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EUT Photograph Front of EUT Rear of EUT
EUT Photograph Label and Label position
EUT Photograph EUT Photograph Label and Label position EUT Photograph EUT Photograph EUT Photograph
Project Number : E1-02-0161 Page 1 of 15 EMC TEST REPORT According to FCC Part 18 β ISM Consumer Device Project Number : E1-02-0161 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 18 CFR47 Subpart C Intentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. 1. Applicant Name :SAMSUNG ELECTRONICS CO., LTD. 416 Maetan 3 Dong, Paldal-Ku, Suwon City, Kyungki Do, Korea, 442-742 2. Identification of tested device 2.1 FCC ID :A3LMC1015 2.2 Device Name :MICROWAVE OVEN 2.3 Trade Name :SAMSUNG Electronics Co.,Ltd. 2.4 Model Number :MC1015WB 2.5 RF Output Power :1000W(by IEC 705 method) 3. Test Procedure and Items 3.1 FCC/OST MP-5 : 1986 4. Issued Date :May 7, 2002 Tested by: Chun Kyu, PARK / Test Engineer Reviewed by: Yang Soo, KIM / Manager of EMC Lab. Authorized by: Kyu Baek, CHUNG / Chief of EMC Lab. This reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE :200447-0 Project Number : E1-02-0161 Page 2 of 15 TABLE OF CONTENTS 1. Product Description 2. Test Facility 3. Accreditation and Listing 4. Radio Noise Emission Measurement Procedures/Results 4.1 Radiation Hazard Measurement 4.2 Input Power Measurement 4.3 RF Output Power Measurement 4.4 Operation Frequency Measurement 4.4.1 Variation in Operating Frequency with Time Measurement 4.4.2 Variation in Operating Frequency with Voltage Measurement 4.4.3 Variation in Operating Frequency with Time Plot 4.4.4 Variation in Operating Frequency with Voltage Plot(96Vac) 4.4.5 Variation in Operating Frequency with Voltage Plot(120Vac) 4.4.6 Variation in Operating Frequency with Voltage Plot(150Vac) 4.5 Radiated Emission Measurement 4.5.1 Radiated Emission Measurement Procedure 4.5.2 Radiated Emission Measurement Configuration 4.5.3 Radiated Emission Measurement Data(30 - 1000MHz) 4.5.4 Radiated Emission Measurement Data(1 - 25GHz) 5. Measurement Equipment List This reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Project Number : E1-02-0161 Page 3 of 15 1. Product Description The equipment under test is a microwave oven sold for consumer use. Model :MC1015WBis a1000W microwave oven with digital controls. 1) Installation Type: Counter-Top 2) Magnetron : OM-75P manufactured by Samsung Electronic Co., Ltd. 3) Electrical Ratings Power Supply : 120 V ac, 60 Hz Operating Frequency : 2450 +/- 50 MHz Power Input : 1500 W (Microwave) Clock Frequency : 4.0 MHz 2. Test Facility The Semi-anechoic chamber and Conducted measurement facilities used to collect the radiated data are located at 416 Maetan 3 Dong, Paldal-Ku, Suwon City, Kyungki Do, Korea. The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR Publication 22. 3. Accreditation and Listing The test facilities used to perform radiated and conducted emissions tests are accredited by National Voluntary Laboratory Accreditation Program for the specific of accreditation under Lab Code: 200447-0 to perform Electromagnetic Interference tests according to FCC PART 15 and CISPR 22 requirements. No part of this report may be used to claim or imply product endorsement by NVLAP or any agency of the US Government. In addition, the test facilities are listed with Federal Communications Commission(Registration Number:98856, Anechoic Chamber #1). This reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Project Number : E1-02-0161 Page 4 of 15 4. Radio Noise Emission Measurement Procedures/Results 4.1 Radiation Hazard Measurement A 700-ml water load was placed in the center of the oven. The power setting was set to maximum power. While the oven was operating, the Microwave Survey Meter probe was moved slowly around the door seams to check for leakage. Fig. 1 Test Setup and the locations of maximum leakage The results of this test are as follows. ProbeMaximum LeakageLimit Location[mW/Cm2][mW/Cm2] 20.101.0 50.101.0 90.101.0 All others0.051.0 This reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 12 4 3 5 7 8 9 6 Project Number : E1-02-0161 Page 5 of 15 4.2 Input Power Measurement Input power and current were measured using a Power Analyzer. A 700ml water load was placed in the center of the oven and the oven set to maximum power. A 700 ml water load was chosen for its compatibility. Manufacturers to determine their input ratings commonly use this procedure. The results of this test are as follows. InputInputMeasuredEUT Spec. VoltageCurrentInput powerInput power [Vac][amps][watts][watts] 120 12.714851500 Based on the measured input power, the EUT was found to be operating within the intended specifications. 4.3 RF Output Power Measurement The Caloric Method was used to determine maximum output power. The initial temperature of a 1000-ml water load was measured. The water load was placed in the center of the oven. The oven was operated at maximum output power for 120 seconds. Then the temperature of the water re-measured. QuantityStartingFinalElapsedRF Power of waterTemperatureTemperatureTime [ml][centigrade][centigrade][seconds][watts] 10001038.2120983.9 10001036.3120917.7 10001035120872.3 924.6 Power = (4.187 Joules/Cal) x (Volume in ml) x (Temp. Rise) Time in seconds The measured output was found to be ABOVE 500Watts. Therefore, in accordance with section 18.305 of Subpart C, the measured out-of-band emissions were compared to the 25xSQRT(power/500)[uV/m] @ 300M limit. This reports shall not be reproduced except in full, without the written approval of SEC EMC Tesβ¦
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Fig. 1 Test Setup for Input power & RF output power Fig. 2 Test Setup for Operating Frequency Measurements This reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Fig. 3 Test Setup for Radiated Emission(30 - 1000MHz) Fig. 4 Test Setup for Radiated Emission(1 - 25GHz) This reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory.
6660-B Dobbin Road Β· Columbia, Maryland Β· United States
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 18 | 2.45 GHz - 2.45 GHz | 1000 W |
Portable Handset
Equipment Class
6VL - 15E 6 GHZ Very Low Power DeviceBT,BLE Tablet DTS,UNII a,b,g,n,ac,ax,be and digitizer
Equipment Class
DTS - Digital Transmission SystemPortable Handset
Equipment Class
6CD - 15E 6 GHz Low Power Dual ClientBT,BLE Tablet DTS,UNII a,b,g,n,ac,ax and Digitizer
Equipment Class
DSS - Part 15 Spread Spectrum TransmitterWCDMA, LTE, 5G NR Tablet BT,BLE, DTS,UNII a b g n ac ax and Digitizer
Equipment Class
JBP - Part 15 Class B Computing Device Peripheral