A3LHXD7Compact Component System

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FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE)

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Page : 1 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE050566 Equipment under Test Address 516229, Chen Jiang town, Huizhou City, Guangdong Province, China Product Name Compact Component System Model Name CA-HXD7 Manufacturer SAMSUNG ELECTRONICS HUIZHOU CO., LTD Brand Name JVC Variant Model See Page 3 FCC ID A3LHXD7 Date of Test March 22 ~ 23, 2005 Issued Date March 24, 2005 Name/Position Signature Tested by Tae Young, Jang Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. Page : 2 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant SAMSUNG ELECTRONICS HUIZHOU CO., LTD Model name CA-HXD7 Applicant Address 516229, Chen Jiang town, Huizhou City, Guangdong Province, China Contact Person Oh Won, Seo Kind of product Compact Component Syetem Valiant list None Manufacturer SAMSUNG ELECTRONICS HUIZHOU CO., LTD 1.2 Detail Information related Product Specification Item(s) Description Power Supply AC 120V, 60Hz Power consumption 160W/210VA USB USB Version 1.1 Dimension 175 mm x 373 mm x 389 mm 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cables were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. - USB Streaming 1.4 Equipment Modifications No equipment modifications were required. Page : 4 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Seq Device Model Name Serial # Maker FCC ID A Audio Systems CA-HXD7 - JVC A3LAT50L6 B Note PC X15 BA68-02276A20 SAMSUNG DoC C Speaker PSFS6102 - SAMSUNG - D Head Phone - - SAMSUNG - E Loop Antenna - - JVC - F Remote Controller - - JVC - Port Description Connect Cable Length [m] Shielded [Y/N] Remark 1 Power 1.5 No to the Mains 2 Ant 1 in 1.5 Yes To the SG 3 USB 1.5 Yes To the PC 4 AUX 1.5 Yes Not termination 5 Speaker 1.5 No To the Speaker 6 Headphone 1.5 No To The Headphone Page : 5 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram 1.6 Applied Standards List Applied Standards Test Procedure FCC Part15 Subpart B ANSI C63.4 : 2003 Page : 6 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 16-1, 16-2. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Conducted Emission 1.64 Radiated Emission 5.09 (According to NAMAS Pub.NIS81) Page : 7 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conducted Emission FCC Part15 Subpart B Complied 3.2 Radiated Emission FCC Part15 Subpart B Complied Page : 8 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 3. Description of Individual Tests 3.1 Conducted Emission Test Information Test Engineer Tae Young, Jang Test Date March 23, 2005 Climate Condition Ambient Temperature : 20.5 Relative Humidity : 38% Test Place Shield Room #5 Test Equipments Calibration Equipment Modal Name Manufacturer Serial No. Next Date Interval L.I.S.N ESH3-Z5 R&S 100261 2005-07-23 12 Test Software EP5CE TOYO None N/A N/A Spectrum Analyzer E7405A Agilent US4110272 2005-08-26 12 Field strength meter ESS-30 R…

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Page : 12 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission(Front View) Picture 1. Conducted Emission(Side View) Page : 13 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050566 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (Front View) Picture 4. Radiated Emission (Rear View)