F PS/2 Mouse P801 01117287 SAMSUNG DOC Used Cable Description Connect Cable Length [m] Shielded [Y/N] Remark 1 Parallel (Printer) 1.7 Yes 2 DLP PROJECTION TV 1.5 Yes 3 DVI 1.5 Yes 4 PS/2 1.5 Yes 5 Component Video Out 1.5 No 6 AV IN 1.5 No 7 Component Audio Out 1.5 No 8 S -Video Out 1.5 Yes 9 AV Out 1.5 No Page : 5 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram 1.6 Applied Standards List Product or Generic Standards Basic Standards FCC Part15 Subpart B ANSI 63.4 : 2000 Page : 6 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 22, 16-1, 16-2, 11. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Radiated Disturbance 5.09 Disturbance voltage at the mains terminals 1.64 Disturbance Power 2.46 (According to NAMAS Pub.NIS81) Page : 7 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conducted Emission FCC Part15 Subpart B Complied 3.2 Radiated Emission FCC Part15 Subpart B Complied Page : 8 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 3. Description of Individual Tests 3.1 Conducted Emission Test Information Test Engineer Sung Wook Choi Test Date June 16, 2004 Climate Condition Ambient Temperature : 23°C Relative Humidity : 37% Test Place Shield Room #5 Test Equipments Calibration Equipment Modal Name Manufacturer Serial No. Next Date Interval Spectrum Analyzer E7405A Agilent US4110272 2005-07-14 12 L.I.S.N ESH3-Z5 R&S 100261 2004-07-16 12 Field strength me…

Text truncated - open the document above for the full version.

Page : 16 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission (Front) Picture 2. Conducted Emission (Rear) Page : 17 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE041242 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (Front) Picture 4. Radiated Emission (Rear)